CN101140726A - Panel lighting test machine and detecting method thereof - Google Patents
Panel lighting test machine and detecting method thereof Download PDFInfo
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- CN101140726A CN101140726A CNA2007101816430A CN200710181643A CN101140726A CN 101140726 A CN101140726 A CN 101140726A CN A2007101816430 A CNA2007101816430 A CN A2007101816430A CN 200710181643 A CN200710181643 A CN 200710181643A CN 101140726 A CN101140726 A CN 101140726A
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Abstract
The invention discloses a testing machine for panel lighting and its method of detection, used for lighting testing and panel repairing, which comprises a base, a panel bearing base, a plurality of lighting testing units, a support stand and a laser repair unit. The panel bearing base, composed of a rectangular frame, a bearing board and a plurality of positioning units, is amounted on the base. The bearing board is equipped on the rectangular frame and the said positioning units are set separately on the sides of the bearing board. The lighting testing units is installed on the medial side of the rectangular frame, consisting of a slide rail, a plurality of probe sliders and a positioning unit for the probe sliders. The said probe sliders with a plurality of probes are separately equipped on the slide rail. The said positioning unit for the probe sliders is provided with a plurality of grooves, in which the probe sliders are amounted to limit the location of the said probe sliders. On the other hand, the said support frame fitted with the laser repair unit is equipped on the upside of the base.
Description
Technical field
The present invention relates to a kind of panel lighting test machine and detection method thereof, refer to a kind of panel lighting test machine that can effectively shorten the required time of panel Hotfix and can adjust the position of its probe slide block quickly and accurately especially.
Background technology
See also shown in Figure 1ly, it is the schematic perspective view of known panel lighting test machine.Known panel lighting test machine comprises: a base 11, a panel load bearing seat 12, a panel stationary fixture 13, a plurality of lighting test portion (not shown).Wherein, panel load bearing seat 12 is arranged on the base 11 and the Y direction in Fig. 1 moves back and forth on base 11, and 13 of panel stationary fixtures are arranged on the panel load bearing seat 12 and with a panel 14 and are fixed in wherein.In addition, aforesaid a plurality of lighting test portion (not shown) is arranged at the downside of panel stationary fixture 13 respectively and comprises a plurality of probe slide block (not shown) respectively, so that the needed signal of lighting test is inputed in the driving circuit (not shown) of panel 14.
But, owing to panel stationary fixture 13 is made for the size of foundation panel 14, so the size of each panel stationary fixture 13 is fixed.Therefore, when known panel lighting test machine is desired the panel of lighting test different size, operating personnel need earlier original panel stationary fixture 13 to be removed on panel load bearing seat 12, another panel stationary fixture 13 that will have another size again is mounted on the panel load bearing seat 12, known panel lighting test machine is lit a lamp detect the panel of another different size.
Moreover because aforesaid panel stationary fixture 13 has certain volume and weight, operating personnel must spend a period of time and just can finish the replacing program of aforesaid panel stationary fixture 13.Generally speaking, this section period is about 4 to 8 hours.And in the process of changing panel stationary fixture 13, known panel lighting test machine also can't operate, and causes the valuable board process time to be wasted.
On the other hand, because when lighting a lamp the panel of detection different size, the quantity and the position of each probe slide block (not shown) that a plurality of lighting test portion (not shown) of known panel lighting test machine is had are all inequality, so in the program of changing panel stationary fixture 13, operating personnel also need in the lump the probe slide block of right quantity accurately to be located in regular turn, just can make the panel of known panel lighting test machine lighting test different size, and this probe slide block finder also need expend many times.
In addition, because known panel lighting test machine can't carry out laser preparing at defective panel, when detecting defective panel, need the recording defect coordinate and coordinate data is sent to the laser preparing board, again panel is sent to the laser preparing board and repairs.Because there is the location zero error in different platform, even if before carrying out laser preparing, reorientate positions of panels, also can cause the laser preparing offset, cause repairing failure carrying out laser preparing often because of the defect coordinate skew that positions of panels and panel lighting test machine write down.And the panel of finishing laser preparing need retransfer to panel lighting test machine and carry out lighting test, confirms the laser preparing effect.The skew of delivery panel and laser preparing causes repairing failure back and forth all can increase the process time of lighting a lamp and detecting.
Therefore, industry needs a kind of can lighting a lamp at short notice to detect the panel of different size, and can adjust the panel lighting test machine of the position of its probe slide block quickly and accurately.
Summary of the invention
Fundamental purpose of the present invention is to provide a kind of panel lighting test machine and detection method thereof, can exempt the affirmation program that need continue and carry out after carrying out the panel Hotfix originally, effectively shortens the required time of panel Hotfix.
Another object of the present invention is to provide a kind of panel lighting test machine and detection method thereof, can adjust the position of its probe slide block quickly and accurately, detect the panel of different size so that light a lamp.
