CN100360920C - Multiband comprehensive photoelectric properties field on-line measurement device - Google Patents
Multiband comprehensive photoelectric properties field on-line measurement device Download PDFInfo
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- CN100360920C CN100360920C CNB2004100924398A CN200410092439A CN100360920C CN 100360920 C CN100360920 C CN 100360920C CN B2004100924398 A CNB2004100924398 A CN B2004100924398A CN 200410092439 A CN200410092439 A CN 200410092439A CN 100360920 C CN100360920 C CN 100360920C
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Abstract
The present invention discloses a multi-band comprehensive photoelectric performance field on-line measuring device. The present invention has the structure that white micro light is used for dividing a target light source and the contrast grade of illumination intensity to be connected with a pattern scanning control circuit, and thus, an intelligent programmed control dividing board is formed. A target light source of a black body of a surface source is used for being connected with a control circuit of temperature difference, and thus, an infrared target object generator is formed. An infrared point target is used for being connected with an analogue light source of a laser pulse light field and a power control and encoding control circuit to form an analogue transmitter of an infrared point light source and a laser light field. The three parts are respectively connected with a cassegrain collimator supported on a supporting work rack in connection. Control circuits of the three parts are respectively connected with a serial interface of an industrial control unit. The industrial control unit is provided with a circuit interface receiving the output of a reflecting result of a checked optoelectronic system. The present invention is suitable for the field on-line operation, and can carry out the field on-line integrated measurement to the photoelectric performance of the checked photoelectric system.
Description
Technical field
The present invention relates to a kind of optical system optical property comprehensive test device, specifically a kind of multiband comprehensive photoelectric properties field on-line measurement device.
Background technology
Being used for instrument, equipment that photoelectric properties measure at present is the composite measurement of individual event parameter or same wave band mostly, and not only volume, quality are big, and intelligent degree is low, and how to use in the laboratory.Begin to the mid-80 the seventies in last century, a series of biography letter measuring instruments have been developed in the world in succession, as the EROS series transport function measuring instrument of Britain Yi Ling Bake (Ealing 8L Beck) company, the MTF measuring instrument of U.S. Tropel company, the GCH-1 type transfer function measuring instruments of China etc.These all are the surveying instruments of white light wave band individual event parameter, complicated operation not only, and be subject to environmental factor and disturb, measure time and effort consuming, efficiency ratio is lower.Since the last century the nineties, several developed countries have developed some photoelectric measurement instrument equipment in succession, OTF determinator as (Leitz) company production now of West Germany's Lay, the KVI type MTF object lens somascope that common (Opton) company difficult to understand produces, and the MTF VARIANT of Hofbauer-optik company production and UNILENS measuring instrument etc., Video MTF Image Analysis System and Coherent-Ealing MTF, the thermal imagery testing apparatus etc. of U.S. Optikos company in addition.Though these instrument robotizations, intelligent degree are much improved, but still be the single band performance test, and the white light performance test does not fundamentally realize the simulation of object scene and the full-automation of test result acquisition process output, moreover the equipment heaviness can not be applied to the on-line measurement of open-air electro-optical system.
Summary of the invention
Purpose of the present invention just provides a kind of multiband comprehensive photoelectric properties field on-line measurement device that each wave band measurement function is incorporated into one that collects, by improving integrated degree, reduced volume, the weight reduction of device, thereby realize the full-automatic field on-line measurement of tested electro-optical system photoelectric properties.
The object of the present invention is achieved like this: this measurement mechanism is to be connected with the pattern scan control circuit with the illumination contrast by white low-light graduation target light source, forms intelligent program-controlled graticule; Be connected with temperature difference control circuit by the extend blackbody target light source, form the infrared target generator; Control is connected with encoding control circuit with power with laser pulse light field simulation light source by infrared point target, forms infrared spotlight and laser light field simulating emitter; Above-mentioned three parts---intelligent program-controlled graticule, infrared target generator and infrared spotlight join with the Cassegrain's parallel light tube that is connected at supporting falsework upper support respectively with the laser light field simulating emitter; Control circuit in above-mentioned three parts---intelligent program-controlled graticule, infrared target generator and infrared spotlight and the laser light field simulating emitter is connected on the output serial line interface of industry control unit; On the industry control unit, be provided with the circuit interface that receives tested electro-optical system reflection result output.
