CA1213325A - Digital circuit testing arrangement - Google Patents

Digital circuit testing arrangement

Info

Publication number
CA1213325A
CA1213325A CA000455999A CA455999A CA1213325A CA 1213325 A CA1213325 A CA 1213325A CA 000455999 A CA000455999 A CA 000455999A CA 455999 A CA455999 A CA 455999A CA 1213325 A CA1213325 A CA 1213325A
Authority
CA
Canada
Prior art keywords
output
input
circuit
digital circuit
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA000455999A
Other languages
English (en)
French (fr)
Inventor
Joel W. Gannett
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
American Telephone and Telegraph Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Telephone and Telegraph Co Inc filed Critical American Telephone and Telegraph Co Inc
Application granted granted Critical
Publication of CA1213325A publication Critical patent/CA1213325A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
CA000455999A 1983-06-20 1984-06-06 Digital circuit testing arrangement Expired CA1213325A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US506,070 1983-06-20
US06/506,070 US4551838A (en) 1983-06-20 1983-06-20 Self-testing digital circuits

Publications (1)

Publication Number Publication Date
CA1213325A true CA1213325A (en) 1986-10-28

Family

ID=24013045

Family Applications (1)

Application Number Title Priority Date Filing Date
CA000455999A Expired CA1213325A (en) 1983-06-20 1984-06-06 Digital circuit testing arrangement

Country Status (9)

Country Link
US (1) US4551838A (en, 2012)
JP (1) JPH0641968B2 (en, 2012)
BE (1) BE899941A (en, 2012)
CA (1) CA1213325A (en, 2012)
DE (1) DE3422287A1 (en, 2012)
FR (1) FR2548382B1 (en, 2012)
GB (1) GB2141829B (en, 2012)
IT (1) IT1175519B (en, 2012)
NL (1) NL192355C (en, 2012)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6068624A (ja) * 1983-09-26 1985-04-19 Toshiba Corp Ｌｓｉの自己検査装置
JPS60213873A (ja) * 1984-04-06 1985-10-26 Advantest Corp ロジツクアナライザ
US4644265A (en) * 1985-09-03 1987-02-17 International Business Machines Corporation Noise reduction during testing of integrated circuit chips
US4890270A (en) * 1988-04-08 1989-12-26 Sun Microsystems Method and apparatus for measuring the speed of an integrated circuit device
US5488615A (en) * 1990-02-28 1996-01-30 Ail Systems, Inc. Universal digital signature bit device
US5230000A (en) * 1991-04-25 1993-07-20 At&T Bell Laboratories Built-in self-test (bist) circuit
US5515383A (en) * 1991-05-28 1996-05-07 The Boeing Company Built-in self-test system and method for self test of an integrated circuit

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3783254A (en) * 1972-10-16 1974-01-01 Ibm Level sensitive logic system
JPS5352029A (en) * 1976-10-22 1978-05-12 Fujitsu Ltd Arithmetic circuit unit
DE2842750A1 (de) * 1978-09-30 1980-04-10 Ibm Deutschland Verfahren und anordnung zur pruefung von durch monolithisch integrierten halbleiterschaltungen dargestellten sequentiellen schaltungen
US4225957A (en) * 1978-10-16 1980-09-30 International Business Machines Corporation Testing macros embedded in LSI chips
DE2902375C2 (de) * 1979-01-23 1984-05-17 Siemens AG, 1000 Berlin und 8000 München Logikbaustein für integrierte Digitalschaltungen
FR2451672A1 (fr) * 1979-03-15 1980-10-10 Nippon Electric Co Circuit logique integre pour l'execution de tests
US4320509A (en) * 1979-10-19 1982-03-16 Bell Telephone Laboratories, Incorporated LSI Circuit logic structure including data compression circuitry
US4377757A (en) * 1980-02-11 1983-03-22 Siemens Aktiengesellschaft Logic module for integrated digital circuits
US4340857A (en) * 1980-04-11 1982-07-20 Siemens Corporation Device for testing digital circuits using built-in logic block observers (BILBO's)
NL8004176A (nl) * 1980-07-21 1982-02-16 Philips Nv Inrichting voor het testen van een schakeling met digitaal werkende en kombinatorisch werkende onderdelen.

Also Published As

Publication number Publication date
NL192355B (nl) 1997-02-03
NL8401925A (nl) 1985-01-16
GB2141829A (en) 1985-01-03
DE3422287A1 (de) 1984-12-20
DE3422287C2 (en, 2012) 1993-09-23
FR2548382B1 (fr) 1987-12-04
GB8415145D0 (en) 1984-07-18
GB2141829B (en) 1987-03-18
FR2548382A1 (fr) 1985-01-04
NL192355C (nl) 1997-06-04
JPH0641968B2 (ja) 1994-06-01
IT1175519B (it) 1987-07-01
JPS6015570A (ja) 1985-01-26
IT8421499A0 (it) 1984-06-19
US4551838A (en) 1985-11-05
BE899941A (fr) 1984-10-15

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Legal Events

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