BRPI1009038A2 - antena de faixa de frequência em thz, sistema eletrônico que opera na faixa de frequência em thz, sistema de distinção entre um sinal em thz e ruído de fundo e método para ajustar a resposta de uma antena de faixa de frequência em thz - Google Patents

antena de faixa de frequência em thz, sistema eletrônico que opera na faixa de frequência em thz, sistema de distinção entre um sinal em thz e ruído de fundo e método para ajustar a resposta de uma antena de faixa de frequência em thz

Info

Publication number
BRPI1009038A2
BRPI1009038A2 BRPI1009038A BRPI1009038A BRPI1009038A2 BR PI1009038 A2 BRPI1009038 A2 BR PI1009038A2 BR PI1009038 A BRPI1009038 A BR PI1009038A BR PI1009038 A BRPI1009038 A BR PI1009038A BR PI1009038 A2 BRPI1009038 A2 BR PI1009038A2
Authority
BR
Brazil
Prior art keywords
frequency range
thz
thz frequency
range antenna
distinguishing
Prior art date
Application number
BRPI1009038A
Other languages
English (en)
Inventor
Audrey Anne-Marie Berrier
Jaime Gomez Rivas
Lorenzo Tripodi
Marion Matters-Kammerer
Stefan Alexander Maier
Vincenzo Giannini
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Publication of BRPI1009038A2 publication Critical patent/BRPI1009038A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0237—Adjustable, e.g. focussing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0256—Compact construction
    • G01J3/0259—Monolithic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Details Of Aerials (AREA)
BRPI1009038A 2009-06-03 2010-06-04 antena de faixa de frequência em thz, sistema eletrônico que opera na faixa de frequência em thz, sistema de distinção entre um sinal em thz e ruído de fundo e método para ajustar a resposta de uma antena de faixa de frequência em thz BRPI1009038A2 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP09161766 2009-06-03
EP09173166 2009-10-15
PCT/EP2010/057846 WO2010139791A1 (en) 2009-06-03 2010-06-04 Thz frequency range antenna

Publications (1)

Publication Number Publication Date
BRPI1009038A2 true BRPI1009038A2 (pt) 2016-03-08

Family

ID=42370888

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI1009038A BRPI1009038A2 (pt) 2009-06-03 2010-06-04 antena de faixa de frequência em thz, sistema eletrônico que opera na faixa de frequência em thz, sistema de distinção entre um sinal em thz e ruído de fundo e método para ajustar a resposta de uma antena de faixa de frequência em thz

Country Status (7)

Country Link
US (1) US9040922B2 (pt)
EP (1) EP2438410B1 (pt)
JP (1) JP5632911B2 (pt)
CN (1) CN102483350B (pt)
BR (1) BRPI1009038A2 (pt)
RU (1) RU2528243C2 (pt)
WO (1) WO2010139791A1 (pt)