For reaching above-mentioned purpose, panel lighting test machine of the present invention, it is used to light a lamp and detects a panel, comprising: a base, a panel load bearing seat, a plurality of lighting test portion, a bracing frame and a laser preparing unit.Wherein, the panel load bearing seat is arranged on the base and along a predetermined direction and moves on this base, the panel load bearing seat comprises a rectangle framework, a loading plate and a plurality of positioning unit, and loading plate is arranged on the rectangle framework, and these positioning units then are arranged at the side of loading plate respectively.In addition, aforesaid a plurality of lighting test portion is arranged at the inboard of rectangle framework respectively and comprises a slide rail, a plurality of probe slide block and a probe slide block positioning unit respectively.These probe slide blocks are slidedly arranged on the slide rail and comprise a plurality of probes respectively, and probe slide block positioning unit has a plurality of grooves, and aforesaid probe slide block then lays respectively in these grooves to limit the position of described a plurality of probe slide blocks.On the other hand, bracing frame is arranged at the upside of base, and the laser preparing unit then is arranged on the bracing frame and along another predetermined direction and moves on bracing frame.
Beneficial effect of the present invention is: use panel lighting test machine of the present invention need not change known panel stationary fixture and just can light a lamp and detect the panel of different size, effectively shorten the processing procedure switching time of panel lighting test machine.In addition, because panel lighting test machine of the present invention has the laser preparing unit, so can carry out panel defect after test repairs, and panel lighting test machine of the present invention is this panel after repairing of lighting test directly, and need not again this panel be moved, effectively shorten the required time of panel test and Hotfix.At last, by using a probe slide block positioning unit, each lighting test portion that panel lighting test machine of the present invention had all can adjust the position of each probe slide block that they had respectively quickly and accurately, detects the panel of different size so that light a lamp.
Description of drawings
Fig. 1 is the schematic perspective view of known panel lighting test machine.
Fig. 2 is the schematic perspective view of the panel lighting test machine of one embodiment of the invention, and wherein the panel size of the panel lighting test machine of one embodiment of the invention institute lighting test is 28.194 cun (promptly 37 inches).
Fig. 3 is the decomposing schematic representation of the panel lighting test machine of one embodiment of the invention.
Fig. 4 A is the schematic perspective view of lighting test portion of the panel lighting test machine of one embodiment of the invention.
Fig. 4 B is the schematic perspective view of probe slide block of lighting test portion of the panel lighting test machine of one embodiment of the invention.
Fig. 5 A, Fig. 5 B and Fig. 5 C are the synoptic diagram that each probe slide block of the lighting test portion of the panel lighting test machine of one embodiment of the invention is positioned the step on the slide rail.
Fig. 6 is the schematic perspective view of the panel lighting test machine of one embodiment of the invention, and wherein the panel size of the panel lighting test machine of one embodiment of the invention institute lighting test is 30.044 cun (promptly 42 inches).
Fig. 7 A and Fig. 7 B are when the panel of the panel lighting test machine lighting test different size of one embodiment of the invention, the synoptic diagram of the distribution of each probe slide block of its lighting test portion.
Fig. 8 is the schematic perspective view of the panel lighting test machine of another embodiment of the present invention, and wherein the panel size of the panel lighting test machine of another embodiment of the present invention institute lighting test is 28.194 cun (promptly 37 inches).
Fig. 9 is the decomposing schematic representation of the panel lighting test machine of another embodiment of the present invention.
Wherein, description of reference numerals is as follows:
11,21,81 bases, 12,22,82 panel load bearing seats
13 panel stationary fixtures, 14,3,9 panels
25,85 bracing frames, 26,86 laser preparing unit
23,24,83,84 lighting test portions, 28,88 light source cells
29,89 supplemental support seats, 31,32 sides
33 the 3rd sides, 221,821 rectangle frameworks
222,822 loading plates, 223,224,823,824 positioning units
225,226,825,826 press strips, 231,52 slide rails
232,531,532,533 probe slide blocks, 233,243,51 probe slide block positioning units
261 image acquisition units, 291,891 panel support portions
271,272,273,274,871,872,873,874 vacuum suction unit
292,892 auxiliary point lamp test portions, 2221,2222,8221,8222 sides
2321 slide block bodies, 2322 fixed cells
2323 probes, 2332,2432,514 protuberances
2331,2431,511,512,513 grooves
2912,2913,8912,8913 linear slide rails, 2911,8911 screw rods
711,712,713,714,715,716,717,721,722,723,731,732,733,734,735,736,737,738,741,742,743,744 probe slide blocks
Embodiment
At first, see also Fig. 2 and shown in Figure 3, wherein Fig. 2 is the schematic perspective view of the panel lighting test machine of one embodiment of the invention, and Fig. 3 then is the decomposing schematic representation of the panel lighting test machine of one embodiment of the invention.The panel lighting test machine of one embodiment of the invention comprises: base 21, panel load bearing seat 22, a plurality of lighting test portion 23,24, bracing frame 25 and laser preparing unit 26.Wherein, panel load bearing seat 22 is arranged on the base 21 and the Y direction in Fig. 2 moves back and forth on base 21.In addition, panel load bearing seat 22 comprises rectangle framework 221, loading plate 222 and a plurality of positioning unit 223,224, and loading plate 222 is arranged on the rectangle framework 221, and 223,224 of a plurality of positioning units are arranged at the dual- side 2221,2222 of loading plate 222 respectively.In the present embodiment, loading plate 222 is a rectangular glass.In addition, 223,224 of aforesaid a plurality of positioning units are respectively " X-locatees edge strip " and " Y-locatees edge strip ", and both are orthogonal but do not contact with each other.Be noted that for simplicity of illustration, Fig. 3 does not draw base 21, bracing frame 25 and laser preparing unit 26.
