CN1003394B - 测光装置 - Google Patents

测光装置 Download PDF

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Publication number
CN1003394B
CN1003394B CN85107724.2A CN85107724A CN1003394B CN 1003394 B CN1003394 B CN 1003394B CN 85107724 A CN85107724 A CN 85107724A CN 1003394 B CN1003394 B CN 1003394B
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light
emitting diode
light emitting
temperature
mentioned
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CN85107724A (zh
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藤田茂
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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Publication of CN85107724A publication Critical patent/CN85107724A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/58—Radiation pyrometry, e.g. infrared or optical thermometry using absorption; using extinction effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
    • G01K11/12—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in colour, translucency or reflectance

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Measuring Magnetic Variables (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

本发明是关于具有通过其光的透射量根据温度而变化的材料进行受光，并将光量变换为电量的光接收部件的光检测装置，通过设置由恒流源激励部件所激励的发光二极管光源，藉着检测这个发光二极管的正向电压并以这检出值来补正光接收部件的输出，消除上述发光二极管的由于温度变化而引起波长变化所造成的测定误差。

Description

测光装置
本发明是关于光的计测装置，例如有关使用光的透射量根据温度而变化的材料来测定温度的装置的构造。
图3是原来所用的这种光的温度测定装置的一实施例，该图中的（1）是光源，（2）是光导纤维，（3）是其透光量作为温度的函数而变化的材料，（4）是光接收部件，（5）是信号处理部件，（6）是显示部件，（1a）是包围光源（1）的恒温槽。
由光源（1）射出的光是通过光导纤维（2）传导到测定温度的材料（3）。根据该材料（3）作为与温度相对应的光量通过光导纤维（2）在光接收部件（4）进行受光。光接收部件（4）把光变换成电量，由信号处理部件（5）推定温度，在显示部件（5）显示出来。恒温槽（1a）包围光源（1）而构成，起着稳定光源（1）的温度的作用。这是因为一般由光源（1）射出的光的波长，受光源（1）温度的影响，其变动就构成在温度测定上产生误差的主要原因。
因为原来的温度测定装置有如上述的构造，所以就需要稳定光源（1）的波长，因而恒温槽就必不可少了。而这样一来装置的价格就要变高，而且形状要扩大。
本发明的目的在于解决上述的问题，提供无需恒温槽而且小型价廉的装置。
本发明之测光装置是使用发光二极管作为光源，检测其正向电压，补正来自光接收部件的输出。
在本发明里，发光二极管的波长与正向电压之间有一定的关系，因为是检测其正向电压来对输出进行补正的，所以就能消除由于发光二极管的温度变化而产生波长变化所引起的测定误差。
附图的简单说明
图1是表示本发明一实施例的构成图，图2（a）是吸收限波长的温度变化，图2（b）是发光二极管波长和吸收限波长，图2（c）是在图2（b）B时的透光量，图2（d）是在图2（b）C时的透光量，图2（e）是发光二极管的正向电压与波长的关系图，图3是原来的光温度计的构成图。
还有，各图中的同一符号表示相同的或者相当的部分。
以下就本发明的一实施例进行说明。
图1中的（2）是光导纤维，（3）是光的透射量作为温度函数变化的材料，（4）是光接收部件，（5）是信号处理部件，（6）是显示部件，（7）是发光二极管，（8）是激励发光二极管（7）的恒流源之激励部件，（9）是检测发光二极管（7）波长的波长检测部件。
以下就它的动作，连同表示各个特性的图2来进行说明
由激励部件（8）激励的发光二极管（7）的光，通过光导纤维传导到检测温度的材料（3）。材料（3）的构成如图2（a）所示对于不同波长其透射吸收量产生变化，这种透射吸收量（吸收限）随着温度上升而向着长波长区变化。材料（3）的某个温度的吸收限波长A和发光二极管（7）的波长曲线以图2（b）B表示;这时的透射量以图2（C）表示。透射过来的光量在光接收部件被变换成电量。在信号处理部件（5），事先存储了对于不同温度所透射过来的光量再与这个值相比较从而检测温度。
发光二极管（7）的光波长也和材料（3）的光透射量一样，同样是温度的函数。也就是说发光二极管（7）周围的温度一上升，波长也会朝长波长区变化，图2（b）的B就变化为C，这时的透射量也由图2（c）变为图2（d），其变化量则成为误差。因此为了补正这种误着，就通过波长检测部件（9）来对发光二极管（7）的正向电压（发光二极管的阳极、阴极间的电压）进行测定。图2（e）就是表示由于发光二极管（7）周围温度而使波长变化和正向电压的关系。发光二极管（7）周围的温度一上升，波长就移向长波长区，而正向电压就下降。
由于正向电压和发光二极管（7）的波长具有密切的关系，所以通过在信号处理部件（5）事先储存与正向电压的误差关系，对温度推定的结果给予补正值，从而能消除发光二极管（7）由于温度变化而产生的误差，并把正确的值显示在显示部件（6）。
还有，虽然上述实施例是就温度测定所作的说明，但是在利用光的二次电光效应的电压表，利用法拉第效应的第电流表等，由于温度使光源的波长发生变化时而造成误差的各种测光装置也能发挥同样的效果。
如上所述，由于本发明是通过正向电压来检测由于发光二极管的温度变化而造成波长变化的误差，而对检测值给予补正而构成的，所以本发明之测光装置无需恒温槽，而且价廉，小型并具有高精度的效果。

