BR9804048A - Processo de analisar um elemento ou composto em uma amostra e dispositivo para executar o mesmo - Google Patents

Processo de analisar um elemento ou composto em uma amostra e dispositivo para executar o mesmo

Info

Publication number
BR9804048A
BR9804048A BR9804048-0A BR9804048A BR9804048A BR 9804048 A BR9804048 A BR 9804048A BR 9804048 A BR9804048 A BR 9804048A BR 9804048 A BR9804048 A BR 9804048A
Authority
BR
Brazil
Prior art keywords
compound
sample
energizing
spectrum
pure
Prior art date
Application number
BR9804048-0A
Other languages
English (en)
Inventor
Peter Thebock
Original Assignee
Wahoo Trust
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wahoo Trust filed Critical Wahoo Trust
Publication of BR9804048A publication Critical patent/BR9804048A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2255—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident ion beams, e.g. proton beams
    • G01N23/2257—Measuring excited X-rays, i.e. particle-induced X-ray emission [PIXE]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

"PROCESSO DE ANALISAR UM ELEMENTO OU COMPOSTO EM UMA AMOSTRA E DISPOSITIVO PARA EXECUTAR O MESMO". Um processo de análise elementar qualitativa e quantitativa de uma amostra é efetuada, primeiro, pela energização de um ânodo contendo ou um dos elementos ou um seu composto energizando o anódo de elemento puro ou ânodo composto com um feixe "e" pulsado e obtendo um espectro do feixe de raios-X produzido, e, então, energizando a amostra a ser analisada com um feixe de raios-X pulsado, obtendo um espectro do feixe de raios-X produzido e o superpondo entre a linha zero e o espectro do elemento puro ou composto, e comparando os espectros quanto à semelhança qualitativa, e, se semelhante, determinar a concentração relativa do elemento ou composto na amostra pela medição direta dos espectros superpostos, calibrando os mencionados dados pela subtração da função de resposta resolução/energia usada como uma linha zero do elemento puro ou composto.
BR9804048-0A 1997-10-25 1998-10-22 Processo de analisar um elemento ou composto em uma amostra e dispositivo para executar o mesmo BR9804048A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB9722478.6A GB9722478D0 (en) 1997-10-25 1997-10-25 Analysis of chemical elements

Publications (1)

Publication Number Publication Date
BR9804048A true BR9804048A (pt) 2001-03-20

Family

ID=10821028

Family Applications (1)

Application Number Title Priority Date Filing Date
BR9804048-0A BR9804048A (pt) 1997-10-25 1998-10-22 Processo de analisar um elemento ou composto em uma amostra e dispositivo para executar o mesmo

Country Status (9)

Country Link
EP (1) EP0911627A1 (pt)
JP (1) JPH11201918A (pt)
AR (1) AR015982A1 (pt)
AU (1) AU759024B2 (pt)
BR (1) BR9804048A (pt)
CA (1) CA2251182A1 (pt)
GB (1) GB9722478D0 (pt)
IL (1) IL126620A (pt)
ZA (1) ZA989501B (pt)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6477227B1 (en) 2000-11-20 2002-11-05 Keymaster Technologies, Inc. Methods for identification and verification
US6501825B2 (en) 2001-01-19 2002-12-31 Keymaster Technologies, Inc. Methods for identification and verification
US6909770B2 (en) 2001-12-05 2005-06-21 The United States Of America As Represented By The United States National Aeronautics And Space Administration Methods for identification and verification using vacuum XRF system
US6850592B2 (en) 2002-04-12 2005-02-01 Keymaster Technologies, Inc. Methods for identification and verification using digital equivalent data system
EP1609155A4 (en) 2003-04-01 2009-09-23 Keymaster Technologies Inc SOURCE OUT OF RADIOACTIVITY REQUIREMENTS FOR X-RAY FLUORESCENCE DEVICE
US9952165B2 (en) 2012-04-19 2018-04-24 University Of Leicester Methods and apparatus for X-ray diffraction
CN108132270A (zh) * 2017-12-27 2018-06-08 吴俊逸 一种烟花爆竹用烟火药中镉元素的快速定性检测方法
CN108195862A (zh) * 2017-12-27 2018-06-22 吴俊逸 一种烟花爆竹用烟火药中铋元素的快速定性检测方法
CN108120734A (zh) * 2017-12-27 2018-06-05 吴俊逸 一种烟花爆竹用烟火药中铝元素的快速定性检测方法
CN108120733A (zh) * 2017-12-27 2018-06-05 吴俊逸 一种烟花爆竹用烟火药中钾元素的快速定性检测方法
CN108132269A (zh) * 2017-12-27 2018-06-08 吴俊逸 一种烟花爆竹用烟火药中锑元素的快速定性检测方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4612660A (en) * 1985-05-17 1986-09-16 The United States Of America As Represented By The Secretary Of The Navy Time resolved extended X-ray absorption fine structure spectrometer

Also Published As

Publication number Publication date
AU759024B2 (en) 2003-04-03
IL126620A0 (en) 1999-08-17
AR015982A1 (es) 2001-05-30
AU8937798A (en) 1999-05-13
IL126620A (en) 2001-10-31
GB9722478D0 (en) 1997-12-24
EP0911627A1 (en) 1999-04-28
CA2251182A1 (en) 1999-04-25
ZA989501B (en) 1999-07-28
JPH11201918A (ja) 1999-07-30

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Legal Events

Date Code Title Description
B25A Requested transfer of rights approved

Free format text: ZARYX (PTY) LIMITED (ZA)

B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 6A , 7A E 8A ANUIDADES.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 1871 DE 14/11/2006.