CH557028A - Optisches messgeraet, insbesondere zur rauchdichte- oder sichtweitemessung. - Google Patents
Optisches messgeraet, insbesondere zur rauchdichte- oder sichtweitemessung.Info
- Publication number
- CH557028A CH557028A CH1723773A CH1723773A CH557028A CH 557028 A CH557028 A CH 557028A CH 1723773 A CH1723773 A CH 1723773A CH 1723773 A CH1723773 A CH 1723773A CH 557028 A CH557028 A CH 557028A
- Authority
- CH
- Switzerland
- Prior art keywords
- measuring device
- optical measuring
- smoke density
- visibility measurement
- visibility
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
- G01N21/534—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke by measuring transmission alone, i.e. determining opacity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/53—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
- G01N21/538—Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke for determining atmospheric attenuation and visibility
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2303040A DE2303040C3 (de) | 1973-01-23 | 1973-01-23 | Optisches Meßgerät, insbesondere zur Rauchdichte- oder Sichtweitemessung |
Publications (1)
Publication Number | Publication Date |
---|---|
CH557028A true CH557028A (de) | 1974-12-13 |
Family
ID=5869652
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CH1723773A CH557028A (de) | 1973-01-23 | 1973-12-06 | Optisches messgeraet, insbesondere zur rauchdichte- oder sichtweitemessung. |
Country Status (8)
Country | Link |
---|---|
US (1) | US3857641A (de) |
JP (1) | JPS5314938B2 (de) |
CH (1) | CH557028A (de) |
DE (1) | DE2303040C3 (de) |
FR (1) | FR2229322A5 (de) |
GB (1) | GB1406018A (de) |
IT (1) | IT1003318B (de) |
SE (1) | SE388940B (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113711011A (zh) * | 2019-03-28 | 2021-11-26 | 卡尔蔡司光谱学有限公司 | 测量光源以及用于检测反射光谱的测量设施 |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL96179C (de) * | 1975-02-28 | |||
DE2521934C3 (de) * | 1975-05-16 | 1978-11-02 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Vorrichtung zur Bestimmung der Konzentrationen von Komponenten eines Abgasgemisches |
US3982130A (en) * | 1975-10-10 | 1976-09-21 | The United States Of America As Represented By The Secretary Of The Air Force | Ultraviolet wavelength smoke detector |
JPS5628530Y2 (de) * | 1977-06-10 | 1981-07-07 | ||
SE414231B (sv) * | 1977-11-18 | 1980-07-14 | Asea Ab | Siktmetare med minst en metstrecka |
JPS5492789A (en) * | 1977-12-29 | 1979-07-23 | Fujitsu Ltd | Gas analytical method by infrared ray |
SE432029B (sv) * | 1981-03-25 | 1984-03-12 | Ericsson Telefon Ab L M | Optisk branddetektor |
JPS59500146A (ja) * | 1982-02-01 | 1984-01-26 | サザン・カリフオルニア・エデイソン・カンパニ− | アポダイズされたビ−ムの利用方法及び手段 |
DE3309838C2 (de) * | 1983-03-18 | 1986-06-05 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Optisches Transmissionsmeßgerät |
GB8518941D0 (en) * | 1985-07-26 | 1985-09-04 | Shell Int Research | Atmospheric mist/smoke detecting system |
DE3627232C2 (de) * | 1986-08-11 | 1995-11-16 | Leybold Ag | Fotometer |
US6879284B2 (en) * | 1999-06-26 | 2005-04-12 | Otto Dufek | Method and apparatus for identifying objects |
WO2005115119A2 (en) * | 2004-05-25 | 2005-12-08 | Cowan, James, J. | Surface relief structure |
US9013700B2 (en) * | 2011-02-21 | 2015-04-21 | Uwm Research Foundation, Inc. | Variable path length photon trapping spectrometer |
CN108444917A (zh) * | 2018-06-05 | 2018-08-24 | 深圳迎凯生物科技有限公司 | 自校准的弱光检测装置 |
CN109709078B (zh) * | 2018-12-14 | 2021-07-06 | 中国科学院合肥物质科学研究院 | 基于单光子探测技术的透射式大气能见度测量装置及方法 |
CN118011319B (zh) * | 2024-04-10 | 2024-06-07 | 四川大学 | 一种基于旋转相位差的光源定位系统及方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1325753A (en) * | 1969-11-06 | 1973-08-08 | Baxter Laboratories Inc | Testing radiation absorption characteristics |
US3790290A (en) * | 1971-08-11 | 1974-02-05 | Sick Optik Elektronik Erwin | Single modulated light beam photometer |
US3824020A (en) * | 1971-11-19 | 1974-07-16 | Eaton Corp | Retroreflective fine position sensing means |
US3761724A (en) * | 1972-07-06 | 1973-09-25 | Resalab Inc | Double beam hydrocarbon gas detector |
-
1973
- 1973-01-23 DE DE2303040A patent/DE2303040C3/de not_active Expired
- 1973-12-06 CH CH1723773A patent/CH557028A/de not_active IP Right Cessation
- 1973-12-13 GB GB5777773A patent/GB1406018A/en not_active Expired
- 1973-12-14 SE SE7316914A patent/SE388940B/xx unknown
- 1973-12-28 FR FR7347209A patent/FR2229322A5/fr not_active Expired
-
1974
- 1974-01-04 IT IT19066/74A patent/IT1003318B/it active
- 1974-01-04 US US00430703A patent/US3857641A/en not_active Expired - Lifetime
- 1974-01-18 JP JP844274A patent/JPS5314938B2/ja not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113711011A (zh) * | 2019-03-28 | 2021-11-26 | 卡尔蔡司光谱学有限公司 | 测量光源以及用于检测反射光谱的测量设施 |
Also Published As
Publication number | Publication date |
---|---|
SE388940B (sv) | 1976-10-18 |
DE2303040C3 (de) | 1978-03-30 |
GB1406018A (en) | 1975-09-10 |
US3857641A (en) | 1974-12-31 |
FR2229322A5 (de) | 1974-12-06 |
DE2303040B2 (de) | 1977-08-04 |
JPS49106875A (de) | 1974-10-09 |
JPS5314938B2 (de) | 1978-05-20 |
IT1003318B (it) | 1976-06-10 |
DE2303040A1 (de) | 1974-07-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PL | Patent ceased |