CN100351678C - Combined detecting circuit for display panel - Google Patents
Combined detecting circuit for display panel Download PDFInfo
- Publication number
- CN100351678C CN100351678C CNB031553532A CN03155353A CN100351678C CN 100351678 C CN100351678 C CN 100351678C CN B031553532 A CNB031553532 A CN B031553532A CN 03155353 A CN03155353 A CN 03155353A CN 100351678 C CN100351678 C CN 100351678C
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- signal line
- display panel
- testing circuit
- drive end
- pole plate
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Abstract
The present invention relates to a combined detecting circuit for display panels. A combined circuit is used for detecting the wiring in program creating of a display panel thin-film transistor array (LCD TFT Array), and in the method, a plurality of circuit switches together with conducting wires are led into short-ring wiring and short-bar wiring. Therefore, panel manufacturers are not restricted by detection devices during designing wiring; accordingly, the detection of any wiring device can be fully used, and the circuit switches can be used for freely switching various detection methods to achieve the purposes of improving yield and reducing cost.
Description
Technical field
The present invention utilizes a wiring that merges in the electric circuit inspection display panel thin film transistor (TFT) array processing procedure, the method imports ring-type short circuit wiring commonly used and shaft-like short circuit wiring, be not subject to checkout equipment when making the wiring of design panel, to promote its output, to reduce cost.
Background technology
When after present panel of LCD (LCD panel) is made, dispatching from the factory, must be via the formality that detects together, purpose is to detect respectively to control thin film transistor (TFT) (the Thin Film Transistor that picture element (pixel) shows in the display panel, TFT) whether running is correct, testing circuit wiring around its panel needs to cooperate the checkout equipment form, and wherein the wiring of the testing circuit of current use includes ring-type short circuit wiring (short-ring layout) and shaft-like short circuit wiring (shorting-bar layout).
Because the difference of above-mentioned two kinds of equipment wiring, its processing procedure light shield is also different, cause this array processing procedure production capacity to be difficult for collocation, often because the wiring kind difference of panel vendor's design, as panel size, resolution etc., and need to switch different array detection equipment, and so can cause the burden of panel designs manufacturers design and cost in many ways to consider, more can increase cost when buying checkout equipment because of taking into account various wirings.Below promptly these two kinds wirings are described in detail:
See also the ring-type short circuit wired circuit synoptic diagram shown in common technology Figure 1A, Figure 1A is the display component array wiring diagram of a panel of LCD, panel is pulled out a plurality of sweep traces 13 by gate drive end G (gate driver) and data drive end D (data driver) and is formed with data line 14 mutual vertical interlaceds, and the thin film transistor (TFT) 11 that the control picture element shows is arranged at the staggered position of sweep trace 13 and data line 14, have electric capacity 12 to connect in addition between the sweep trace 13, picture element shows that promptly the control that discharges and recharges of electric capacity 12 shows thus.Respectively connect thin film transistor (TFT) 11 elements such as grade and the correctness that connects up all around for detecting, these a plurality of sweep traces 13 respectively have circuit to be connected external detection equipment with data line 14, as shown in the figure, a plurality of sweep traces 13 are connected with a plurality of first contact pole plate 15a, a plurality of data lines 14 are connected with a plurality of second contact pole plate 15b, these a plurality of contact pole plate (15a, be to be the set probe institute position contacting of checkout equipment 15b), wherein whether each display element is good to detect, each is connected lead 17 by a plurality of impedances 16 these a plurality of first contact pole plate 15a and the second contact pole plate 15b, with checkout equipment probe and the detected data derivation of each display element, judge yield, this panel promptly can downcut the external substrate testing circuit after finishing detection along illustrated line of cut 18 directions, to continue a part of processing procedure down.
