CA1006244A - Radiation sensitive means for detecting flaws in glass - Google Patents

Radiation sensitive means for detecting flaws in glass

Info

Publication number
CA1006244A
CA1006244A CA166,634A CA166634A CA1006244A CA 1006244 A CA1006244 A CA 1006244A CA 166634 A CA166634 A CA 166634A CA 1006244 A CA1006244 A CA 1006244A
Authority
CA
Canada
Prior art keywords
glass
radiation sensitive
sensitive means
detecting flaws
flaws
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA166,634A
Other languages
English (en)
Other versions
CA166634S (en
Inventor
Richard D. Vanderneut
Kurt C. Schwind
Charles J. Cushing
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Maxar Space LLC
Original Assignee
Aeronutronic Ford Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aeronutronic Ford Corp filed Critical Aeronutronic Ford Corp
Application granted granted Critical
Publication of CA1006244A publication Critical patent/CA1006244A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CA166,634A 1972-05-09 1973-03-21 Radiation sensitive means for detecting flaws in glass Expired CA1006244A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US25183272A 1972-05-09 1972-05-09

Publications (1)

Publication Number Publication Date
CA1006244A true CA1006244A (en) 1977-03-01

Family

ID=22953602

Family Applications (1)

Application Number Title Priority Date Filing Date
CA166,634A Expired CA1006244A (en) 1972-05-09 1973-03-21 Radiation sensitive means for detecting flaws in glass

Country Status (4)

Country Link
US (1) US3743431A (enExample)
JP (1) JPS5250555B2 (enExample)
CA (1) CA1006244A (enExample)
FR (1) FR2184333A5 (enExample)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3890050A (en) * 1973-04-10 1975-06-17 Vladimir Dmitrievich Kozlov Device for measuring nonuniformity of photoparametric characteristics of materials
US3871773A (en) * 1973-04-24 1975-03-18 Ppg Industries Inc Method of and apparatus for detecting defects and the position thereof in transparent articles
JPS5434558B2 (enExample) * 1974-03-18 1979-10-27
US3919531A (en) * 1974-05-16 1975-11-11 Libbey Owens Ford Co Method of and apparatus for inspecting the contours of moving bent articles
US3880750A (en) * 1974-06-06 1975-04-29 Owens Illinois Inc Sealing surface gauge
JPS51989A (ja) * 1974-06-21 1976-01-07 Yaskawa Denki Seisakusho Kk Ketsukankenshutsusochi
JPS5417341B2 (enExample) * 1974-11-14 1979-06-29
JPS51126191A (en) * 1975-04-25 1976-11-04 Central Glass Co Ltd Optical method to inspect a surface condition of a glass plate
JPS5229789A (en) * 1975-09-02 1977-03-05 Toray Ind Inc Apparatus for derection, identification and indication of surface defe cts of travelling sheet-form objects
JPS5233790A (en) * 1975-09-11 1977-03-15 Kinriyou Seisakusho:Kk Punching dectection apparatus for transparent objects
US4038554A (en) * 1976-03-09 1977-07-26 Columbia Research Corporation Detection of flaws in a moving web of transparent material
JPS5813332Y2 (ja) * 1976-05-11 1983-03-15 株式会社安川電機 欠点検出器
US4253768A (en) * 1978-08-09 1981-03-03 Westinghouse Electric Corp. Processing system for detection and the classification of flaws on metallic surfaces
US4306808A (en) * 1979-12-14 1981-12-22 Ford Aerospace & Communications Corp. Glass flaw inspection system
DE3028942A1 (de) 1980-07-30 1982-02-18 Krones Ag Hermann Kronseder Maschinenfabrik, 8402 Neutraubling Verfahren und inspektionsgeraet zum inspizieren eines gegenstandes, insbesondere einer flasche
US4376583A (en) * 1981-05-12 1983-03-15 Aeronca Electronics, Inc. Surface inspection scanning system
GB8424084D0 (en) * 1984-09-24 1984-10-31 Sira Ltd Inspection apparatus
GB8702130D0 (en) * 1987-01-30 1987-03-04 Sira Ltd Surface inspection
DE3806384A1 (de) * 1988-02-29 1989-09-07 Feldmuehle Ag Verfahren und vorrichtung zum pruefen von laufenden transparenten bahnen
DE3938113C2 (de) * 1989-11-16 1994-11-03 Focus Mestechnik Gmbh & Co Kg Optisches Dickenmeßgerät für transparente Werkstücke
IL119850A (en) * 1996-12-17 2000-11-21 Prolaser Ltd Optical method and apparatus for detecting low frequency defects
DE19850969A1 (de) * 1998-11-05 2000-05-31 Basler Ag Verfahren zum Anzeigen der Fehlerhäufigkeit und der Fehlerfrequenz bei einem taktweise arbeitenden Fehlerinspektionssystem
ES2156071B1 (es) * 1999-03-01 2002-02-01 Sevilla Juan Antonio Lasso Equipo de luz coherente xenon para el control de calidad en la fabricacion del vidrio.
CN100462789C (zh) * 2002-04-03 2009-02-18 Nh科技玻璃株式会社 液晶显示器用玻璃基板及其基样玻璃制造方法和检测装置
DE102006019468B3 (de) * 2006-04-26 2007-08-30 Siemens Ag Optischer Sensor und Verfahren zur optischen Inspektion von Oberflächen

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL272308A (enExample) * 1960-12-13
US3245306A (en) * 1961-10-05 1966-04-12 Aluminum Co Of America Photometer and method
DE1548263C3 (de) * 1966-11-10 1975-05-22 Ernst Leitz Gmbh, 6330 Wetzlar Verfahren zur Bestimmung der Größe geometrischer Veränderungen oder Abweichungen einer reflektierenden Oberfläche von einer Solloberfläche mittels optischer Mittel

Also Published As

Publication number Publication date
JPS4962176A (enExample) 1974-06-17
US3743431A (en) 1973-07-03
FR2184333A5 (enExample) 1973-12-21
JPS5250555B2 (enExample) 1977-12-24

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