PL3271717T3 - Zautomatyzowana kontrola i selekcja jakości - Google Patents

Zautomatyzowana kontrola i selekcja jakości

Info

Publication number
PL3271717T3
PL3271717T3 PL16713324T PL16713324T PL3271717T3 PL 3271717 T3 PL3271717 T3 PL 3271717T3 PL 16713324 T PL16713324 T PL 16713324T PL 16713324 T PL16713324 T PL 16713324T PL 3271717 T3 PL3271717 T3 PL 3271717T3
Authority
PL
Poland
Prior art keywords
selection
quality control
automated quality
automated
control
Prior art date
Application number
PL16713324T
Other languages
English (en)
Inventor
Mattias VAN DAEL
Pieter Verboven
Bart NICOLAÏ
Jelle DHAENE
Luc Van Hoorebeke
Jan Sijbers
Original Assignee
Katholieke Universiteit Leuven
Universiteit Gent
Universiteit Antwerpen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Katholieke Universiteit Leuven, Universiteit Gent, Universiteit Antwerpen filed Critical Katholieke Universiteit Leuven
Publication of PL3271717T3 publication Critical patent/PL3271717T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18Investigating the presence of flaws defects or foreign matter
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/02Food
    • G01N33/025Fruits or vegetables
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20Image signal generators
    • H04N13/204Image signal generators using stereoscopic image cameras
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/419Imaging computed tomograph
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10028Range image; Depth image; 3D point clouds
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10072Tomographic images
    • G06T2207/10081Computed x-ray tomography [CT]
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10116X-ray image
    • G06T2207/10124Digitally reconstructed radiograph [DRR]
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30128Food products
PL16713324T 2015-03-16 2016-03-16 Zautomatyzowana kontrola i selekcja jakości PL3271717T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB1504360.7A GB201504360D0 (en) 2015-03-16 2015-03-16 Automated quality control and selection system
PCT/EP2016/055718 WO2016146703A1 (en) 2015-03-16 2016-03-16 Automated quality control and selection
EP16713324.8A EP3271717B1 (en) 2015-03-16 2016-03-16 Automated quality control and selection

Publications (1)

Publication Number Publication Date
PL3271717T3 true PL3271717T3 (pl) 2020-06-01

Family

ID=53016155

Family Applications (1)

Application Number Title Priority Date Filing Date
PL16713324T PL3271717T3 (pl) 2015-03-16 2016-03-16 Zautomatyzowana kontrola i selekcja jakości

Country Status (12)

Country Link
US (1) US10520452B2 (pl)
EP (1) EP3271717B1 (pl)
BR (1) BR112017019834B1 (pl)
CA (1) CA2979932C (pl)
CL (1) CL2017002353A1 (pl)
ES (1) ES2772698T3 (pl)
GB (1) GB201504360D0 (pl)
NZ (1) NZ735513A (pl)
PL (1) PL3271717T3 (pl)
PT (1) PT3271717T (pl)
WO (1) WO2016146703A1 (pl)
ZA (1) ZA201706920B (pl)

