CA2166207C - Quadrupole with applied signal having off-resonance frequency - Google Patents
Quadrupole with applied signal having off-resonance frequency Download PDFInfo
- Publication number
- CA2166207C CA2166207C CA002166207A CA2166207A CA2166207C CA 2166207 C CA2166207 C CA 2166207C CA 002166207 A CA002166207 A CA 002166207A CA 2166207 A CA2166207 A CA 2166207A CA 2166207 C CA2166207 C CA 2166207C
- Authority
- CA
- Canada
- Prior art keywords
- field
- supplemental
- trapping
- combined
- ions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/426—Methods for controlling ions
- H01J49/427—Ejection and selection methods
- H01J49/4275—Applying a non-resonant auxiliary oscillating voltage, e.g. parametric excitation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/426—Methods for controlling ions
- H01J49/427—Ejection and selection methods
- H01J49/429—Scanning an electric parameter, e.g. voltage amplitude or frequency
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Developing Agents For Electrophotography (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US8397293A | 1993-06-28 | 1993-06-28 | |
US08/083,972 | 1993-06-28 | ||
PCT/US1994/007176 WO1995000237A1 (en) | 1993-06-28 | 1994-06-27 | Quadrupole with applied signal having off-resonance frequency |
Publications (2)
Publication Number | Publication Date |
---|---|
CA2166207A1 CA2166207A1 (en) | 1995-01-05 |
CA2166207C true CA2166207C (en) | 2003-09-16 |
Family
ID=22181839
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA002166207A Expired - Lifetime CA2166207C (en) | 1993-06-28 | 1994-06-27 | Quadrupole with applied signal having off-resonance frequency |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP0765190B1 (de) |
JP (1) | JP3067208B2 (de) |
AT (1) | ATE188139T1 (de) |
CA (1) | CA2166207C (de) |
DE (1) | DE69422429T2 (de) |
WO (1) | WO1995000237A1 (de) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5726448A (en) * | 1996-08-09 | 1998-03-10 | California Institute Of Technology | Rotating field mass and velocity analyzer |
US6130980A (en) | 1997-05-06 | 2000-10-10 | Dsm N.V. | Ribbon assemblies and ink coating compositions for use in forming the ribbon assemblies |
US6197422B1 (en) | 1997-05-06 | 2001-03-06 | Dsm, N.V. | Ribbon assemblies and radiation-curable ink compositions for use in forming the ribbon assemblies |
JPWO2003041116A1 (ja) * | 2001-11-07 | 2005-03-03 | 株式会社日立ハイテクノロジーズ | 質量分析方法及びイオントラップ質量分析計 |
US6794647B2 (en) | 2003-02-25 | 2004-09-21 | Beckman Coulter, Inc. | Mass analyzer having improved mass filter and ion detection arrangement |
US7186972B2 (en) | 2003-10-23 | 2007-03-06 | Beckman Coulter, Inc. | Time of flight mass analyzer having improved mass resolution and method of operating same |
EP2797105B1 (de) * | 2013-04-26 | 2018-08-15 | Amsterdam Scientific Instruments Holding B.V. | Detektion von Ionen in einer Ionenfalle |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4982088A (en) * | 1990-02-02 | 1991-01-01 | California Institute Of Technology | Method and apparatus for highly sensitive spectroscopy of trapped ions |
US5182451A (en) * | 1991-04-30 | 1993-01-26 | Finnigan Corporation | Method of operating an ion trap mass spectrometer in a high resolution mode |
-
1994
- 1994-06-27 CA CA002166207A patent/CA2166207C/en not_active Expired - Lifetime
- 1994-06-27 WO PCT/US1994/007176 patent/WO1995000237A1/en active IP Right Grant
- 1994-06-27 AT AT94920813T patent/ATE188139T1/de not_active IP Right Cessation
- 1994-06-27 DE DE69422429T patent/DE69422429T2/de not_active Expired - Lifetime
- 1994-06-27 JP JP7503108A patent/JP3067208B2/ja not_active Expired - Fee Related
- 1994-06-27 EP EP94920813A patent/EP0765190B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69422429D1 (de) | 2000-02-03 |
JPH09501537A (ja) | 1997-02-10 |
EP0765190B1 (de) | 1999-12-29 |
JP3067208B2 (ja) | 2000-07-17 |
EP0765190A4 (de) | 1997-09-03 |
EP0765190A1 (de) | 1997-04-02 |
WO1995000237A1 (en) | 1995-01-05 |
ATE188139T1 (de) | 2000-01-15 |
CA2166207A1 (en) | 1995-01-05 |
DE69422429T2 (de) | 2000-08-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0736221B1 (de) | Massenspektrometrisches verfahren mit zwei sperrfeldern gleicher form | |
US5864136A (en) | Mass spectrometry method with two applied trapping fields having the same spatial form | |
EP0601118B1 (de) | Massenspektrometrie verfahren unter verwendung zusatslicher wechselspannungssignale | |
US5134286A (en) | Mass spectrometry method using notch filter | |
EP0617837B1 (de) | Verfahren zur massenspektrometrie unter verwendung eines rauschfreien signals | |
US5196699A (en) | Chemical ionization mass spectrometry method using notch filter | |
US5451782A (en) | Mass spectometry method with applied signal having off-resonance frequency | |
US5610397A (en) | Mass spectrometry method using supplemental AC voltage signals | |
CA2166207C (en) | Quadrupole with applied signal having off-resonance frequency | |
US5173604A (en) | Mass spectrometry method with non-consecutive mass order scan | |
EP0573579B1 (de) | Massenspektrometrieverfahren mittels zusätzlicher ac spannungssignale |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EEER | Examination request | ||
MKEX | Expiry |
Effective date: 20140627 |