CH680236A5 - - Google Patents
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- Publication number
- CH680236A5 CH680236A5 CH398489A CH398489A CH680236A5 CH 680236 A5 CH680236 A5 CH 680236A5 CH 398489 A CH398489 A CH 398489A CH 398489 A CH398489 A CH 398489A CH 680236 A5 CH680236 A5 CH 680236A5
- Authority
- CH
- Switzerland
- Prior art keywords
- wavelength
- frequency
- radiation
- interferometer
- constant
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02049—Interferometers characterised by particular mechanical design details
- G01B9/02051—Integrated design, e.g. on-chip or monolithic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/60—Reference interferometer, i.e. additional interferometer not interacting with object
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19883837593 DE3837593A1 (de) | 1988-11-05 | 1988-11-05 | Wellenlaengenstabilisierung |
Publications (1)
Publication Number | Publication Date |
---|---|
CH680236A5 true CH680236A5 (ja) | 1992-07-15 |
Family
ID=6366561
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CH398489A CH680236A5 (ja) | 1988-11-05 | 1989-10-30 |
Country Status (2)
Country | Link |
---|---|
CH (1) | CH680236A5 (ja) |
DE (1) | DE3837593A1 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1992006353A1 (de) * | 1990-10-01 | 1992-04-16 | Tabarelli, Werner | Interferometer |
US5127731A (en) * | 1991-02-08 | 1992-07-07 | Hughes Aircraft Company | Stabilized two-color laser diode interferometer |
FR2696546B1 (fr) * | 1992-10-06 | 1994-12-30 | Suisse Electronique Microtech | Interféromètre comprenant un ensemble intégré et un miroir séparés l'un de l'autre par une région de mesure. |
FR2696545B1 (fr) * | 1992-10-06 | 1994-12-30 | Suisse Electronique Microtech | Interféromètre comprenant un ensemble intégré et une unité réfléchissante séparés l'un de l'autre par une région de mesure. |
GB9320500D0 (en) * | 1993-10-05 | 1993-11-24 | Rensihaw Plc | Interferometric distance measuring apparatus |
DE19640725A1 (de) * | 1996-10-02 | 1998-04-09 | Reinhold Prof Dr Ing Noe | Netzwerkanalysator |
CN102032950B (zh) * | 2010-10-15 | 2012-07-11 | 中国科学院安徽光学精密机械研究所 | 一种通过白日观测恒星测量整层大气相干长度的方法 |
US20140078495A1 (en) * | 2012-09-14 | 2014-03-20 | Stmicroelectronics, Inc. | Inline metrology for attaining full wafer map of uniformity and surface charge |
-
1988
- 1988-11-05 DE DE19883837593 patent/DE3837593A1/de not_active Withdrawn
-
1989
- 1989-10-30 CH CH398489A patent/CH680236A5/de not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
DE3837593A1 (de) | 1990-05-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PL | Patent ceased |