CL2017002353A1 - Control de calidad y selección automatizados - Google Patents

Control de calidad y selección automatizados

Info

Publication number
CL2017002353A1
CL2017002353A1 CL2017002353A CL2017002353A CL2017002353A1 CL 2017002353 A1 CL2017002353 A1 CL 2017002353A1 CL 2017002353 A CL2017002353 A CL 2017002353A CL 2017002353 A CL2017002353 A CL 2017002353A CL 2017002353 A1 CL2017002353 A1 CL 2017002353A1
Authority
CL
Chile
Prior art keywords
radiography
model
selection
quality control
radiation
Prior art date
Application number
CL2017002353A
Other languages
English (en)
Inventor
Bart Nicolai
Pieter Verboven
Dael Mattias Van
Jelle Dhaene
Hoorebeke Luc Van
Jan Sijbers
Original Assignee
Katholieke Univ Leuven Univ Gent Univ Antwerpen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Katholieke Univ Leuven Univ Gent Univ Antwerpen filed Critical Katholieke Univ Leuven Univ Gent Univ Antwerpen
Publication of CL2017002353A1 publication Critical patent/CL2017002353A1/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/02—Food
    • G01N33/025—Fruits or vegetables
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20—Image signal generators
    • H04N13/204—Image signal generators using stereoscopic image cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10072—Tomographic images
    • G06T2207/10081—Computed x-ray tomography [CT]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10116—X-ray image
    • G06T2207/10124—Digitally reconstructed radiograph [DRR]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30128—Food products

Landscapes

  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Food Science & Technology (AREA)
  • Theoretical Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Medicinal Chemistry (AREA)
  • Pulmonology (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

<p>MÉTODO DE INSPECCIÓN NO DESTRUCTIVA PARA LA INSPECCIÓN EN LÍNEA DE UN OBJETO QUE COMPRENDE MOVER UN OBJETO QUE ES AL MENOS PARCIALMENTE TRANSPARENTE A LA RADIACIÓN DE UNA CALIDAD DE RADIACIÓN PREDETERMINADA A LO LARGO DE UNA TRAYECTORIA PREDETERMINADA ENTRE UNA FUENTE DE RADIACIÓN Y UN DETECTOR DE IMÁGENES, GENERAR IMÁGENES DE DICHO OBJETO USANDO EL DETECTOR DE IMÁGENES, ESCANEAR UNA SUPERFICIE EXTERIOR DE DICHO OBJETO USANDO EL ESCÁNER TRIDIMENSIONAL PARA OBTENER DATOS DE ESCANEO TRIDIMENSIONAL DE DICHO OBJETO, AJUSTAR UN MODELO DE FORMA DE DICHO OBJETO PARA OBTENER UN MODELO DE SUPERFICICE DE DICHA SUPERFICIE EXTERIOR, CREAR UN MODELO SÓLIDO DE DICHO MODELO DE SUPERFICIE, SIMULAR UNA RADIOGRAFÍA  DE REFERENCIA A PARTIR DE DICHO MODELO SÓLIDO Y COMPARAR DICHA RADIOGRAFÍA DE REFERENCIA CON DICHA RADIOGRAFÍA DE PROYECCIÓN PARA DETECTAR Y/O MEDIR DESCVIACIONES INTERNAS DE DICHO OBJETO CON RESPECTO AL OBJETO DE REFERENCIA; SISTEMA.</p>
CL2017002353A 2015-03-16 2017-09-15 Control de calidad y selección automatizados CL2017002353A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB1504360.7A GB201504360D0 (en) 2015-03-16 2015-03-16 Automated quality control and selection system

Publications (1)

Publication Number Publication Date
CL2017002353A1 true CL2017002353A1 (es) 2018-07-13

Family

ID=53016155

Family Applications (1)

Application Number Title Priority Date Filing Date
CL2017002353A CL2017002353A1 (es) 2015-03-16 2017-09-15 Control de calidad y selección automatizados

Country Status (12)

Country Link
US (1) US10520452B2 (es)
EP (1) EP3271717B1 (es)
BR (1) BR112017019834B1 (es)
CA (1) CA2979932C (es)
CL (1) CL2017002353A1 (es)
ES (1) ES2772698T3 (es)
GB (1) GB201504360D0 (es)
NZ (1) NZ735513A (es)
PL (1) PL3271717T3 (es)
PT (1) PT3271717T (es)
WO (1) WO2016146703A1 (es)
ZA (1) ZA201706920B (es)

