CH566001A5 - - Google Patents

Info

Publication number
CH566001A5
CH566001A5 CH588974A CH588974A CH566001A5 CH 566001 A5 CH566001 A5 CH 566001A5 CH 588974 A CH588974 A CH 588974A CH 588974 A CH588974 A CH 588974A CH 566001 A5 CH566001 A5 CH 566001A5
Authority
CH
Switzerland
Application number
CH588974A
Original Assignee
Pluss Stauffer Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pluss Stauffer Ag filed Critical Pluss Stauffer Ag
Publication of CH566001A5 publication Critical patent/CH566001A5/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CH588974A 1974-01-17 1974-04-30 CH566001A5 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2402127A DE2402127C3 (de) 1974-01-17 1974-01-17 Vorrichtung zur Messung des Glanzschleiers von Oberflächen

Publications (1)

Publication Number Publication Date
CH566001A5 true CH566001A5 (de) 1975-08-29

Family

ID=5905000

Family Applications (1)

Application Number Title Priority Date Filing Date
CH588974A CH566001A5 (de) 1974-01-17 1974-04-30

Country Status (6)

Country Link
US (1) US4072426A (de)
JP (1) JPS546387B2 (de)
AT (1) AT354773B (de)
CH (1) CH566001A5 (de)
DE (1) DE2402127C3 (de)
FR (1) FR2258626B1 (de)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2924241A1 (de) * 1979-06-15 1981-01-08 Basf Ag Goniophotometer zur messung des glanzes und/oder des glanzschleiers von oberflaechen
US4284356A (en) * 1979-09-26 1981-08-18 Ppg Industries, Inc. Method of and apparatus for comparing surface reflectivity
US4390277A (en) * 1980-07-31 1983-06-28 Mcdonnell Douglas Corporation Flat sheet scatterometer
US4498140A (en) * 1982-06-02 1985-02-05 Chesley F. Carlson Automated self calibrating exposure computer
DE3479832D1 (en) * 1983-05-17 1989-10-26 Sumitomo Heavy Industries Method of an apparatus for measuring dampening water for printing machine
CA1216169A (en) * 1983-05-23 1987-01-06 Joseph A. Freilino Method of determining surface roughness using a visible and infrared laser source
JPS6117047A (ja) * 1984-02-29 1986-01-25 Suga Shikenki Kk 視感光沢度測定方法
US4715717A (en) * 1985-12-05 1987-12-29 The Dow Chemical Company Method for monitoring surface texture and quality for moving transparent film bodies
JPS62156277A (ja) * 1985-12-27 1987-07-11 Sumitomo Special Metals Co Ltd エツチング量評価方法
FI78355C (fi) * 1986-05-27 1989-07-10 Puumalaisen Tutkimuslaitos Oy Metod foer maetning av glans och apparatur foer tillaempning av metoden.
US4888983A (en) * 1988-04-20 1989-12-26 Basf Aktiengesellschaft Profilometry
EP0371643A3 (de) * 1988-11-23 1991-05-29 W.R. Grace & Co.-Conn. Verfahren und Vorrichtung zum Nachprüfen von Werkstücken
US4945253A (en) * 1988-12-09 1990-07-31 Measurex Corporation Means of enhancing the sensitivity of a gloss sensor
US5066865A (en) * 1989-09-01 1991-11-19 Measurex Corporation Single sided reflectance sensor for measuring select physical properties of a material using one or more wavelengths of radiation
DE3929172A1 (de) * 1989-09-02 1991-03-07 Bayer Ag Vorrichtung zur bestimmung der groessenverteilung von pigmentkoernern in einer lackoberflaeche
US5196906A (en) * 1990-06-29 1993-03-23 Tma Technologies, Inc. Modular scatterometer with interchangeable scanning heads
US5387977A (en) * 1991-09-04 1995-02-07 X-Rite, Incorporated Multiangular color measuring apparatus
JPH06272866A (ja) * 1993-03-16 1994-09-27 Fuji Mc:Kk 複合型加熱装置
US6088104A (en) * 1994-12-02 2000-07-11 Veridian Erim International, Inc. Surface characterization apparatus
KR100513210B1 (ko) 2000-09-25 2005-09-08 마츠시타 덴끼 산교 가부시키가이샤 크로마토그래피 정량 측정 장치
DE10201075A1 (de) * 2002-01-14 2003-07-24 Basf Ag Verfahren und Vorrichtung zur Untersuchung des Weissanlaufens
US20050012939A1 (en) * 2003-07-15 2005-01-20 Snyder Donald M. Method and apparatus for quantifying the degree of fusion of a layer
WO2007053788A1 (en) * 2005-11-07 2007-05-10 Cardinal Cg Company Method and apparatus for identifying photocatalytic coatings
ES2375386B1 (es) * 2010-07-21 2012-09-27 Abengoa Solar New Technologies, S.A. Reflectómetro portátil y método de caracterización de espejos de centrales termosolares.
FR2968402B1 (fr) 2010-12-07 2013-02-15 Ecole Polytech Systeme et procede d'imagerie multitechniques pour l'analyse chimique, biologique ou biochimique d'un echantillon.
US8483291B2 (en) * 2011-06-30 2013-07-09 Broadcom Corporation Analog to digital converter with increased sub-range resolution

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA466114A (en) * 1950-06-27 Boor Ladislav Glossmeter
GB156920A (en) * 1919-10-17 1921-01-17 Pilkington Brothers Ltd Improvements in pneumatic load-engaging means
US2378433A (en) * 1939-08-26 1945-06-19 Riszdorfer Laszlo Photoelectric exposure meter
US3229564A (en) * 1961-05-12 1966-01-18 Bausch & Lomb Reflectometer
US3310680A (en) * 1964-03-06 1967-03-21 Hasegawa Toshitsune Photosensitive concentration measuring apparatus for colloidal solutions
DE1548263C3 (de) * 1966-11-10 1975-05-22 Ernst Leitz Gmbh, 6330 Wetzlar Verfahren zur Bestimmung der Größe geometrischer Veränderungen oder Abweichungen einer reflektierenden Oberfläche von einer Solloberfläche mittels optischer Mittel
US3804521A (en) * 1972-02-22 1974-04-16 Itek Corp Optical device for measuring surface roughness
US3835315A (en) * 1972-12-06 1974-09-10 Us Commerce System for determining parameters of a particle by radiant energy scattering techniques
US3850526A (en) * 1973-03-16 1974-11-26 Atomic Energy Commission Optical method and system for measuring surface finish

Also Published As

Publication number Publication date
FR2258626B1 (de) 1978-08-11
JPS50115083A (de) 1975-09-09
ATA440974A (de) 1979-06-15
US4072426A (en) 1978-02-07
FR2258626A1 (de) 1975-08-18
DE2402127A1 (de) 1975-07-24
AT354773B (de) 1979-01-25
DE2402127B2 (de) 1977-07-21
JPS546387B2 (de) 1979-03-28
DE2402127C3 (de) 1978-04-06

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Legal Events

Date Code Title Description
PL Patent ceased