CH536561A - Piezoelektrisches Kristallelement - Google Patents

Piezoelektrisches Kristallelement

Info

Publication number
CH536561A
CH536561A CH375771A CH375771A CH536561A CH 536561 A CH536561 A CH 536561A CH 375771 A CH375771 A CH 375771A CH 375771 A CH375771 A CH 375771A CH 536561 A CH536561 A CH 536561A
Authority
CH
Switzerland
Prior art keywords
crystal element
piezoelectric crystal
piezoelectric
crystal
Prior art date
Application number
CH375771A
Other languages
English (en)
Inventor
Calderara Reto
Original Assignee
Kistler Instrumente Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kistler Instrumente Ag filed Critical Kistler Instrumente Ag
Priority to CH375771A priority Critical patent/CH536561A/de
Priority to DE2207852A priority patent/DE2207852C3/de
Priority to AT141672A priority patent/AT319632B/de
Priority to GB867172A priority patent/GB1356917A/en
Priority to DK116072A priority patent/DK135599B/da
Priority to FR7208746A priority patent/FR2129643A5/fr
Publication of CH536561A publication Critical patent/CH536561A/de
Priority to US05/805,468 priority patent/US4148530A/en

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02Details
    • H03H9/02007Details of bulk acoustic wave devices
    • H03H9/02015Characteristics of piezoelectric layers, e.g. cutting angles
    • H03H9/02023Characteristics of piezoelectric layers, e.g. cutting angles consisting of quartz
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/16Measuring force or stress, in general using properties of piezoelectric devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • G01L9/0041Transmitting or indicating the displacement of flexible diaphragms
    • G01L9/008Transmitting or indicating the displacement of flexible diaphragms using piezoelectric devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01PMEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/09Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by piezoelectric pick-up
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/80Constructional details

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Measuring Fluid Pressure (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
  • Gyroscopes (AREA)
CH375771A 1971-03-15 1971-03-15 Piezoelektrisches Kristallelement CH536561A (de)

Priority Applications (7)

Application Number Priority Date Filing Date Title
CH375771A CH536561A (de) 1971-03-15 1971-03-15 Piezoelektrisches Kristallelement
DE2207852A DE2207852C3 (de) 1971-03-15 1972-02-19 Piezoelektrisches Kristallelement
AT141672A AT319632B (de) 1971-03-15 1972-02-22 Piezoelektrisches Kristallelement
GB867172A GB1356917A (en) 1971-03-15 1972-02-24 Piezoelectric crystal element
DK116072A DK135599B (da) 1971-03-15 1972-03-14 Piezoelektrisk krystalelement især til anvendelse i kraft-, tryk- og accelerationstransorer.
FR7208746A FR2129643A5 (de) 1971-03-15 1972-03-14
US05/805,468 US4148530A (en) 1971-03-15 1977-06-10 Cut angles for piezoelectric quartz crystal elements

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH375771A CH536561A (de) 1971-03-15 1971-03-15 Piezoelektrisches Kristallelement
US23470272A 1972-03-15 1972-03-15

Publications (1)

Publication Number Publication Date
CH536561A true CH536561A (de) 1973-04-30

Family

ID=25693780

Family Applications (1)

Application Number Title Priority Date Filing Date
CH375771A CH536561A (de) 1971-03-15 1971-03-15 Piezoelektrisches Kristallelement

Country Status (6)

Country Link
US (1) US4148530A (de)
AT (1) AT319632B (de)
CH (1) CH536561A (de)
DE (1) DE2207852C3 (de)
FR (1) FR2129643A5 (de)
GB (1) GB1356917A (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2529670A1 (fr) * 1982-07-01 1984-01-06 Asulab Sa Element sensible pour capteur de contraintes et capteur en faisant application
US4472655A (en) * 1983-03-25 1984-09-18 Kabushiki Kaisha Daini Seikosha Tuning fork flexural quartz resonator
US4586018A (en) * 1983-09-19 1986-04-29 Ford Motor Company Combustion pressure sensor
FR2634067B1 (fr) * 1988-07-07 1992-04-03 Electro Microtechn Centre Resonateur piezoelectrique
US5311096A (en) * 1991-01-25 1994-05-10 Seiko Electronic Components Ltd. KT cut width-extensional mode quartz crystal resonator
DE4229449A1 (de) * 1992-09-03 1994-03-10 Abb Research Ltd Faseroptischer Quarz-Spannungs-Sensor
AT399778B (de) * 1994-02-07 1995-07-25 Avl Verbrennungskraft Messtech Piezoelektrisches messelement
AT401201B (de) * 1994-03-03 1996-07-25 Avl Verbrennungskraft Messtech Piezoelektrisches messelement
US6923068B2 (en) * 2003-06-19 2005-08-02 Dynisco, Inc. Pressure transducer
CH706635A1 (de) * 2012-06-20 2013-12-31 Kistler Holding Ag Messelement, Messkörper und Messanordnung zum Messen einer Kraft und Verwendung eines solchen Messkörpers.
US9762206B2 (en) * 2014-02-07 2017-09-12 Samsung Electro-Mechanics Co., Ltd. AT-cut quartz crystal vibrator with a long side along the X-axis direction
CN104260214B (zh) * 2014-06-04 2016-11-16 北京石晶光电科技股份有限公司济源分公司 一种高精密波长板晶片加工工艺
AT520901B1 (de) * 2018-01-24 2019-11-15 Avl List Gmbh Messvorrichtung und Verfahren zur Bestimmung einer Kraft und/oder eines Drehmoments an einer drehmomentübertragenden Welle

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2173589A (en) * 1933-12-14 1939-09-19 Bell Telephone Labor Inc Piezoelectric apparatus
US2212139A (en) * 1936-03-18 1940-08-20 Rca Corp Piezoelectric quartz element
BE424774A (de) * 1936-11-25
US2743144A (en) * 1951-04-07 1956-04-24 Motorola Inc Zero temperature coefficient piezoelectric crystal
USRE25413E (en) * 1961-07-05 1963-07-09 Temperature xc
US3423609A (en) * 1964-01-30 1969-01-21 Hewlett Packard Co Quartz crystal temperature transducer

Also Published As

Publication number Publication date
GB1356917A (en) 1974-06-19
DE2207852A1 (de) 1972-10-26
DE2207852C3 (de) 1975-07-10
AT319632B (de) 1974-12-27
DE2207852B2 (de) 1974-10-17
FR2129643A5 (de) 1972-10-27
US4148530A (en) 1979-04-10

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Legal Events

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PL Patent ceased