BR9916368A - Análise de emissão fluorescente de raio x para determinar concentração de material - Google Patents

Análise de emissão fluorescente de raio x para determinar concentração de material

Info

Publication number
BR9916368A
BR9916368A BR9916368-3A BR9916368A BR9916368A BR 9916368 A BR9916368 A BR 9916368A BR 9916368 A BR9916368 A BR 9916368A BR 9916368 A BR9916368 A BR 9916368A
Authority
BR
Brazil
Prior art keywords
soot
ray fluorescent
dopant concentration
emission analysis
fluorescent emission
Prior art date
Application number
BR9916368-3A
Other languages
English (en)
Inventor
Alan Peloubet Quinn
Original Assignee
Coring Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Coring Inc filed Critical Coring Inc
Publication of BR9916368A publication Critical patent/BR9916368A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/633—Specific applications or type of materials thickness, density, surface weight (unit area)

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Manufacture, Treatment Of Glass Fibers (AREA)

Abstract

Patente de Invenção para <B>"ANáLISE DE EMISSãO FLUORESCENTE DE RAIO X PARA DETERMINAR CONCENTRAçãO DE MATERIAL"<D>. Um método e aparelho são revelados para determinar uma concentração de dopante em fuligem, que constitui pelo menos uma porção de uma pré-forma de fuligem (12) usada para formar uma guia de onda ótica. A fonte de fóton (30) irradia a pré-forma de fuligem em um mandril (14). Emissões fluorescentes de raio X, a partir da fuligem irradiada, são detectadas, e a concentração de dopante é determinada baseada nas emissões fluorescentes de raio X detectadas. Adicionalmente, a concentração de dopante em camadas de fuligem pode ser controlada pela utilização de emissões fluorescentes de raio X detectadas para determinar um desvio entre uma concentração de dopante na fuligem e uma concentração pré-determinada, e ajuste das condições de deposição baseado no desvio.
BR9916368-3A 1998-12-21 1999-12-06 Análise de emissão fluorescente de raio x para determinar concentração de material BR9916368A (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11347998P 1998-12-21 1998-12-21
PCT/US1999/028951 WO2000037929A1 (en) 1998-12-21 1999-12-06 X-ray fluorescent emission analysis to determine material concentration

Publications (1)

Publication Number Publication Date
BR9916368A true BR9916368A (pt) 2001-10-09

Family

ID=22349684

Family Applications (1)

Application Number Title Priority Date Filing Date
BR9916368-3A BR9916368A (pt) 1998-12-21 1999-12-06 Análise de emissão fluorescente de raio x para determinar concentração de material

Country Status (10)

Country Link
US (1) US6148059A (pt)
EP (1) EP1147407A4 (pt)
JP (1) JP2002533674A (pt)
KR (1) KR20010080775A (pt)
CN (1) CN1331798A (pt)
AU (1) AU2167500A (pt)
BR (1) BR9916368A (pt)
CA (1) CA2355742A1 (pt)
TW (1) TW464760B (pt)
WO (1) WO2000037929A1 (pt)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2350320A1 (en) * 1998-11-06 2000-05-18 Corning Incorporated Methods and apparatus using attenuation of radiation to determine concentration of material in object
KR100997091B1 (ko) * 2008-04-22 2010-11-30 한국원자력연구원 엑스선을 이용한 수분함량 분석방법
US20100169044A1 (en) * 2008-12-18 2010-07-01 Benefiel John R Method of Determining Weight Of Segments Of An Item
JP5504917B2 (ja) * 2010-01-27 2014-05-28 株式会社リコー 画像形成システム
WO2020047837A1 (en) * 2018-09-07 2020-03-12 Shenzhen Xpectvision Technology Co., Ltd. Systems and methods of controlling electroplating
CN110132188B (zh) * 2019-06-19 2020-11-10 中国人民解放军空军工程大学 一种基于多元素x射线特征光谱综合分析的涂渗层厚度计算方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1183514A (en) * 1967-04-28 1970-03-11 Atomic Energy Authority Uk Improvements in or relating to the analysis of materials
JPS5244657A (en) * 1975-10-06 1977-04-07 Hitachi Ltd Method of measuring thin film charcteristics by fluorescent x-rays met hod
US4349736A (en) * 1977-10-17 1982-09-14 Miller Bob R Method for locating and evaluating subsurface uranium deposits having an apparent grade of up to approximately 5% contained U3 O8
US4161656A (en) * 1978-03-28 1979-07-17 Bell Telephone Laboratories, Incorporated Methods for measuring dopant concentrations in optical fibers and preforms
US4292341A (en) * 1980-02-26 1981-09-29 Bell Telephone Laboratories, Incorporated Method of controlling the index profile of optical fiber preforms
JPS6241737A (ja) * 1985-08-14 1987-02-23 Furukawa Electric Co Ltd:The 光フアイバ母材の製造方法
US5027379A (en) * 1990-02-22 1991-06-25 Bp America Inc. Method for identifying drilling mud filtrate invasion of a core sample from a subterranean formation
DE4021617C2 (de) * 1990-07-06 1993-12-02 Kugelfischer G Schaefer & Co Vorrichtung zum kontinuierlichen Messen des Eisengehaltes in Zinkschichten
JPH05264480A (ja) * 1992-03-17 1993-10-12 Sumitomo Metal Ind Ltd 蛍光ｘ線分析方法および該方法に使用する装置
JPH08152378A (ja) * 1994-11-29 1996-06-11 Nikon Corp 光ファイバーの検査方法および装置
US5537451A (en) * 1995-05-26 1996-07-16 Pohl Otto Method and apparatus for detecting trace elements in a substance through x-ray fluorescence
US6023496A (en) * 1997-04-30 2000-02-08 Shimadzu Corporation X-ray fluorescence analyzing apparatus

