CN100373164C - Testing system of IC card interface electric characteristics - Google Patents
Testing system of IC card interface electric characteristics Download PDFInfo
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- CN100373164C CN100373164C CNB2005101168091A CN200510116809A CN100373164C CN 100373164 C CN100373164 C CN 100373164C CN B2005101168091 A CNB2005101168091 A CN B2005101168091A CN 200510116809 A CN200510116809 A CN 200510116809A CN 100373164 C CN100373164 C CN 100373164C
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Abstract
A test system for the electrical property of an IC card interface, which relates to a card reading terminal and a test system for the electrical property of the IC card interface satisfying an ISO 7816 specification, particularly to a special test system for interface electrical property, which adopts analog to digital (A/D) converting technology to collect interface signal waveforms, adopts digital to analog (D/A) converting technology to output interface signals and tests an IC card and the card reading terminal through the simulation of the interface waveforms and the electrical property of the card reading terminal and the IC card by software so as to carry out communication. The range of the signal waveforms generated by the system is greater than the range specified by the ISO 7816, and the deviation permissibility of received signals of the system is greater; thereby, a test on the compatibility between the card reading terminal or the IC card and the ISO 7816 can be carried out, and a detailed report on the compatibility between each performance index of the card reading terminal or the IC card and the ISO 7816 specification can also be given out; the detailed report comprises a specification compatibility quantizing report, a compatibility quantization index and a deviation quantization index.
Description
Technical field
Present technique relates to interface communication technology, embedded software technology, signal processing technology and electrical characteristics measuring technology.
Background technology
At present the IC-card based on the card-reading terminal of ISO7816 has been widely used in fields of society, comprises the most general separation between machine and card communication terminal, the IC of bank card reader and identification IC-card etc.And the enterprise of production card-reading terminal and IC-card is a lot, and product category emerges in an endless stream.But whether the equipment that present reading card terminal and IC-card are tested can only meet the test of ISO7816, but can not provide the electrical characteristics interface capability, comprises more volume data such as level signal guard time, waveform delay, interface features departure.Thereby can not provide the performance difference test of different product.Because card reader is that different enterprises independent design is finished with IC-card basically, of a great variety, compatibility test each other is difficult to finish simultaneously.In case compatibility issue occurs, the test analysis report judgement that does not have a kind of testing apparatus can provide quantification is how the problem and the problematic product of which kind of product improves interface capability.Card-reading terminal manufacturer or IC-card manufacturer have better compatibility for the product that makes oneself simultaneously, have to drop into great amount of manpower (tester), material resources (purchasing various terminals and IC-card) are tested, this test needs to carry out repeated test again for newly developing product.Cause the significant wastage of resource.
Summary of the invention
IC-card interface electric characteristics test macro of the present invention not only can be tested the whether test of compatible ISO7816 of card-reading terminal and IC-card, the various detailed performance index reports that can provide interface electric characteristics simultaneously comprise and consistent property quantification report, compatible quantizating index, deviation quantizating index.Thereby realize the more accurate test of reading card device and IC-card interface electric characteristics, thoroughly solve compatibility test problem each other, realize automatically can repeatedly testing, greatly reduce testing cost, can select and distinguish the performance of product simultaneously for operator, improve the quality of product, strengthen the purpose of the satisfaction of client's use.
For achieving the above object, the technical solution used in the present invention is:
1, IC-card interface electric characteristics test macro is made of IC-card interface electric characteristics test module, computer based data analysis disposal system, wherein
Described IC-card interface electric characteristics test module is by the IC-card connector that satisfies the ISO7816 standard, analog digital (A/D) change-over circuit, digital simulation (D/A) change-over circuit, processor (CPU) circuit of carrying out embedded software program constitutes, wherein the IC-card connector is electrically connected with analog digital (A/D) change-over circuit, the IC-card connector is electrically connected with digital simulation (D/A) change-over circuit, analog digital (A/D) change-over circuit is electrically connected with processor (CPU) circuit of carrying out embedded software program, and digital simulation (D/A) change-over circuit is electrically connected with processor (CPU) circuit of carrying out embedded software program;
Described IC-card interface electric characteristics test module adopts the computer standard Peripheral Interface to be electrically connected with described computer based data analysis disposal system.
2, analog digital (A/D) change-over circuit adopts analog digital (A/D) switch technology to gather the described ISO7816 standard that satisfies
IC-card connector interface signal waveform, described digital simulation (D/A) change-over circuit adopts digital simulation (D/A) to change
Change technology export IC-card connector interface signal waveform to the IC-card connector of the described ISO7816 of satisfying standard.
