JP1529603S - - Google Patents
Info
- Publication number
- JP1529603S JP1529603S JPD2014-27121F JP2014027121F JP1529603S JP 1529603 S JP1529603 S JP 1529603S JP 2014027121 F JP2014027121 F JP 2014027121F JP 1529603 S JP1529603 S JP 1529603S
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2014-27121F JP1529603S (en) | 2014-12-04 | 2014-12-04 | |
| US29/528,958 USD764331S1 (en) | 2014-12-04 | 2015-06-02 | Probe pin |
| TW104302992F TWD173048S (en) | 2014-12-04 | 2015-06-03 | Probe pin for ic socket |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2014-27121F JP1529603S (en) | 2014-12-04 | 2014-12-04 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP1529603S true JP1529603S (en) | 2015-07-27 |
Family
ID=53764630
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JPD2014-27121F Active JP1529603S (en) | 2014-12-04 | 2014-12-04 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | USD764331S1 (en) |
| JP (1) | JP1529603S (en) |
| TW (1) | TWD173048S (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWD226028S (en) * | 2022-04-29 | 2023-06-21 | 南韓商普因特工程有限公司 | Semiconductor probe pin |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD507197S1 (en) * | 2004-11-22 | 2005-07-12 | Fu-Cheng Sun | Measure tape |
| KR100701498B1 (en) | 2006-02-20 | 2007-03-29 | 주식회사 새한마이크로텍 | Probe pin assembly for testing semiconductor and method for manufacturing the same |
| WO2011036800A1 (en) * | 2009-09-28 | 2011-03-31 | 株式会社日本マイクロニクス | Contactor and electrical connection device |
| KR101058146B1 (en) * | 2009-11-11 | 2011-08-24 | 하이콘 주식회사 | Spring contacts and sockets with spring contacts |
| TWD138876S1 (en) * | 2010-01-27 | 2011-02-01 | 日本麥克隆尼股份有限公司 | Electric contact |
| TWM390564U (en) * | 2010-03-18 | 2010-10-11 | Hon Hai Prec Ind Co Ltd | Electrical contact |
| JP4998838B2 (en) * | 2010-04-09 | 2012-08-15 | 山一電機株式会社 | Probe pin and IC socket having the same |
| USD665745S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
| USD665744S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
| JP5708430B2 (en) * | 2011-10-14 | 2015-04-30 | オムロン株式会社 | Contact |
| JP5699899B2 (en) * | 2011-10-14 | 2015-04-15 | オムロン株式会社 | Contact |
| USD749968S1 (en) * | 2014-01-24 | 2016-02-23 | Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. | Electrical test lead |
| USD750987S1 (en) * | 2014-01-24 | 2016-03-08 | Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. | Interactive test probe for battery tester |
-
2014
- 2014-12-04 JP JPD2014-27121F patent/JP1529603S/ja active Active
-
2015
- 2015-06-02 US US29/528,958 patent/USD764331S1/en active Active
- 2015-06-03 TW TW104302992F patent/TWD173048S/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| TWD173048S (en) | 2016-01-11 |
| USD764331S1 (en) | 2016-08-23 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| TRDD | Decision of grant or rejection written |