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US8785855B2 (en) * 2012-10-16 2014-07-22 Uvic Industry Partnerships Inc. Interlaced terahertz transceiver using plasmonic resonance
WO2014126789A1 (en) 2013-02-14 2014-08-21 The Government of the United State of America, as represented by the Secretary of the Navy Actively tunable polar-dielectric optical devices
JP6196787B2 (ja) * 2013-03-08 2017-09-13 キヤノン株式会社 画像形成装置、及びイメージングシステム
EP2824435B1 (en) * 2013-07-11 2016-06-01 FOM Institute for Atomic and Molecular Physics Terahertz frequency sensing
RU2545497C1 (ru) * 2014-01-09 2015-04-10 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Сибирская государственная геодезическая академия" (ФГБОУ ВПО "СГГА") Способ изготовления детекторов терагерцового диапазона
US9966668B1 (en) 2014-05-15 2018-05-08 Rockwell Collins, Inc. Semiconductor antenna
CN105204190A (zh) * 2014-06-10 2015-12-30 中国科学院苏州纳米技术与纳米仿生研究所 一种基于低维电子等离子体波的太赫兹调制器及其制造方法
CN104091837B (zh) * 2014-06-13 2016-09-28 南京大学 一种基于光学天线的太赫兹探测器
CN104502303B (zh) * 2015-01-20 2017-05-31 中国人民解放军第三军医大学第一附属医院 用于快速帧检细菌的亚太赫兹纳米生物传感器及其检测方法
CN104535479B (zh) * 2015-01-20 2017-06-30 中国人民解放军第三军医大学第一附属医院 用于单个或少量细胞检测的亚太赫兹纳米生物传感器
EP3392662A4 (en) * 2015-12-15 2019-07-31 Tokyo Institute of Technology TERAHERTZ DETECTION SENSOR AND TERAHERTZ IMAGE MEASURING DEVICE
EP3220133B1 (en) * 2016-03-18 2020-04-01 IHP GmbH - Innovations for High Performance Microelectronics / Leibniz-Institut für innovative Mikroelektronik Sub thz to mid infrared tunable semiconductor plasmonics
DE102016206999A1 (de) 2016-03-18 2017-09-21 Ihp Gmbh - Innovations For High Performance Microelectronics / Leibniz-Institut Für Innovative Mikroelektronik Sub-THz- bis Mittelinfrarot- durchstimmbare Halbleiterplasmonik
CN105870582B (zh) * 2016-05-24 2017-07-18 深圳市太赫兹系统设备有限公司 太赫兹近场探测器、光电导天线及其制作方法
JP7102526B2 (ja) * 2017-09-07 2022-07-19 アマースト カレッジ スピン共鳴分光法のためのループギャップ共振器
EP3503206B1 (en) * 2017-12-22 2020-12-09 Fundació Institut de Ciències Fotòniques A device for operating with thz and/or ir and/or mw radiation
CN109459143B (zh) * 2018-11-12 2020-02-07 中国科学院长春光学精密机械与物理研究所 基于等离激元及压电薄膜温度频率特性的红外传感器
CN109459146B (zh) * 2018-11-12 2020-02-07 中国科学院长春光学精密机械与物理研究所 一种基于压电谐振器的非制冷红外探测器的制备方法
RU202634U1 (ru) * 2020-03-23 2021-03-01 Федеральное государственное бюджетное образовательное учреждение высшего образования "Сибирский государственный университет геосистем и технологий" (СГУГиТ) Низкопрофильная диэлектрическая антенна терагерцового диапазона
US11888233B2 (en) * 2020-04-07 2024-01-30 Ramot At Tel-Aviv University Ltd Tailored terahertz radiation
RU201847U1 (ru) * 2020-10-21 2021-01-15 Федеральное государственное бюджетное образовательное учреждение высшего образования «Сибирский государственный университет геосистем и технологий» (СГУГиТ) Фотопроводящая антенная решетка
CN116666949B (zh) * 2023-06-07 2024-05-28 广东工业大学 一种谐振体耦合增强的光电导天线

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US5729017A (en) 1996-05-31 1998-03-17 Lucent Technologies Inc. Terahertz generators and detectors
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JP4095486B2 (ja) 2003-04-18 2008-06-04 浜松ホトニクス株式会社 テラヘルツ電磁波対応ウェハ、テラヘルツ発生検出デバイス及びそれらの製造方法
JP2006010319A (ja) * 2004-06-22 2006-01-12 Matsushita Electric Ind Co Ltd テラヘルツ電磁波発生・検出装置
US7607431B1 (en) 2005-02-11 2009-10-27 Cruitt Stanley L Medical reminder device suited for use with nebulizers
JP4432822B2 (ja) * 2005-04-19 2010-03-17 船井電機株式会社 形状可変ミラー及びそれを備えた光ピックアップ装置
RU2318192C1 (ru) * 2006-06-09 2008-02-27 Государственное образовательное учреждение высшего профессионального образования "Российский университет дружбы народов" (РУДН) Плазмонный спектрометр терагерцового диапазона для исследования проводящей поверхности
JP5035618B2 (ja) * 2006-12-05 2012-09-26 独立行政法人理化学研究所 電磁波を用いた検出方法、及び検出装置
US8309930B2 (en) * 2007-03-05 2012-11-13 University Of Virginia Patent Foundation Method of local electro-magnetic field enhancement of terahertz (THz) radiation in sub- wavelength regions and improved coupling of radiation to materials through the use of the discontinuity edge effect
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Also Published As

Publication number Publication date
EP2438410A1 (en) 2012-04-11
RU2528243C2 (ru) 2014-09-10
CN102483350A (zh) 2012-05-30
US9040922B2 (en) 2015-05-26
JP5632911B2 (ja) 2014-11-26
US20120074323A1 (en) 2012-03-29
RU2011154216A (ru) 2013-07-20
EP2438410B1 (en) 2017-04-26
CN102483350B (zh) 2014-10-29
JP2012529168A (ja) 2012-11-15
WO2010139791A1 (en) 2010-12-09

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Legal Events

Date Code Title Description
B25D Requested change of name of applicant approved

Owner name: KONINKLIJKE PHILIPS N.V. (NL)

B25G Requested change of headquarter approved

Owner name: KONINKLIJKE PHILIPS N.V. (NL)

B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B06T Formal requirements before examination [chapter 6.20 patent gazette]
B11E Dismissal acc. art. 34 of ipl - requirements for examination incomplete
B11T Dismissal of application maintained [chapter 11.20 patent gazette]