On the other hand, panel load bearing seat 22 also comprises a plurality of press strips 225,226 that lay respectively at the upside of loading plate 222, and when panel 3 is placed on panel load bearing seat 22 when detecting to light a lamp, these press strips 225,226 contact with panel 3, are fixed on the loading plate 222 so that panel 3 is oppressed.In the present embodiment, these press strips 225,226 correspond respectively to aforesaid positioning unit 223,224 and are arranged at the upside of loading plate 222.
Please consult Fig. 3 again, the panel lighting test machine of one embodiment of the invention also comprises a plurality of vacuum suction unit 271,272,273,274, and these vacuum suction unit 271,272,273,274 are arranged at the downside of loading plate 222.When panel 3 was fixed in a ad-hoc location on the loading plate 222 by aforesaid a plurality of positioning units 223,224 after, these vacuum suction unit 271,272,273,274 just further were fixed in panel 3 on the load bearing seat 22 by the mode that vacuumizes.In addition, the panel lighting test machine of one embodiment of the invention also comprises at least one light source cell 28, and it also is arranged at the downside of loading plate 222, so that needed light source when carrying out the lighting test program to be provided.In the present embodiment, light source cell 28 is a backlight module.
For another example shown in Fig. 4 A, aforesaid a plurality of lighting test portion 23 is arranged at the inboard of rectangle framework 221 respectively, and lighting test portion 23 comprises a slide rail 231, a plurality of probe slide block 232 and a probe slide block positioning unit 233.In addition, because the structure of lighting test portion 24 is identical with lighting test portion 23, just repeat no more at this.On the other hand, because the light a lamp size of panel 3 of detection of the panel lighting test machine of one embodiment of the invention for example is 28.194 cun (promptly 37 inches), aforesaid lighting test portion 23 has 7 probe slide blocks, and 24 in lighting test portion has 3 probe slide blocks.But, when the panel lighting test machine of one embodiment of the invention is lit a lamp when detecting the panel of another different size, as a panel that is of a size of 30.044 cun (promptly 42 inches), aforesaid lighting test portion 23 and 24 in lighting test portion have the probe slide block of different numbers in addition.
In addition, shown in Fig. 4 B, aforesaid probe slide block 232 comprises slide block body 2321, fixed cell 2322 and a plurality of probe 2323, and slides on slide rail 231.In addition, though in the present embodiment, fixed cell 2322 is a fixed screw, and in other application, fixed cell 2322 also can be geometrical clamp or magnet unit.
On the other hand, shown in Fig. 4 A, probe slide block positioning unit 233 has a plurality of grooves 2331, and the shape of these grooves is corresponding with the slide block body that aforesaid each probe slide block 232 is had respectively respectively.And as shown in Figure 3, the probe slide block positioning unit 243 of lighting test portion 24 also has a plurality of grooves 2431, and the shape of these grooves 2331,2431 is corresponding with the slide block body that aforesaid probe slide block 232 is had respectively respectively.Therefore, aforesaid each probe slide block can lay respectively in these grooves that probe slide block positioning unit 233,243 had.
At last, aforesaid probe slide block positioning unit 233,243 has a protuberance 2332,2432 respectively, probe slide block positioning unit 233,243 can be respectively by protuberance 2332,2432 be resisted against respectively slide rail 231 an end mode and combine with slide rail 231.So, aforesaid each probe slide block position on each slide rail just can be determined by probe slide block positioning unit 233,243 easily.As for the detailed step that these probe slide blocks is positioned on the slide rail, after will being described in.
Again as shown in Figure 2, the bracing frame 25 of the panel lighting test machine of one embodiment of the invention is arranged at the upside of base 21, and in the present embodiment, bracing frame 25 is a gantry structure.In addition, laser preparing unit 26 is arranged on the bracing frame 25, and it moves back and forth on bracing frame 25 along the directions X among Fig. 2.On the other hand, laser preparing unit 26 can also comprise an image acquisition unit 261, with the image of acquisition panel 3.In the present embodiment, image acquisition unit 261 is that a collocation has the charge-coupled device (CCD) of an optical microscope, and it can be shown in the image of panel in the one display unit (not shown) and confirms for operating personnel whether panel defect is finished by repairing.
