BRPI0821098A2 - Cabeça de medição de espectrômetro para análise de variáveis características de substâncias líquidas, pastosas ou sólidas - Google Patents

Cabeça de medição de espectrômetro para análise de variáveis características de substâncias líquidas, pastosas ou sólidas

Info

Publication number
BRPI0821098A2
BRPI0821098A2 BRPI0821098-5A BRPI0821098A BRPI0821098A2 BR PI0821098 A2 BRPI0821098 A2 BR PI0821098A2 BR PI0821098 A BRPI0821098 A BR PI0821098A BR PI0821098 A2 BRPI0821098 A2 BR PI0821098A2
Authority
BR
Brazil
Prior art keywords
pasty
analysis
liquid
measuring head
solid substances
Prior art date
Application number
BRPI0821098-5A
Other languages
English (en)
Inventor
Uwe Kirschner
Matthias Lau
Original Assignee
Sentronic Gmbh Ges Für Optische Messsysteme
Bühler AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sentronic Gmbh Ges Für Optische Messsysteme, Bühler AG filed Critical Sentronic Gmbh Ges Für Optische Messsysteme
Publication of BRPI0821098A2 publication Critical patent/BRPI0821098A2/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • G01N21/276Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Optical Head (AREA)
BRPI0821098-5A 2007-11-30 2008-11-28 Cabeça de medição de espectrômetro para análise de variáveis características de substâncias líquidas, pastosas ou sólidas BRPI0821098A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102007058563A DE102007058563A1 (de) 2007-11-30 2007-11-30 Spektrometermesskopf zur Analyse von Kenngrößen flüssiger, pastöser oder fester Substanzen
PCT/DE2008/002046 WO2009068022A2 (de) 2007-11-30 2008-11-28 Spektrometermesskopf zur analyse von kenngrössen flüssiger, pastöser oder fester substanzen

Publications (1)

Publication Number Publication Date
BRPI0821098A2 true BRPI0821098A2 (pt) 2015-06-16

Family

ID=40568551

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0821098-5A BRPI0821098A2 (pt) 2007-11-30 2008-11-28 Cabeça de medição de espectrômetro para análise de variáveis características de substâncias líquidas, pastosas ou sólidas

Country Status (9)

Country Link
US (1) US8582095B2 (pt)
EP (1) EP2215456B1 (pt)
JP (1) JP2011505001A (pt)
KR (1) KR20100110301A (pt)
CN (1) CN101981435A (pt)
BR (1) BRPI0821098A2 (pt)
DE (2) DE102007058563A1 (pt)
RU (1) RU2010126633A (pt)
WO (1) WO2009068022A2 (pt)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2522127C2 (ru) 2009-12-22 2014-07-10 Бюлер Аг Устройство (варианты), способ измерения сыпучих продуктов и применение устройства для измерения сыпучих материалов
EP2581774A1 (en) * 2011-10-14 2013-04-17 Astrium Limited Suppression of back reflection in a waveguide
EP2999954A1 (en) * 2013-05-21 2016-03-30 Sensorex Corporation Fluid diagnostic devices and methods of using the same
DE102018212489A1 (de) * 2018-07-26 2020-01-30 Implen GmbH Vorrichtung für eine lichtspektroskopische Analyse
CN111896320B (zh) * 2020-08-06 2024-03-12 北京微芯区块链与边缘计算研究院 水样采集装置、水质监测器
CN114035320A (zh) * 2022-01-10 2022-02-11 中国人民解放军63921部队 一种共口径宽光谱成像系统