By the wiring of the ring-type short circuit shown in Figure 1B local circuit synoptic diagram as can be known, sweep trace 13 or data line 14 are connected with a plurality of contact pole plate (15a, 15b), the probe 19 of checkout equipment contacts as shown in the figure at contact pole plate (15a, 15b), to detect signal by impedance 17 again and send to lead 17, impedance 16 can postpone each end points signal, makes the unlikely phase mutual interference of each signal.
And Fig. 2 A is depicted as the shaft-like short circuit wired circuit synoptic diagram of common technology, shown in Figure 1A, it is the display component array wiring diagram of a panel of LCD, panel is pulled out a plurality of sweep traces 13 by gate drive end G and data drive end D and is formed with data line 14 mutual vertical interlaceds, be provided with the thin film transistor (TFT) 11 that the control picture element shows therebetween, picture element shows by the control that discharges and recharges of electric capacity 12 wherein and shows.This shaft-like short circuit wiring detection mode is not used probe in detecting, respectively connect thin film transistor (TFT) 11 elements such as grade and the correctness that connects up all around for detecting, these a plurality of sweep traces 13 respectively have circuit to be connected external detection equipment with data line 14, as shown in the figure, a plurality of sweep traces 13 are connected with a plurality of first pole plate 25a, a plurality of data lines 14 are connected with a plurality of second pole plate 25b, these a plurality of pole plate (25a, 25b) respectively be connected with external substrate circuit plural wires, be illustrated as adjacent two pole plates and connect different leads respectively.
In the diagram, the first pole plate 25a is a plurality of pole plates that the sweep trace 13 of gate drive end G in the panel is connected, and adjacent two pole plates are connected with privates 23 and privates 24 respectively, and terminal is connected to the first gate terminal G1 and the second gate terminal G2 respectively; In like manner, data line 14 is connected with a plurality of second pole plate 25b, adjacent pole plate connects first lead 21 and second lead 22 respectively, the lead terminal is connected with the first data end D1 and the second data end D2, and this shaft-like short circuit wired circuit promptly will detect the data derivation by the first data end D1, the second data end D2, the first gate terminal G1 and the second gate terminal G2, do not make and go on well to detect this panel internal display element, this panel promptly can downcut the testing circuit of external substrate after finishing detection along illustrated line of cut 28 directions, to continue a part of processing procedure down.
Fig. 2 B is the shaft-like short circuit wiring local circuit synoptic diagram of common technology, this figure is the gate drive end G local circuit of Fig. 2 A, wherein a plurality of sweep traces 13 are connected with a plurality of first pole plate 25a, adjacent two pole plates form odd even in pairs and separately connect privates 23 and privates 24, terminal is provided with the first gate terminal G1 and the second gate terminal G2, can connect the detection signal that odd number end pole plate and even number end pole plate are passed respectively, do not exceed during actual enforcement to be divided into two groups, can be divided into plural groups for increasing detection efficiency, promptly can be provided with pole plate signal that plural wires will be divided into plural groups and spread out of to terminal and detect.
More than two kinds of detection mode differences commonly used, therefore the wires design in the panel also can be different because of the detection mode of using, and can be therefore restricted in wiring, because of making the switching of light shield and purchase that cost is added, the difference that connects up increases again, so the present invention merges above two kinds of testing circuits, not only can import ring-type short circuit wiring commonly used and shaft-like short circuit wiring, be not subject to checkout equipment when making the wiring of design panel, can advise so that equipment vendors' improvement to be provided by relative merits again, so reach the purpose that promotes its output, reduces cost with comparison various kinds detection method.
Summary of the invention
The object of the present invention is to provide a kind of display panel to merge testing circuit, be to utilize a wiring that merges in the electric circuit inspection display panel thin film transistor (TFT) array processing procedure, import ring-type short circuit wiring and shaft-like short circuit wiring simultaneously with the connection of plurality of circuits switch, make panel manufacturer when designing wiring, be not limited to checkout equipment, contactor switches the detection of using this arbitrary wiring unit thus, to reach the purpose that promotes its output, reduces cost.
