JP1567320S - - Google Patents
Info
- Publication number
- JP1567320S JP1567320S JPD2016-3162F JP2016003162F JP1567320S JP 1567320 S JP1567320 S JP 1567320S JP 2016003162 F JP2016003162 F JP 2016003162F JP 1567320 S JP1567320 S JP 1567320S
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2016-3162F JP1567320S (en) | 2016-02-15 | 2016-02-15 | |
| US29/573,441 USD789223S1 (en) | 2016-02-15 | 2016-08-05 | Probe pin |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2016-3162F JP1567320S (en) | 2016-02-15 | 2016-02-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP1567320S true JP1567320S (en) | 2017-01-23 |
Family
ID=57806280
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JPD2016-3162F Active JP1567320S (en) | 2016-02-15 | 2016-02-15 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | USD789223S1 (en) |
| JP (1) | JP1567320S (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWM349590U (en) * | 2008-06-16 | 2009-01-21 | Hon Hai Prec Ind Co Ltd | Electrical contact |
| US7815440B2 (en) * | 2008-08-11 | 2010-10-19 | Hon Hai Precision Ind. Co., Ltd. | Electrical contact with interlocking arrangement |
| KR101058146B1 (en) * | 2009-11-11 | 2011-08-24 | 하이콘 주식회사 | Spring contacts and sockets with spring contacts |
| TWM385829U (en) * | 2010-01-12 | 2010-08-01 | Hon Hai Prec Ind Co Ltd | Electrical connector contact |
| JP4998838B2 (en) * | 2010-04-09 | 2012-08-15 | 山一電機株式会社 | Probe pin and IC socket having the same |
| KR101154519B1 (en) * | 2010-05-27 | 2012-06-13 | 하이콘 주식회사 | Structure of spring contacts |
| US8547128B1 (en) * | 2012-05-06 | 2013-10-01 | Jerzy Roman Sochor | Contact probe with conductively coupled plungers |
-
2016
- 2016-02-15 JP JPD2016-3162F patent/JP1567320S/ja active Active
- 2016-08-05 US US29/573,441 patent/USD789223S1/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| USD789223S1 (en) | 2017-06-13 |