CA1038496A - Dynamic memory with non-volatile back-up mode - Google Patents
Dynamic memory with non-volatile back-up modeInfo
- Publication number
- CA1038496A CA1038496A CA239,394A CA239394A CA1038496A CA 1038496 A CA1038496 A CA 1038496A CA 239394 A CA239394 A CA 239394A CA 1038496 A CA1038496 A CA 1038496A
- Authority
- CA
- Canada
- Prior art keywords
- memory
- volatile
- memory system
- threshold
- stored
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000015654 memory Effects 0.000 title claims abstract description 124
- 238000003860 storage Methods 0.000 claims abstract description 63
- 239000003990 capacitor Substances 0.000 claims abstract description 29
- 239000004065 semiconductor Substances 0.000 claims description 18
- 238000012546 transfer Methods 0.000 claims description 18
- 238000012545 processing Methods 0.000 claims description 17
- 238000000034 method Methods 0.000 claims description 7
- 230000005669 field effect Effects 0.000 claims description 5
- 230000006378 damage Effects 0.000 claims description 2
- 230000000977 initiatory effect Effects 0.000 claims 1
- 230000004044 response Effects 0.000 claims 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical group O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 239000000758 substrate Substances 0.000 description 5
- 238000001514 detection method Methods 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 230000014759 maintenance of location Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000000377 silicon dioxide Substances 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical group N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- SVTBMSDMJJWYQN-UHFFFAOYSA-N 2-methylpentane-2,4-diol Chemical compound CC(O)CC(C)(C)O SVTBMSDMJJWYQN-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000011982 device technology Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000003334 potential effect Effects 0.000 description 1
- 238000012163 sequencing technique Methods 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/403—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh
- G11C11/404—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh with one charge-transfer gate, e.g. MOS transistor, per cell
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C14/00—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0466—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/811—Combinations of field-effect devices and one or more diodes, capacitors or resistors
- H10D84/813—Combinations of field-effect devices and capacitor only
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
- Memory System (AREA)
- Dram (AREA)
- Static Random-Access Memory (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US537796A US3916390A (en) | 1974-12-31 | 1974-12-31 | Dynamic memory with non-volatile back-up mode |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA1038496A true CA1038496A (en) | 1978-09-12 |
Family
ID=24144125
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA239,394A Expired CA1038496A (en) | 1974-12-31 | 1975-11-12 | Dynamic memory with non-volatile back-up mode |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US3916390A (https=) |
| JP (1) | JPS5615071B2 (https=) |
| CA (1) | CA1038496A (https=) |
| DE (1) | DE2557359C2 (https=) |
| FR (1) | FR2296913A1 (https=) |
| GB (1) | GB1483029A (https=) |
| IT (1) | IT1051404B (https=) |
Families Citing this family (47)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5279630A (en) * | 1975-12-25 | 1977-07-04 | Toshiba Corp | Data processing unit |
| US3986180A (en) * | 1975-09-22 | 1976-10-12 | International Business Machines Corporation | Depletion mode field effect transistor memory system |