The present invention is connected respectively by intelligent program-controlled graticule, infrared target generator, infrared spotlight and laser light field simulating emitter etc. and Cassegrain's parallel light tube, send the analog light source or the detection signal that optical property detects that be used for of each wave bands such as white low-light, infrared thermal imagery, infrared television and laser, after receiving respectively by the corresponding object lens on the tested electro-optical system, output corresponding reflection result or signal.These reflection results or signal pass back to the industry control unit again by circuit interface, and the micro computer collection in the industry control unit is directly exported corresponding performance parameter measurement result after handling.Adopt this structure, it is programme-controlled to make that testing process can realize, thereby has realized the automatic on-line measurement of the multiband light electrical property of tested electro-optical system.Key of the present invention just is this.
The present invention also can realize like this: the described circuit interface that is located at the tested electro-optical system reflection of the reception result output on the industry control unit includes USB interface and receives tested electro-optical system laser reflection result's parallel interface; The output terminal and the USB interface of image pick-up card are joined, the input end of image pick-up card joins with the output terminal as analyzer and CCD that absorbs imaging signal from the visual window of tested electro-optical system, also is provided with the input end that receives tested electro-optical system video output signals on image pick-up card; The output terminal that receives the peak power collector of tested electro-optical system Laser emission signal joins by voltage acquisition card and USB interface.
Like this, this measurement mechanism can directly be observed from the visual window of tested electro-optical system, directly to measure corresponding performance parameter for the reflection output result of white light, low-light or the infrared thermal imaging etc. of tested electro-optical system.Also can draw measurement result through after the analysis of instrument by absorbing this output result as analyzer and CCD.Also the picture signal as analyzer and CCD picked-up directly can be transferred to the industry control unit by image pick-up card and USB interface, the micro computer collection in the industry control unit is exported corresponding performance parameter measurement result after handling.Reflection output result for the infrared thermal imagery of tested electro-optical system or infrared television etc., also can be by the video output terminal of tested electro-optical system, directly be transferred to the industry control unit through image pick-up card and USB interface, after micro computer collection processing wherein, export corresponding performance parameter measurement result.Also the parallel interface of microcomputer in the electronic signal output terminal of tested electro-optical system and the industry control unit directly can be connected, utilize microcomputer directly to gather reflection results such as the laser ranging echo of tested electro-optical system, communication instruction, after the microcomputer computing, the measurement result of output respective performances parameter.Laser emission output signal for tested electro-optical system, can utilize the collection of peak power collector continuous laser pulse hot spot and peak power, after testing result converts electric signal to, be transferred in the industry control unit through voltage acquisition card and USB interface, to measure performance parameters such as laser spot size, the angle of divergence, peak value.Realized the online composite measurement of the multiband light electrical property of tested electro-optical system thus.
The present invention is equipped collection, control and a process software in the microcomputer system in the industry control unit, and install image pick-up card, voltage acquisition card additional, install the hardware such as object scene control circuit board that comprise the control circuit in this three part of intelligent program-controlled graticule, infrared target generator, infrared spotlight and laser light field simulating emitter additional.By intelligent program-controlled graticule, infrared target generator, infrared spotlight and laser light field simulating emitter are installed, realize the simulation of each wave band scene on Cassegrain's parallel light tube.By the supporting falsework, realize Cassegrain's parallel light tube and peak power collector, focus between image dissector and the CCD three and with the collimation of tested electro-optical system, thereby the microcomputer serial interface in the industry control unit, parallel interface and USB interface control are down, realize the resolution of white low-light instrument, parallax, multiplying power, distortion, performance parameters such as MTF, the MRTD of infrared thermal imaging device, MDTD, SiTF, performance parameters such as MTF, the assessment of infrared television angular instrument sighting distance, laser ranging detects with the guidance light field simulation, the measurement of 20 remainder performance parameters such as recurrent frequency pulse laser peak power and continuous laser hot spot change with time.