Also Published As

Publication number Publication date
KR20010080775A (ko) 2001-08-22
EP1147407A1 (en) 2001-10-24
CN1331798A (zh) 2002-01-16
EP1147407A4 (en) 2003-01-29
TW464760B (en) 2001-11-21
JP2002533674A (ja) 2002-10-08
WO2000037929A1 (en) 2000-06-29
AU2167500A (en) 2000-07-12
CA2355742A1 (en) 2000-06-29
US6148059A (en) 2000-11-14

Similar Documents

Publication Publication Date Title
BR9807603A (pt) Aparelho e método para detectar uma composição de pluma de descarga
MY119650A (en) Method for the fractional condensation of a hot gas mixture containing acrylic acid or methacrylic acid and having a high proportion of non-condensable constituents
FR2764280B1 (fr) Procede pour la fabrication de carbone 60
FI951673A (fi) Menetelmä ja laite glukoosianalyysiä varten biologisessa matriisissa
ATE208658T1 (de) Vorrichtung und verfahren zur nukleinsäurevervielfältigung
EP1837647A3 (en) Multiplexed capillary electrophoresis method
EP0793404A3 (en) X-ray apparatus
FR2670774B1 (fr) Vitrage diffusant.
AU7911087A (en) Optical analysis
BR9916368A (pt) Análise de emissão fluorescente de raio x para determinar concentração de material
SE8500201D0 (sv) Forfarande for analys av dna-fragment
ATE79097T1 (de) Verfahren und vorrichtung zur reinigung von trinkwasser mittels sonnenlicht und -waerme.
BR9004568A (pt) Aparelho de iluminacao,metodo para aperfeicoar seletivamente radiacao de fonte e metodo para aperfeicoar operacao de fonte de radiacao por descarga de gas
CN106501192A (zh) 气体分析仪
ES2052034T3 (es) Metodo y aparato para la fabricacion de tubos con agujeros.
SE8102772L (sv) Forfarande for laserinducerad fluoriscensdetektering och anordning for genomforande av forfarandet
DE59007050D1 (de) Partikelzähler.
WO2004084592A3 (en) Device for and method of generating extreme ultraviolet and/or soft x-ray radiation by means of a plasma
SE8304180D0 (sv) Sett och anordning for optisk inspektion
BR0112793B1 (pt) aparelho e método para tratar termicamente uma pluralidade de ferramentas de corte.
Alferdinck et al. Discomfort glare from D1 headlamps of different size
BR0205111A (pt) Processo para obter um rebordo de cola, e, dispositivo para obter a formação de rebordos de cola
WO2000055608A3 (en) Method and apparatus for the analysis of material composition
WO2003031959A3 (en) Method for performing a transmission diffraction analysis
BR0005375A (pt) Disposição optoeletrÈnica

Legal Events

Date Code Title Description
B11A Dismissal acc. art.33 of ipl - examination not requested within 36 months of filing
B11Y Definitive dismissal - extension of time limit for request of examination expired [chapter 11.1.1 patent gazette]