Display panel provided by the invention merges testing circuit and includes:
The plurality of signals pole plate includes a plurality of first signal pole plates and a plurality of second signal pole plate, and a plurality of sweep traces of this display panel are connected outer detecting circuit with a plurality of data lines by this plurality of signals pole plate;
A plurality of impedances, these a plurality of data lines of a plurality of sweep traces and this are to be connected a ring signal line by these a plurality of impedances;
A plurality of data drive end signal line, these a plurality of second signal pole plates are rotated mutually by plural wires and are connected these a plurality of data drive end signal line;
A plurality of gate drive end signal line, these a plurality of first signal pole plates are rotated mutually by plural wires and are connected these a plurality of gate drive end signal line;
A plurality of change-over switches are arranged on the lead that a plurality of gate drive end signal line of this plurality of signals pole plate and this a plurality of data drive end signal line and this are connected;
The detection signal that is switched this display panel by these a plurality of change-over switches is for reaching on this ring signal line or this a plurality of data drive end signal line and this a plurality of gate drive end signal line.
Wherein these a plurality of change-over switches are to implement with plurality of transistors.
Wherein these a plurality of change-over switches are to connect lead with one to interconnect.
Wherein this ring signal line is connected to a ring signal end.
Wherein these a plurality of gate drive end signal line are connected to a plurality of gate terminal.
Wherein these a plurality of data drive end signal line are connected to a plurality of data ends.
Wherein this ring signal end, these a plurality of gate terminal are for detecting the signal test side with these a plurality of data ends.
Wherein this plurality of signals pole plate is a plurality of probes contact pole plate.
When wherein these a plurality of change-over switches are conducting (on), promptly use the testing circuit of a shaft-like short circuit wiring; When these a plurality of change-over switches are when ending (off), promptly use the testing circuit of ring-type short circuit wiring.
Description of drawings
Figure 1A is the ring-type short circuit wired circuit synoptic diagram of common technology;
Figure 1B is the ring-type short circuit wiring local circuit synoptic diagram of common technology;
Fig. 2 A is the shaft-like short circuit wired circuit synoptic diagram of common technology;
Fig. 2 B is the shaft-like short circuit wiring local circuit synoptic diagram of common technology;
Fig. 3 A merges the testing circuit synoptic diagram for display panel of the present invention;
Fig. 3 B detects gate drive terminal circuit partial schematic diagram for display panel of the present invention merges;
Fig. 3 C merges detection data drive end circuit partial schematic diagram for display panel of the present invention.
Embodiment
Existing display element and the checkout equipment of circuit before dispatching from the factory for display panel includes ring-type short circuit wiring (short-ring layout) and shaft-like short circuit wiring (shorting-bar layout) two kinds, need at the beginning of the panel designs to consider that the society's equipment of cutting that will use is a kind of for that, and its wiring promptly can be restricted, the invention provides one and merge testing circuit, make it to consider that different array detection equipment can detect, need not be to the correctness of the shaft-like short circuit wiring of the ability probatio inspectionem pecuoarem detection of lighting a lamp, not only can promote the power of sowing of checkout equipment, also can reduce cost.
See also Fig. 3 A, display panel of the present invention merges the testing circuit synoptic diagram, be illustrated as the display component array wiring diagram of a panel of LCD, this panel size is decided by size and resolution size, panel is pulled out a plurality of sweep traces 13 by gate drive end G (gate driver) and data drive end D (data driver) and is formed with data line 14 mutual vertical interlaceds, and the thin film transistor (TFT) 11 that the control picture element shows is arranged at the staggered position of sweep trace 13 and data line 14, in addition between the sweep trace 13 by there being electric capacity 12 to connect, picture element shows that promptly the control that discharges and recharges of electric capacity 12 shows thus, wherein a plurality of sweep traces 13 are connected with a plurality of first signal pole plate 35a, a plurality of data lines 14 are connected with a plurality of second signal pole plate 35b, (35a 35b) connects outer detecting circuit to the plurality of signals pole plate thus.
