BR7307535D0 - Processo aperfeicoado para testar aparas logicas individuais e painel plano aperfeicoado dotado das referidas apara - Google Patents
Processo aperfeicoado para testar aparas logicas individuais e painel plano aperfeicoado dotado das referidas aparaInfo
- Publication number
- BR7307535D0 BR7307535D0 BR7535/73A BR753573A BR7307535D0 BR 7307535 D0 BR7307535 D0 BR 7307535D0 BR 7535/73 A BR7535/73 A BR 7535/73A BR 753573 A BR753573 A BR 753573A BR 7307535 D0 BR7307535 D0 BR 7307535D0
- Authority
- BR
- Brazil
- Prior art keywords
- perfect
- apara
- appliances
- individual logic
- testing individual
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31915—In-circuit Testers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US29327072A | 1972-09-28 | 1972-09-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
BR7307535D0 true BR7307535D0 (pt) | 1974-08-29 |
Family
ID=23128409
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR7535/73A BR7307535D0 (pt) | 1972-09-28 | 1973-09-27 | Processo aperfeicoado para testar aparas logicas individuais e painel plano aperfeicoado dotado das referidas apara |
Country Status (9)
Country | Link |
---|---|
US (1) | US3789205A (pt) |
JP (1) | JPS5245620B2 (pt) |
BR (1) | BR7307535D0 (pt) |
CA (1) | CA986183A (pt) |
DE (1) | DE2341951C2 (pt) |
GB (1) | GB1416787A (pt) |
IT (1) | IT1007532B (pt) |
NL (1) | NL171201C (pt) |
SE (1) | SE384283B (pt) |
Families Citing this family (38)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2330014A1 (fr) * | 1973-05-11 | 1977-05-27 | Ibm France | Procede de test de bloc de circuits logiques integres et blocs en faisant application |
US3904861A (en) * | 1974-03-13 | 1975-09-09 | Digital Equipment Corp | Printed circuit board testing unit |
US3958110A (en) * | 1974-12-18 | 1976-05-18 | Ibm Corporation | Logic array with testing circuitry |
US3961254A (en) * | 1974-12-20 | 1976-06-01 | International Business Machines Corporation | Testing embedded arrays |
US3961251A (en) * | 1974-12-20 | 1976-06-01 | International Business Machines Corporation | Testing embedded arrays |
US3961252A (en) * | 1974-12-20 | 1976-06-01 | International Business Machines Corporation | Testing embedded arrays |
IN146507B (pt) * | 1975-09-29 | 1979-06-23 | Ericsson Telefon Ab L M | |
US4066880A (en) * | 1976-03-30 | 1978-01-03 | Engineered Systems, Inc. | System for pretesting electronic memory locations and automatically identifying faulty memory sections |
US4140967A (en) * | 1977-06-24 | 1979-02-20 | International Business Machines Corporation | Merged array PLA device, circuit, fabrication method and testing technique |
JPS54121036A (en) * | 1978-03-13 | 1979-09-19 | Cho Lsi Gijutsu Kenkyu Kumiai | Method of testing function of logic circuit |
FR2432175A1 (fr) * | 1978-07-27 | 1980-02-22 | Cii Honeywell Bull | Procede pour tester un systeme logique et systeme logique pour la mise en oeuvre de ce procede |
US4220917A (en) * | 1978-07-31 | 1980-09-02 | International Business Machines Corporation | Test circuitry for module interconnection network |
US4241307A (en) * | 1978-08-18 | 1980-12-23 | International Business Machines Corporation | Module interconnection testing scheme |
US4236246A (en) * | 1978-11-03 | 1980-11-25 | Genrad, Inc. | Method of and apparatus for testing electronic circuit assemblies and the like |
US4244048A (en) * | 1978-12-29 | 1981-01-06 | International Business Machines Corporation | Chip and wafer configuration and testing method for large-scale-integrated circuits |
DE2944149C2 (de) * | 1979-11-02 | 1985-02-21 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Integrierte Schaltungsanordnung in MOS-Technik |
DE3029883A1 (de) * | 1980-08-07 | 1982-03-11 | Ibm Deutschland Gmbh, 7000 Stuttgart | Schieberegister fuer pruef- und test-zwecke |
US4479088A (en) * | 1981-01-16 | 1984-10-23 | Burroughs Corporation | Wafer including test lead connected to ground for testing networks thereon |
FR2501867A1 (fr) * | 1981-03-11 | 1982-09-17 | Commissariat Energie Atomique | Systeme de test de la defaillance ou du bon fonctionnement d'un circuit a composants logiques |
US4404635A (en) * | 1981-03-27 | 1983-09-13 | International Business Machines Corporation | Programmable integrated circuit and method of testing the circuit before it is programmed |
FR2506045A1 (fr) * | 1981-05-15 | 1982-11-19 | Thomson Csf | Procede et dispositif de selection de circuits integres a haute fiabilite |
US4494066A (en) * | 1981-07-02 | 1985-01-15 | International Business Machines Corporation | Method of electrically testing a packaging structure having n interconnected integrated circuit chips |
