CH384093A - Blendenanordnung für Elektronenmikroskope für durchstrahlbare Präparate mit Zusatzeinrichtung zur Röntgenspektroskopie - Google Patents
Blendenanordnung für Elektronenmikroskope für durchstrahlbare Präparate mit Zusatzeinrichtung zur RöntgenspektroskopieInfo
- Publication number
- CH384093A CH384093A CH514560A CH514560A CH384093A CH 384093 A CH384093 A CH 384093A CH 514560 A CH514560 A CH 514560A CH 514560 A CH514560 A CH 514560A CH 384093 A CH384093 A CH 384093A
- Authority
- CH
- Switzerland
- Prior art keywords
- radiopaque
- specimens
- additional equipment
- ray spectroscopy
- electron microscopes
- Prior art date
Links
- 238000000441 X-ray spectroscopy Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/09—Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/079—Investigating materials by wave or particle radiation secondary emission incident electron beam and measuring excited X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/316—Accessories, mechanical or electrical features collimators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/418—Imaging electron microscope
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DES63144A DE1099102B (de) | 1959-05-26 | 1959-05-26 | Blendenanordnung fuer Elektronenmikroskope mit Zusatzeinrichtung zur Roentgenspektroskopie durchstrahlbarer Praeparate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CH384093A true CH384093A (de) | 1964-11-15 |
Family
ID=7496165
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CH514560A CH384093A (de) | 1959-05-26 | 1960-05-05 | Blendenanordnung für Elektronenmikroskope für durchstrahlbare Präparate mit Zusatzeinrichtung zur Röntgenspektroskopie |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3086114A (de) |
| CH (1) | CH384093A (de) |
| DE (1) | DE1099102B (de) |
| GB (1) | GB915299A (de) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB918297A (en) * | 1960-04-07 | 1963-02-13 | William Charles Nixon | Improvements in electron microscopes |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US1865441A (en) * | 1923-08-04 | 1932-07-05 | Wappler Electric Company Inc | Method of and apparatus for controlling the direction of x-rays |
| US2098990A (en) * | 1934-03-10 | 1937-11-16 | Phillip S Newton | Therapeutic lamp and method |
| US2260041A (en) * | 1939-03-22 | 1941-10-21 | Gen Electric | Electron microscope |
| US2386785A (en) * | 1942-07-28 | 1945-10-16 | Friedman Herbert | Method and means for measuring x-ray diffraction patterns |
| US2418029A (en) * | 1943-10-08 | 1947-03-25 | Rca Corp | Electron probe analysis employing X-ray spectrography |
| US2819404A (en) * | 1951-05-25 | 1958-01-07 | Herrnring Gunther | Optical image-forming mirror systems having aspherical reflecting surfaces |
| US2846589A (en) * | 1954-04-01 | 1958-08-05 | United States Steel Corp | Apparatus for determining the thickness of zinc coating on a ferrous metal base |
-
1959
- 1959-05-26 DE DES63144A patent/DE1099102B/de active Pending
-
1960
- 1960-03-31 GB GB11321/60A patent/GB915299A/en not_active Expired
- 1960-04-14 US US22262A patent/US3086114A/en not_active Expired - Lifetime
- 1960-05-05 CH CH514560A patent/CH384093A/de unknown
Also Published As
| Publication number | Publication date |
|---|---|
| GB915299A (en) | 1963-01-09 |
| DE1099102B (de) | 1961-02-09 |
| US3086114A (en) | 1963-04-16 |
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