CH539903A - Anlage zum Prüfen einer Eingangs-Ausgangs-Steuerungseinheit - Google Patents

Anlage zum Prüfen einer Eingangs-Ausgangs-Steuerungseinheit

Info

Publication number
CH539903A
CH539903A CH913771A CH913771A CH539903A CH 539903 A CH539903 A CH 539903A CH 913771 A CH913771 A CH 913771A CH 913771 A CH913771 A CH 913771A CH 539903 A CH539903 A CH 539903A
Authority
CH
Switzerland
Prior art keywords
testing
input
control unit
output control
output
Prior art date
Application number
CH913771A
Other languages
English (en)
Inventor
Yoshitake Norito
Imazeki Ryoji
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Publication of CH539903A publication Critical patent/CH539903A/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
CH913771A 1970-06-22 1971-06-22 Anlage zum Prüfen einer Eingangs-Ausgangs-Steuerungseinheit CH539903A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP45054250A JPS5040745B1 (de) 1970-06-22 1970-06-22

Publications (1)

Publication Number Publication Date
CH539903A true CH539903A (de) 1973-07-31

Family

ID=12965289

Family Applications (1)

Application Number Title Priority Date Filing Date
CH913771A CH539903A (de) 1970-06-22 1971-06-22 Anlage zum Prüfen einer Eingangs-Ausgangs-Steuerungseinheit

Country Status (6)

Country Link
US (1) US3710350A (de)
JP (1) JPS5040745B1 (de)
CA (1) CA940637A (de)
CH (1) CH539903A (de)
FR (1) FR2096418B1 (de)
GB (1) GB1355253A (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3778767A (en) * 1972-05-30 1973-12-11 Burroughs Corp Dynamic debug aid for computer data communication networks
US3920973A (en) * 1973-01-09 1975-11-18 Westinghouse Electric Corp Method and system for testing signal transmission paths
JPS5031746A (de) * 1973-07-21 1975-03-28
US3889109A (en) * 1973-10-01 1975-06-10 Honeywell Inf Systems Data communications subchannel having self-testing apparatus
JPS5433820B2 (de) * 1973-12-29 1979-10-23
JPS50128933A (de) * 1974-03-29 1975-10-11
JPS51113547A (en) * 1975-03-31 1976-10-06 Nec Corp Data processing system
US4298955A (en) * 1976-04-01 1981-11-03 The Insurance Technical Bureau Method of and apparatus for the detection and analysis of hazards
US4156132A (en) * 1977-11-01 1979-05-22 Burroughs Corporation Automatic fault injection apparatus and method
US4275464A (en) * 1979-02-16 1981-06-23 Robertshaw Controls Company Universal self-diagnosing appliance control
US4489414A (en) * 1981-10-28 1984-12-18 Hal Computers Limited Computer peripheral testing equipment
JPS5877630A (ja) * 1981-11-02 1983-05-11 Nissan Motor Co Ltd 温度測定装置
US4672566A (en) * 1981-12-01 1987-06-09 Nissan Motor Company, Limited Device for measuring variable with automatic compensation for offset
JPS60144851A (ja) * 1983-12-30 1985-07-31 Fujitsu Ltd チヤネル制御装置
JPS61188602A (ja) * 1985-02-16 1986-08-22 Omron Tateisi Electronics Co 入出力バスの監視回路
US5263170A (en) * 1985-02-16 1993-11-16 Omron Tateisi Electronics, Co. Monitor circuit for detecting noise conditions through input output coincidence comparison
JPH05292822A (ja) * 1992-04-21 1993-11-09 Kubota Corp 農作業機の刈り刃装置
GB9417266D0 (en) * 1994-08-26 1994-10-19 Inmos Ltd Testing a non-volatile memory
US6799290B1 (en) * 2000-02-25 2004-09-28 Infineon Technologies North America Corp Data path calibration and testing mode using a data bus for semiconductor memories

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3387262A (en) * 1965-01-12 1968-06-04 Ibm Diagnostic system
US3497685A (en) * 1965-11-03 1970-02-24 Ibm Fault location system
US3510843A (en) * 1967-03-27 1970-05-05 Burroughs Corp Digital data transmission system having means for automatically determining the types of peripheral units communicating with the system
US3576541A (en) * 1968-01-02 1971-04-27 Burroughs Corp Method and apparatus for detecting and diagnosing computer error conditions

Also Published As

Publication number Publication date
JPS5040745B1 (de) 1975-12-26
FR2096418A1 (de) 1972-02-18
GB1355253A (en) 1974-06-05
CA940637A (en) 1974-01-22
FR2096418B1 (de) 1975-02-07
DE2130917A1 (de) 1971-12-30
DE2130917B2 (de) 1972-11-16
US3710350A (en) 1973-01-09

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Legal Events

Date Code Title Description
PL Patent ceased