CH559348A5 - - Google Patents

Info

Publication number
CH559348A5
CH559348A5 CH1778071A CH1778071A CH559348A5 CH 559348 A5 CH559348 A5 CH 559348A5 CH 1778071 A CH1778071 A CH 1778071A CH 1778071 A CH1778071 A CH 1778071A CH 559348 A5 CH559348 A5 CH 559348A5
Authority
CH
Switzerland
Application number
CH1778071A
Original Assignee
Zumbach Electronic Automatic
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zumbach Electronic Automatic filed Critical Zumbach Electronic Automatic
Priority to CH1778071A priority Critical patent/CH559348A5/xx
Priority to DE2258022A priority patent/DE2258022A1/de
Priority to SE7215407A priority patent/SE382688B/xx
Priority to GB5482572A priority patent/GB1406274A/en
Priority to AT1013472A priority patent/AT367906B/de
Priority to IT32366/72A priority patent/IT971434B/it
Priority to BE792177D priority patent/BE792177A/xx
Priority to US312047A priority patent/US3884076A/en
Priority to CA158,381A priority patent/CA994096A/en
Priority to JP12301472A priority patent/JPS5648801B2/ja
Priority to FR7244453A priority patent/FR2169816B1/fr
Publication of CH559348A5 publication Critical patent/CH559348A5/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B13/00—Measuring arrangements characterised by the use of fluids
    • G01B13/02—Measuring arrangements characterised by the use of fluids for measuring length, width or thickness
    • G01B13/06—Measuring arrangements characterised by the use of fluids for measuring length, width or thickness for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/107—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/62—Support for workpiece air film or bearing with positive or negative pressure
CH1778071A 1971-12-07 1971-12-07 CH559348A5 (de)

Priority Applications (11)

Application Number Priority Date Filing Date Title
CH1778071A CH559348A5 (de) 1971-12-07 1971-12-07
DE2258022A DE2258022A1 (de) 1971-12-07 1972-11-27 Messvorrichtung
SE7215407A SE382688B (sv) 1971-12-07 1972-11-27 Metanordning.
GB5482572A GB1406274A (en) 1971-12-07 1972-11-28 Measuring device
AT1013472A AT367906B (de) 1971-12-07 1972-11-28 Messvorrichtung
IT32366/72A IT971434B (it) 1971-12-07 1972-11-30 Misuratore di grandezze meccaniche
BE792177D BE792177A (fr) 1971-12-07 1972-12-01 Appareil de mesure
US312047A US3884076A (en) 1971-12-07 1972-12-04 Measuring device
CA158,381A CA994096A (en) 1971-12-07 1972-12-06 Measuring nozzle with control piston
JP12301472A JPS5648801B2 (de) 1971-12-07 1972-12-07
FR7244453A FR2169816B1 (de) 1971-12-07 1972-12-13

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH1778071A CH559348A5 (de) 1971-12-07 1971-12-07

Publications (1)

Publication Number Publication Date
CH559348A5 true CH559348A5 (de) 1975-02-28

Family

ID=4428054

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1778071A CH559348A5 (de) 1971-12-07 1971-12-07

Country Status (11)

Country Link
US (1) US3884076A (de)
JP (1) JPS5648801B2 (de)
AT (1) AT367906B (de)
BE (1) BE792177A (de)
CA (1) CA994096A (de)
CH (1) CH559348A5 (de)
DE (1) DE2258022A1 (de)
FR (1) FR2169816B1 (de)
GB (1) GB1406274A (de)
IT (1) IT971434B (de)
SE (1) SE382688B (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3814697A1 (de) * 1988-04-30 1989-11-09 Wernicke & Co Gmbh Verfahren und einrichtung zum abtasten des umfangs einer schablone, eines brillenglases oder des nutenbodens einer brillengestelloeffnung zum gewinnen von koordinatenwerten in der ebene der schablone, des brillenglases oder der brillengestelloeffnung