In addition, as shown in Figures 2 and 3, the panel lighting test machine of one embodiment of the invention also comprises supplemental support seat 29, it is positioned at a side of the rectangle framework 221 of panel load bearing seat 22, lit a lamp with the panel lighting test machine of convenient one embodiment of the invention and to be detected the size during know panel 3 greater than a particular value, as 28.194 cun (promptly 37 inches), assist to support the end that panel 3 protrudes in loading plate 222, avoid panel 3 to be out of shape because of action of gravity.
In addition, supplemental support seat 29 comprises panel support portion 291 and auxiliary point lamp test portion 292.Panel support portion 291 comprises screw rod 2911 and a plurality of linear slide rail 2912,2913, make supplemental support seat 29 can towards or move away from panel load bearing seat 22.As for the structure of auxiliary point lamp test portion 292, since identical with lighting test portion 23, just repeat no more at this.
About aforesaid each probe slide block being positioned at the detailed step on the slide rail respectively, will cooperate Fig. 5 A, Fig. 5 B and Fig. 5 C to be described in down:
The size of the panel of definite at first, earlier desire lighting test is also standby with probe slide block positioning unit 51 taking-ups of correspondence.In the present embodiment, the size of panel 3 for example is 28.194 cun (promptly 37 inches), and probe slide block positioning unit 51 has a plurality of grooves 511,512,513 and a protuberance 514.In addition, will originally be fixed in the fixed cell of each probe slide block 531,532,533 of slide rail 52 again, for example be that the screw (not shown) unscrews respectively, makes these probe slide blocks 531,532,533 freely to slide on slide rail 52.
Subsequently, traveling probe slide block positioning unit 51 is to a side of slide rail 52 and aforesaid each the probe slide block 531,532,533 that slides respectively, making that these probe slide blocks 531,532,533 are corresponding respectively is arranged in each groove 511,512,513 that probe slide block positioning unit 51 is had, shown in Fig. 5 B.
Then, traveling probe slide block positioning unit 51 is resisted against an end of slide rail 52 up to protuberance 514.And in the process that probe slide block positioning unit 51 moves gradually, each groove 511,512,513 of probe slide block positioning unit 51 just drives each probe slide block 531,532,533 respectively and slides on slide rail 52.And when probe slide block positioning unit 51 when being resisted against an end of slide rail 52, just each probe slide block 531,532,533 be restricted in the ad-hoc location, shown in Fig. 5 C.
At last, again with the fixed cell of these probe slide blocks 531,532,533, for example be that the screw (not shown) screws respectively, make these probe slide blocks 531,532,533 be fixed on the slide rail 51.So, the panel lighting test machine of one embodiment of the invention just can be adjusted the position of its probe slide block quickly and accurately, detects the panel of different size so that light a lamp.
The step of lighting a lamp and detecting and repair a panel as for the panel lighting test machine of one embodiment of the invention, i.e. detection method then is described in detail in down:
At first, by aforesaid step, with each probe slide block of each lighting test portion be positioned respectively they on the ad-hoc location that should be positioned at.
Secondly, provide a panel 3, and panel 3 is positioned over the loading plate 222 of panel load bearing seat 22, and the dual- side 31,32 of panel 3 contacts with positioning unit 223,224 respectively, make panel 3 be located in the ad-hoc location on the loading plate 222.Then, 225,226 of press strips from the upside of loading plate 222 towards panel 3 near and contact with panel 3,271,272,273,274 downsides from loading plate 222 in vacuum suction unit adsorb panels 3, with the position of further fixed panel 3.
When panel 3 after the position on the loading plate 222 is fixed, lighting test portion 23,24 just moves gradually up, the probe that makes each probe slide block 232 be had respectively contacts with panel 3, in order to provide lighting test needed test signal in the driving circuit (not shown) of panel 3.So, the panel lighting test machine of one embodiment of the invention just can be lit a lamp and be detected panel 3 and whether have defective, when panel 3 is detected defective, and this panel defect location of location (or record).
After in case the position of panel defect is positioned out, the panel lighting test machine of one embodiment of the invention is the position of removable panel load bearing seat 22 and laser preparing unit 26 just, make laser preparing unit 26 be positioned at the panel defect top, make laser radiation that laser preparing unit 26 sent on the aforesaid panel defect that is positioned out, and repair this panel defect.
At last, after Hotfix is finished, the panel lighting test machine of one embodiment of the invention can get up near the panel image capture the panel defect part by the image acquisition unit 261 of its laser preparing unit 26, be shown in again in the display unit (not shown), confirm for operating personnel whether panel defect is finished by repairing.So, whether the panel after this repairs just no longer needs to be moved on the traditional type lighting test, be repaired to confirm aforesaid panel defect.That is to say that the panel lighting test machine of one embodiment of the invention can be exempted the affirmation program that need continue and carry out originally after carrying out the panel Hotfix, effectively shorten the required time of panel Hotfix.
