CH579778A5 - - Google Patents

Info

Publication number
CH579778A5
CH579778A5 CH805175A CH805175A CH579778A5 CH 579778 A5 CH579778 A5 CH 579778A5 CH 805175 A CH805175 A CH 805175A CH 805175 A CH805175 A CH 805175A CH 579778 A5 CH579778 A5 CH 579778A5
Authority
CH
Switzerland
Application number
CH805175A
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of CH579778A5 publication Critical patent/CH579778A5/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G01R31/59—Testing of lines, cables or conductors while the cable continuously passes the testing apparatus, e.g. during manufacture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
    • G01R33/1238—Measuring superconductive properties
    • G01R33/1246—Measuring critical current
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/825—Apparatus per se, device per se, or process of making or operating same
    • Y10S505/842—Measuring and testing
    • Y10S505/843—Electrical
    • Y10S505/845—Magnetometer
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/825—Apparatus per se, device per se, or process of making or operating same
    • Y10S505/872—Magnetic field shield
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49004—Electrical device making including measuring or testing of device or component part

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electrochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Measuring Magnetic Variables (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
CH805175A 1974-07-01 1975-06-20 CH579778A5 (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2431505A DE2431505C2 (de) 1974-07-01 1974-07-01 Verfahren und Vorrichtung zur kontinuierlichen, kontaktlosen Prüfung eines langgestreckten, wenigstens teilweise aus Supraleitermaterial bestehenden Leiters

Publications (1)

Publication Number Publication Date
CH579778A5 true CH579778A5 (nl) 1976-09-15

Family

ID=5919387

Family Applications (1)

Application Number Title Priority Date Filing Date
CH805175A CH579778A5 (nl) 1974-07-01 1975-06-20

Country Status (10)

Country Link
US (1) US3976934A (nl)
JP (1) JPS5125995A (nl)
CA (1) CA1031036A (nl)
CH (1) CH579778A5 (nl)
DE (1) DE2431505C2 (nl)
FR (1) FR2277348A1 (nl)
GB (1) GB1499164A (nl)
IT (1) IT1039442B (nl)
NL (1) NL7506562A (nl)
SE (1) SE400386B (nl)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2606504C3 (de) * 1976-02-18 1978-08-17 Siemens Ag, 1000 Berlin Und 8000 Muenchen Verfahren und Vorrichtung zur kontinuierlichen, kontaktlosen Prüfung eines langgestreckten, wenigstens teilweise aus Supraleitermaterial bestehenden Leiters
US5030614A (en) * 1987-05-15 1991-07-09 Omega Engineering, Inc. Superconductor sensors
US4939458A (en) * 1988-02-08 1990-07-03 Colorado School Of Mines Method and apparatus for quantifying superconductivity
US5004724A (en) * 1989-03-09 1991-04-02 International Superconductor Corp. Superconductive quantum interference device for the non-destructive evaluation of metals
DE19612613C2 (de) * 1996-03-29 1999-12-16 Karlsruhe Forschzent Verfahren zur Bestimmung des kritischen Stromes I¶c¶ von Supraleitern und Meßeinrichtung zur Durchführung des Verfahrens
JPH1010091A (ja) * 1996-06-21 1998-01-16 Sumitomo Electric Ind Ltd 磁性体微粉の検出装置
JP3171131B2 (ja) * 1997-02-25 2001-05-28 住友電気工業株式会社 超電導線の臨界電流値を測定する方法および装置
DE19717283C1 (de) * 1997-04-24 1998-04-23 Karlsruhe Forschzent Verfahren zur kontaktfreien, longitudinalen und transversalen Homogenitätsuntersuchung der kritischen Stromdiche j¶c¶ in Band-Supraleitern und eine Meßapparatur zur Durchführung des Verfahrens
US6841988B1 (en) * 1998-07-16 2005-01-11 American Superconductor Corporation Method for the determination of the critical current for a conductor including superconducting material, and an apparatus for performing the method
EP1105744B1 (en) * 1998-07-16 2002-09-18 Nordic Superconductor Technologies A/S A method for the determination of the critical current for a conductor including superconducting material, and an apparatus for performing the method
US20040008022A1 (en) * 2002-07-11 2004-01-15 Viola Jeffrey L. Current sensor
JP4579107B2 (ja) * 2005-09-06 2010-11-10 財団法人国際超電導産業技術研究センター 連続型磁束観察装置および方法
US20090006015A1 (en) * 2007-06-29 2009-01-01 Mueller Frederick M Method and apparatus for measuring current density in conductive materials
JP5229923B2 (ja) * 2008-03-05 2013-07-03 国立大学法人豊橋技術科学大学 Ｓｑｕｉｄ磁気センサを用いる非破壊検査装置
US20100019776A1 (en) * 2008-07-23 2010-01-28 Folts Douglas C Method for analyzing superconducting wire
CN108982950B (zh) * 2018-07-02 2021-10-22 东北大学 测试ybco膜超导环流电压信号的传感器及其制作方法
CN109030568B (zh) * 2018-09-07 2023-09-19 西南交通大学 一种高温超导膜临界电流无损检测装置及其检测方法
CN111351844B (zh) * 2020-03-16 2023-11-03 中国工程物理研究院材料研究所 一种基于超导量子干涉仪的涡流检测装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1128972A (en) * 1965-08-19 1968-10-02 Atomic Energy Authority Uk Improvements in or relating to superconductors

Also Published As

Publication number Publication date
IT1039442B (it) 1979-12-10
DE2431505B1 (de) 1975-04-17
DE2431505C2 (de) 1975-11-27
NL7506562A (nl) 1976-01-05
GB1499164A (en) 1978-01-25
FR2277348A1 (fr) 1976-01-30
SE7507405L (sv) 1976-01-02
US3976934A (en) 1976-08-24
SE400386B (sv) 1978-03-20
CA1031036A (en) 1978-05-09
JPS5125995A (nl) 1976-03-03
FR2277348B1 (nl) 1978-03-17

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Legal Events

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PL Patent ceased