BR112018006139A2 - dispositivo emissor de luz e método de fabricação de um dispositivo emissor de luz - Google Patents
dispositivo emissor de luz e método de fabricação de um dispositivo emissor de luzInfo
- Publication number
- BR112018006139A2 BR112018006139A2 BR112018006139A BR112018006139A BR112018006139A2 BR 112018006139 A2 BR112018006139 A2 BR 112018006139A2 BR 112018006139 A BR112018006139 A BR 112018006139A BR 112018006139 A BR112018006139 A BR 112018006139A BR 112018006139 A2 BR112018006139 A2 BR 112018006139A2
- Authority
- BR
- Brazil
- Prior art keywords
- light emitting
- emitting device
- light
- processing
- manufacturing
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title abstract 2
- 230000003287 optical effect Effects 0.000 abstract 3
- 239000000463 material Substances 0.000 abstract 2
- 238000003491 array Methods 0.000 abstract 1
- 239000011159 matrix material Substances 0.000 abstract 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18386—Details of the emission surface for influencing the near- or far-field, e.g. a grating on the surface
- H01S5/18388—Lenses
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/44—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the coatings, e.g. passivation layer or anti-reflective coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/028—Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers
- H01S5/0282—Passivation layers or treatments
- H01S5/0283—Optically inactive coating on the facet, e.g. half-wave coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0421—Electrical excitation ; Circuits therefor characterised by the semiconducting contacting layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18386—Details of the emission surface for influencing the near- or far-field, e.g. a grating on the surface
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/42—Arrays of surface emitting lasers
- H01S5/423—Arrays of surface emitting lasers having a vertical cavity
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2301/00—Functional characteristics
- H01S2301/17—Semiconductor lasers comprising special layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/0014—Measuring characteristics or properties thereof
- H01S5/0042—On wafer testing, e.g. lasers are tested before separating wafer into chips
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/0201—Separation of the wafer into individual elements, e.g. by dicing, cleaving, etching or directly during growth
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Structural Engineering (AREA)
- Architecture (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Led Devices (AREA)
- Semiconductor Lasers (AREA)
- Led Device Packages (AREA)
- Surface Treatment Of Optical Elements (AREA)
Abstract
a invenção se refere a um dispositivo emissor de luz (100). o dispositivo emissor de luz (100) compreende pelo menos uma estrutura emissora de luz (110), pelo menos uma camada de processamento (120) e pelo menos uma estrutura óptica (130). a estrutura óptica (130) compreende pelo menos um material processado por meio de luz de processamento (150). a pelo menos uma camada de processamento (120) é disposta para reduzir a reflexão da luz de processamento (150) em uma direção da estrutura óptica (130) em pelo menos 50%, de preferência em pelo menos 80%, com mais preferência em pelo menos 95% e com a máxima preferência em pelo menos 99%, durante o processamento do material por meio da luz de processamento (150). é uma ideia básica da presente invenção incorporar uma camada de processamento com pouca ou nenhuma reflexão (120) sobre uma estrutura emissora de luz (110) como uma matriz de laser de emissão de superfície de cavidade vertical (vcsel - ?vertical cavity surface emitting laser?) para possibilitar o processamento em pastilha de estruturas emissoras de luz (130) como matrizes de microlentes. a invenção se refere adicionalmente a um método de fabricação de tal dispositivo emissor de luz (100).
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP15187849 | 2015-10-01 | ||
PCT/EP2016/072498 WO2017055160A1 (en) | 2015-10-01 | 2016-09-22 | