CA2259352C - Ion source for a mass analyser and method of providing a source of ions for analysis - Google Patents

Ion source for a mass analyser and method of providing a source of ions for analysis Download PDF

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Publication number
CA2259352C
CA2259352C CA002259352A CA2259352A CA2259352C CA 2259352 C CA2259352 C CA 2259352C CA 002259352 A CA002259352 A CA 002259352A CA 2259352 A CA2259352 A CA 2259352A CA 2259352 C CA2259352 C CA 2259352C
Authority
CA
Canada
Prior art keywords
interface chamber
mass spectrometer
sample
flow
ion source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CA002259352A
Other languages
English (en)
French (fr)
Other versions
CA2259352A1 (en
Inventor
Stevan Bajic
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thermo Finnigan LLC
Original Assignee
Thermo Finnigan LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thermo Finnigan LLC filed Critical Thermo Finnigan LLC
Publication of CA2259352A1 publication Critical patent/CA2259352A1/en
Application granted granted Critical
Publication of CA2259352C publication Critical patent/CA2259352C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
CA002259352A 1997-04-29 1998-04-28 Ion source for a mass analyser and method of providing a source of ions for analysis Expired - Lifetime CA2259352C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB9708715A GB2324906B (en) 1997-04-29 1997-04-29 Ion source for a mass analyser and method of providing a source of ions for analysis
GB9708715.9 1997-04-29
PCT/GB1998/001232 WO1998049710A1 (en) 1997-04-29 1998-04-28 Ion source for a mass analyser and method of providing a source of ions for analysis

Publications (2)

Publication Number Publication Date
CA2259352A1 CA2259352A1 (en) 1998-11-05
CA2259352C true CA2259352C (en) 2006-11-07

Family

ID=10811558

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002259352A Expired - Lifetime CA2259352C (en) 1997-04-29 1998-04-28 Ion source for a mass analyser and method of providing a source of ions for analysis

Country Status (6)

Country Link
US (1) US6462336B1 (OSRAM)
EP (1) EP0912988A1 (OSRAM)
JP (1) JP2000513873A (OSRAM)
CA (1) CA2259352C (OSRAM)
GB (1) GB2324906B (OSRAM)
WO (1) WO1998049710A1 (OSRAM)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2346730B (en) * 1999-02-11 2003-04-23 Masslab Ltd Ion source for mass analyser
GB2404784B (en) 2001-03-23 2005-06-22 Thermo Finnigan Llc Mass spectrometry method and apparatus
WO2003025973A1 (en) * 2001-09-17 2003-03-27 Mds Inc. Doing Business As Mds Sciex Method and apparatus for cooling and focusing ions
AU2002950505A0 (en) * 2002-07-31 2002-09-12 Varian Australia Pty Ltd Mass spectrometry apparatus and method
JP2004157057A (ja) * 2002-11-08 2004-06-03 Hitachi Ltd 質量分析装置
ATE450050T1 (de) 2003-02-14 2009-12-15 Mds Sciex Atmosphärendruck-diskriminator für geladene teilchen für massenspektrometrie
CA2976507C (en) 2003-06-09 2020-05-12 Perkinelmer Health Sciences Canada, Inc. Mass spectrometer interface
US7015466B2 (en) 2003-07-24 2006-03-21 Purdue Research Foundation Electrosonic spray ionization method and device for the atmospheric ionization of molecules
US7385189B2 (en) * 2005-06-29 2008-06-10 Agilent Technologies, Inc. Nanospray ionization device and method
US7391019B2 (en) * 2006-07-21 2008-06-24 Thermo Finnigan Llc Electrospray ion source
CN101495849B (zh) 2006-07-31 2013-01-30 应用材料公司 原位分析电子器件制造系统中的气体的方法及系统
US8288719B1 (en) * 2006-12-29 2012-10-16 Griffin Analytical Technologies, Llc Analytical instruments, assemblies, and methods
JP2010524178A (ja) * 2007-04-06 2010-07-15 ウオーターズ・テクノロジーズ・コーポレイシヨン 質量分析の機器、装置および方法
US7868289B2 (en) * 2007-04-30 2011-01-11 Ionics Mass Spectrometry Group Inc. Mass spectrometer ion guide providing axial field, and method
US7564029B2 (en) * 2007-08-15 2009-07-21 Varian, Inc. Sample ionization at above-vacuum pressures
EP2218093B1 (en) 2007-11-30 2018-03-21 Waters Technologies Corporation Device for performing mass analysis
US8324565B2 (en) * 2009-12-17 2012-12-04 Agilent Technologies, Inc. Ion funnel for mass spectrometry
US8373118B2 (en) * 2010-10-21 2013-02-12 Advion, Inc. Atmospheric pressure ionization inlet for mass spectrometers
JP6080311B2 (ja) * 2011-04-20 2017-02-15 マイクロマス ユーケー リミテッド 高速スプレーとターゲットとの相互作用による大気圧イオン源
US9851333B2 (en) 2013-05-29 2017-12-26 Dionex Corporation Nebulizer for charged aerosol detection (CAD) system
GB201316697D0 (en) * 2013-09-20 2013-11-06 Micromass Ltd Tool free gas cone retaining device for mass spectrometer ion block assembly
WO2015040387A1 (en) * 2013-09-20 2015-03-26 Micromass Uk Limited Tool free gas cone retaining device for mass spectrometer ion block assembly
WO2015128661A1 (en) * 2014-02-26 2015-09-03 Micromass Uk Limited Ambient ionisation with an impactor spray source
GB2632683A (en) * 2023-08-17 2025-02-19 Thermo Fisher Scient Bremen Gmbh Mass spectrometer comprising a vacuum system and a method of operation