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US10282499B2 (en) * 2015-12-18 2019-05-07 Triple Ring Technologies, Inc. Method and apparatus for x-ray ionizing radiation control
GB2550117A (en) * 2016-05-04 2017-11-15 E M & I (Maritime) Ltd Inspection method
CA3038417A1 (en) 2016-09-29 2018-04-05 Marel Iceland Ehf. A method of generating a three dimensional surface profile of a food object
MX2019010766A (es) * 2017-03-10 2019-12-11 Walmart Apollo Llc Metodos y sistemas de determinacion de propiedad interna de producto alimenticio.
CN107085001B (zh) * 2017-04-19 2019-10-25 天津博迈科海洋工程有限公司 大型工艺管线缺陷探测方法
US10529082B2 (en) * 2017-06-20 2020-01-07 Mitutoyo Corporation Three-dimensional geometry measurement apparatus and three-dimensional geometry measurement method
US10621406B2 (en) * 2017-09-15 2020-04-14 Key Technology, Inc. Method of sorting
US10460512B2 (en) * 2017-11-07 2019-10-29 Microsoft Technology Licensing, Llc 3D skeletonization using truncated epipolar lines
US11049236B2 (en) * 2017-11-17 2021-06-29 Kodak Alaris Inc. Automated in-line object inspection
CZ2017777A3 (cs) 2017-12-05 2019-07-03 Radalytica s.r.o. Způsob nedestruktivního zobrazování vnitřní struktury a zařízení k provádění tohoto způsobu
AU2019234203B2 (en) * 2018-03-14 2023-11-23 Atlas Pacific Engineering Company Produce orientor
DE102018002622A1 (de) * 2018-03-29 2019-10-02 Twinner Gmbh 3-D-Objekt-Erfassungssystem
EP3814758A1 (en) * 2018-06-29 2021-05-05 Universiteit Antwerpen Item inspection by dynamic selection of projection angle
EP3814759B1 (en) * 2018-06-29 2023-09-06 Universiteit Antwerpen Item inspection by radiation imaging using an iterative projection-matching approach
WO2020061078A1 (en) * 2018-09-19 2020-03-26 Edwards Lifesciences Corporation Medical implant inspection using imaging
CN109377487B (zh) * 2018-10-16 2022-04-12 浙江大学 一种基于深度学习分割的水果表面缺陷检测方法
WO2020191121A1 (en) * 2019-03-20 2020-09-24 Carl Zeiss Smt Inc. Method for imaging a region of interest of a sample using a tomographic x-ray microscope, microscope, system and computer program
DE102019109789A1 (de) * 2019-04-12 2020-10-15 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und Computerprogramm zum zeitaufgelösten Berechnen einer Deformation eines Körpers
US11335021B1 (en) 2019-06-11 2022-05-17 Cognex Corporation System and method for refining dimensions of a generally cuboidal 3D object imaged by 3D vision system and controls for the same
US11605177B2 (en) * 2019-06-11 2023-03-14 Cognex Corporation System and method for refining dimensions of a generally cuboidal 3D object imaged by 3D vision system and controls for the same
IT201900011778A1 (it) * 2019-07-15 2021-01-15 Microtec Srl Metodi implementati tramite computer per addestrare o utilizzare una infrastruttura software basata su tecniche di machine learning
EP3789955A1 (en) * 2019-09-04 2021-03-10 Faro Technologies, Inc. System and method for training a neural network to fill gaps between scan points in images and to de-noise point cloud images
CN111062988B (zh) * 2019-11-29 2024-02-13 佛山科学技术学院 一种基于局部点云的葡萄位姿估计方法
ES2847236B2 (es) 2020-01-11 2022-04-20 Quandum Aerospace S L Sistema de posicionamiento de camaras y luces para inspeccion de mangueras empleadas en el repostaje aereo y procedimiento de inspeccion
JP7394645B2 (ja) * 2020-02-05 2023-12-08 富士フイルム株式会社 教師画像生成装置、方法およびプログラム、学習装置、方法およびプログラム、判別器、並びに放射線画像処理装置、方法およびプログラム
US11937019B2 (en) 2021-06-07 2024-03-19 Elementary Robotics, Inc. Intelligent quality assurance and inspection device having multiple camera modules
US11232554B1 (en) * 2021-06-07 2022-01-25 Elementary Robotics, Inc. Machine-learning based camera image triggering for quality assurance inspection processes
EP3954985A1 (en) * 2020-08-04 2022-02-16 Biometic S.r.l. Industrial tomography apparatus and method for checking the composition of industrial products which comprise a plurality of primary parts
US11443421B2 (en) * 2021-01-12 2022-09-13 Wipro Limited Method and system for detecting infestation in agricultural products
US11605159B1 (en) 2021-11-03 2023-03-14 Elementary Robotics, Inc. Computationally efficient quality assurance inspection processes using machine learning
US11675345B2 (en) 2021-11-10 2023-06-13 Elementary Robotics, Inc. Cloud-based multi-camera quality assurance architecture
US11605216B1 (en) 2022-02-10 2023-03-14 Elementary Robotics, Inc. Intelligent automated image clustering for quality assurance
CN117368670B (zh) * 2023-11-07 2024-03-26 东莞市一丁精密模具组件有限公司 一种模具放电特性柔性检测方法及系统

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WO2010091493A1 (en) * 2009-02-10 2010-08-19 Optosecurity Inc. Method and system for performing x-ray inspection of a product at a security checkpoint using simulation

Also Published As

Publication number Publication date
CL2017002353A1 (es) 2018-07-13
ZA201706920B (en) 2019-02-27
BR112017019834A2 (pt) 2018-05-29
US10520452B2 (en) 2019-12-31
PT3271717T (pt) 2020-02-20
NZ735513A (en) 2020-07-31
WO2016146703A1 (en) 2016-09-22
GB201504360D0 (en) 2015-04-29
EP3271717B1 (en) 2019-11-13
BR112017019834B1 (pt) 2022-02-01
US20180113083A1 (en) 2018-04-26
EP3271717A1 (en) 2018-01-24
CA2979932A1 (en) 2016-09-22
CA2979932C (en) 2021-01-05
ES2772698T3 (es) 2020-07-08

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