CA2150679A1 - Improved Structure for CdSe TFT - Google Patents
Improved Structure for CdSe TFTInfo
- Publication number
- CA2150679A1 CA2150679A1 CA2150679A CA2150679A CA2150679A1 CA 2150679 A1 CA2150679 A1 CA 2150679A1 CA 2150679 A CA2150679 A CA 2150679A CA 2150679 A CA2150679 A CA 2150679A CA 2150679 A1 CA2150679 A1 CA 2150679A1
- Authority
- CA
- Canada
- Prior art keywords
- deposited
- layer
- semiconductor channel
- thin film
- gate electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 title 1
- 239000004065 semiconductor Substances 0.000 abstract 4
- 239000012212 insulator Substances 0.000 abstract 3
- 238000002161 passivation Methods 0.000 abstract 3
- 239000000758 substrate Substances 0.000 abstract 3
- 239000010409 thin film Substances 0.000 abstract 3
- 239000011521 glass Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/417—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions carrying the current to be rectified, amplified or switched
- H01L29/41725—Source or drain electrodes for field effect devices
- H01L29/41733—Source or drain electrodes for field effect devices for thin film transistors with insulated gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/78681—Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising AIIIBV or AIIBVI or AIVBVI semiconductor materials, or Se or Te
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Thin Film Transistor (AREA)
- Liquid Crystal (AREA)
Abstract
A thin film transistor, comprising: a glass substrate; a gate electrode deposited on the substrate; a gate insulator layer deposited on the substrate so as to overly the gate electrode; a thin film semiconductor channel layer deposited on the gate insulator layer and substantially aligned with the gate electrode;
a passivation layer deposited on the gate insulator layer so as to overly the thin film semiconductor channel layer; a pair of via holes etched though the passivation layer to the semiconductor channel layer; and a pair of source and drain electrodes deposited on the passivation layer and extending through the via holes for contacting the semiconductor channel layer.
a passivation layer deposited on the gate insulator layer so as to overly the thin film semiconductor channel layer; a pair of via holes etched though the passivation layer to the semiconductor channel layer; and a pair of source and drain electrodes deposited on the passivation layer and extending through the via holes for contacting the semiconductor channel layer.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6512599A JPH08511130A (en) | 1992-12-01 | 1992-12-01 | Improved structure for CdSe thin film transistor |
CA002150679A CA2150679C (en) | 1992-12-01 | 1992-12-01 | Improved structure for cdse tft |
PCT/CA1992/000520 WO1994013019A1 (en) | 1992-12-01 | 1992-12-01 | IMPROVED STRUCTURE FOR CdSe TFT |
EP92923643A EP0672302A1 (en) | 1992-12-01 | 1992-12-01 | IMPROVED STRUCTURE FOR CdSe TFT |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA002150679A CA2150679C (en) | 1992-12-01 | 1992-12-01 | Improved structure for cdse tft |
PCT/CA1992/000520 WO1994013019A1 (en) | 1992-12-01 | 1992-12-01 | IMPROVED STRUCTURE FOR CdSe TFT |
Publications (2)
Publication Number | Publication Date |
---|---|
CA2150679A1 true CA2150679A1 (en) | 1994-06-09 |
CA2150679C CA2150679C (en) | 2000-01-11 |
Family
ID=25677986
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA002150679A Expired - Fee Related CA2150679C (en) | 1992-12-01 | 1992-12-01 | Improved structure for cdse tft |
Country Status (2)
Country | Link |
---|---|
CA (1) | CA2150679C (en) |
WO (1) | WO1994013019A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6043113A (en) * | 1995-07-31 | 2000-03-28 | 1294339 Ontario, Inc. | Method of forming self-aligned thin film transistor |
CN104020621B (en) * | 2014-05-26 | 2017-03-01 | 京东方科技集团股份有限公司 | A kind of array base palte and preparation method thereof, display device |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5010027A (en) * | 1990-03-21 | 1991-04-23 | General Electric Company | Method for fabricating a self-aligned thin-film transistor utilizing planarization and back-side photoresist exposure |
-
1992
- 1992-12-01 CA CA002150679A patent/CA2150679C/en not_active Expired - Fee Related
- 1992-12-01 WO PCT/CA1992/000520 patent/WO1994013019A1/en not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
CA2150679C (en) | 2000-01-11 |
WO1994013019A1 (en) | 1994-06-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EEER | Examination request | ||
MKLA | Lapsed |