Respectively connect thin film transistor (TFT) 11 elements such as grade and the correctness that connects up all around for detecting, and in conjunction with above-mentioned ring-type short circuit wiring and shaft-like short circuit wiring.With gate drive end G, a plurality of of being pulled out by the first signal pole plate 35a connect on leads and are respectively arranged with a plurality of change-over switches 39, this change-over switch 39 can be implemented by transistor, connecting lead 306 by one links mutually, transmission as the switch signal, to switch the circuit of ring-type short circuit wiring and shaft-like short circuit wiring, connected the lead that by a plurality of first signal pole plate 35a and more connected a ring signal line 37 by complex impedance 36, making the detection data encircle signal line 37 therewith by impedance 36 derives, each adjacent a plurality of first signal pole plate 35a also is connected to the 3rd signal line 33 and the 4th signal line 34 by lead respectively, so can switch two kinds of testing circuits by change-over switch 39, can detect the detection signal of being sent by the ring signal end 305 of ring signal line 37 connections, also can judge whether the panel running is good by the detection signal that first gate terminal 303 and second gate terminal 304 are sent.
In like manner, with data drive end D, a plurality of of being pulled out by the second signal pole plate 35b connect on leads and are respectively arranged with a plurality of change-over switches 39, this change-over switch 39 can transistor or thin film transistor (TFT) (TFT) implement, link mutually by connecting lead 306, transmission as the switch signal, to switch the circuit of ring-type short circuit wiring and shaft-like short circuit wiring, connected the lead that by a plurality of second signal pole plate 35b and more connected a ring signal line 37 by complex impedance 36, making the detection data encircle signal line 37 therewith by impedance 36 derives, each adjacent a plurality of second signal pole plate 35b also is connected to a plurality of data drive end signal line by lead respectively, include first signal line 31 and second signal line 32, and can switch two kinds of testing circuits by change-over switch 39, can detect the detection signal of being sent by the ring signal end 305 of ring signal line 37 connections, also can judge whether the panel running is good by the detection signal that the first data end 301 and the second data end 302 are sent.The second signal pole plate 35b of the first signal pole plate 35a of the above gate drive end G and data drive end D is connected to ring signal line 37 jointly, and the gate drive end G signal pole plate adjacent with data drive end D rotated mutually and is connected first signal line 31 of same a plurality of data drive end signal line, and second signal line 32 also connects the signal pole plate that is connected with rotating mutually of data drive end D by gate drive end G, in like manner, in a plurality of gate drive end signal line, including the 3rd signal line 33 also is the signal line that links to each other jointly with the 4th signal line 34, and the testing circuit of the testing circuit of use ring-type short circuit wiring or shaft-like short circuit wiring is by connecting two kinds of patterns of lead 306 unified switchings by a plurality of change-over switches 39.This panel promptly can downcut the external substrate testing circuit after finishing detection along illustrated line of cut 38 directions, to continue a part of processing procedure down.
See also Fig. 3 B again, the present invention detects gate drive terminal circuit partial schematic diagram, it shown in the figure local circuit of gate drive end G, a plurality of first signal pole plate 35a that sweep trace 13 is connected, each first signal pole plate 35a is connected with two signal line by lead, one for being connected to ring signal line 37 via impedance 36, another is process change-over switch 39, be connected to the 3rd signal line 33 or the 4th signal line 34 of a plurality of gate drive end signal line again, adjacent in twos signal pole plate is rotated mutually and is connected these a plurality of signal line, is not limited to described the 3rd signal line 34 of this figure and the 4th signal line 34.Change-over switch 39 is to utilize transistor unit to produce an electronic switch, when gate (gate) end of transistor unit adds a high voltage, transistor unit gets final product conducting (on), be considered as source electrode and drain conducting (S-D short), because the reason of impedance 36, the signal electric current will be sent to the 3rd signal line 33 through change-over switch 39 thus by the signal pole plate, and the signal electric current of adjacent signal pole plate will be sent to the 4th signal line 34, and this state is just as the testing circuit that uses shaft-like short circuit wiring; When change-over switch 39 is ended (off), the signal electric current then is switched switch 39 blocking-up, this signal will be sent to ring signal line 37 via impedance 36, and can be with on plurality of probes 19 these a plurality of first signal pole plate 35a of contact, and this state is as the testing circuit of ring-type short circuit wiring.Reach the purpose of switching two kinds of testing circuits with this function mode.