See also Fig. 6, it detects the synoptic diagram that a size for example is the panel of 30.044 cun (promptly 42 inches) for the panel lighting test machine of one embodiment of the invention.At this moment, because panel 3 is of a size of 30.044 cun (promptly 42 inches), the one end just protrudes in outside the loading plate 222, and aforesaid supplemental support seat 29 just moves and protrudes in the part of loading plate 222 with panel support portion 291 support panels 3 towards panel 3, is out of shape because of action of gravity to avoid panel 3.In addition, the auxiliary point lamp test portion 292 of supplemental support seat 29 also contacts with panel 3, with the 3rd side 33 of auxiliary point lamp test panel 3, promptly carries out so-called " the 3rd edge point is bright " program.Light a lamp as for the panel lighting test machine of one embodiment of the invention and to detect the process of these 30.044 cun (promptly 42 inches) panels, since identical with the light a lamp process that detects 28.194 cun (promptly 37 inches) panels of the panel lighting test machine of aforesaid one embodiment of the invention, just repeat no more at this.
In addition, shown in Fig. 7 A and Fig. 7 B, when detecting the panel of different size when lighting a lamp, institute of each lighting test portion of the panel lighting test machine of one embodiment of the invention quantity and the position of the probe slide block of use respectively is all inequality.For example, when detecting 28.194 cun (promptly 37 inches) panels when lighting a lamp, lighting test portion 23 uses 7 probe slide blocks 711,712,713,714,715,716,717, and 24 in lighting test portion uses 3 probe slide blocks 721,722,723, shown in Fig. 7 A.
But, when detecting 30.044 cun (promptly 42 inches) panels when lighting a lamp, lighting test portion 23 but uses 8 probe slide blocks 731,732,733,734,735,736,737,738,24 in lighting test portion uses 4 probe slide blocks 741,742,743,744, and the position of each probe slide block all when before lighting a lamp the panel that detects one 28.194 cun (promptly 37 inches) position of each probe slide block different, shown in Fig. 7 B.That is to say, detect the panel of various sizes in order to light a lamp respectively, as 16.764 cun (promptly 22 inches), 28.194 cun (promptly 37 inches), 30.044 cun (promptly 42 inches) or 35.814 cun (promptly 47 inches) etc., the panel lighting test machine of one embodiment of the invention has a plurality of have the respectively groove of different numbers and the probe slide block positioning units of different groove arrangement modes, is positioned at diverse location on the slide rail respectively with each the probe slide block with its lighting test portion.
Therefore, when the panel lighting test machine of one embodiment of the invention need be lit a lamp when detecting the panel of different size, the panel lighting test machine of one embodiment of the invention only need be fixed in suitable probe slide block positioning unit one end of the slide rail of its lighting test portion, just can be quickly and accurately with the probe slide block of correct number be positioned to they the position that should be positioned at, significantly shorten the time that existing panel lighting test machine is changed the required cost of panel size that detects of lighting a lamp.
See also Fig. 8 and Fig. 9, wherein Fig. 8 is the schematic perspective view of the panel lighting test machine of another embodiment of the present invention, and Fig. 9 then is the decomposing schematic representation of the panel lighting test machine of another embodiment of the present invention.The panel lighting test machine of another embodiment of the present invention comprises: base 81, panel load bearing seat 82 and a plurality of lighting test portion 83,84.Wherein, panel load bearing seat 82 is arranged on the base 81 and the Y direction in Fig. 8 moves back and forth on base 81.In addition, panel load bearing seat 82 comprises rectangle framework 821, loading plate 822 and a plurality of positioning unit 823,824, and loading plate 822 is arranged on the rectangle framework 821, and 823,824 of a plurality of positioning units are arranged at the dual- side 8221,8222 of loading plate 822 respectively.In the present embodiment, loading plate 822 is a rectangular glass.In addition, 823,824 of aforesaid a plurality of positioning units are respectively " X-locatees edge strip " and " Y-locatees edge strip ", and both are orthogonal but do not contact with each other.Be noted that for simplicity of illustration, Fig. 9 does not draw base 81.
On the other hand, panel load bearing seat 82 also comprises a plurality of press strips 825,826 that lay respectively at the upside of loading plate 822, and when panel 9 is placed on the panel load bearing seat 82 when detecting to light a lamp, these press strips 825,826 contact with panel 9, are fixed on the loading plate 822 so that panel 9 is oppressed.In the present embodiment, these press strips 825,826 correspond respectively to aforesaid positioning unit 823,824 and are arranged at the upside of loading plate 822.
In addition, as shown in Figure 9, the panel lighting test machine of another embodiment of the present invention also comprises a plurality of vacuum suction unit 871,872,873,874, and these vacuum suction unit 871,872,873,874 are arranged at the downside of loading plate 822.When panel 9 was fixed in a ad-hoc location on the loading plate 822 by aforesaid a plurality of positioning units 823,824 after, these vacuum suction unit 871,872,873,874 just further were fixed in panel 9 on the load bearing seat 82 by the mode that vacuumizes.In addition, the panel lighting test machine of another embodiment of the present invention also comprises at least one light source cell 88, and it also is arranged at the downside of loading plate 822, needed light source when carrying out the lighting test program with the panel lighting test machine that another embodiment of the present invention is provided.In the present embodiment, light source cell 88 is a backlight module.