Claims (1)

1、一种测光装置，具有一由恒流源激励部件激励的发光二极管，一用以透射发于上述发光二极管的光，而其透射特性具有波长依存性，且为被测光量的函数的透光材料，一接收透过上述透光材料的光并将之变换为电量的光接收部件，以及一信号处理部件，其特征在于，该测光装置进一步备有一检测上述发光二极管的正向电压的电压检测机构、以及所说的信号处理部件根据上述电压检测机构的输出修正上述光接收部件的输出，从而消除上述发光二极管随着温度变化而发生波长变化所造成的检测误差以计算测定量。
CN85107724.2A 1984-12-04 1985-10-21 测光装置 Expired CN1003394B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP59256853A JPS61133826A (ja) 1984-12-04 1984-12-04 光計測装置
JP256853/84 1984-12-04
JP59-256853 1984-12-04

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CN85107724A CN85107724A (zh) 1986-05-10
CN1003394B true CN1003394B (zh) 1989-02-22

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US (1) US4700064A (zh)
EP (1) EP0186802A3 (zh)
JP (1) JPS61133826A (zh)
KR (1) KR900001963B1 (zh)
CN (1) CN1003394B (zh)

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JPS638923A (ja) * 1986-06-30 1988-01-14 Alps Electric Co Ltd 光学式位置入力装置
JPH01287445A (ja) * 1988-05-13 1989-11-20 Minolta Camera Co Ltd 光学濃度計
US5185635A (en) * 1990-04-25 1993-02-09 Tektronix, Inc. Method of calibrating and controlling the optical power output of an OTDR
JPH04127076A (ja) * 1990-09-19 1992-04-28 Tokyo Electric Power Co Inc:The 光磁界センサ
JP2818329B2 (ja) * 1991-11-29 1998-10-30 日立電線株式会社 光ファイバジャイロ
US5299869A (en) * 1992-08-19 1994-04-05 Hughes Aircraft Company Laser diode temperature sensing system
DE19917239A1 (de) * 1999-04-16 2000-10-26 Hella Kg Hueck & Co Verfahren zur Ermittlung von Korrekturfaktoren zur Kompensation der Temperaturdrift der Strahlstärke einer LED
US6796710B2 (en) * 2001-06-08 2004-09-28 Ethicon Endo-Surgery, Inc. System and method of measuring and controlling temperature of optical fiber tip in a laser system
US7052180B2 (en) * 2002-01-04 2006-05-30 Kelvin Shih LED junction temperature tester
CN102365536B (zh) * 2009-05-01 2014-06-11 富士通株式会社 温度测定系统以及温度测定方法
WO2011058496A2 (en) * 2009-11-16 2011-05-19 Koninklijke Philips Electronics N.V. Sensor device with light emitting diode
JP5697890B2 (ja) * 2010-04-22 2015-04-08 アズビル株式会社 蛍光式温度センサ及び温度の測定方法
CN101871889B (zh) * 2010-06-02 2012-11-28 张琪 使用led光源的液体样本检测装置
CN101871888B (zh) * 2010-06-02 2012-08-08 张琪 使用led光源进行液体样本检测的方法
CN106052898B (zh) * 2016-08-09 2018-08-31 上海禾赛光电科技有限公司 基于光谱技术的无线测温装置及方法

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US4338516A (en) * 1980-09-12 1982-07-06 Nasa Optical crystal temperature gauge with fiber optic connections
SE424022B (sv) * 1980-10-21 1982-06-21 Asea Ab Fiberoptiskt metdon for spektralanalys
JPS59111027A (ja) * 1982-12-17 1984-06-27 Fuji Electric Corp Res & Dev Ltd 温度測定方法
SE455345B (sv) * 1982-12-30 1988-07-04 Asea Ab Ljusalstrande element innefattande ett optiskt filter som ger den emitterade signalen en temperaturoberoende uteffekt, samt anvendning av det ljusalstrande elementet

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Publication number Publication date
CN85107724A (zh) 1986-05-10
KR900001963B1 (ko) 1990-03-27
EP0186802A3 (en) 1988-07-06
JPH0464420B2 (zh) 1992-10-14
US4700064A (en) 1987-10-13
JPS61133826A (ja) 1986-06-21
KR860005216A (ko) 1986-07-18
EP0186802A2 (en) 1986-07-09

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