BRPI0922259A2 - dispositivo e método para medir uma construção - Google Patents

dispositivo e método para medir uma construção

Info

Publication number
BRPI0922259A2
BRPI0922259A2 BRPI0922259A BRPI0922259A BRPI0922259A2 BR PI0922259 A2 BRPI0922259 A2 BR PI0922259A2 BR PI0922259 A BRPI0922259 A BR PI0922259A BR PI0922259 A BRPI0922259 A BR PI0922259A BR PI0922259 A2 BRPI0922259 A2 BR PI0922259A2
Authority
BR
Brazil
Prior art keywords
building
measuring
Prior art date
Application number
BRPI0922259A
Other languages
English (en)
Inventor
Jonas Bäckman
Original Assignee
Alignment Systems Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Alignment Systems Ab filed Critical Alignment Systems Ab
Publication of BRPI0922259A2 publication Critical patent/BRPI0922259A2/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/32Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring the deformation in a solid
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/004Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/22Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring angles or tapers; for testing the alignment of axes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/34Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C19/00Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
    • G01C19/02Rotary gyroscopes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Conveying And Assembling Of Building Elements In Situ (AREA)
  • Gyroscopes (AREA)
BRPI0922259A 2008-12-15 2009-12-15 dispositivo e método para medir uma construção BRPI0922259A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE0850137A SE0850137A1 (sv) 2008-12-15 2008-12-15 Anordning och förfarande för mätning av en konstruktion
PCT/SE2009/051421 WO2010071571A1 (en) 2008-12-15 2009-12-15 Device and method for measuring a construction

Publications (1)

Publication Number Publication Date
BRPI0922259A2 true BRPI0922259A2 (pt) 2015-12-29

Family

ID=42111943

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0922259A BRPI0922259A2 (pt) 2008-12-15 2009-12-15 dispositivo e método para medir uma construção

Country Status (9)

Country Link
US (1) US8931325B2 (pt)
EP (1) EP2366090A4 (pt)
KR (1) KR101706370B1 (pt)
CN (2) CN102257349B (pt)
BR (1) BRPI0922259A2 (pt)
MX (1) MX2011006402A (pt)
RU (1) RU2515961C2 (pt)
SE (1) SE0850137A1 (pt)
WO (1) WO2010071571A1 (pt)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201201700D0 (en) * 2012-02-01 2012-03-14 Wfs Technologies Ltd Apparatus and method for determining a spatial relationship between two surfaces
CN106767588B (zh) * 2016-11-13 2020-05-12 泉州旗信专利技术咨询有限公司 一种测量方法及测量装置
CN110132221B (zh) * 2019-05-31 2020-09-18 华南理工大学 多倾角传感器非同步采集后同步处理的桥梁挠度测量方法

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2045938A (en) * 1979-03-09 1980-11-05 Newall Electronics Ltd Dimension measuring device
CN1015935B (zh) * 1987-03-31 1992-03-18 航天工业部第一研究院第十三设计所 车辆动态测试仪
RU2111452C1 (ru) * 1993-03-02 1998-05-20 Обнинский институт атомной энергетики Способ измерения геометрии канальных труб и устройство для его осуществления
SE502850C2 (sv) * 1994-04-20 1996-01-29 Optab Optronikinnovation Ab Mätsystem för att på fordon mäta hjulvinklar och positionsbestämma lägen för i fordon ingående chassienheter
TW245771B (pt) 1993-09-27 1995-04-21 Australian Road Res Board Ltd
US5719764A (en) * 1995-07-19 1998-02-17 Honeywell Inc. Fault tolerant inertial reference system
DE19637554B4 (de) * 1995-09-19 2004-01-08 Deutsches Zentrum für Luft- und Raumfahrt e.V. Verfahren und Vorrichtung zum Meßfehlerausgleich bei Meßrobotern
CN1089160C (zh) * 1998-08-07 2002-08-14 清华大学 一种应用微型惯性测量组合进行三维位置测量的方法
WO2000025674A1 (de) * 1998-11-04 2000-05-11 Idiag Messanordnung zum erfassen einer oberflächenlinie eines körpers
EP1153292B1 (en) * 1998-12-23 2011-08-24 Image Guided Technologies, Inc. A hybrid 3-d probe tracked by multiple sensors
CA2272500C (en) * 1999-05-19 2007-05-01 Sandvik Tamrock Oy Method and apparatus for measuring dimensional rough stone blocks
DE10143539A1 (de) * 2001-09-06 2003-04-03 Daimler Chrysler Ag Verfahren und Anordnung zum Bestimmen der Position und Ausrichtung einer Bildaufnahme-Einrichtung beim optischen Vermessen von Objekten
KR20030041513A (ko) * 2001-11-20 2003-05-27 기아자동차주식회사 화물차량 적재함용 사이드 게이트
CN1139786C (zh) * 2002-02-06 2004-02-25 何秀凤 自主式定位定向导航仪
CA2506043A1 (en) * 2002-11-15 2004-06-03 Alan George Rock Level, angle and distance measuring device
RU2272995C1 (ru) 2005-02-21 2006-03-27 Владимир Аронович Беленький Способ выработки навигационных параметров и вертикали места (варианты)
US20070038409A1 (en) * 2005-08-02 2007-02-15 Kurt Gilson Position sensing means and method
SE529780C2 (sv) * 2005-08-04 2007-11-20 Hexagon Metrology Ab Mätförfarande och mätanordning för användning i mätsystem såsom koordinatmätmaskiner
FR2924215B1 (fr) * 2007-11-23 2010-01-01 Thales Sa Systeme comprenant deux instruments combines et procede d'alignement du systeme
CN101246005B (zh) * 2008-03-03 2011-02-02 北京航空航天大学 一种微惯导测量实体外形的装置
CN101246024B (zh) * 2008-03-26 2010-09-01 北京航空航天大学 一种外场快速标定微型多传感器组合导航系统的方法

Also Published As

Publication number Publication date
US8931325B2 (en) 2015-01-13
KR101706370B1 (ko) 2017-02-13
KR20110095416A (ko) 2011-08-24
CN103542834B (zh) 2017-04-12
SE532832C2 (sv) 2010-04-20
CN102257349A (zh) 2011-11-23
US20110290019A1 (en) 2011-12-01
RU2011126654A (ru) 2013-01-20
WO2010071571A1 (en) 2010-06-24
EP2366090A4 (en) 2017-08-02
CN103542834A (zh) 2014-01-29
MX2011006402A (es) 2011-09-15
SE0850137A1 (sv) 2010-04-20
EP2366090A1 (en) 2011-09-21
RU2515961C2 (ru) 2014-05-20
CN102257349B (zh) 2016-09-14

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Legal Events

Date Code Title Description
B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B06T Formal requirements before examination [chapter 6.20 patent gazette]
B15K Others concerning applications: alteration of classification

Free format text: AS CLASSIFICACOES ANTERIORES ERAM: G01B 7/004 , G01B 7/34 , G01C 19/02

Ipc: G01B 21/02 (1980.01), G01B 21/20 (1980.01), G01B 2

B11E Dismissal acc. art. 34 of ipl - requirements for examination incomplete
B11T Dismissal of application maintained [chapter 11.20 patent gazette]