As for the structure and the mode of motion of lighting test portion 83,84, since identical with the structure and the mode of motion of the lighting test portion that panel lighting test machine had 23,24 of aforesaid one embodiment of the invention, just repeat no more at this.In addition, the panel lighting test machine of another embodiment of the present invention also comprises supplemental support seat 89, it is positioned at a side of the rectangle framework 821 of panel load bearing seat 82, lit a lamp the size of the panel 9 that detects during greater than a particular value with the panel lighting test machine of convenient another embodiment of the present invention, as 28.194 cun (promptly 37 inches), assistance supports the end that panel 9 protrudes in loading plate 822, avoids panel 9 to be out of shape because of action of gravity.On the other hand, supplemental support seat 89 comprises panel support portion 891 and auxiliary point lamp test portion 892.Panel support portion 891 comprises screw rod 8911 and a plurality of linear slide rail 8912,8913, make supplemental support seat 89 can towards or move away from panel load bearing seat 82.As for the structure and the mode of motion of auxiliary point lamp test portion 892, since identical with the structure and the mode of motion of the auxiliary point lamp test portion 292 that panel lighting test machine had of aforesaid one embodiment of the invention, just repeat no more at this.
In sum, panel lighting test machine of the present invention need not be changed the panel stationary fixture and just can light a lamp and detect the panel of another size, effectively shortens the processing procedure switching time of panel lighting test machine.In addition, because panel lighting test machine of the present invention has the laser preparing unit, so after having repaired panel defect, panel lighting test machine of the present invention is this panel after repairing of lighting test directly, and need not again this panel be moved to a traditional panel lighting test machine to carry out the affirmation program, effectively shorten the required time of panel Hotfix.At last, by using a probe slide block positioning unit, each lighting test portion that panel lighting test machine of the present invention had all can adjust the position of each probe slide block that they had respectively quickly and accurately, detects the panel of different size so that light a lamp.
The foregoing description is only given an example for convenience of description, and the interest field that the present invention advocated should come the described of claim to be as the criterion with right, but not only limits to the foregoing description.
Claims (12)
1. panel lighting test machine that detects and repair panel in order to light a lamp comprises:
One base;
One panel load bearing seat, be arranged on this base and and on this base, move along a predetermined direction, this panel load bearing seat comprises a rectangle framework, a loading plate and a plurality of positioning unit, and this loading plate is arranged on this rectangle framework, and described a plurality of positioning units are arranged at the side of this loading plate respectively;
At least one lighting test portion is arranged at the inboard of this rectangle framework and comprises that a slide rail, a plurality of probe slide block and a probe slide block positioning unit, described a plurality of probe slide blocks are slidedly arranged on this slide rail respectively and comprise a plurality of probes respectively; This probe slide block positioning unit has a plurality of grooves, and described a plurality of probe slide blocks lay respectively in described a plurality of groove;
One bracing frame is arranged at the upside of this base; And
One laser preparing unit is arranged on this bracing frame and along another predetermined direction and moves on this bracing frame.
2. panel lighting test machine as claimed in claim 1, wherein this panel load bearing seat also comprises a plurality of press strips, described a plurality of press strips lay respectively at the upside of this loading plate.
3. panel lighting test machine as claimed in claim 1, wherein this probe slide block positioning unit has a protuberance, and this protuberance combines with this slide rail by an end that is resisted against this slide rail.
4. panel lighting test machine as claimed in claim 1, wherein each probe slide block comprises a slide block body and a fixed cell, and the shape of this slide block body is corresponding with the shape of this groove.
5. panel lighting test machine as claimed in claim 1 also comprises: a supplemental support seat, and it is arranged at a side of this rectangle framework; And this panel lighting test machine also comprises a panel support portion and an auxiliary point lamp test portion.
6. panel lighting test machine as claimed in claim 5, wherein this auxiliary point lamp test portion comprises a slide rail, a plurality of probe slide block and a probe slide block positioning unit, the probe slide block positioning unit of this auxiliary point lamp test portion has a plurality of grooves, and a plurality of probe slide blocks of described auxiliary point lamp test portion lay respectively in a plurality of grooves of probe slide block positioning unit of described auxiliary point lamp test portion and comprise a plurality of probes respectively.
7. panel lighting test machine as claimed in claim 1 also comprises a plurality of vacuum suction unit, is arranged at the downside of this loading plate.
8. panel lighting test machine as claimed in claim 1 also comprises at least one light source cell, is arranged at the downside of this loading plate.
9. panel lighting test machine as claimed in claim 1, wherein this laser preparing unit also comprises an image acquisition unit.
10. method of utilizing the described panel lighting test machine of claim 1 to detect and repair panel comprises:
A plurality of probe slide blocks of this lighting test portion are positioned on the ad-hoc location;
One panel is provided, and this panel is positioned on this panel load bearing seat;
On this panel, provide a test signal to detect whether defectiveness of this panel;
As if this panel defectiveness, locate the position of this defective; And
Move this laser preparing unit to repair this defective in this defective locations top.
