CN100535675C - Portable multi-channel photoelectronic chip detection signal generating device and detection method - Google Patents
Portable multi-channel photoelectronic chip detection signal generating device and detection method Download PDFInfo
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- CN100535675C CN100535675C CNB2005101262407A CN200510126240A CN100535675C CN 100535675 C CN100535675 C CN 100535675C CN B2005101262407 A CNB2005101262407 A CN B2005101262407A CN 200510126240 A CN200510126240 A CN 200510126240A CN 100535675 C CN100535675 C CN 100535675C
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Abstract
The invention relates to a mobile multichannel photo-electron chip testing signal generating device that includes keyboard input section, input signal buffer circuit, input/output state indicating circuit, multichannel photo-electron selecting circuit, state matrix assurance circuit, multichannel photo-electron chip driving circuit, output signal buffer circuit, and output signal and tested multichannel photo-electron chip electricity interface. It includes the following steps: keyboard designing the route selecting code, reading input signal buffer circuit, route selecting state indicating circuit reading data from buffer circuit, route selecting state display driving signal; state matrix confirming circuit selecting the working state of control unit.
Description
Technical field
The test signal that the present invention relates to a kind of portable semiconductor optoelectronic device produces equipment, is meant a kind of test signal generation device and feature measurement and fault detection method of realizing that multinomial multi-channel photoelectronic chip characteristics parameter detects simultaneously especially.
Background technology
Dense wave division multipurpose (DWDM) technology is a kind of effective ways that solve broadband, high capacity optical fiber network communication.The multi-channel photoelectronic chip is the critical component of structure dwdm system.In research, production and the application of multi-channel photoelectronic chip, need a kind of specific checkout equipment, this equipment can detect the various optics of each port of multi-channel photoelectronic chip and the overall characteristic parameter of electricity simultaneously, can possess higher detection efficient again, also simple to operate simultaneously, be easy to carry, be fit to common operator and maintenance use fast.Trade information up to now and open source literature show still do not have the proving installation that satisfies above-mentioned requirements in present existing test mode and the testing apparatus.Mainly there is following defective in currently used proving installation: the one, and the equipment heaviness is not easy to carry, and especially is not easy to the quick maintenance of fault in the practical application; The 2nd, complicated operation need have very high optics and electricity knowledge ability correct measurement desired parameters; The 3rd, to finish by artificial calculating the judgement of light path, be not suitable for the test of extensive multichannel chip; The 4th, test process needs expensive signal generator, and these equipment costs are very high, and also very high to the requirement of test environment.
Summary of the invention
The object of the present invention is to provide a kind of portable multi-channel photoelectronic chip photoelectric characteristic test signal generation device and feature measurement and fault detection method, this device have cost low, be convenient for carrying, simple to operate, advantage that testing efficiency is high.
Designed a kind of portable multi-channel photoelectronic chip detection signal generating device according to above-mentioned purpose, this device comprises input keyboard 1, input-buffer circuit 2, state matrix is determined circuit 3, output buffers circuit 4, the driving circuit 5 of multi-channel photoelectronic chip, state selecting circuit 6, input/output port indicating circuit 7, input/output port indicating equipment 8, multi-channel photoelectronic chip 9, and the surveying instrument 10 relevant with optical parameter measurement, multi-channel photoelectronic chip 9 is placed on the circuit board of special reservation, the well heater of each chip unit links to each other with driving circuit by the interface on the circuit board, wherein, input keyboard 1, input-buffer circuit 2, state matrix is determined circuit 3, output buffers circuit 4, the driving circuit 5 of multi-channel photoelectronic chip, multi-channel photoelectronic chip 9, the surveying instrument 10 relevant with optical parameter measurement is linked in sequence successively, input-buffer circuit 2 is linked in sequence successively with input/output port indicating circuit 7 and input/output port indicating equipment 8, and state selecting circuit 6 is connected in state matrix and determines circuit 3.