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JPS48102585A (pt) * 1972-04-04 1973-12-22
DE2358966C2 (de) 1973-11-27 1975-10-30 Eltro Gmbh Gesellschaft Fuer Strahlungstechnik, 6900 Heidelberg Verfahren und Vorrichtung zum Abtasten von Bildfeldern mit Hilfe eines Schwingspiegels
US4231663A (en) * 1979-03-16 1980-11-04 Phillippi Conrad M Device for calibrating the photometric linearity of optical instruments
DE3424230A1 (de) 1984-06-30 1986-03-20 Eltro GmbH, Gesellschaft für Strahlungstechnik, 6900 Heidelberg Schwingspiegel
GB2163548B (en) * 1984-08-09 1987-11-25 Perkin Elmer Ltd Interferometric apparatus particularly for use in ft spectrophotometer
US4888484A (en) * 1986-02-20 1989-12-19 Automatik Machinery Corporation Apparatus and method for spectrophotometric analysis of a material in a moving process stream
JPS62228935A (ja) 1986-03-31 1987-10-07 Toshiba Corp 自動化学分析装置
DE3613233A1 (de) 1986-04-18 1987-10-22 Rodenstock Instr Gmbh Einrichtung zum verstellen eines lichtstrahls in einer auftreffebene
US4778233A (en) 1986-09-19 1988-10-18 Ateo Corporation Steering mirror
JPH0526319A (ja) * 1991-07-15 1993-02-02 Copal Co Ltd 揺動機構およびこれを用いた反射鏡駆動装置
US5406213A (en) * 1991-09-10 1995-04-11 Photon Dynamics, Inc. Instrument for testing liquid crystal display base plates
JPH07120323A (ja) * 1993-10-25 1995-05-12 Nissan Motor Co Ltd 金属表面色測定装置
JPH08128897A (ja) * 1994-10-30 1996-05-21 Horiba Ltd 波長変調機構
JPH08152401A (ja) * 1994-11-29 1996-06-11 Iseki & Co Ltd 近赤外分析装置
US5936727A (en) * 1997-04-24 1999-08-10 Foss Nirsystems, Inc. Wavelength standard
JP3451535B2 (ja) * 1997-09-02 2003-09-29 オムロン株式会社 土壌の光学特性測定装置
US7019822B1 (en) * 1999-04-29 2006-03-28 Mss, Inc. Multi-grade object sorting system and method
AU6232099A (en) * 1999-09-30 2001-04-30 Jipjap B.V. Method and apparatus for determining autofluorescence of skin tissue
DE19962428A1 (de) 1999-12-22 2001-06-28 Siemens Ag Verfahren zur optischen und spektroskopischen Messung der Eigenschaften von festen Materialien und zugehörige Einrichtung
JP2002071561A (ja) * 2000-08-25 2002-03-08 Shimadzu Corp 赤外分光光度計
JP2002139380A (ja) * 2000-11-02 2002-05-17 Hitachi Ltd 分光光度計
EP1221597A1 (de) * 2001-01-05 2002-07-10 Büchi Laboratoriums-Technik AG Spektrometer mit automatischer Referenzierung
SE523138C2 (sv) 2001-01-11 2004-03-30 Bestwood Ab Förfarande och utrustning för belysning och insamling av strålning
US6717669B2 (en) 2002-03-06 2004-04-06 Sci Instruments, Inc. Self-calibrating spectrometers and auto-calibration methods
US6956649B2 (en) * 2002-11-26 2005-10-18 Sensys Medical, Inc. Spectroscopic system and method using a ceramic optical reference
JP2005317611A (ja) * 2004-04-27 2005-11-10 Canon Inc 露光方法及び装置
DE102004048102A1 (de) 2004-04-30 2006-04-20 Carl Zeiss Jena Gmbh Spektrometrischer Messkopf und Verfahren zu dessen Rekalibrierung
DE102004021448B4 (de) 2004-04-30 2016-12-29 Carl Zeiss Spectroscopy Gmbh Spektrometrischer Reflexionsmesskopf und Verfahren zu dessen interner Rekalibrierung
JP2005331788A (ja) * 2004-05-21 2005-12-02 Kubo Kenji 光路変換装置並びに同装置を用いた光通信装置及び照明装置
EP1724029A1 (en) * 2005-05-17 2006-11-22 Visys NV A detection system for use in a sorting apparatus, a method for determining drift in this detection system and a sorting apparatus comprising such detection system
CN2831110Y (zh) 2005-05-31 2006-10-25 天津市三博科技有限公司 长光程差分吸收光谱法污染气体监测仪

Also Published As

Publication number Publication date
US20110001968A1 (en) 2011-01-06
WO2009068022A3 (de) 2009-11-12
RU2010126633A (ru) 2012-01-10
CN101981435A (zh) 2011-02-23
KR20100110301A (ko) 2010-10-12
EP2215456B1 (de) 2015-10-14
DE112008003681A5 (de) 2010-10-28
JP2011505001A (ja) 2011-02-17
US8582095B2 (en) 2013-11-12
WO2009068022A2 (de) 2009-06-04
EP2215456A2 (de) 2010-08-11
DE102007058563A1 (de) 2009-06-04

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Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE AS 6A E 7A ANUIDADES.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2343 DE 01-12-2015 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.