CH591078A5 - Testing liq. - purity in photometric analysis by passing light beam through rotating transparent pipe onto photo-electric cell - Google Patents
Testing liq. - purity in photometric analysis by passing light beam through rotating transparent pipe onto photo-electric cellInfo
- Publication number
- CH591078A5 CH591078A5 CH1548574A CH1548574A CH591078A5 CH 591078 A5 CH591078 A5 CH 591078A5 CH 1548574 A CH1548574 A CH 1548574A CH 1548574 A CH1548574 A CH 1548574A CH 591078 A5 CH591078 A5 CH 591078A5
- Authority
- CH
- Switzerland
- Prior art keywords
- purity
- light beam
- liq
- testing
- photometric analysis
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optical Measuring Cells (AREA)
Abstract
The pipe (4) carrying the liquid has a section cut out of its length and connecting sleeve (1) of transparent plastic material or glass fitted in its place. This connecting sleeve has an annular seal (2, 2') each end, to prevent leaks, and a flange (6) to prevent axial displacement. The sleeve is rotated by a gear (5) mounted around its circumference. Inside is a pair of stationary wiper blades (7, 7') positioned diametrically and spring loaded (9, 10) to bear on the inner surface, keeping it clean. A light beam is passed through the assembly into a photoelectric cell for photometric analysis of the purity of the liquid.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH1548574A CH591078A5 (en) | 1974-11-20 | 1974-11-20 | Testing liq. - purity in photometric analysis by passing light beam through rotating transparent pipe onto photo-electric cell |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH1548574A CH591078A5 (en) | 1974-11-20 | 1974-11-20 | Testing liq. - purity in photometric analysis by passing light beam through rotating transparent pipe onto photo-electric cell |
Publications (1)
Publication Number | Publication Date |
---|---|
CH591078A5 true CH591078A5 (en) | 1977-08-31 |
Family
ID=4409469
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CH1548574A CH591078A5 (en) | 1974-11-20 | 1974-11-20 | Testing liq. - purity in photometric analysis by passing light beam through rotating transparent pipe onto photo-electric cell |
Country Status (1)
Country | Link |
---|---|
CH (1) | CH591078A5 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7145145B2 (en) | 2001-09-20 | 2006-12-05 | Ndc Infrared Engineering, Ltd. | Optical window for monitoring samples |
EP1873515A4 (en) * | 2005-04-20 | 2010-06-16 | Arkray Inc | Analyzer, method for cleaning photometry mechanism in such analyzer, and cleaning tool |
-
1974
- 1974-11-20 CH CH1548574A patent/CH591078A5/en not_active IP Right Cessation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7145145B2 (en) | 2001-09-20 | 2006-12-05 | Ndc Infrared Engineering, Ltd. | Optical window for monitoring samples |
EP1873515A4 (en) * | 2005-04-20 | 2010-06-16 | Arkray Inc | Analyzer, method for cleaning photometry mechanism in such analyzer, and cleaning tool |
US8460616B2 (en) | 2005-04-20 | 2013-06-11 | Arkray, Inc. | Analyzer, method for cleaning photometry mechanism in such analyzer, and cleaning tool |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PL | Patent ceased | ||
PL | Patent ceased |