Wherein, the device that this device adopts is the TTL or the CMOS interface device of standard, and its power supply mode adopts DC power supply or powered battery mode; Input/output port information can directly input to the input metadata cache by keyboard, and input-buffer circuit 2 and output buffers circuit 4 adopt random access memory ram, flash memory FLASH, complex programmable logic array CPLD or on-site programmable gate array FPGA to constitute.State selecting circuit 6 is selected multi-form output test signal according to multi-channel photoelectronic chip 9 scales; State matrix confirms that circuit 3 can be complex programmable gate array CPLD or on-site programmable gate array FPGA.Can be according to input data and signal Processing input information that state selecting circuit sent, and the drive signal of output input/output state indicating section and multi-channel photoelectronic chip drives signal are to output buffers.Input/output port indicating equipment 8 adopts light emitting diode matrix LED or LCDs; The driving circuit 5 of multi-channel photoelectronic chip can be different chip switch elements different drive currents is provided, thereby makes each chip unit be in best delustring state; The drive current size that the driving circuit 5 of multichannel chip provides can be regulated.
The present invention directly imports the routing strobe signal by keyboard, and provides drive signal by the multi-channel photoelectronic chip drive circuit, and control multi-channel photoelectronic chip status is realized the switching of light path.Auxiliary with the surveying instrument relevant such as power meter, oscillograph etc. with optical parameter measurement, can detect the luminous power P that each output port is exported easily
o, the drive current size in the device also can utilize instrument to measure easily simultaneously.The parameter that the present invention detects has contained the normal attribute parameter of multi-channel photoelectronic chip, as Output optical power with the P that concerns of working current
o-I
OpCurve, loss and working current concern Loss-I
OpCurve, and crosstalk, operating power, speed etc.; Once can finish the test of multi-channel photoelectronic chip normal attribute with an equipment, and simple to operate, improve detection efficiency greatly.What is more important, this equipment have realized at low cost that by means of the electronic technology of maturation whole height of devices is integrated, and can directly adopt the powered battery mode that power supply is provided, whole device volume is little, is convenient for carrying, and is particularly suitable for the on-the-spot maintenance fast of fault in the practical application.
Description of drawings
For further specifying content of the present invention and characteristics, below in conjunction with drawings and Examples the present invention is done a detailed description, wherein:
Fig. 1 is the block scheme of proving installation of the present invention.
Fig. 2 is the circuit frame synoptic diagram of one embodiment of the invention.
Fig. 3 is a multi-channel photoelectronic chip unit driving circuit principle schematic of the present invention.
Fig. 4 is that the present invention carries out the workflow synoptic diagram of multi-channel photoelectronic chip characteristics when measuring.
Fig. 5 is the workflow synoptic diagram of the present invention when being applied to fault detect in the real work.
Embodiment
From Fig. 1 as seen, portable multi-channel photoelectronic chip detection signal generating device provided by the invention, comprise input keyboard 1, input-buffer circuit 2, state matrix is determined circuit 3, output buffers circuit 4, the driving circuit 5 of multi-channel photoelectronic chip, state selecting circuit 6, input/output port indicating circuit 7, input/output port indicating equipment 8, multi-channel photoelectronic chip 9, and the surveying instrument 10 relevant with optical parameter measurement, multi-channel photoelectronic chip 9 is placed on the circuit board of special reservation, the well heater of each chip unit links to each other with driving circuit by the interface on the circuit board, wherein, input keyboard 1, input-buffer circuit 2, state matrix is determined circuit 3, output buffers circuit 4, the driving circuit 5 of multi-channel photoelectronic chip, multi-channel photoelectronic chip 9, the surveying instrument 10 relevant with optical parameter measurement is linked in sequence successively, input-buffer circuit 2 is linked in sequence successively with input/output port indicating circuit 7 and input/output port indicating equipment 8, and state selecting circuit 6 is connected in state matrix and determines circuit 3.。
Fig. 2 has provided the circuit diagram of an embodiment of the described device of Fig. 1.In the present embodiment, the multi-channel photoelectronic chip is thermo-optical switch/modulator array.Among the figure, by two row's keyboard inputs, Protection Counter Functions is also by Keyboard Control simultaneously respectively for the input/output port route code.The input information of keyboard is read into input-buffer and is latched the device group simultaneously and latchs.In the present embodiment, this function is finished by a complex programmable gate array CPLD1.Input/output port indicating circuit and state selecting circuit and state matrix determine that circuit is collectively referred to as treatment circuit, CPLD2 finishes by another complex programmable gate array, and circuit structure comprises order register, command decoder, data register, output data register, on off state storer etc.CPLD2 reads in input data information from CPLD1 also to be handled, and finishes the driving of input/output port indicating equipment and the affirmation of array of photoswitch/modulator state.The input and output indicating equipment is light emitting diode matrix LED in the present embodiment, and it can demonstrate the sequence number of input/output port clearly, the logic determines during convenient the test.After thermo-optic switch array/modulator state was determined, control signal corresponding was sent to corresponding driving circuit control end.Driving circuit drives corresponding thermo-optical switch unit/modulator and realizes switch/modulation, and is auxiliary with optical measuring apparatus, can test out the various performance parameters of thermo-optic switch array/modulator easily.Whole test signal generation device adopts the unified power supply of 5V power supply, can finish with electric battery, and owing to used programmable array, volume is little, very convenient carrying.