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2407065C2 (de) * 1974-02-14 1984-10-18 Messer Griesheim Gmbh, 6000 Frankfurt Einrichtung zur kapazitiven Abstandsmessung
SE415801C (sv) * 1979-01-30 1982-10-07 Per Roode Berglund Sjelvstabiliserande pneumatisk legesgivare
US4223479A (en) * 1979-07-10 1980-09-23 The Board Of Regents Of The University Of Nebraska Feedback controlled roller applicator
FR2499711B1 (fr) * 1981-02-09 1987-05-15 Siderurgie Fse Inst Rech Dispositif de mesure de l'epaisseur d'un objet et application dudit dispositif
US4641092A (en) * 1982-07-08 1987-02-03 Sumitomo Metal Industries, Ltd. Rotary probe apparatus for detecting flaws in a test object
DE3247697A1 (de) * 1982-12-20 1984-06-20 Schweizerische Aluminium Ag, Chippis Vorrichtung zum bestimmen und/oder messen der form eines werkstueckes
GB2136128B (en) * 1983-03-01 1986-10-22 British Steel Corp Improvements in or relating to the measurement of surface profile
SE444861B (sv) * 1984-09-10 1986-05-12 Per Roode Berglund Beroringsfri banspenningsmetare
US4607525A (en) * 1984-10-09 1986-08-26 General Signal Corporation Height measuring system
EP0214100A1 (de) * 1985-09-02 1987-03-11 Alcan Rorschach AG Verfahren zum berührungslosen Messen eines Abstandes, Abstandsmesselement, Verfahren zum kontinuierlichen Messen der Planheit von Folien, Element zum Messen der Planheit von Folien sowie Verfahren zum messen der Dicke eines starren Körpers
US4742299A (en) * 1986-10-15 1988-05-03 The United States Of America As Represented By The Department Of Energy Methods of and apparatus for levitating an eddy current probe
DE3703528C1 (de) * 1987-02-03 1987-09-03 Mannesmann Ag Verfahren zur UEberwachung von Rollen in Stranggiessanlagen und Vorrichtung zur Durchfuehrung des Verfahrens
GB8722871D0 (en) * 1987-09-29 1987-11-04 Bnf Metals Tech Centre Measuring apparatus
US4854156A (en) * 1989-01-03 1989-08-08 Systems Research Laboratories, Inc. Pneumatic surface-following control system
US4977777A (en) * 1989-02-09 1990-12-18 The United States Of America As Represented By The United States Department Of Energy Non-contact contour gage
US4977853A (en) * 1989-06-01 1990-12-18 E. I. Du Pont De Nemours And Company Non-contact wet or dry film thickness measuring device
DE4011646A1 (de) * 1990-04-11 1991-10-24 Micro Epsilon Messtechnik Dickenmesseinrichtung
US5389875A (en) * 1993-03-19 1995-02-14 Grumman Aerospace Corporation Apparatus for non-destructive testing of dielectric/magnetic materials
DE19511939C2 (de) * 1995-03-31 2000-05-18 Micro Epsilon Messtechnik Sensor zur berührungslosen Dickenmessung an Folien
IT1282789B1 (it) * 1996-06-07 1998-03-31 Electronic Systems Spa Dispositivo di misurazione senza contatto di spessore per materiali non metallici in film,fogli,nastri o simili
US6318153B1 (en) 1996-09-30 2001-11-20 Micro-Epsilon Messtechnik Gmbh & Co. Kg Non-contact film thickness gauging sensor
SE515644C2 (sv) * 2000-01-14 2001-09-17 D A Production Ab Mätanordning med ett rörligt lagrat givarhuvud
US6220080B1 (en) * 2000-05-12 2001-04-24 Sigma Tech, Inc. Extended range and ultra precision non contact dimensional gauge for ultra thin wafers and work pieces
DE10123975A1 (de) * 2001-05-17 2002-12-05 Framatome Anp Gmbh Meßkopf, insbesondere zum Einsatz bei der Vermessung eines Brennstabs, eines Brennelementkastens und/oder eines Abstandshalters oder sonstige Strukturteile in einem Brennelement einer kerntechnischen Anlage
US6895066B1 (en) 2001-05-17 2005-05-17 Framatome Anp Gmbh Measuring head and measuring assembly for a nuclear fuel rod
SE527204C2 (sv) * 2004-05-28 2006-01-17 Daprox Ab Mätanordning och förfarande
DE102006022882B4 (de) 2006-05-15 2016-04-14 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Vorrichtung zum Messen der Dicke dünner Schichten mit einer Messsonde

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3194055A (en) * 1963-05-06 1965-07-13 Knobel Max Work dimension and position detecting, indicating and controlling method and apparatus
US3472061A (en) * 1963-06-03 1969-10-14 Ingf A Alfredeen Ab Transmitting element for gauging instruments
GB1200213A (en) * 1966-08-19 1970-07-29 Yawata Iron & Steel Co Fluid gauges
US3513555A (en) * 1967-03-30 1970-05-26 Bradstreet J Vachon Thickness gauging apparatus
US3617872A (en) * 1969-10-06 1971-11-02 Indev Inc Magnetic thickness gauge with a gas-supported sensor and a suction source in the base

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3814697A1 (de) * 1988-04-30 1989-11-09 Wernicke & Co Gmbh Verfahren und einrichtung zum abtasten des umfangs einer schablone, eines brillenglases oder des nutenbodens einer brillengestelloeffnung zum gewinnen von koordinatenwerten in der ebene der schablone, des brillenglases oder der brillengestelloeffnung

Also Published As

Publication number Publication date
IT971434B (it) 1974-04-30
JPS4865956A (de) 1973-09-10
ATA1013472A (de) 1981-12-15
FR2169816A1 (de) 1973-09-14
GB1406274A (en) 1975-09-17
US3884076A (en) 1975-05-20
FR2169816B1 (de) 1975-04-11
DE2258022A1 (de) 1973-06-14
JPS5648801B2 (de) 1981-11-18
AT367906B (de) 1982-08-10
BE792177A (fr) 1973-03-30
CA994096A (en) 1976-08-03
SE382688B (sv) 1976-02-09

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Legal Events

Date Code Title Description
PL Patent ceased