11. detection as claimed in claim 10 and the method for repairing panel, wherein the step that a plurality of probe slide blocks of this lighting test portion are positioned on the ad-hoc location also comprises:
Described a plurality of probe slide block is slided on this slide rail;
Move this probe slide block positioning unit in a side of this slide rail, and with described a plurality of probe slide blocks respectively correspondence be arranged in described a plurality of groove;
Move this probe slide block positioning unit up to an end that is resisted against this slide rail, to limit described a plurality of probe slide block in this ad-hoc location.
12. whether detection as claimed in claim 10 and the method for repairing panel, also being contained in provides a test signal to repair to detect this defective once more on this panel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007101816430A CN101140726B (en) | 2007-10-22 | 2007-10-22 | Panel lighting test machine and detecting method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007101816430A CN101140726B (en) | 2007-10-22 | 2007-10-22 | Panel lighting test machine and detecting method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101140726A true CN101140726A (en) | 2008-03-12 |
| CN101140726B CN101140726B (en) | 2010-06-09 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2007101816430A Active CN101140726B (en) | 2007-10-22 | 2007-10-22 | Panel lighting test machine and detecting method thereof |
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| CN101581677B (en) * | 2008-05-16 | 2012-10-03 | 深超光电（深圳）有限公司 | Method for classifying grade of panel to be detected of lighting tester |
| CN102884567A (en) * | 2010-06-17 | 2013-01-16 | 夏普株式会社 | Lighting inspection device |
| TWI391649B (en) * | 2008-09-16 | 2013-04-01 | Au Optronics Corp | Light-on tester for panel defect and light-on test method for panel defect |
| CN103176299A (en) * | 2013-03-08 | 2013-06-26 | 深圳市华星光电技术有限公司 | Detector and liquid crystal alignment machine |
| TWI402497B (en) * | 2008-04-22 | 2013-07-21 | Shuz Tung Machinery Ind Co Ltd | Image capturing apparatus with gantry |
| CN104764959A (en) * | 2015-04-15 | 2015-07-08 | 京东方科技集团股份有限公司 | Lighting jig |
| CN104991391A (en) * | 2015-07-30 | 2015-10-21 | 武汉华星光电技术有限公司 | Repair method for display panel |
| CN106251796A (en) * | 2015-06-12 | 2016-12-21 | 株式会社日本显示器 | Inspection device, the inspection method of display device mother substrate and the display device of display device |
| CN106840605A (en) * | 2017-01-17 | 2017-06-13 | 武汉华星光电技术有限公司 | Detection means and monitor station |
| CN106959532A (en) * | 2017-05-02 | 2017-07-18 | 京东方科技集团股份有限公司 | A kind of localization tool and lighting test system |
| TWI600885B (en) * | 2016-07-04 | 2017-10-01 | Mas Automation Corp | Optical panel detection method and apparatus thereof |
| CN107866697A (en) * | 2017-12-14 | 2018-04-03 | 安徽展鑫电子材料有限公司 | A kind of laser scanning device on copper-clad plate automatic-cutting line |
| CN108091287A (en) * | 2016-11-23 | 2018-05-29 | De&T株式会社 | Panel lighting check device |
| WO2019061608A1 (en) * | 2017-09-30 | 2019-04-04 | 深圳市华星光电半导体显示技术有限公司 | Panel lighting device, panel lighting test system and test method |
| CN110189669A (en) * | 2019-06-12 | 2019-08-30 | 深圳市华星光电半导体显示技术有限公司 | A kind of lighting test jig and test method |
| CN110596484A (en) * | 2019-08-13 | 2019-12-20 | 武汉华星光电技术有限公司 | Multi-size positioning device, lighting equipment and testing method of display panel |
| CN111203631A (en) * | 2020-03-12 | 2020-05-29 | 苏州晶振智能科技有限公司 | Intelligent detection laser repair method for display screen |
| CN111627364A (en) * | 2019-02-27 | 2020-09-04 | 利尔富(苏州)科技设备有限公司 | Two-side detection device of display panel |
| CN111883696A (en) * | 2020-08-26 | 2020-11-03 | 苏州迈为科技股份有限公司 | Method for repairing defects of OLED screen body |
| CN112072003A (en) * | 2020-08-26 | 2020-12-11 | 苏州迈为科技股份有限公司 | OLED screen body back repairing method and OLED screen body double-face repairing method |
| CN112059403A (en) * | 2020-08-26 | 2020-12-11 | 苏州迈为科技股份有限公司 | Follow-up OLED screen body laser repairing method for lighting mechanism |
