CN100529776C - Electron component pull force tester and method - Google Patents
Electron component pull force tester and method Download PDFInfo
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- CN100529776C CN100529776C CNB2006100363015A CN200610036301A CN100529776C CN 100529776 C CN100529776 C CN 100529776C CN B2006100363015 A CNB2006100363015 A CN B2006100363015A CN 200610036301 A CN200610036301 A CN 200610036301A CN 100529776 C CN100529776 C CN 100529776C
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Abstract
本发明提供一种电子元件拉力试验装置及方法,以垂直向上的拉力上拉电子元件,令该电子元件的焊点于均匀拉力下与试片分离。该电子元件拉力试验装置至少包括一固定夹座与活动夹座,且该固定夹座与活动夹座分别轴套于二相对的支撑体上,并呈上、下相对的结构关系,该活动夹座下方装设一挂设钢索的吊勾,且该钢索连接与电子元件粘合的粘着块,且该电子元件焊接在组设于固定夹座的试片上;使用时,活动夹座上移,吊勾随之拉动粘着块,直至电子元件于均匀拉力下与试片分离,避免破坏电子元件的焊点。
The invention provides an electronic component tensile test device and method, which pulls up the electronic component with a vertical upward pulling force, so that the solder joint of the electronic component is separated from the test piece under uniform pulling force. The tensile test device for electronic components at least includes a fixed clip seat and a movable clip seat, and the fixed clip seat and the movable clip seat are respectively sleeved on two opposite support bodies, and are in an upper and lower relative structural relationship. A hook for hanging a steel cable is installed under the seat, and the steel cable is connected to the adhesive block bonded to the electronic component, and the electronic component is welded on the test piece assembled on the fixed clip seat; when in use, the movable clip seat Move, the hook pulls the adhesive block accordingly, until the electronic component is separated from the test piece under uniform tension, so as to avoid damage to the solder joints of the electronic component.
Description
【技朮领域】 【Technical field】
本发明提供一种拉力试验装置及方法,特别是提供一种以垂直向上的拉力上拉电子元件,令该电子元件的各焊点于均匀拉力下与试片脱离的电子元件拉力试验装置及方法。The present invention provides a tensile test device and method, in particular, an electronic component tensile test device and method that pull up an electronic component with a vertical upward pulling force, so that each solder joint of the electronic component is separated from the test piece under a uniform tensile force .
【背景技朮】 【Background technique】
随着电子产品向便携式、小型化、网络化、多媒体化方向迅速发展,对电子组装技术提出了更高的要求,另一方面,由于受到集成电路插脚框架和加工精度的限制,导致组装密度无法再提升。于是球栅阵列(Ball Grid Array,BGA)技术应运而生,该项技术消除了精密间距的集成电路由插接线引起的共面度和曲翘的问题。With the rapid development of electronic products in the direction of portable, miniaturized, networked and multimedia, higher requirements are put forward for electronic assembly technology. On the other hand, due to the limitation of integrated circuit pin frame and processing accuracy, the assembly density cannot Improve again. So the Ball Grid Array (BGA) technology came into being, which eliminates the problems of coplanarity and warpage caused by the plug-in wires of the fine-pitch integrated circuits.
然而,球栅阵列元件焊接点的测试相当困难,不容易保证其质量和可靠性,而于球栅阵列元件失效时必须对其焊点进行破坏性分析,以求得其焊点的失效位置。现有的将球栅阵列元件与PCB板(Printed Circuit Board,印刷电路板)分离的方法是以撬棒靠近该球栅阵列元件的边缘,并施力将其撬开。实施该方法因侧向施力范围小,令球栅阵列元件最外围的焊点有受撬棒破坏变形之虞,且各焊点受力不均匀,也会影响后续的球栅阵列失效分析的准确性。However, it is very difficult to test the solder joints of the BGA components, and it is not easy to guarantee its quality and reliability. When the BGA components fail, the solder joints must be destructively analyzed to obtain the failure location of the solder joints. The existing method for separating the ball grid array element from the PCB board (Printed Circuit Board, printed circuit board) is to use a crowbar close to the edge of the ball grid array element and apply force to pry it open. Due to the small range of lateral force applied by this method, the outermost solder joints of the ball grid array components may be damaged and deformed by the crowbar, and the stress on each solder joint is uneven, which will also affect the subsequent failure analysis of the ball grid array. accuracy.
有鉴于此,实有必要提供一种电子元件拉力试验装置及方法,以垂直向上的拉力上拉电子元件,令该电子元件的各焊点于均匀受力下与PCB板脱离,克服破坏焊点的缺失。In view of this, it is necessary to provide an electronic component tensile test device and method, which pulls up the electronic component with a vertical upward pulling force, so that each solder joint of the electronic component is separated from the PCB board under uniform force, and overcomes the problem of damaging the solder joint. missing.