Fig. 3 has provided the schematic diagram of multi-channel photoelectronic chip unit driving circuit.Come the conducting of controlling and driving triode or end by driving command, thereby provide electric current or power for well heater.Variable resistor R
VarConnect with well heater, thereby can change the switch motion that the electric current that flows through well heater changes the temperature of waveguide phase modulation (PM) arm and then realizes thermo-optical switch/modulator unit by regulating variable-resistance size.
Fig. 4 has provided the job order the when embodiment of the invention is carried out the measurement of multi-channel photoelectronic chip characteristics.When the present invention is applied to the measurement of multi-channel photoelectronic chip characteristics, should follow following job step:
A kind of use portable multi-channel photoelectronic chip detection signal generating device carries out multi-channel photoelectronic chip characteristics measuring method, and its step is as follows:
1) send out one group of test signal by input keyboard 1, this test signal is the route code of multi-channel photoelectronic chip input port and output port; Test signal is transfused to buffer circuit 2 and latchs and be admitted to state matrix and determine circuit 3 and input/output port indicating circuit 7, input/output port indicating circuit 7 drives input/output port indicating equipment 8 indication input/output port information according to test signal, simultaneously state matrix determines that circuit 3 determines the state of the selected multi-channel photoelectronic chip array of circuit instruction and driving command is sent into output buffers circuit 4 that the driving circuit 5 of multi-channel photoelectronic chip is obtained driving command from output buffers circuit 4 according to state matrix;
2) according to driving command, multi-channel photoelectronic chip drive circuit 5 corresponding driving triode conductings or end, well heater to multi-channel photoelectronic chip 9 each chip unit provides electric current, regulates the size that corresponding variable-resistance resistance can change drive current; Utilize the output power of the surveying instrument relevant 10 each output port of monitoring with optical parameter measurement;
3) the draw relation curve of the loss of multi-channel photoelectronic chip, characteristic such as crosstalk and drive current;
4) regulate the drive current size that variable-resistance resistance makes each chip unit successively and be the optimum drive current value, detect the output power of each output port this moment, by calculating loss, crosstalk effect and the chip power-consumption that can obtain chip;
5) zero clearing is sent the zero clearing order by keyboard, and device is placed init state;
6) detect whether do not survey port in addition, if all surveyed, end of test (EOT), otherwise repeat above step.
Fig. 5 has provided the workflow diagram the when embodiment of the invention is carried out fault detect.When the present invention is applied to the detection of multi-channel photoelectronic failure of chip, should follow following job step:
A kind of use portable multi-channel photoelectronic chip detection signal generating device carries out multi-channel photoelectronic failure of chip detection method, and its step is as follows:
1) send out one group of test signal by input keyboard 1, this test signal is multi-channel photoelectronic chip input port and output port route code; Test signal is transfused to buffer circuit 2 and latchs and be admitted to state matrix and determine circuit 3 and input/output port indicating circuit 7, input/output port indicating circuit 7 drives input/output port indicating equipment 8 indication input/output port information according to test signal, state matrix is determined the state of circuit 3 selected multi-channel photoelectronic chip arrays and driving command is sent into output buffers circuit 4 simultaneously, the driving circuit 5 of multi-channel photoelectronic chip is obtained driving command from output buffers circuit 4, drives 9 work of multi-channel photoelectronic chip;
2) utilize the surveying instrument relevant 10 to detect the output port output power with optical parameter measurement;
3) with each port output power during with the device operate as normal index compare, if performance requirement is satisfied in output, illustrate that chip units all on this light path is normally, returns step 1;
4) if output can not be satisfied the operate as normal index, send another group test signal by keyboard again, make its gating light path and have cross unit (being total certain switch element of gating light path) by the gating light path that last one group of test signal is determined;
5) with each port output power during with the device operate as normal index compare, if performance requirement is satisfied in output, then in twice measuring process shared cross unit be the operate as normal unit, otherwise the cross unit of two light paths is trouble unit.