| CN114018544A (en) * | 2021-07-13 | 2022-02-08 | 重庆康佳光电技术研究院有限公司 | Lighting device and lighting method |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| TWI402497B (en) * | 2008-04-22 | 2013-07-21 | Shuz Tung Machinery Ind Co Ltd | Image capturing apparatus with gantry |
| CN101581677B (en) * | 2008-05-16 | 2012-10-03 | 深超光电（深圳）有限公司 | Method for classifying grade of panel to be detected of lighting tester |
| TWI391649B (en) * | 2008-09-16 | 2013-04-01 | Au Optronics Corp | Light-on tester for panel defect and light-on test method for panel defect |
| CN102884567A (en) * | 2010-06-17 | 2013-01-16 | 夏普株式会社 | Lighting inspection device |
| CN102884567B (en) * | 2010-06-17 | 2015-01-28 | 夏普株式会社 | Lighting inspection device |
| CN103176299A (en) * | 2013-03-08 | 2013-06-26 | 深圳市华星光电技术有限公司 | Detector and liquid crystal alignment machine |
| CN104764959A (en) * | 2015-04-15 | 2015-07-08 | 京东方科技集团股份有限公司 | Lighting jig |
| US9881534B2 (en) | 2015-04-15 | 2018-01-30 | Boe Technology Group Co., Ltd. | Lighting fixture |
| CN106251796A (en) * | 2015-06-12 | 2016-12-21 | 株式会社日本显示器 | Inspection device, the inspection method of display device mother substrate and the display device of display device |
| US10283026B2 (en) | 2015-06-12 | 2019-05-07 | Japan Display Inc. | Inspection device of display device, method of inspecting mother substrate for display device, and display device |
| CN104991391B (en) * | 2015-07-30 | 2018-01-30 | 武汉华星光电技术有限公司 | The restorative procedure of display panel |
| CN104991391A (en) * | 2015-07-30 | 2015-10-21 | 武汉华星光电技术有限公司 | Repair method for display panel |
| TWI600885B (en) * | 2016-07-04 | 2017-10-01 | Mas Automation Corp | Optical panel detection method and apparatus thereof |
| CN108091287A (en) * | 2016-11-23 | 2018-05-29 | De&T株式会社 | Panel lighting check device |
| CN106840605A (en) * | 2017-01-17 | 2017-06-13 | 武汉华星光电技术有限公司 | Detection means and monitor station |
| CN106959532A (en) * | 2017-05-02 | 2017-07-18 | 京东方科技集团股份有限公司 | A kind of localization tool and lighting test system |
| WO2019061608A1 (en) * | 2017-09-30 | 2019-04-04 | 深圳市华星光电半导体显示技术有限公司 | Panel lighting device, panel lighting test system and test method |
| CN107866697A (en) * | 2017-12-14 | 2018-04-03 | 安徽展鑫电子材料有限公司 | A kind of laser scanning device on copper-clad plate automatic-cutting line |
| CN111627364A (en) * | 2019-02-27 | 2020-09-04 | 利尔富(苏州)科技设备有限公司 | Two-side detection device of display panel |
| CN111627364B (en) * | 2019-02-27 | 2022-11-15 | 利尔富(苏州)科技设备有限公司 | Two-side detection device of display panel |
| CN110189669B (en) * | 2019-06-12 | 2022-07-12 | 深圳市华星光电半导体显示技术有限公司 | Lighting test fixture and test method |
| CN110189669A (en) * | 2019-06-12 | 2019-08-30 | 深圳市华星光电半导体显示技术有限公司 | A kind of lighting test jig and test method |
| CN110596484A (en) * | 2019-08-13 | 2019-12-20 | 武汉华星光电技术有限公司 | Multi-size positioning device, lighting equipment and testing method of display panel |
| CN111203631A (en) * | 2020-03-12 | 2020-05-29 | 苏州晶振智能科技有限公司 | Intelligent detection laser repair method for display screen |
| CN112072003A (en) * | 2020-08-26 | 2020-12-11 | 苏州迈为科技股份有限公司 | OLED screen body back repairing method and OLED screen body double-face repairing method |
| CN112072003B (en) * | 2020-08-26 | 2022-06-21 | 苏州迈为科技股份有限公司 | OLED screen body back repairing method and OLED screen body double-face repairing method |
| CN112059403A (en) * | 2020-08-26 | 2020-12-11 | 苏州迈为科技股份有限公司 | Follow-up OLED screen body laser repairing method for lighting mechanism |
| CN111883696A (en) * | 2020-08-26 | 2020-11-03 | 苏州迈为科技股份有限公司 | Method for repairing defects of OLED screen body |
| CN114018544A (en) * | 2021-07-13 | 2022-02-08 | 重庆康佳光电技术研究院有限公司 | Lighting device and lighting method |
| CN114018544B (en) * | 2021-07-13 | 2023-12-19 | 重庆康佳光电科技有限公司 | Lighting device and lighting method |
| CN114815339A (en) * | 2022-05-17 | 2022-07-29 | 厦门特仪科技有限公司 | Off-line lighting equipment suitable for LCD screens of different sizes |
| CN114815339B (en) * | 2022-05-17 | 2023-09-26 | 厦门特仪科技有限公司 | Offline lighting device applicable to LCD screens of different sizes |
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