And Fig. 3 C, the present invention detects data drive end circuit partial schematic diagram, it shown in the figure local circuit of data drive end D, a plurality of second signal pole plate 35b that data line 14 is connected, each second signal pole plate 35b also is connected with two signal line by lead, one for being connected to ring signal line 37 via impedance 36, another is process change-over switch 39, be connected to a plurality of data drive end signal line again, include first signal line 31 or second signal line 32, adjacent in twos signal pole plate is rotated mutually and is connected a plurality of signal line, also is not limited to the described mode of this figure.Change-over switch 39 is conducting (on), because the reason of impedance 36, the signal electric current will be sent to first signal line 31 through change-over switch 39 thus by the signal pole plate, and the signal electric current of adjacent signal pole plate will be sent to second signal line 32, and this state is just as the testing circuit that uses shaft-like short circuit wiring; When change-over switch 39 is ended (off), the signal electric current then is switched switch 39 blocking-up, this signal will be sent to ring signal line 37 via impedance 36, and can be with on plurality of probes 19 these a plurality of second signal pole plate 35b of contact, this state reaches the purpose of switching two kinds of testing circuits just as the testing circuit that uses ring-type short circuit wiring with this function mode.
More than merge the detailed description of testing circuit embodiment for display panel of the present invention, a plurality of change-over switches wherein are set on the testing circuit of display panel, reach a panel and merge testing circuit, the circuit that utilizes this change-over switch is to switch different checkout equipments, need not consider the detection wiring when making the panel circuit design and limit its processing procedure, can't be idle because of the checkout equipment that makes another wiring kind detecting a certain wiring kind, mode is compared the good and the bad of checkout equipment more thus, to reach the purpose that reduces cost.
The above only is preferred embodiment of the present invention, when not limiting the scope that the present invention is implemented with this.Promptly the equalization of being done according to the present patent application claim generally changes and modifies, and all should still belong in the scope that patent of the present invention contains.
Claims (9)
1, a kind of display panel merges testing circuit, is to switch the testing circuit of ring-type short circuit wiring and shaft-like short circuit wiring by the set switch of a merging testing circuit, and this display panel merging testing circuit includes:
The plurality of signals pole plate includes a plurality of first signal pole plates and a plurality of second signal pole plate, and a plurality of sweep traces of this display panel are connected outer detecting circuit with a plurality of data lines by this plurality of signals pole plate;
A plurality of impedances, these a plurality of data lines of a plurality of sweep traces and this are to be connected a ring signal line by these a plurality of impedances;
A plurality of data drive end signal line, these a plurality of second signal pole plates are rotated mutually by plural wires and are connected these a plurality of data drive end signal line;
A plurality of gate drive end signal line, these a plurality of first signal pole plates are rotated mutually by plural wires and are connected these a plurality of gate drive end signal line;
A plurality of change-over switches are arranged on the lead that a plurality of gate drive end signal line of this plurality of signals pole plate and this a plurality of data drive end signal line and this are connected;
The detection signal that is switched this display panel by these a plurality of change-over switches is for reaching on this ring signal line or this a plurality of data drive end signal line and this a plurality of gate drive end signal line.
2, display panel as claimed in claim 1 merges testing circuit, and rib is characterised in that wherein these a plurality of change-over switches are to implement with plurality of transistors.
3, display panel as claimed in claim 1 merges testing circuit, it is characterized in that, wherein these a plurality of change-over switches are to connect lead with one to interconnect.