The invention has the beneficial effects as follows:, and come the analyzing and processing image data and by software control digital simulation (D/A) change-over circuit generation interface circuit waveform and the test macro that provides IC-card interface electric characteristics test report by computing machine by software by analog digital (A/D) switch technology acquisition interface signal waveform.Can provide the various detailed performance index reports of interface electric characteristics.
The present invention is described further below in conjunction with implementing accompanying drawing.
Description of drawings:
Fig. 1: theory structure synoptic diagram of the present invention
Fig. 2: the test module of system of the present invention is realized the example principle schematic
Embodiment:
Below in conjunction with accompanying drawing structural principle of the present invention and principle of work are elaborated.
Implement theory structure synoptic diagram such as Fig. 1, the present invention is made of two parts, and a part is the IC-card interface electric characteristics test module 5 that comprises IC-card connector 1, analog digital (A/D) change-over circuit 2, digital simulation (D/A) change-over circuit 3 at least, carries out the formations such as processor (CPU) circuit 4 of embedded software program; A part is based on the data analysis disposal system 6 of computing machine in addition.One of interface 9 modes that adopt present PC support between data analysis disposal system 6 and the test module 5 are connected, and include but not limited to RS232 serial line interface, parallel interface, USB interface, pci interface, pcmcia interface, Ethernet interface etc.
Test module 5 is realized example principle schematic such as Fig. 2, by IC-card connector 1, analog digital (A/D) change-over circuit 2, digital simulation (D/A) change-over circuit 3, processor (CPU) circuit 4 of carrying out embedded software program, data storage circuitry 7, with formation such as computing machine communication interface circuit 8.Analog digital (A/D) change-over circuit 2 will be gathered according to the signal waveform on the contact of ISO7816 normalized definition, comprise power supply signal, reset signal, data line input/output signal, clock signal, program voltage signal.The level of these signals is reference potential with the ground signal.Can produce than the ISO7816 standard signal of each contact of wide region more by digital simulation (D/A) change-over circuit 3, comprise that voltage and current within the specific limits exports continuously adjustable power supply signal: voltage and current is within the specific limits exported continuously adjustable program voltage signal; Can produce that high-low level is adjustable continuously in certain limit, frequency is adjustable continuously in certain limit, dutycycle is in the continuously adjustable clock signal of certain limit; Can produce that high-low level is adjustable continuously in certain limit, frequency is adjustable continuously in certain limit, dutycycle is at the continuously adjustable data output signal of certain limit; Can produce that high-low level is adjustable continuously in certain limit, the reset level duration is at the continuously adjustable reset output signal of certain limit.When working in test during card-reading terminal, reset signal wherein, clock signal, power supply signal, program voltage signal, test module 5 works in output state; When test module 5 works in test I C card, reset signal wherein, clock signal, power supply signal, program voltage signal work in input state.By the certain limit of reset signal, clock signal, power supply signal, program voltage signal being regulated the quantification performance index that to measure tested card-reading terminal or IC-card and to the adaptability of unlike signal waveform.Because each signal for the contact adopts analog digital (A/D) change-over circuit 2 to gather, analyze and recognition data by software then, can realize having incompatible the time or signal still can analyze data after being interfered, send correct response to measurand as card-reading terminal or IC-card and ISO7816.Therefore can in certain deviation range, finish test, and give the quantizating index that deviates.
Computer based data analysis system 6 program circuits are described below: the data analysis system 6 test data use-case that is prepared in advance, select test case according to measurand by software, test data is sent to test module 5, after test module 5 is finished a conversation test, test module 5 is sent to data analysis system 6 with the data that collect, data analysis system 6 is analyzed data, provides detailed test report.Comprise and consistent property quantification report, compatible quantizating index, deviation quantizating index etc.
Claims (2)
1.IC the card electrical characteristics test system is characterized in that being made of IC-card interface electric characteristics test module, computer based data analysis disposal system, wherein
Described IC-card interface electric characteristics test module is by the IC-card connector that satisfies the ISO7816 standard, analog digital (A/D) change-over circuit, digital simulation (D/A) change-over circuit, processor (CPU) circuit of carrying out embedded software program constitutes, wherein the IC-card connector is electrically connected with analog digital (A/D) change-over circuit, the IC-card connector is electrically connected with digital simulation (D/A) change-over circuit, analog digital (A/D) change-over circuit is electrically connected with processor (CPU) circuit of carrying out embedded software program, and digital simulation (D/A) change-over circuit is electrically connected with processor (CPU) circuit of carrying out embedded software program;
Described IC-card interface electric characteristics test module adopts the computer standard Peripheral Interface to be electrically connected with described computer based data analysis disposal system.