【发明内容】 【Content of invention】
因此,本发明的目的即提供一种电子元件拉力试验装置及方法,用于以垂直向上的拉力上拉电子元件,令该电子元件的各焊点于均匀拉力下与试片分离,避免破坏焊点,提高电子元件失效测试的准确性。Therefore, the object of the present invention is to provide a device and method for tensile testing of electronic components, which is used to pull up electronic components with a vertical upward pulling force, so that each solder joint of the electronic component is separated from the test piece under uniform pulling force, so as to avoid damage to the solder joints. Points to improve the accuracy of failure testing of electronic components.
为达上述目的,本发明提供一种电子元件拉力试验装置及方法,用于以垂直向上的拉力上拉电子元件,令该电子元件各焊点于均匀拉力下与试片脱离。该电子元件拉力试验装置至少包括一固定夹座与活动夹座,且该固定夹座与活动夹座分别轴套于二相对的支撑体上,并呈上、下相对的结构关系,该活动夹座下方装设一挂设钢索的吊勾,且该钢索连接与电子元件粘合的粘着块,且该电子元件焊接在组设于固定夹座的试片上。In order to achieve the above purpose, the present invention provides an electronic component tensile test device and method, which are used to pull up the electronic component with a vertical upward pulling force, so that each solder joint of the electronic component is separated from the test piece under a uniform pulling force. The tensile test device for electronic components at least includes a fixed clip seat and a movable clip seat, and the fixed clip seat and the movable clip seat are respectively sleeved on two opposite support bodies, and are in an upper and lower relative structural relationship. A hook for hanging a steel cable is installed under the seat, and the steel cable is connected with an adhesive block bonded to the electronic component, and the electronic component is welded on the test piece assembled on the fixing clamp seat.
本发明的电子元件拉力试验方法应用于上述电子元件拉力试验装置上,其包括:(1)粘合粘着块与试片上的电子元件,使粘着块与电子元件的中心点一致;(2)定位粘着块;(3)将试片固定于固定夹座;(4)对粘着块施以垂直向上的拉力直至电子元件与试片分离。The electronic component tensile test method of the present invention is applied on the above-mentioned electronic component tensile test device, which includes: (1) bonding the electronic components on the adhesive block and the test piece, so that the adhesive block is consistent with the center point of the electronic component; (2) positioning Adhesive block; (3) Fix the test piece on the fixing clip seat; (4) Apply a vertical upward pulling force to the adhesive block until the electronic component is separated from the test piece.
相较于现有技术,本发明以垂直向上的拉力上拉电子元件,令该电子元件的各焊点于均匀受力下与试片脱离,实已解决现有的缺失。Compared with the prior art, the present invention pulls up the electronic component with a vertical upward pulling force, so that each solder joint of the electronic component is separated from the test piece under a uniform force, which has solved the existing deficiency.
【附图说明】 【Description of drawings】
图1为本发明的电子元件拉力试验机的使用状态的前视图。Fig. 1 is a front view of the electronic component tensile testing machine of the present invention in use.
图2为本发明的电子元件拉力试验装置的立体分解图。Fig. 2 is a three-dimensional exploded view of the electronic component tensile testing device of the present invention.
图3为本发明的电子元件拉力试验装置的使用铅垂的示意图。Fig. 3 is a schematic diagram of a vertically used electronic component tensile test device of the present invention.
图3为本发明的电子元件拉力试验方法的流程图。Fig. 3 is a flow chart of the electronic component tensile test method of the present invention.