US4441075A (en) * | 1981-07-02 | 1984-04-03 | International Business Machines Corporation | Circuit arrangement which permits the testing of each individual chip and interchip connection in a high density packaging structure having a plurality of interconnected chips, without any physical disconnection |
US4504784A (en) * | 1981-07-02 | 1985-03-12 | International Business Machines Corporation | Method of electrically testing a packaging structure having N interconnected integrated circuit chips |
US4410987B1 (en) * | 1981-07-13 | 1995-02-28 | Texas Instruments Inc | Preload test circuit for programmable logic arrays |
US4808915A (en) * | 1981-10-30 | 1989-02-28 | Honeywell Bull, Inc. | Assembly of electronic components testable by a reciprocal quiescent testing technique |
US4556840A (en) * | 1981-10-30 | 1985-12-03 | Honeywell Information Systems Inc. | Method for testing electronic assemblies |
US4503386A (en) * | 1982-04-20 | 1985-03-05 | International Business Machines Corporation | Chip partitioning aid (CPA)-A structure for test pattern generation for large logic networks |
US4509008A (en) * | 1982-04-20 | 1985-04-02 | International Business Machines Corporation | Method of concurrently testing each of a plurality of interconnected integrated circuit chips |
US4691161A (en) * | 1985-06-13 | 1987-09-01 | Raytheon Company | Configurable logic gate array |
US4644265A (en) * | 1985-09-03 | 1987-02-17 | International Business Machines Corporation | Noise reduction during testing of integrated circuit chips |
EP0233634A3 (de) * | 1986-02-20 | 1989-07-26 | Siemens Aktiengesellschaft | Verfahren zum Funktionstest von digitalen Bausteinen |
JPH0711787B2 (ja) * | 1987-03-02 | 1995-02-08 | 日本電気株式会社 | デ−タ処理装置 |
EP0352910A3 (en) * | 1988-07-28 | 1991-04-17 | Digital Equipment Corporation | Finding faults in circuit boards |
US5406197A (en) * | 1992-07-31 | 1995-04-11 | International Business Machines Corporation | Apparatus for controlling test inputs of circuits on an electronic module |
US5446399A (en) * | 1994-11-18 | 1995-08-29 | Varian Associates, Inc. | Method and structure for a fault-free input configuration control mechanism |
US5847561A (en) * | 1994-12-16 | 1998-12-08 | Texas Instruments Incorporated | Low overhead input and output boundary scan cells |
US7340660B2 (en) * | 2003-10-07 | 2008-03-04 | International Business Machines Corporation | Method and system for using statistical signatures for testing high-speed circuits |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2961607A (en) * | 1956-07-27 | 1960-11-22 | Gen Precision Inc | Automatic testing system |
US3445811A (en) * | 1964-08-10 | 1969-05-20 | Fujitsu Ltd | Error system for logic circuits |
US3471778A (en) * | 1967-01-13 | 1969-10-07 | Ibm | Method of testing an ordered,multi-element electrical circuit array including connecting certain elements in common |
US3469186A (en) * | 1967-03-14 | 1969-09-23 | Us Navy | Stimulus injection system for localizing defective components in cascaded systems |
DE1951861A1 (de) * | 1968-10-17 | 1970-08-06 | Gen Electric Information Syste | Verfahren und Anordnung zur automatischen UEberpruefung von Karten mit gedruckten Schaltungen |
US3614608A (en) * | 1969-05-19 | 1971-10-19 | Ibm | Random number statistical logic test system |
US3633016A (en) * | 1970-03-04 | 1972-01-04 | Digital General Corp | Apparatus and method for testing electrical systems having a plurality of terminals |
US3681757A (en) * | 1970-06-10 | 1972-08-01 | Cogar Corp | System for utilizing data storage chips which contain operating and non-operating storage cells |
-
1972
- 1972-09-28 US US00293270A patent/US3789205A/en not_active Expired - Lifetime
-
1973
- 1973-07-24 IT IT26963/73A patent/IT1007532B/it active
- 1973-08-14 JP JP48090617A patent/JPS5245620B2/ja not_active Expired
- 1973-08-16 NL NLAANVRAGE7311289,A patent/NL171201C/xx not_active IP Right Cessation
- 1973-08-20 DE DE2341951A patent/DE2341951C2/de not_active Expired
- 1973-08-20 GB GB3924173A patent/GB1416787A/en not_active Expired
- 1973-09-05 SE SE7312054A patent/SE384283B/xx unknown
- 1973-09-18 CA CA181,280A patent/CA986183A/en not_active Expired
- 1973-09-27 BR BR7535/73A patent/BR7307535D0/pt unknown
Also Published As
Publication number | Publication date |
---|---|
US3789205A (en) | 1974-01-29 |
NL171201B (nl) | 1982-09-16 |
NL7311289A (pt) | 1974-04-01 |
SE384283B (sv) | 1976-04-26 |
DE2341951A1 (de) | 1974-04-11 |
JPS5245620B2 (pt) | 1977-11-17 |
CA986183A (en) | 1976-03-23 |
GB1416787A (en) | 1975-12-10 |
IT1007532B (it) | 1976-10-30 |
JPS4973082A (pt) | 1974-07-15 |
NL171201C (nl) | 1983-02-16 |
DE2341951C2 (de) | 1982-01-07 |
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