In sum, a kind of portable multi-channel photoelectronic chip detection signal generating device of the present invention has the following advantages at least:
1. portable multi-channel photoelectronic chip detection signal generating device of the present invention is simple in structure, technical maturity, and cost of manufacture is low.
2. portable multi-channel photoelectronic chip detection signal generating device of the present invention is simple to operate, and volume is little, is easy to carry, and can adopts powered battery, and this advantage is particularly important in physical fault detects.
3. portable multi-channel photoelectronic chip detection signal generating device of the present invention has been introduced the elementary cell that CPLD and FPGA handle as circuit signal, greatly reduces cost and be easy to realize.
4. portable multi-channel photoelectronic chip detection signal generating device of the present invention is aided with optical measuring apparatus, can disposablely finish the test of multi-channel photoelectronic chip multinomial performance index, the testing efficiency height.
The above; only be embodiments of the invention; be not that the present invention is done any pro forma restriction; every according to the technology of the present invention essence to any simple modification, equivalent variations and modification that above embodiment did; all still belong within the technical solution of the present invention scope, so protection scope of the present invention is when being as the criterion with claims.
Claims (12)
1. portable multi-channel photoelectronic chip detection signal generating device, it is characterized in that, this device comprises input keyboard (1), input-buffer circuit (2), state matrix is determined circuit (3), output buffers circuit (4), the driving circuit of multi-channel photoelectronic chip (5), state selecting circuit (6), input/output port indicating circuit (7), input/output port indicating equipment (8), multi-channel photoelectronic chip (9), and the surveying instrument relevant (10) with optical parameter measurement, multi-channel photoelectronic chip (9) is placed on the circuit board of special reservation, the well heater of each chip unit links to each other with driving circuit by the interface on the circuit board, wherein, input keyboard (1), input-buffer circuit (2), state matrix is determined circuit (3), output buffers circuit (4), the driving circuit of multi-channel photoelectronic chip (5), multi-channel photoelectronic chip (9), the surveying instrument relevant with optical parameter measurement (10) is linked in sequence successively, input-buffer circuit (2) is linked in sequence successively with input/output port indicating circuit (7) and input/output port indicating equipment (8), and state selecting circuit (6) is connected in state matrix and determines circuit (3).
2. test signal generation device according to claim 1 is characterized in that, the device that this device adopts is the TTL or the CMOS interface device of standard, and its power supply mode adopts DC power supply or powered battery.
3. test signal generation device according to claim 1, it is characterized in that input-buffer circuit (2) and output buffers circuit (4) adopt random access memory ram, flash memory FLASH, complex programmable logic array CPLD or on-site programmable gate array FPGA to constitute.
4. test signal generation device according to claim 1 is characterized in that, input/output port indicating equipment (8) adopts light emitting diode matrix LED or LCDs.
5. test signal generation device according to claim 1 is characterized in that, described state matrix confirms that circuit (3) is complex programmable gate array CPLD or on-site programmable gate array FPGA.
6. test signal generation device according to claim 1 is characterized in that, described state selecting circuit (6) is selected multi-form output test signal according to multi-channel photoelectronic chip (9) scale.
7. test signal generation device according to claim 1, it is characterized in that, described input-buffer circuit (2), input/output port indicating circuit (7), state selecting circuit (6) and state matrix determine that circuit (3) adopts independent component to realize respectively, or are integrated among CPLD or the FPGA and realize.
8. test signal generation device according to claim 1 is characterized in that, the driving circuit of described multi-channel photoelectronic chip (5) provides different drive currents for different chip units, thereby makes each chip unit be in best delustring state.
9. test signal generation device according to claim 1 is characterized in that, the drive current size that the driving circuit of described multi-channel photoelectronic chip (5) provides can be regulated.
10. test signal generation device according to claim 1 is characterized in that, the surveying instrument relevant with optical parameter measurement (10) is power meter/oscilloscope measurement equipment.
