CA2166207A1 - Quadrupole with applied signal having off-resonance frequency - Google Patents

Quadrupole with applied signal having off-resonance frequency

Info

Publication number
CA2166207A1
CA2166207A1 CA002166207A CA2166207A CA2166207A1 CA 2166207 A1 CA2166207 A1 CA 2166207A1 CA 002166207 A CA002166207 A CA 002166207A CA 2166207 A CA2166207 A CA 2166207A CA 2166207 A1 CA2166207 A1 CA 2166207A1
Authority
CA
Canada
Prior art keywords
field
supplemental
ion
frequency
combined
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA002166207A
Other languages
French (fr)
Other versions
CA2166207C (en
Inventor
Paul E. Kelley
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2166207A1 publication Critical patent/CA2166207A1/en
Application granted granted Critical
Publication of CA2166207C publication Critical patent/CA2166207C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H01J49/4275—Applying a non-resonant auxiliary oscillating voltage, e.g. parametric excitation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H01J49/429—Scanning an electric parameter, e.g. voltage amplitude or frequency

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Developing Agents For Electrophotography (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

A mass spectrometry method in which a combined field (comprising a trapping field and supplemental field) is established and at least one parameter of the combined field is changed to excite ions trapped in the combined field sequentially (such as for detection). The supplemental field is a periodically varying field having an off-resonance frequency, in the sense that the supplemental field frequency nearly matches (but differs from) a frequency of motion of an ion stably trapped by the trapping field alone. Sequential ion excitation in accordance with the invention can rapidly excite each ion to a degree sufficient for a desired purpose but insufficient for ejection from the trap. The amplitude of the supplemental field is kept sufficiently high to excite ions (via an off-resonance excitation mechanism) before they undergo resonant excitation.
CA002166207A 1993-06-28 1994-06-27 Quadrupole with applied signal having off-resonance frequency Expired - Lifetime CA2166207C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US8397293A 1993-06-28 1993-06-28
US08/083,972 1993-06-28
PCT/US1994/007176 WO1995000237A1 (en) 1993-06-28 1994-06-27 Quadrupole with applied signal having off-resonance frequency

Publications (2)

Publication Number Publication Date
CA2166207A1 true CA2166207A1 (en) 1995-01-05
CA2166207C CA2166207C (en) 2003-09-16

Family

ID=22181839

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002166207A Expired - Lifetime CA2166207C (en) 1993-06-28 1994-06-27 Quadrupole with applied signal having off-resonance frequency

Country Status (6)

Country Link
EP (1) EP0765190B1 (en)
JP (1) JP3067208B2 (en)
AT (1) ATE188139T1 (en)
CA (1) CA2166207C (en)
DE (1) DE69422429T2 (en)
WO (1) WO1995000237A1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5726448A (en) * 1996-08-09 1998-03-10 California Institute Of Technology Rotating field mass and velocity analyzer
US6197422B1 (en) 1997-05-06 2001-03-06 Dsm, N.V. Ribbon assemblies and radiation-curable ink compositions for use in forming the ribbon assemblies
US6130980A (en) 1997-05-06 2000-10-10 Dsm N.V. Ribbon assemblies and ink coating compositions for use in forming the ribbon assemblies
EP1463090B1 (en) * 2001-11-07 2012-02-15 Hitachi High-Technologies Corporation Mass spectrometry and ion trap mass spectrometer
US6794647B2 (en) 2003-02-25 2004-09-21 Beckman Coulter, Inc. Mass analyzer having improved mass filter and ion detection arrangement
US7186972B2 (en) 2003-10-23 2007-03-06 Beckman Coulter, Inc. Time of flight mass analyzer having improved mass resolution and method of operating same
EP2797105B1 (en) * 2013-04-26 2018-08-15 Amsterdam Scientific Instruments Holding B.V. Detection of ions in an ion trap

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4982088A (en) * 1990-02-02 1991-01-01 California Institute Of Technology Method and apparatus for highly sensitive spectroscopy of trapped ions
US5182451A (en) * 1991-04-30 1993-01-26 Finnigan Corporation Method of operating an ion trap mass spectrometer in a high resolution mode

Also Published As

Publication number Publication date
JPH09501537A (en) 1997-02-10
JP3067208B2 (en) 2000-07-17
CA2166207C (en) 2003-09-16
EP0765190A1 (en) 1997-04-02
DE69422429D1 (en) 2000-02-03
ATE188139T1 (en) 2000-01-15
WO1995000237A1 (en) 1995-01-05
DE69422429T2 (en) 2000-08-03
EP0765190A4 (en) 1997-09-03
EP0765190B1 (en) 1999-12-29

Similar Documents

Publication Publication Date Title
US4749860A (en) Method of isolating a single mass in a quadrupole ion trap
Hunt et al. Tandem quadrupole Fourier-transform mass spectrometry of oligopeptides and small proteins.
US5179278A (en) Multipole inlet system for ion traps
EP0202943B2 (en) Method of operating an ion trap
CA2116344A1 (en) Mass spectrometry method using supplemental ac voltage signals
US5128542A (en) Method of operating an ion trap mass spectrometer to determine the resonant frequency of trapped ions
CA2567759A1 (en) Linear ion trap apparatus and method utilizing an asymmetrical trapping field
EP1051733B1 (en) Method of and apparatus for selective collision-induced dissociation of ions in a quadrupole ion guide
CA2198655A1 (en) Mass scanning method using an ion trap mass spectrometer
EP1122763A3 (en) Mass spectrometer and method with improved ion transmission
EP0630042A3 (en) Method of high mass resolution scanning of an ion trap spectrometer.
EP1009015A3 (en) Space change control method for improved ion isolation in ion trap mass spectrometer by dynamically adaptive sampling
JPS63276863A (en) Fourier transformation four-terminal mass spectrometer and method of mass spectrometry
CA2101427A1 (en) Mass Spectrometry Method Using Notch Filter
WO2002086946A1 (en) Method and apparatus for separating ions in time as functions of preselected ion mobility and ion mass
WO2009094760A1 (en) Method of operating a linear ion trap to provide low pressure short time high amplitude excitation with pulsed pressure
CA2575209A1 (en) High-q pulsed fragmentation in ion traps
US20060289738A1 (en) Measurement of light fragment ions with ion traps
CA2094869A1 (en) Method of detecting the ions in an ion trap mass spectrometer
DE69434452D1 (en) MASS SPECTROMETRIC PROCESS WITH TWO LOCKS OF SIMILAR SHAPE
Bruce et al. Selected‐ion accumulation from an external electrospray ionization source with a Fourier‐transform ion cyclotron resonance mass spectrometer
EP1396008A2 (en) Method for mass spectrometry, separation of ions with different charges
CA2178244A1 (en) Method of detecting selected ion species in a quadrupole ion trap
US5396064A (en) Quadrupole trap ion isolation method
CA2066893A1 (en) Method of operating an ion trap mass spectrometer in a high resolution mode

Legal Events

Date Code Title Description
EEER Examination request
MKEX Expiry

Effective date: 20140627