One of innovation point of the present invention, be to utilize combining of illumination contrast and pattern scan control circuit and white low-light graduation target light source, under the control of industry control unit, form an illumination, contrast, the intelligent program-controlled graticule of the white low-light of self-scanning that the graduation pattern is adjustable.It can make that differentiating pattern, edge of a knife pattern, glass sieve plate pattern etc. all can carry out self-scanning according to the parameter that is provided with on the microcomputer and show, and its illumination, contrast etc. all can be controlled automatically by corresponding standard.Like this, when the various correlated performance parameters of white low-light are measured in to tested electro-optical system, just can avoid the artificial replacing of original various graticules, thereby work efficiency and automaticity that white low-light wave band performance parameter detects have been improved, and because its illumination, contrast etc. also make thus that by controlling automatically by respective standard the industry control unit measuring accuracy of correlated performance parameter increases.
Two of innovation point of the present invention is to utilize combining of temperature difference control circuit and extend blackbody target light source, under the control of industry control unit, forms a blackbody radiation and circumstance of temperature difference and the controlled infrared target generator of pattern.Like this, when the various correlated performance parameters of infrared thermal imaging are measured in to tested electro-optical system, just can make four bar targets, square target, circular, slit target etc. rotate switching automatically by the parameter of required test, target temperature can carry out stable control with temperature difference control circuit and heating (Peltier), and can monitor real-time and accurately and regulate the difference of target temperature and ambient temperature, improved the measuring accuracy of correlated performance parameter thus.Adopt the infrared target generator of this version, can only use an extend blackbody that structure is small and exquisite, changed the extend blackbody of two big body structures of original infrared target generator use, just make that thus the volume of infrared target generator greatly reduces, promoted reducing of this measurement mechanism overall volume.
Three of innovation point of the present invention, be to utilize combining of infrared point target and laser pulse light field simulation light source and power control and encoding control circuit, formed the simulation of a collection infrared spotlight, laser ranging and guidance light field simulation, function synthesizeds such as Laser emission performance opto-electronic conversion are in the transmitting-receiving performance test head (being infrared light supply and laser light field simulating emitter) of one, this measuring head can connect the infrared beam that sends adjustable power, the angle of divergence is 0.02mard, be equivalent to a pointolite, can realize the operating distance emulation assessment of infrared television angular instrument or infrared goniometer, simultaneously can also carry out any power, arbitrary sequence (frequency, dutycycle, the echo number), the arbitrarily laser ranging of duration and guidance light field simulation, thus measure the counting decoding performance of laser pick-off device.
Four of innovation point of the present invention is before the circuit interface that receives reflection result or signal, and a peak power collector has been installed in design additional.This peak power collector contains a big visual field, long-focus, telephoto objective optical system that volume is little, be equipped with a high-frequency pulse and keep the broadening discharge circuit, can realize high-precision continuous laser pulse hot spot collection and peak power collection thus, thereby improve tested electro-optical system laser spot size, the angle of divergence and the isoparametric measuring accuracy of peak power.
Measurement mechanism of the present invention, compact conformation, each several part dismounting combined and instant is easy to carry, and test function is various, and the automaticity height is suitable for open-air on-line operation, thereby can carry out field on-line measurement to tested electro-optical system photoelectric properties.The measurement drawback that having overcome original measurement mechanism thus can only single band, carry out tested electro-optical system in the laboratory to the individual event parameter.Thereby its versatility is good, and practicality is stronger, and use value is higher, to improving the serviceability of tested equipment and photoelectric instrument equipment, positive facilitation is arranged.
Description of drawings
Accompanying drawing is the structured flowchart of measurement mechanism of the present invention.
Embodiment
As shown in drawings, measurement mechanism of the present invention is to be connected with pattern scan control circuit 1b with the illumination contrast by white low-light graduation target light source 1a, forms intelligent program-controlled graticule 1; Be connected with temperature difference control circuit 2b by extend blackbody target light source 2a, form infrared target generator 2; Control is connected with encoding control circuit 3b with power with laser pulse light field simulation light source 3a by infrared point target, forms infrared spotlight and laser light field simulating emitter 3.Intelligent program-controlled graticule 1, infrared target generator 2 and infrared spotlight are connected with the Cassegrain's parallel light tube 6 that is connected at supporting falsework 5 upper supports respectively with laser light field simulating emitter 3.The control circuit of each target light source or analog light source is connected on the serial line interface 4a of industry control unit 4 output terminals.Each target light source or analog light source all can adopt the optical measurement of known structure, and each control circuit also can adopt conventional circuit structure to build, and makes control circuit board, is installed in the microsystem in the industry control unit 4.