2. IC-card interface electric characteristics test macro as claimed in claim 1, it is characterized in that described analog digital (A/D) change-over circuit adopts analog digital (A/D) switch technology to gather the IC-card connector interface signal waveform of the described ISO7816 of satisfying standard, described digital simulation (D/A) change-over circuit adopts digital simulation (D/A) switch technology output IC-card connector interface signal waveform to the described IC-card connector that satisfies the ISO7816 standard.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005101168091A CN100373164C (en) | 2005-10-31 | 2005-10-31 | Testing system of IC card interface electric characteristics |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005101168091A CN100373164C (en) | 2005-10-31 | 2005-10-31 | Testing system of IC card interface electric characteristics |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1793991A CN1793991A (en) | 2006-06-28 |
| CN100373164C true CN100373164C (en) | 2008-03-05 |
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| Application Number | Title | Priority Date | Filing Date |
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| CNB2005101168091A Expired - Fee Related CN100373164C (en) | 2005-10-31 | 2005-10-31 | Testing system of IC card interface electric characteristics |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101413986B (en) * | 2007-10-17 | 2010-08-18 | 北京中电华大电子设计有限责任公司 | Method for testing reliability of smart card |
| CN101349617B (en) * | 2008-08-26 | 2010-10-06 | 浙江省计量科学研究院 | IC card service life test stand |
| CN101988939B (en) * | 2009-07-31 | 2014-06-04 | 环旭电子股份有限公司 | External power supply device and power supply method thereof |
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| JPS6363978A (en) * | 1986-09-04 | 1988-03-22 | Mitsubishi Electric Corp | Method for checking check card of measuring system |
| CN1026367C (en) * | 1991-05-10 | 1994-10-26 | 华中理工大学 | Magnetic card tester |
| CN1472700A (en) * | 2003-01-28 | 2004-02-04 | 上海长丰智能卡有限公司 | IC card chip and module chip testing system |
| CN1540733A (en) * | 2003-04-22 | 2004-10-27 | 上海华园微电子技术有限公司 | Device for testing chip operation system and compatibility of chip in IC card |
| US20040222305A1 (en) * | 2003-05-09 | 2004-11-11 | Stmicroelectronics, Inc. | Smart card including a JTAG test controller and related methods |
| CN1567219A (en) * | 2003-07-04 | 2005-01-19 | 上海华园微电子技术有限公司 | Test circuit for non-contact type integrated circuit and test method thereof |
| JP2005100332A (en) * | 2003-08-29 | 2005-04-14 | Kyodo Printing Co Ltd | Test/measurement method of electric property of ic chip built in contact type ic card or ic module, test/measurement system and stabilized power supply used for it |
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- 2005-10-31 CN CNB2005101168091A patent/CN100373164C/en not_active Expired - Fee Related
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JPS6363978A (en) * | 1986-09-04 | 1988-03-22 | Mitsubishi Electric Corp | Method for checking check card of measuring system |
| CN1026367C (en) * | 1991-05-10 | 1994-10-26 | 华中理工大学 | Magnetic card tester |
| CN1472700A (en) * | 2003-01-28 | 2004-02-04 | 上海长丰智能卡有限公司 | IC card chip and module chip testing system |
| CN1540733A (en) * | 2003-04-22 | 2004-10-27 | 上海华园微电子技术有限公司 | Device for testing chip operation system and compatibility of chip in IC card |
| US20040222305A1 (en) * | 2003-05-09 | 2004-11-11 | Stmicroelectronics, Inc. | Smart card including a JTAG test controller and related methods |
| CN1567219A (en) * | 2003-07-04 | 2005-01-19 | 上海华园微电子技术有限公司 | Test circuit for non-contact type integrated circuit and test method thereof |
| JP2005100332A (en) * | 2003-08-29 | 2005-04-14 | Kyodo Printing Co Ltd | Test/measurement method of electric property of ic chip built in contact type ic card or ic module, test/measurement system and stabilized power supply used for it |
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| 智能卡技术－IC卡. 王爱英，148-152页，清华大学出版社. 2000 * |
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| CN1793991A (en) | 2006-06-28 |
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