BR9202063A - Dispositivos de circuito integrado ou impresso,testador para os mesmos,metodos de teste e computador pessoal que os compreende - Google Patents

Dispositivos de circuito integrado ou impresso,testador para os mesmos,metodos de teste e computador pessoal que os compreende

Info

Publication number
BR9202063A
BR9202063A BR929202063A BR9202063A BR9202063A BR 9202063 A BR9202063 A BR 9202063A BR 929202063 A BR929202063 A BR 929202063A BR 9202063 A BR9202063 A BR 9202063A BR 9202063 A BR9202063 A BR 9202063A
Authority
BR
Brazil
Prior art keywords
integrated
personal computer
printed circuit
understands
tester
Prior art date
Application number
BR929202063A
Other languages
English (en)
Inventor
Daniel P Fuoco
Luis A Hernandez
Eric Mathisen
Jonathan H Raymond
Esmaeil Tashakori
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of BR9202063A publication Critical patent/BR9202063A/pt

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/2733—Test interface between tester and unit under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/70—Testing of connections between components and printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31915—In-circuit Testers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
BR929202063A 1991-06-10 1992-05-29 Dispositivos de circuito integrado ou impresso,testador para os mesmos,metodos de teste e computador pessoal que os compreende BR9202063A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US71348991A 1991-06-10 1991-06-10

Publications (1)

Publication Number Publication Date
BR9202063A true BR9202063A (pt) 1993-02-02

Family

ID=24866347

Family Applications (1)

Application Number Title Priority Date Filing Date
BR929202063A BR9202063A (pt) 1991-06-10 1992-05-29 Dispositivos de circuito integrado ou impresso,testador para os mesmos,metodos de teste e computador pessoal que os compreende

Country Status (3)

Country Link
EP (1) EP0518550A3 (pt)
JP (1) JPH05107295A (pt)
BR (1) BR9202063A (pt)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5715254A (en) * 1994-11-21 1998-02-03 Texas Instruments Incorporated Very low overhead shared resource boundary scan design
US5732091A (en) * 1994-11-21 1998-03-24 Texas Instruments Incorporated Self initializing and correcting shared resource boundary scan with output latching
US5715255A (en) * 1994-11-21 1998-02-03 Texas Instruments Incorporated Low overhead memory designs for IC terminals
US5701307A (en) * 1994-12-16 1997-12-23 Texas Instruments Incorporated Low overhead input and output boundary scan cells
US5706296A (en) * 1995-02-28 1998-01-06 Texas Instruments Incorporated Bi-directional scan design with memory and latching circuitry
US5880595A (en) * 1995-04-28 1999-03-09 Texas Instruments Incorporated IC having memoried terminals and zero-delay boundary scan
US5938783A (en) * 1995-04-28 1999-08-17 Texas Instruments Incorporated Dual mode memory for IC terminals
US5656953A (en) * 1995-05-31 1997-08-12 Texas Instruments Incorporated Low overhead memory designs for IC terminals
US6405335B1 (en) 1998-02-25 2002-06-11 Texas Instruments Incorporated Position independent testing of circuits
US6728915B2 (en) 2000-01-10 2004-04-27 Texas Instruments Incorporated IC with shared scan cells selectively connected in scan path
US6769080B2 (en) 2000-03-09 2004-07-27 Texas Instruments Incorporated Scan circuit low power adapter with counter

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4703484A (en) * 1985-12-19 1987-10-27 Harris Corporation Programmable integrated circuit fault detection apparatus
JPS63195582A (ja) * 1987-02-06 1988-08-12 Mitsubishi Electric Corp Ｌｓｉ内部回路のテスト回路

Also Published As

Publication number Publication date
EP0518550A2 (en) 1992-12-16
EP0518550A3 (en) 1994-08-10
JPH05107295A (ja) 1993-04-27

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Legal Events

Date Code Title Description
FB36 Technical and formal requirements: requirement - article 36 of industrial property law
FA8 Dismissal: dismissal - article 36, par. 1 of industrial property law