CN100523849C - 基于位数可选的EFlash串口测试方法 - Google Patents
基于位数可选的EFlash串口测试方法 Download PDFInfo
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- CN100523849C CN100523849C CNB2005101114299A CN200510111429A CN100523849C CN 100523849 C CN100523849 C CN 100523849C CN B2005101114299 A CNB2005101114299 A CN B2005101114299A CN 200510111429 A CN200510111429 A CN 200510111429A CN 100523849 C CN100523849 C CN 100523849C
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Application Number | Priority Date | Filing Date | Title |
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CNB2005101114299A CN100523849C (zh) | 2005-12-13 | 2005-12-13 | 基于位数可选的EFlash串口测试方法 |
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CNB2005101114299A CN100523849C (zh) | 2005-12-13 | 2005-12-13 | 基于位数可选的EFlash串口测试方法 |
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CN1982910A CN1982910A (zh) | 2007-06-20 |
CN100523849C true CN100523849C (zh) | 2009-08-05 |
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CNB2005101114299A Active CN100523849C (zh) | 2005-12-13 | 2005-12-13 | 基于位数可选的EFlash串口测试方法 |
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Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
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CN102610281A (zh) * | 2011-01-24 | 2012-07-25 | 上海华虹集成电路有限责任公司 | 基于智能卡片上flash串行测试接口时序的实现方法 |
CN107271884B (zh) * | 2017-06-28 | 2019-11-26 | 中国电子科技集团公司第五十八研究所 | 一种高可靠性和高集成度的eFlash串口测试电路 |
CN107729271B (zh) * | 2017-10-26 | 2020-06-30 | 中国电子科技集团公司第五十八研究所 | 具备自测试功能的双总线型e-flash控制电路 |
CN108519937A (zh) * | 2018-04-04 | 2018-09-11 | 奇酷互联网络科技(深圳)有限公司 | 接口电路测试方法、系统、可读存储介质及主板 |
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Owner name: SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING Free format text: FORMER OWNER: HUAHONG NEC ELECTRONICS CO LTD, SHANGHAI Effective date: 20140121 |
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Free format text: CORRECT: ADDRESS; FROM: 201206 PUDONG NEW AREA, SHANGHAI TO: 201203 PUDONG NEW AREA, SHANGHAI |
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Effective date of registration: 20140121 Address after: 201203 Shanghai city Zuchongzhi road Pudong New Area Zhangjiang hi tech Park No. 1399 Patentee after: Shanghai Huahong Grace Semiconductor Manufacturing Corporation Address before: 201206, Shanghai, Pudong New Area, Sichuan Road, No. 1188 Bridge Patentee before: Shanghai Huahong NEC Electronics Co., Ltd. |