BR112022001465A2 - Calibração e monitoramento automatizados por raio-x - Google Patents

Calibração e monitoramento automatizados por raio-x

Info

Publication number
BR112022001465A2
BR112022001465A2 BR112022001465A BR112022001465A BR112022001465A2 BR 112022001465 A2 BR112022001465 A2 BR 112022001465A2 BR 112022001465 A BR112022001465 A BR 112022001465A BR 112022001465 A BR112022001465 A BR 112022001465A BR 112022001465 A2 BR112022001465 A2 BR 112022001465A2
Authority
BR
Brazil
Prior art keywords
electromagnetic
automated
monitoring
levels
ray calibration
Prior art date
Application number
BR112022001465A
Other languages
English (en)
Inventor
M Butt Amer
C Gill Jeffrey
D Timperio Richard
Original Assignee
John Bean Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by John Bean Technologies Corp filed Critical John Bean Technologies Corp
Publication of BR112022001465A2 publication Critical patent/BR112022001465A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/02—Food
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/03—Investigating materials by wave or particle radiation by transmission
    • G01N2223/04—Investigating materials by wave or particle radiation by transmission and measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
    • G01N2223/3035—Accessories, mechanical or electrical features calibrating, standardising phantom
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/306—Accessories, mechanical or electrical features computer control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/316—Accessories, mechanical or electrical features collimators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3307—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts source and detector fixed; object moves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3308—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object translates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G01N2223/501—Detectors array
    • G01N2223/5015—Detectors array linear array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/618—Specific applications or type of materials food
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/645—Specific applications or type of materials quality control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts

Abstract

calibração e monitoramento automatizados por raio. um digitalizador compreende uma fonte de onda eletromagnética; um colimador posicionado para alterar as ondas eletromagnéticas emitidas da fonte de ondas eletromagnéticas em um feixe eletromagnético; e um detector posicionado para medir um ou mais níveis de energia eletromagnética do feixe eletromagnético, em que um elemento do colimador é espacialmente ajustável em pelo menos um eixo por meio de um ou mais mecanismos de ajuste para alterar um ou mais níveis da energia eletromagnética medida no detector.
BR112022001465A 2019-08-16 2020-08-13 Calibração e monitoramento automatizados por raio-x BR112022001465A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201962888209P 2019-08-16 2019-08-16
PCT/US2020/046178 WO2021034610A1 (en) 2019-08-16 2020-08-13 X-ray automated calibration and monitoring

Publications (1)

Publication Number Publication Date
BR112022001465A2 true BR112022001465A2 (pt) 2022-03-22

Family

ID=72240515

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112022001465A BR112022001465A2 (pt) 2019-08-16 2020-08-13 Calibração e monitoramento automatizados por raio-x

Country Status (7)

Country Link
US (1) US20220291148A1 (pt)
EP (1) EP4014029A1 (pt)
CN (1) CN114222915A (pt)
AU (1) AU2020332297A1 (pt)
BR (1) BR112022001465A2 (pt)
CA (1) CA3147108A1 (pt)
WO (1) WO2021034610A1 (pt)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11977037B2 (en) 2018-10-22 2024-05-07 Rapiscan Holdings, Inc. Insert for screening tray
US20230017006A1 (en) * 2021-07-16 2023-01-19 Voti Inc. Material detection in x-ray security screening

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7356115B2 (en) * 2002-12-04 2008-04-08 Varian Medical Systems Technology, Inc. Radiation scanning units including a movable platform
US7742568B2 (en) * 2007-06-09 2010-06-22 Spectrum San Diego, Inc. Automobile scanning system
EP2130494A1 (en) * 2008-06-06 2009-12-09 Helmholtz Zentrum München Deutsches Forschungszentrum für Gesundheit und Umwelt (GmbH) Scanner device and method for computed tomography imaging
GB201001736D0 (en) * 2010-02-03 2010-03-24 Rapiscan Security Products Inc Scanning systems
US8948338B2 (en) * 2011-11-03 2015-02-03 Medtronic Navigation, Inc. Dynamically scanned X-ray detector panel
US8989348B2 (en) * 2011-11-18 2015-03-24 Visuum, Llc Multi-linear X-ray scanning systems and methods for X-ray scanning
WO2014107493A1 (en) * 2013-01-04 2014-07-10 American Science And Engineering, Inc. Dynamic dose reduction in x-ray inspection
CN104634796B (zh) * 2014-12-11 2017-12-12 清华大学 用于集装箱或车辆检查系统的对准系统和对准方法
WO2021034829A1 (en) * 2019-08-22 2021-02-25 John Bean Technologies Corporation X-ray unit technology modules and automated application training

Also Published As

Publication number Publication date
CN114222915A (zh) 2022-03-22
CA3147108A1 (en) 2021-02-25
US20220291148A1 (en) 2022-09-15
EP4014029A1 (en) 2022-06-22
WO2021034610A4 (en) 2021-05-20
WO2021034610A1 (en) 2021-02-25
AU2020332297A1 (en) 2022-02-10

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