CN101149413B - 优化探针台扎针次数的方法 - Google Patents
优化探针台扎针次数的方法 Download PDFInfo
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- CN101149413B CN101149413B CN 200610116403 CN200610116403A CN101149413B CN 101149413 B CN101149413 B CN 101149413B CN 200610116403 CN200610116403 CN 200610116403 CN 200610116403 A CN200610116403 A CN 200610116403A CN 101149413 B CN101149413 B CN 101149413B
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CN 200610116403 CN101149413B (zh) | 2006-09-22 | 2006-09-22 | 优化探针台扎针次数的方法 |
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CN 200610116403 CN101149413B (zh) | 2006-09-22 | 2006-09-22 | 优化探针台扎针次数的方法 |
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CN101149413A CN101149413A (zh) | 2008-03-26 |
CN101149413B true CN101149413B (zh) | 2010-09-29 |
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Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
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CN103336256B (zh) * | 2013-06-26 | 2016-03-30 | 上海华力微电子有限公司 | Wat探针卡智能处理系统及方法 |
CN105070320B (zh) * | 2015-08-11 | 2018-03-30 | 上海华虹宏力半导体制造有限公司 | 一种存储器晶圆测试方法及存储器测试机 |
CN116581051B (zh) * | 2023-07-12 | 2023-09-29 | 杭州朗迅科技股份有限公司 | 一种晶圆的测试方法及装置 |
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CN1797005A (zh) * | 2004-12-30 | 2006-07-05 | 威宇科技测试封装有限公司 | 用于晶圆测试的探针卡的钨针处理方法 |
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CN1797005A (zh) * | 2004-12-30 | 2006-07-05 | 威宇科技测试封装有限公司 | 用于晶圆测试的探针卡的钨针处理方法 |
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JP特开2002-368056A 2002.12.20 |
JP特开平11-121553A 1999.04.30 |
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Owner name: SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING Free format text: FORMER OWNER: HUAHONG NEC ELECTRONICS CO LTD, SHANGHAI Effective date: 20140110 |
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Free format text: CORRECT: ADDRESS; FROM: 201206 PUDONG NEW AREA, SHANGHAI TO: 201203 PUDONG NEW AREA, SHANGHAI |
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Effective date of registration: 20140110 Address after: 201203 Shanghai city Zuchongzhi road Pudong New Area Zhangjiang hi tech Park No. 1399 Patentee after: Shanghai Huahong Grace Semiconductor Manufacturing Corp. Address before: 201206, Shanghai, Pudong New Area, Sichuan Road, No. 1188 Bridge Patentee before: Shanghai Hua Hong NEC Electronics Co.,Ltd. |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100929 |
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CF01 | Termination of patent right due to non-payment of annual fee |