| US4094008A (en) * | 1976-06-18 | 1978-06-06 | Ncr Corporation | Alterable capacitor memory array |
| US4091460A (en) * | 1976-10-05 | 1978-05-23 | The United States Of America As Represented By The Secretary Of The Air Force | Quasi static, virtually nonvolatile random access memory cell |
| US4064492A (en) * | 1976-10-05 | 1977-12-20 | Schuermeyer Fritz L | Virtually nonvolatile random access memory cell |
| GB1545169A (en) * | 1977-09-22 | 1979-05-02 | Burroughs Corp | Data processor system including data-save controller for protection against loss of volatile memory information during power failure |
| JPS55138104A (en) * | 1979-04-13 | 1980-10-28 | Hitachi Ltd | Engine controller |
| US4327410A (en) * | 1980-03-26 | 1982-04-27 | Ncr Corporation | Processor auto-recovery system |
| US4363110A (en) * | 1980-12-22 | 1982-12-07 | International Business Machines Corp. | Non-volatile dynamic RAM cell |
| DE3174858D1 (en) * | 1980-12-25 | 1986-07-24 | Fujitsu Ltd | Nonvolatile semiconductor memory device |
| US4525800A (en) * | 1981-06-01 | 1985-06-25 | General Electric Co. | Enhanced reliability data storage system with second memory for preserving time-dependent progressively updated data from destructive transient conditions |
| DE3123654A1 (de) * | 1981-06-15 | 1983-01-20 | Vdo Adolf Schindling Ag, 6000 Frankfurt | Schaltungsanordnung zur speicherung eines mehrstelligen dekadischen zaehlwerts einer von einem fahrzeug zurueckgelegten wegstrecke |
| US4432072A (en) * | 1981-12-31 | 1984-02-14 | International Business Machines Corporation | Non-volatile dynamic RAM cell |
| US4446535A (en) * | 1981-12-31 | 1984-05-01 | International Business Machines Corporation | Non-inverting non-volatile dynamic RAM cell |
| US4471471A (en) * | 1981-12-31 | 1984-09-11 | International Business Machines Corporation | Non-volatile RAM device |
| JPS59967A (ja) * | 1983-06-03 | 1984-01-06 | Hitachi Ltd | 半導体不揮発性記憶装置 |
| US4615020A (en) * | 1983-12-06 | 1986-09-30 | Advanced Micro Devices, Inc. | Nonvolatile dynamic ram circuit |
| US4959774A (en) * | 1984-07-06 | 1990-09-25 | Ampex Corporation | Shadow memory system for storing variable backup blocks in consecutive time periods |
| US4651307A (en) * | 1984-11-01 | 1987-03-17 | Motorola, Inc. | Non-volatile memory storage system |
| US4742482A (en) * | 1985-10-29 | 1988-05-03 | Hayes Microcomputer Products, Inc. | Modem controller |
| US4860228A (en) * | 1987-02-24 | 1989-08-22 | Motorola, Inc. | Non-volatile memory incremental counting system |
| US4861976A (en) * | 1988-06-06 | 1989-08-29 | American Telephone And Telegraph Company, At&T Bell Laboratories | Optical or opto-electronic device having a trapping layer in contact with a semiconductive layer |
| US4965828A (en) * | 1989-04-05 | 1990-10-23 | Quadri Corporation | Non-volatile semiconductor memory with SCRAM hold cycle prior to SCRAM-to-E2 PROM backup transfer |
| JP2825135B2 (ja) * | 1990-03-06 | 1998-11-18 | 富士通株式会社 | 半導体記憶装置及びその情報書込読出消去方法 |
| US5544312A (en) * | 1994-04-29 | 1996-08-06 | Intel Corporation | Method of detecting loss of power during block erasure and while writing sector data to a solid state disk |
| US5598367A (en) * | 1995-06-07 | 1997-01-28 | International Business Machines Corporation | Trench EPROM |
| US6181630B1 (en) * | 1999-02-23 | 2001-01-30 | Genatek, Inc. | Method of stabilizing data stored in volatile memory |
| US6473355B2 (en) | 2000-12-01 | 2002-10-29 | Genatek, Inc. | Apparatus for using volatile memory for long-term storage |
| US6742140B2 (en) | 2000-12-01 | 2004-05-25 | Jason R. Caulkins | Method for using volatile memory for long-term storage |
| KR100719178B1 (ko) * | 2003-08-29 | 2007-05-17 | 주식회사 하이닉스반도체 | 비휘발성 디램의 구동방법 |