11. one kind is used portable multi-channel photoelectronic chip detection signal generating device to carry out multi-channel photoelectronic chip characteristics measuring method, its step is as follows:
1) send out one group of test signal by input keyboard (1), this test signal is the route code of multi-channel photoelectronic chip input port and output port; Test signal is transfused to buffer circuit (2) and latchs and be admitted to state matrix and determine circuit (3) and input/output port indicating circuit (7), input/output port indicating circuit (7) drives input/output port indicating equipment (8) indication input/output port information according to test signal, simultaneously state matrix determines that circuit (3) determines the state of the selected multi-channel photoelectronic chip array of circuit instruction and driving command is sent into output buffers circuit (4) that the driving circuit of multi-channel photoelectronic chip (5) is obtained driving command from output buffers circuit (4) according to state matrix;
2) according to driving command, multi-channel photoelectronic chip drive circuit (5) corresponding driving triode conducting or end, well heater to each chip unit of multi-channel photoelectronic chip (9) provides electric current, regulates the size that corresponding variable-resistance resistance can change drive current; Utilize the surveying instrument (10) relevant to monitor the output power of each output port with optical parameter measurement;
3) the draw relation curve of loss, crosstalk effect and drive current of multi-channel photoelectronic chip;
4) regulate the drive current size that variable-resistance resistance makes each chip unit successively and be the optimum drive current value, detect the output power of each output port this moment, by calculating loss, crosstalk effect and the chip power-consumption that can obtain chip;
5) zero clearing is sent the zero clearing order by keyboard, and device is placed init state;
6) detect whether do not survey port in addition, if all surveyed, end of test (EOT), otherwise repeat above step.
12. one kind is used portable multi-channel photoelectronic chip detection signal generating device to carry out multi-channel photoelectronic failure of chip detection method, its step is as follows:
1) send out one group of test signal by input keyboard (1), this test signal is multi-channel photoelectronic chip input port and output port route code; Test signal is transfused to buffer circuit (2) and latchs and be admitted to state matrix and determine circuit (3) and input/output port indicating circuit (7), input/output port indicating circuit (7) drives input/output port indicating equipment (8) indication input/output port information according to test signal, state matrix is determined the state of the selected multi-channel photoelectronic chip array of circuit (3) and driving command is sent into output buffers circuit (4) simultaneously, the driving circuit of multi-channel photoelectronic chip (5) is obtained driving command from output buffers circuit (4), drives multi-channel photoelectronic chip (9) work;
2) utilize the surveying instrument (10) relevant to detect the output port output power with optical parameter measurement;
3) with each port output power during with the device operate as normal index compare, if performance requirement is satisfied in output, illustrate that chip units all on this light path is normally, returns step 1);
4) if output can not be satisfied the operate as normal index, send another group test signal by keyboard again, make its gating light path and have cross unit, be i.e. total certain switch element of gating light path by the definite gating light path of last one group of test signal;
5) with each port output power during with the device operate as normal index compare, if performance requirement is satisfied in output, then in twice measuring process shared cross unit be the operate as normal unit, otherwise the cross unit of two light paths is trouble unit.
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| CNB2005101262407A CN100535675C (en) | 2005-11-30 | 2005-11-30 | Portable multi-channel photoelectronic chip detection signal generating device and detection method |
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| CNB2005101262407A CN100535675C (en) | 2005-11-30 | 2005-11-30 | Portable multi-channel photoelectronic chip detection signal generating device and detection method |
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| CN100535675C true CN100535675C (en) | 2009-09-02 |
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| CN104280572A (en) * | 2013-07-12 | 2015-01-14 | 上海华虹宏力半导体制造有限公司 | ATE test channel designing method |
| CN115372779B (en) * | 2022-08-18 | 2024-04-05 | 无锡芯光互连技术研究院有限公司 | Method and device for testing working state of thermo-optical switch array |
| CN115856589B (en) * | 2023-02-28 | 2023-06-20 | 北京紫光青藤微系统有限公司 | Test circuit and test method for NFC chip power tube transmitting circuit |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN1654966A (en) * | 2005-01-07 | 2005-08-17 | 清华大学 | Transient current measuring method and system for IC chip |
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| CN1654966A (en) * | 2005-01-07 | 2005-08-17 | 清华大学 | Transient current measuring method and system for IC chip |
Non-Patent Citations (2)
| Title |
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| 光开关矩阵控制和驱动电路及集成技术的研究进展. 李运涛，陈少武，余金中.激光与红外，第35卷第1期. 2005 * |
| 电吸收调制器和DFB激光器集成器件的测量. 王幼林，刘宇，孙建伟，祝宁华.半导体学报，第24卷第9期. 2003 * |
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