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0153113A3 (en) 1984-02-10 1987-09-23 Finnigan Corporation Thermospray ion sampling device
JPH07118295B2 (ja) 1985-10-30 1995-12-18 株式会社日立製作所 質量分析計
US4861988A (en) 1987-09-30 1989-08-29 Cornell Research Foundation, Inc. Ion spray apparatus and method
GB8826966D0 (en) * 1988-11-18 1988-12-21 Vg Instr Group Plc Gas analyzer
US4999493A (en) * 1990-04-24 1991-03-12 Vestec Corporation Electrospray ionization interface and method for mass spectrometry
US5070240B1 (en) * 1990-08-29 1996-09-10 Univ Brigham Young Apparatus and methods for trace component analysis
US5171990A (en) 1991-05-17 1992-12-15 Finnigan Corporation Electrospray ion source with reduced neutral noise and method
GB9110960D0 (en) * 1991-05-21 1991-07-10 Logicflit Limited Mass spectrometer
US5565679A (en) 1993-05-11 1996-10-15 Mds Health Group Limited Method and apparatus for plasma mass analysis with reduced space charge effects
US5349186A (en) * 1993-06-25 1994-09-20 The Governors Of The University Of Alberta Electrospray interface for mass spectrometer and method of supplying analyte to a mass spectrometer
US5495108A (en) * 1994-07-11 1996-02-27 Hewlett-Packard Company Orthogonal ion sampling for electrospray LC/MS
US5753910A (en) * 1996-07-12 1998-05-19 Hewlett-Packard Company Angled chamber seal for atmospheric pressure ionization mass spectrometry

Also Published As

Publication number Publication date
EP0912988A1 (en) 1999-05-06
GB9708715D0 (en) 1997-06-18
JP2000513873A (ja) 2000-10-17
WO1998049710A1 (en) 1998-11-05
GB2324906B (en) 2002-01-09
GB2324906A (en) 1998-11-04
CA2259352A1 (en) 1998-11-05
US6462336B1 (en) 2002-10-08

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Effective date: 20180430