| US8904098B2 (en) | 2007-06-01 | 2014-12-02 | Netlist, Inc. | Redundant backup using non-volatile memory |
| US8301833B1 (en) | 2007-06-01 | 2012-10-30 | Netlist, Inc. | Non-volatile memory module |
| US8874831B2 (en) | 2007-06-01 | 2014-10-28 | Netlist, Inc. | Flash-DRAM hybrid memory module |
| US8154259B2 (en) * | 2007-07-25 | 2012-04-10 | Agiga Tech Inc. | Capacitor save energy verification |
| US8046546B2 (en) * | 2007-07-25 | 2011-10-25 | AGIGA Tech | Variable partitioning in a hybrid memory subsystem |
| US8074034B2 (en) * | 2007-07-25 | 2011-12-06 | Agiga Tech Inc. | Hybrid nonvolatile ram |
| US7865679B2 (en) * | 2007-07-25 | 2011-01-04 | AgigA Tech Inc., 12700 | Power interrupt recovery in a hybrid memory subsystem |
| US9842628B2 (en) * | 2008-07-10 | 2017-12-12 | Agiga Tech Inc. | Capacitor enablement voltage level adjustment method and apparatus |
| US8479061B2 (en) * | 2009-09-24 | 2013-07-02 | AGIGA Tech | Solid state memory cartridge with wear indication |
| US8468317B2 (en) | 2011-06-07 | 2013-06-18 | Agiga Tech Inc. | Apparatus and method for improved data restore in a memory system |
| US10380022B2 (en) | 2011-07-28 | 2019-08-13 | Netlist, Inc. | Hybrid memory module and system and method of operating the same |
| US10198350B2 (en) | 2011-07-28 | 2019-02-05 | Netlist, Inc. | Memory module having volatile and non-volatile memory subsystems and method of operation |
| US10838646B2 (en) | 2011-07-28 | 2020-11-17 | Netlist, Inc. | Method and apparatus for presearching stored data |
| US9214465B2 (en) | 2012-07-24 | 2015-12-15 | Flashsilicon Incorporation | Structures and operational methods of non-volatile dynamic random access memory devices |
| US10372551B2 (en) | 2013-03-15 | 2019-08-06 | Netlist, Inc. | Hybrid memory system with configurable error thresholds and failure analysis capability |
| US9436600B2 (en) | 2013-06-11 | 2016-09-06 | Svic No. 28 New Technology Business Investment L.L.P. | Non-volatile memory storage for multi-channel memory system |
| US10248328B2 (en) | 2013-11-07 | 2019-04-02 | Netlist, Inc. | Direct data move between DRAM and storage on a memory module |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3387286A (en) * | 1967-07-14 | 1968-06-04 | Ibm | Field-effect transistor memory |
| US4003701A (en) * | 1971-02-02 | 1977-01-18 | Scott Paper Company | Graft copolymerization processes |
| JPS5432915B2 (https=) * | 1971-09-10 | 1979-10-17 | ||
| US3771148A (en) * | 1972-03-31 | 1973-11-06 | Ncr | Nonvolatile capacitive memory cell |
| US3761901A (en) * | 1972-06-28 | 1973-09-25 | Ncr | Nonvolatile memory cell |
| US3774177A (en) * | 1972-10-16 | 1973-11-20 | Ncr Co | Nonvolatile random access memory cell using an alterable threshold field effect write transistor |
| US3811076A (en) * | 1973-01-02 | 1974-05-14 | Ibm | Field effect transistor integrated circuit and memory |
-
1974
- 1974-12-31 US US537796A patent/US3916390A/en not_active Expired - Lifetime
-
1975
- 1975-11-12 CA CA239,394A patent/CA1038496A/en not_active Expired
- 1975-11-28 FR FR7537205A patent/FR2296913A1/fr active Granted
- 1975-12-02 GB GB49366/75A patent/GB1483029A/en not_active Expired
- 1975-12-02 JP JP14246875A patent/JPS5615071B2/ja not_active Expired
- 1975-12-19 DE DE2557359A patent/DE2557359C2/de not_active Expired
- 1975-12-19 IT IT30501/75A patent/IT1051404B/it active
Also Published As
| Publication number | Publication date |
|---|---|
| GB1483029A (en) | 1977-08-17 |
| FR2296913A1 (fr) | 1976-07-30 |
| JPS5180731A (https=) | 1976-07-14 |
| US3916390A (en) | 1975-10-28 |
| FR2296913B1 (https=) | 1978-05-12 |
| IT1051404B (it) | 1981-04-21 |
| JPS5615071B2 (https=) | 1981-04-08 |
| DE2557359C2 (de) | 1983-05-05 |
| DE2557359A1 (de) | 1976-07-08 |
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