【具体实施方式】 【Detailed ways】
请参阅图1,为本发明的电子元件拉力试验装置的使用状态的前视图,如图所示,该电子元件拉力试验装置1至少包括一固定夹座80与活动夹座60,且该固定夹座80与活动夹座60分别轴套于二相对的支撑体70上,并呈上、下相对的结构关系,该活动夹座60下方装设一吊勾30,该吊勾30上挂设一钢索20,该钢索20连接一粘着块12,该粘着块12与焊接于试片10上的电子元件11组合一体,且该试片10固定于固定夹座80上,以于活动夹座60上移时,吊勾30随之拉动粘着块12直至电子元件11与试片10分离。Please refer to Fig. 1, which is a front view of the use state of the electronic component tensile test device of the present invention. As shown in the figure, the electronic component
请一并参阅图1与图2,其中,图2为本发明的电子元件拉力试验装置的立体分解图,其中,该活动夹座60下方装设有吊勾30,用以挂设钢索20的一端,该钢索20另一端穿过钢锁螺丝21顶部侧边开设的穿孔211;另,该活动夹座60内设有一动力部(未绘示),该动力部一端拉动该吊勾30,另一端将该拉力传递给一传感器(未绘示),该传感器将该拉力转换为一电测量信号,并予以显示;又,该活动夹座60两端设有滑塞(未图示),容设于滑槽71内。Please refer to Fig. 1 and Fig. 2 together, wherein, Fig. 2 is the three-dimensional exploded view of the electronic component tensile test device of the present invention, wherein, the
该固定夹座80上承载一试片台40,该试片台40上间隔开设若干第二螺孔41,以供套设压置片42的固定螺丝43锁紧,且该压置片42一端压置于一焊接有待测电子元件11的试片10,进而将该试片10固定于试片台40上;又,粘着块12粘接于电子元件11上,且该粘着块12与该电子元件11中心点保持一致,其中,该粘着块12形状规则对称且质地均匀,且该粘着块12可实施为正方形、长方形、圆形、正三角形、椭圆形等其中之一,且该粘着块12位于钢索20另一端即钢锁螺丝21的下方;另,该粘着块12以其中心为轴心开设一第一螺孔121,以与钢锁螺丝21锁合。A
请参照图1,该支撑体70相对该活动夹座60的滑塞以凹陷的方式设有滑槽71,且该滑槽71由该支撑体70组设固定夹座80的位置延伸至该支撑体70的顶端,用以收容滑塞,以便活动夹座60沿滑槽71滑动。Please refer to FIG. 1 , the supporting
本发明还揭示一种电子元件拉力试验方法,参阅图4,为本发明的电子元件拉力试验方法的流程图,其步骤如下:The present invention also discloses a method for tensile testing of electronic components. Referring to FIG. 4 , it is a flow chart of the method for tensile testing of electronic components of the present invention. The steps are as follows:
步骤410,粘合粘着块12与试片10上的电子元件11,以令粘着块12与电子元件11的中心点一致,并将试片10置于试片台40上;
步骤420,定位该粘着块12,即将铅垂50挂设于吊勾30上,同时微调该试片10(参阅图3),直至该铅垂50对准粘着块12的第一螺孔121的轴心,此时,吊勾30施力方向为该粘着块12的中心线的反方向,即为垂直向上的拉力;
步骤430,将试片10固定在试片台40上,即锁合固定螺丝43与第二螺孔41,并令压置片42将焊接待测电子元件11的试片10压置固定于试片台40上,然后锁合钢索螺丝21与粘着块12的第一螺孔121,且将穿过穿孔211的钢索20挂设于吊勾30上;
步骤440,对粘着块12施以垂直向上的拉力,即以动力部上拉该吊勾30,此时,由于粘着块12的拉力分散作用,电子元件11的各焊点均匀受力,直至该电子元件11与试片10分离,同时,该拉力亦经传感器转换为一电测量信号,并予以显示。
相较于现有技术,本发明的电子元件拉力试验装置及方法以垂直向上的拉力上拉与电子元件组合为一体的粘着块,由于粘着块的拉力分散作用,则该电子元件的焊点均匀受力,且可同时获取电子元件脱离试片时的拉力值,以进行后续电子元件失效分析,实已解决现有的缺失。Compared with the prior art, the electronic component tensile test device and method of the present invention pull up the adhesive block combined with the electronic component with a vertical upward pulling force. Due to the dispersion effect of the tensile force of the adhesive block, the solder joints of the electronic component are uniform force, and at the same time obtain the tensile value of the electronic component when it is separated from the test piece, so as to carry out the failure analysis of the subsequent electronic component, which has solved the existing deficiencies.
Claims (9)
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Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
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CN102735540A (en) * | 2011-04-01 | 2012-10-17 | 亚旭电子科技(江苏)有限公司 | Tensile test device |
CN102628776A (en) * | 2012-03-20 | 2012-08-08 | 威力盟电子(苏州)有限公司 | Push-pull effort test machine |
CN103454156B (en) * | 2012-05-28 | 2018-01-26 | 富泰华工业(深圳)有限公司 | Pulling capacity mechanism for testing and drawing force test method |
CN102706749A (en) * | 2012-06-26 | 2012-10-03 | 横店集团联宜电机有限公司 | Terminal tension tester |
CN103267646B (en) * | 2013-01-21 | 2015-08-26 | 福耀玻璃(湖北)有限公司 | A kind of automotive glass bracket device for testing tensile force |
CN106442313B (en) * | 2016-08-23 | 2019-04-02 | 北京时代民芯科技有限公司 | A kind of lead integrity tester |
CN108639957B (en) * | 2018-07-26 | 2024-08-13 | 国网辽宁省电力有限公司本溪供电公司 | Auxiliary device for power transmission and distribution operation hoisting machine test |
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US4895028A (en) * | 1989-01-27 | 1990-01-23 | U.S. Philips Corporation | Method of pull-testing wire connectors on an electrical device |
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US4895028A (en) * | 1989-01-27 | 1990-01-23 | U.S. Philips Corporation | Method of pull-testing wire connectors on an electrical device |
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