Be provided with the circuit interface that receives tested electro-optical system reflection result on industry control unit 4, this circuit interface includes USB interface 4b and receives tested electro-optical system laser reflection result's parallel interface 4c.The output terminal of image pick-up card 7 and USB interface 4b join, the input end of image pick-up card 7 with join as the output terminal of analyzer and CCD 10, have another input end and tested electro-optical system video output terminal 11e to join on the image pick-up card 7.The output terminal of peak power collector 9 joins with USB interface 4b by voltage acquisition card 8.Each structure member all has the corresponding component of known or stereotyped structure.
Industry control unit 4 among the present invention provides the power supply commonly used of series for each parts of this measurement mechanism, and the microcomputer system by wherein, the graduation pattern of dialogue low-light carries out the automatic control adjustment, various targets to infrared thermal imaging automatically switch, the target of infrared thermal imagery and the temperature difference of background are carried out real-time precise monitoring and adjusting, analog transmissions to infrared point target or laser light field is controlled, output result to tested electro-optical system gathers automatically, calculates, and printout measurement result accurately.Industry control unit 4 can adopt the design of industrial plastic pressing mold, in light weight, portable row, also can carry out the function expansion, as increase the performance test of wave bands such as ultraviolet, and leave interface, can realize wired or wireless data communication, performance test metering for tested electro-optical system provides a good operation platform.Supporting falsework 5 among the present invention is to connect Cassegrain's parallel light tube 6, peak power collector 9, first-class as analyzer and CCD shooting in order to supporting, and mutual maintenance collimation is focused, and is the reliably working of this measurement mechanism, and the locus guarantee is provided.Cassegrain's parallel light tube 6 is to realize one of vitals that multiband comprehensive photoelectric properties detects, the patented product (patent No. ZL01201745) that preferably adopts the applicant to design, be characterized in to reach gripping altogether of theoretic focus and infinite distant place object point, aberrationless exists, thereby precision height, volume is little, in light weight, thus be specially adapted in the present invention the dialogue low-light see take aim at, multiple synthesizing optical systems such as infrared thermal imaging, infrared television and laser carry out the measurement verification of multiband, many optical axises.
In the accompanying drawing, receiving objective in the tested comprehensive electro-optical system 11, as receiving objective 11c of white low-light receiving objective 11a, infrared thermal imagery receiving objective 11b, infrared television angle measurement or laser ranging echo, communication instruction etc. etc., relative with Cassegrain's parallel light tube 6, to receive corresponding target light source or analog light source, after tested comprehensive electro-optical system 11 effects, produce corresponding output signal again.White light wherein, low-light output signal can directly observe at the visual window 11d of tested electro-optical system; Also can draw analysis result by attached picture analyzer and CCD10 picked-up; Or, be sent to industry control unit 4 through image pick-up card 7, handle and export corresponding performance test and assessment result by microcomputer.Reflection output result for the infrared thermal imagery of tested electro-optical system 11 or infrared television etc., video output terminal 11e by tested electro-optical system, directly be transferred to industry control unit 4 through image pick-up card 7 and USB interface 4b, after micro computer collection processing wherein, export corresponding performance parameter measurement result.For the reflection result of the laser ranging echo of tested electro-optical system 11 or communication instruction etc., can directly output to the parallel interface 4c of microcomputer in the industry control unit 4, after the microcomputer computing, the measurement result of output respective performances parameter.
The Laser emission output signal of tested electro-optical system 11 is to be received by peak power collector 9, reaches the USB interface 4b of industry control unit 4 through voltage acquisition card 8, is handled by microcomputer, exports corresponding performance test results.Also can focus as analyzer and CCD 10 with peak power collector 9 collimations, can be by the images category results such as laser facula that telephoto objective received in the peak power collector 9, by picture analyzer and CCD 10 picked-ups, reach industry control unit 4 through image pick-up card 7, USB interface 4b again, handle by industry control unit 4, export relevant measurement result, thereby expanded the measurement content of this device.
