CH591079A5 - - Google Patents
Info
- Publication number
- CH591079A5 CH591079A5 CH797275A CH797275A CH591079A5 CH 591079 A5 CH591079 A5 CH 591079A5 CH 797275 A CH797275 A CH 797275A CH 797275 A CH797275 A CH 797275A CH 591079 A5 CH591079 A5 CH 591079A5
- Authority
- CH
- Switzerland
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7422722A FR2279093A1 (fr) | 1974-06-28 | 1974-06-28 | Procede et dispositif d'analyse chimique locale des solides |
Publications (1)
Publication Number | Publication Date |
---|---|
CH591079A5 true CH591079A5 (fi) | 1977-08-31 |
Family
ID=9140694
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CH797275A CH591079A5 (fi) | 1974-06-28 | 1975-06-19 |
Country Status (6)
Country | Link |
---|---|
US (1) | US4001582A (fi) |
JP (1) | JPS5812980B2 (fi) |
CH (1) | CH591079A5 (fi) |
DE (1) | DE2528596A1 (fi) |
FR (1) | FR2279093A1 (fi) |
GB (1) | GB1463795A (fi) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2739829C2 (de) * | 1977-09-03 | 1986-04-10 | Gesellschaft für Strahlen- und Umweltforschung mbH, 8000 München | Anordnung zur Analyse einer Probenschicht durch Beschuß mit elektromagnetischer Strahlung |
WO1985002907A1 (en) * | 1983-12-23 | 1985-07-04 | Sri International | Method and apparatus for surface diagnostics |
GB8408043D0 (en) * | 1984-03-28 | 1984-05-10 | Ion Tech Ltd | Mass spectrometer analysis |
US6995847B2 (en) | 2002-05-24 | 2006-02-07 | Honeywell International Inc. | Methods and systems for substrate surface evaluation |
US20060026807A1 (en) * | 2003-08-07 | 2006-02-09 | Carnevali Jeffrey D | Quick release mounting apparatus |
US20100306941A1 (en) * | 2009-06-03 | 2010-12-09 | Hayco Manufacturing Limited | Toothbrush |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR1402020A (fr) * | 1964-04-27 | 1965-06-11 | Csf | Perfectionnements aux sources d'ions |
GB1210218A (en) * | 1967-02-08 | 1970-10-28 | Ass Elect Ind | Improvements relating to ion probe target analysis |
US3660655A (en) * | 1969-09-08 | 1972-05-02 | Ass Elect Ind | Ion probe with means for mass analyzing neutral particles sputtered from a specimen |
US3864575A (en) * | 1970-07-25 | 1975-02-04 | Nujeeb Hashmi | Contact ionization ion source |
US3770954A (en) * | 1971-12-29 | 1973-11-06 | Gen Electric | Method and apparatus for analysis of impurities in air and other gases |
-
1974
- 1974-06-28 FR FR7422722A patent/FR2279093A1/fr active Granted
-
1975
- 1975-06-19 CH CH797275A patent/CH591079A5/xx not_active IP Right Cessation
- 1975-06-20 US US05/588,706 patent/US4001582A/en not_active Expired - Lifetime
- 1975-06-25 GB GB2698375A patent/GB1463795A/en not_active Expired
- 1975-06-26 DE DE19752528596 patent/DE2528596A1/de not_active Ceased
- 1975-06-28 JP JP50080468A patent/JPS5812980B2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
FR2279093B1 (fi) | 1979-08-03 |
DE2528596A1 (de) | 1976-01-15 |
JPS5812980B2 (ja) | 1983-03-11 |
FR2279093A1 (fr) | 1976-02-13 |
JPS5124292A (en) | 1976-02-27 |
GB1463795A (en) | 1977-02-09 |
US4001582A (en) | 1977-01-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PL | Patent ceased |