ZA989501B - Analysis of chemical elements - Google Patents
Analysis of chemical elementsInfo
- Publication number
- ZA989501B ZA989501B ZA989501A ZA989501A ZA989501B ZA 989501 B ZA989501 B ZA 989501B ZA 989501 A ZA989501 A ZA 989501A ZA 989501 A ZA989501 A ZA 989501A ZA 989501 B ZA989501 B ZA 989501B
- Authority
- ZA
- South Africa
- Prior art keywords
- analysis
- chemical elements
- chemical
- elements
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
- G01N23/2255—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident ion beams, e.g. proton beams
- G01N23/2257—Measuring excited X-rays, i.e. particle-induced X-ray emission [PIXE]
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB9722478.6A GB9722478D0 (en) | 1997-10-25 | 1997-10-25 | Analysis of chemical elements |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ZA989501B true ZA989501B (en) | 1999-07-28 |
Family
ID=10821028
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ZA989501A ZA989501B (en) | 1997-10-25 | 1998-10-19 | Analysis of chemical elements |
Country Status (9)
| Country | Link |
|---|---|
| EP (1) | EP0911627A1 (pt) |
| JP (1) | JPH11201918A (pt) |
| AR (1) | AR015982A1 (pt) |
| AU (1) | AU759024B2 (pt) |
| BR (1) | BR9804048A (pt) |
| CA (1) | CA2251182A1 (pt) |
| GB (1) | GB9722478D0 (pt) |
| IL (1) | IL126620A (pt) |
| ZA (1) | ZA989501B (pt) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6477227B1 (en) | 2000-11-20 | 2002-11-05 | Keymaster Technologies, Inc. | Methods for identification and verification |
| US6501825B2 (en) | 2001-01-19 | 2002-12-31 | Keymaster Technologies, Inc. | Methods for identification and verification |
| US6909770B2 (en) | 2001-12-05 | 2005-06-21 | The United States Of America As Represented By The United States National Aeronautics And Space Administration | Methods for identification and verification using vacuum XRF system |
| US6850592B2 (en) | 2002-04-12 | 2005-02-01 | Keymaster Technologies, Inc. | Methods for identification and verification using digital equivalent data system |
| WO2004089056A2 (en) | 2003-04-01 | 2004-10-21 | Keymaster Technologies, Inc. | Exempt source for an x-ray fluorescence device |
| US9952165B2 (en) | 2012-04-19 | 2018-04-24 | University Of Leicester | Methods and apparatus for X-ray diffraction |
| CN108132269A (zh) * | 2017-12-27 | 2018-06-08 | 吴俊逸 | 一种烟花爆竹用烟火药中锑元素的快速定性检测方法 |
| CN108195862A (zh) * | 2017-12-27 | 2018-06-22 | 吴俊逸 | 一种烟花爆竹用烟火药中铋元素的快速定性检测方法 |
| CN108132270A (zh) * | 2017-12-27 | 2018-06-08 | 吴俊逸 | 一种烟花爆竹用烟火药中镉元素的快速定性检测方法 |
| CN108120734A (zh) * | 2017-12-27 | 2018-06-05 | 吴俊逸 | 一种烟花爆竹用烟火药中铝元素的快速定性检测方法 |
| CN108120733A (zh) * | 2017-12-27 | 2018-06-05 | 吴俊逸 | 一种烟花爆竹用烟火药中钾元素的快速定性检测方法 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4612660A (en) * | 1985-05-17 | 1986-09-16 | The United States Of America As Represented By The Secretary Of The Navy | Time resolved extended X-ray absorption fine structure spectrometer |
-
1997
- 1997-10-25 GB GBGB9722478.6A patent/GB9722478D0/en not_active Ceased
-
1998
- 1998-10-15 EP EP98308417A patent/EP0911627A1/en not_active Withdrawn
- 1998-10-15 IL IL12662098A patent/IL126620A/en not_active IP Right Cessation
- 1998-10-16 AU AU89377/98A patent/AU759024B2/en not_active Ceased
- 1998-10-19 ZA ZA989501A patent/ZA989501B/xx unknown
- 1998-10-22 BR BR9804048-0A patent/BR9804048A/pt not_active IP Right Cessation
- 1998-10-23 AR ARP980105317A patent/AR015982A1/es unknown
- 1998-10-26 CA CA2251182A patent/CA2251182A1/en not_active Abandoned
- 1998-10-26 JP JP10304266A patent/JPH11201918A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| CA2251182A1 (en) | 1999-04-25 |
| AU8937798A (en) | 1999-05-13 |
| JPH11201918A (ja) | 1999-07-30 |
| IL126620A0 (en) | 1999-08-17 |
| AR015982A1 (es) | 2001-05-30 |
| EP0911627A1 (en) | 1999-04-28 |
| BR9804048A (pt) | 2001-03-20 |
| AU759024B2 (en) | 2003-04-03 |
| GB9722478D0 (en) | 1997-12-24 |
| IL126620A (en) | 2001-10-31 |
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