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US10282499B2 (en) * 2015-12-18 2019-05-07 Triple Ring Technologies, Inc. Method and apparatus for x-ray ionizing radiation control
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EP3519764B1 (en) 2016-09-29 2020-07-29 Marel Iceland EHF A method of generating a three dimensional surface profile of a food object
WO2018165671A1 (en) * 2017-03-10 2018-09-13 Walmart Apollo, Llc Methods and systems for determining an internal property of a food product
CN107085001B (zh) * 2017-04-19 2019-10-25 天津博迈科海洋工程有限公司 大型工艺管线缺陷探测方法
US10529082B2 (en) * 2017-06-20 2020-01-07 Mitutoyo Corporation Three-dimensional geometry measurement apparatus and three-dimensional geometry measurement method
US10460512B2 (en) * 2017-11-07 2019-10-29 Microsoft Technology Licensing, Llc 3D skeletonization using truncated epipolar lines
US11049236B2 (en) * 2017-11-17 2021-06-29 Kodak Alaris Inc. Automated in-line object inspection
CZ2017777A3 (cs) 2017-12-05 2019-07-03 Radalytica s.r.o. Způsob nedestruktivního zobrazování vnitřní struktury a zařízení k provádění tohoto způsobu
BR112020015628A2 (pt) * 2018-03-14 2021-01-05 Atlas Pacific Engineering Company Orientador de produção
DE102018002622A1 (de) * 2018-03-29 2019-10-02 Twinner Gmbh 3-D-Objekt-Erfassungssystem
EP3814759B1 (en) * 2018-06-29 2023-09-06 Universiteit Antwerpen Item inspection by radiation imaging using an iterative projection-matching approach
EP3814758A1 (en) * 2018-06-29 2021-05-05 Universiteit Antwerpen Item inspection by dynamic selection of projection angle
CN112955733A (zh) * 2018-09-19 2021-06-11 爱德华兹生命科学公司 使用成像的医疗植入检查
CN109377487B (zh) * 2018-10-16 2022-04-12 浙江大学 一种基于深度学习分割的水果表面缺陷检测方法
WO2020191121A1 (en) * 2019-03-20 2020-09-24 Carl Zeiss Smt Inc. Method for imaging a region of interest of a sample using a tomographic x-ray microscope, microscope, system and computer program
DE102019109789A1 (de) * 2019-04-12 2020-10-15 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und Computerprogramm zum zeitaufgelösten Berechnen einer Deformation eines Körpers
US11605177B2 (en) * 2019-06-11 2023-03-14 Cognex Corporation System and method for refining dimensions of a generally cuboidal 3D object imaged by 3D vision system and controls for the same
US11335021B1 (en) 2019-06-11 2022-05-17 Cognex Corporation System and method for refining dimensions of a generally cuboidal 3D object imaged by 3D vision system and controls for the same
IT201900011778A1 (it) * 2019-07-15 2021-01-15 Microtec Srl Metodi implementati tramite computer per addestrare o utilizzare una infrastruttura software basata su tecniche di machine learning
EP3789955A1 (en) * 2019-09-04 2021-03-10 Faro Technologies, Inc. System and method for training a neural network to fill gaps between scan points in images and to de-noise point cloud images
CN111062988B (zh) * 2019-11-29 2024-02-13 佛山科学技术学院 一种基于局部点云的葡萄位姿估计方法
ES2847236B2 (es) 2020-01-11 2022-04-20 Quandum Aerospace S L Sistema de posicionamiento de camaras y luces para inspeccion de mangueras empleadas en el repostaje aereo y procedimiento de inspeccion
JP7394645B2 (ja) * 2020-02-05 2023-12-08 富士フイルム株式会社 教師画像生成装置、方法およびプログラム、学習装置、方法およびプログラム、判別器、並びに放射線画像処理装置、方法およびプログラム
US11937019B2 (en) 2021-06-07 2024-03-19 Elementary Robotics, Inc. Intelligent quality assurance and inspection device having multiple camera modules
US11232554B1 (en) * 2021-06-07 2022-01-25 Elementary Robotics, Inc. Machine-learning based camera image triggering for quality assurance inspection processes
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Also Published As

Publication number Publication date
ES2772698T3 (es) 2020-07-08
BR112017019834B1 (pt) 2022-02-01
US10520452B2 (en) 2019-12-31
EP3271717A1 (en) 2018-01-24
PL3271717T3 (pl) 2020-06-01
CA2979932C (en) 2021-01-05
PT3271717T (pt) 2020-02-20
WO2016146703A1 (en) 2016-09-22
ZA201706920B (en) 2019-02-27
CA2979932A1 (en) 2016-09-22
BR112017019834A2 (pt) 2018-05-29
EP3271717B1 (en) 2019-11-13
US20180113083A1 (en) 2018-04-26
GB201504360D0 (en) 2015-04-29
NZ735513A (en) 2020-07-31

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