|
USD420644S
(en)
*
|
1998-12-22 |
2000-02-15 |
Nemal Electronics International, Inc. |
Twelve channel audio cable connector
|
|
US6396293B1
(en)
|
1999-02-18 |
2002-05-28 |
Delaware Capital Formation, Inc. |
Self-closing spring probe
|
|
US6462567B1
(en)
*
|
1999-02-18 |
2002-10-08 |
Delaware Capital Formation, Inc. |
Self-retained spring probe
|
|
JP2001318119A
(en)
|
2000-05-02 |
2001-11-16 |
Fujitsu Ltd |
IC package connection method and IC contactor
|
|
JP4889183B2
(en)
|
2000-06-16 |
2012-03-07 |
日本発條株式会社 |
Micro contactor probe and electrical probe unit
|
|
US6541991B1
(en)
|
2001-05-04 |
2003-04-01 |
Xilinx Inc. |
Interface apparatus and method for testing different sized ball grid array integrated circuits
|
|
USD474741S1
(en)
*
|
2002-02-28 |
2003-05-20 |
Russell Mistretta Abbott |
Electrical interconnect having an integral helically shaped resilient portion
|
|
KR100584225B1
(en)
|
2004-10-06 |
2006-05-29 |
황동원 |
Electronic Contact
|
|
CN101501509B
(en)
*
|
2005-06-10 |
2013-08-14 |
特拉华资本组成公司 |
Electrical contact probe with compliant internal interconnect
|
|
US7862391B2
(en)
*
|
2007-09-18 |
2011-01-04 |
Delaware Capital Formation, Inc. |
Spring contact assembly
|
|
TWM359094U
(en)
*
|
2008-09-01 |
2009-06-11 |
Hon Hai Prec Ind Co Ltd |
Contact of electrical connector
|
|
TWM356263U
(en)
*
|
2008-09-16 |
2009-05-01 |
Hon Hai Prec Ind Co Ltd |
Electrical connector contact
|
|
US20100267291A1
(en)
*
|
2009-04-20 |
2010-10-21 |
Scott Chabineau-Lovgren |
Swaging process for improved compliant contact electrical test performance
|
|
TWI458184B
(en)
*
|
2009-09-16 |
2014-10-21 |
Hon Hai Prec Ind Co Ltd |
Electrical terminal
|
|
WO2011036800A1
(en)
*
|
2009-09-28 |
2011-03-31 |
株式会社日本マイクロニクス |
Contactor and electrical connection device
|
|
TWM385829U
(en)
*
|
2010-01-12 |
2010-08-01 |
Hon Hai Prec Ind Co Ltd |
Electrical connector contact
|
|
TWD138876S1
(en)
*
|
2010-01-27 |
2011-02-01 |
日本麥克隆尼股份有限公司 |
Electric contact
|
|
TWM398701U
(en)
*
|
2010-07-16 |
2011-02-21 |
Hon Hai Prec Ind Co Ltd |
Electrical contact
|
|
USD665744S1
(en)
*
|
2010-09-28 |
2012-08-21 |
Adamant Kogyo Co., Ltd. |
Optical fiber connector
|
|
USD665745S1
(en)
*
|
2010-09-28 |
2012-08-21 |
Adamant Kogyo Co., Ltd. |
Optical fiber connector
|
|
TWD151640S
(en)
*
|
2011-10-31 |
2013-02-01 |
日本麥克隆尼股份有限公司 |
Electric contact
|
|
USD699607S1
(en)
*
|
2012-03-01 |
2014-02-18 |
Yamaichi Electronics Co., Ltd. |
Contact probe
|
|
SG11201406561XA
(en)
*
|
2012-04-13 |
2014-11-27 |
Capital Formation Inc |
Test probe assembly and related methods
|
|
US8373430B1
(en)
*
|
2012-05-06 |
2013-02-12 |
Jerzy Roman Sochor |
Low inductance contact probe with conductively coupled plungers
|
|
TWI514686B
(en)
*
|
2013-01-28 |
2015-12-21 |
Hon Hai Prec Ind Co Ltd |
Electrical connector and contacts thereof
|
|
TWD175504S
(en)
|
2014-03-14 |
2016-05-11 |
歐姆龍股份有限公司 |
A part of probe pin for ic socket
|
|
USD758970S1
(en)
*
|
2014-05-27 |
2016-06-14 |
Vishay Dale Electronics, Llc |
Edge-wound resistor
|
|
JP1529603S
(en)
*
|
2014-12-04 |
2015-07-27 |
|
|
|
JP1529602S
(en)
*
|
2014-12-04 |
2015-07-27 |
|
|
|
JP1529605S
(en)
*
|
2014-12-15 |
2015-07-27 |
|
|
|
JP1529606S
(en)
*
|
2014-12-15 |
2015-07-27 |
|
|
|
JP1529608S
(en)
*
|
2014-12-15 |
2015-07-27 |
|
|
|
JP1529607S
(en)
*
|
2014-12-15 |
2015-07-27 |
|
|
|
JP1529612S
(en)
*
|
2014-12-19 |
2015-07-27 |
|
|
|
JP1567318S
(en)
*
|
2016-02-15 |
2017-01-23 |
|
|
|
JP1567320S
(en)
*
|
2016-02-15 |
2017-01-23 |
|
|
|
JP1613494S
(en)
|
2017-12-27 |
2018-09-10 |
|
|
|
KR102121754B1
(en)
|
2018-12-19 |
2020-06-11 |
주식회사 오킨스전자 |
Device for test socket pin having single coil spring divided into upper and lower regions
|
|
US11387587B1
(en)
*
|
2021-03-13 |
2022-07-12 |
Plastronics Socket Partners, Ltd. |
Self-retained slider contact pin
|
|
USD980223S1
(en)
*
|
2022-11-18 |
2023-03-07 |
Pioneer Square Brands, Inc. |
Connector adapter for portable electronic computing device
|