Claims (3)
1, a kind of multiband comprehensive photoelectric properties field on-line measurement device is characterized in that this measurement mechanism is to connect to form intelligent program-controlled graticule (1) by white low-light graduation target light source (1a) and illumination contrast and pattern scan control circuit (1b); Connect to form infrared target generator (2) by extend blackbody target light source (2a) and temperature difference control circuit (2b); Connect to form infrared spotlight and laser light field simulating emitter (3) by infrared point target and laser pulse light field simulation light source (3a) and power control with encoding control circuit (3b); Above-mentioned three parts---intelligent program-controlled graticule (1), infrared target generator (2) and infrared spotlight join with the Cassegrain's parallel light tube (6) that is connected at supporting falsework (5) upper support respectively with laser light field simulating emitter (3); Control circuit in above-mentioned three parts---intelligent program-controlled graticule (1), infrared target generator (2) and infrared spotlight and the laser light field simulating emitter (3) is connected on the output serial line interface (4a) of industry control unit (4); On industry control unit (4), be provided with the circuit interface that receives tested electro-optical system reflection result output.
2, multiband comprehensive photoelectric properties field on-line measurement device according to claim 1 is characterized in that the described circuit interface that is located at the tested electro-optical system reflection of the reception result output on the industry control unit (4) includes USB interface (4b) and receives the parallel interface (4c) that tested electro-optical system laser reflects the result; The output terminal of image pick-up card (7) and USB interface (4b) are joined, the input end of image pick-up card (7) joins with the output terminal as analyzer and CCD (10) that absorbs imaging signal from the visual window of tested electro-optical system, also is provided with the input end that receives tested electro-optical system video output signals on image pick-up card (7); The output terminal that receives the peak power collector (9) of tested electro-optical system Laser emission signal joins by voltage acquisition card (8) and USB interface (4b).
3, multiband comprehensive photoelectric properties field on-line measurement device according to claim 2 is characterized in that picture analyzer and CCD (10) also focus with peak power collector (9) collimation.
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| Application Number | Priority Date | Filing Date | Title |
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| CNB2004100924398A CN100360920C (en) | 2004-12-27 | 2004-12-27 | Multiband comprehensive photoelectric properties field on-line measurement device |
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| Application Number | Priority Date | Filing Date | Title |
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| CNB2004100924398A CN100360920C (en) | 2004-12-27 | 2004-12-27 | Multiband comprehensive photoelectric properties field on-line measurement device |
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| Publication Number | Publication Date |
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| CN1632500A CN1632500A (en) | 2005-06-29 |
| CN100360920C true CN100360920C (en) | 2008-01-09 |
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| CNB2004100924398A Expired - Fee Related CN100360920C (en) | 2004-12-27 | 2004-12-27 | Multiband comprehensive photoelectric properties field on-line measurement device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110657952A (en) * | 2019-10-22 | 2020-01-07 | 长春军晟科技有限公司 | Universal device for detecting performance of photoelectric instrument |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100397061C (en) * | 2005-12-19 | 2008-06-25 | 中国人民解放军总装备部军械技术研究所 | Multi-band pulse laser simulating emitter |
| CN102589848B (en) * | 2011-12-14 | 2015-03-18 | 北京国科世纪激光技术有限公司 | System for testing optical thin film damage threshold |
| CN102589705B (en) * | 2012-01-20 | 2014-05-14 | 中国人民解放军总装备部军械技术研究所 | Single-blackbody temperature-controlled MRTD (Minimum Resolvable Temperature Difference) field online automatic detection device and method for thermal imager |
| CN103471820B (en) * | 2013-09-29 | 2016-06-08 | 四川九洲电器集团有限责任公司 | The real-time calibration tester of Portable multiple spectrum optoelectronic device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2458591Y (en) * | 2001-01-20 | 2001-11-07 | 中国人民解放军总装备部军械技术研究所 | Multifunctional Cassegrain collimator |
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Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2458591Y (en) * | 2001-01-20 | 2001-11-07 | 中国人民解放军总装备部军械技术研究所 | Multifunctional Cassegrain collimator |
Non-Patent Citations (1)
| Title |
|---|
| 激光测距机瞄准系统分辨率全自动检测技术研究. 陈志斌，梁艳.红外与激光工程，第33卷第5期. 2004 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110657952A (en) * | 2019-10-22 | 2020-01-07 | 长春军晟科技有限公司 | Universal device for detecting performance of photoelectric instrument |
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