4, display panel as claimed in claim 1 merges testing circuit, it is characterized in that, wherein this ring signal line is connected to a ring signal end.
5, display panel as claimed in claim 1 merges testing circuit, it is characterized in that wherein these a plurality of gate drive end signal line are connected to a plurality of gate terminal.
6, display panel as claimed in claim 1 merges testing circuit, it is characterized in that wherein these a plurality of data drive end signal line are connected to a plurality of data ends.
7, merge testing circuit as claim 3,4 or 5 described display panels, it is characterized in that, wherein this ring signal end, these a plurality of gate terminal are for detecting the signal test side with these a plurality of data ends.
8, display panel as claimed in claim 1 merges testing circuit, it is characterized in that, wherein this plurality of signals pole plate is a plurality of probes contact pole plate.
9, display panel as claimed in claim 1 merges testing circuit, it is characterized in that, when wherein these a plurality of change-over switches are conducting, promptly uses the testing circuit of a shaft-like short circuit wiring; When these a plurality of change-over switches for by the time, promptly use the testing circuit of ring-type short circuit wiring.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB031553532A CN100351678C (en) | 2003-08-27 | 2003-08-27 | Combined detecting circuit for display panel |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB031553532A CN100351678C (en) | 2003-08-27 | 2003-08-27 | Combined detecting circuit for display panel |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1591028A CN1591028A (en) | 2005-03-09 |
| CN100351678C true CN100351678C (en) | 2007-11-28 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB031553532A Expired - Fee Related CN100351678C (en) | 2003-08-27 | 2003-08-27 | Combined detecting circuit for display panel |
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| Country | Link |
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| CN (1) | CN100351678C (en) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200732808A (en) | 2006-02-24 | 2007-09-01 | Prime View Int Co Ltd | Thin film transistor array substrate and electronic ink display device |
| CN101089934B (en) * | 2006-06-16 | 2010-04-14 | 胜华科技股份有限公司 | Display module circuit capable of switching detection and drive function |
| CN101620818B (en) * | 2008-07-03 | 2011-02-09 | 中华映管股份有限公司 | Display panel and detection method thereof |
| CN101826533B (en) * | 2009-03-06 | 2011-11-16 | 华映视讯（吴江）有限公司 | Switching component structure of active array-type display |
| CN101639508B (en) * | 2009-04-30 | 2012-07-04 | 华映光电股份有限公司 | Detection circuit and display |
| CN101572045B (en) * | 2009-06-01 | 2011-01-05 | 深圳华映显示科技有限公司 | Flat display and measurement method thereof |
| CN102681226B (en) * | 2010-01-04 | 2015-01-21 | 京东方科技集团股份有限公司 | Array substrate detection signal distribution device and detection device |
| CN102967954B (en) * | 2012-11-20 | 2015-11-25 | 深圳市华星光电技术有限公司 | The proving installation of liquid crystal panel and method |
| CN103474418B (en) * | 2013-09-12 | 2016-05-04 | 京东方科技集团股份有限公司 | A kind of array base palte and preparation method thereof, display unit |
| TWI540323B (en) * | 2014-09-16 | 2016-07-01 | 友達光電股份有限公司 | Test cell structure of display panel and related display panel |
| CN109410852A (en) * | 2018-10-22 | 2019-03-01 | 惠科股份有限公司 | Display device and detection method thereof |
| CN109727563B (en) | 2019-01-30 | 2021-06-25 | 武汉华星光电半导体显示技术有限公司 | Lower narrow frame display panel |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002099222A (en) * | 2000-06-08 | 2002-04-05 | Semiconductor Energy Lab Co Ltd | Method for manufacturing semiconductor device |
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2003
- 2003-08-27 CN CNB031553532A patent/CN100351678C/en not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002099222A (en) * | 2000-06-08 | 2002-04-05 | Semiconductor Energy Lab Co Ltd | Method for manufacturing semiconductor device |
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| CN1591028A (en) | 2005-03-09 |
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