CA1224845A - Method of measuring a frequency domain characteristic - Google Patents

Method of measuring a frequency domain characteristic

Info

Publication number
CA1224845A
CA1224845A CA000424902A CA424902A CA1224845A CA 1224845 A CA1224845 A CA 1224845A CA 000424902 A CA000424902 A CA 000424902A CA 424902 A CA424902 A CA 424902A CA 1224845 A CA1224845 A CA 1224845A
Authority
CA
Canada
Prior art keywords
signal
peak
level
integer
output signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA000424902A
Other languages
English (en)
French (fr)
Inventor
Bruce J. Penney
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Application granted granted Critical
Publication of CA1224845A publication Critical patent/CA1224845A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Analogue/Digital Conversion (AREA)
  • Measurement Of Current Or Voltage (AREA)
CA000424902A 1982-03-30 1983-03-30 Method of measuring a frequency domain characteristic Expired CA1224845A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP5216482A JPS58169067A (ja) 1982-03-30 1982-03-30 周波数領域特性の測定方法
JP52164/1982 1982-03-30

Publications (1)

Publication Number Publication Date
CA1224845A true CA1224845A (en) 1987-07-28

Family

ID=12907186

Family Applications (1)

Application Number Title Priority Date Filing Date
CA000424902A Expired CA1224845A (en) 1982-03-30 1983-03-30 Method of measuring a frequency domain characteristic

Country Status (4)

Country Link
EP (1) EP0095234B1 (enExample)
JP (1) JPS58169067A (enExample)
CA (1) CA1224845A (enExample)
DE (1) DE3381119D1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006031027A1 (de) * 2006-07-05 2008-01-24 Atmel Germany Gmbh Verfahren zur Funktionskontrolle von wenigstens einem analogen Schaltungsblock

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2924769A (en) * 1958-06-16 1960-02-09 Gen Electric Peak reading circuit
IT1025356B (it) * 1974-10-31 1978-08-10 Ates Componenti Elettron Circuito duplicatore rivelatore in cascata

Also Published As

Publication number Publication date
JPS58169067A (ja) 1983-10-05
JPH0368351B2 (enExample) 1991-10-28
DE3381119D1 (de) 1990-02-22
EP0095234A3 (en) 1986-03-26
EP0095234B1 (en) 1990-01-17
EP0095234A2 (en) 1983-11-30

Similar Documents

Publication Publication Date Title
US4799008A (en) AC level calibration apparatus
US4613814A (en) Method of measuring a frequency domain characteristic
US5248935A (en) Electronic type watthour meter including automatic measuring-error correcting function
US4958294A (en) Swept microwave power measurement system and method
US3934197A (en) Automatic calibration system
EP0321963B1 (en) Impedance measuring apparatus
US5039872A (en) Digitally synthesized audio frequency voltage source
US4743845A (en) Oscilloscope-based signal level measurement system
US4901078A (en) Variable duty cycle window detecting analog to digital converter
CA1224845A (en) Method of measuring a frequency domain characteristic
US4605868A (en) Peak-to-peak detection apparatus
US5410245A (en) Method and apparatus for calibrating electronic scales for the horizontal axis
Oldham et al. An intercomparison of ac voltage using a digitally synthesized source
RU2269867C1 (ru) Способ определения погрешности амплитудных цифровых преобразователей угла следящего типа
Sounders et al. Measurement of the transient versus steady-state response of waveform recorders
CA1248600A (en) Sine-wave generator
CA1242813A (en) Apparatus for measuring characteristics of electronic devices
JPS62153779A (ja) 補償回路網の適正補償指示装置
JPH0533976Y2 (enExample)
JPH0691464B2 (ja) Ａ／ｄ変換器の試験装置
RU1777160C (ru) Устройство дл определени статических характеристик случайных процессов
SU1406548A2 (ru) Устройство дл поверки измерителей параметров паразитной амплитудной модул ции
JPH11173846A (ja) ロータリエンコーダの調整機能付き測量装置
Turgel Phase Meter Calibration at NBS
Souders Data converter test methods

Legal Events

Date Code Title Description
MKEX Expiry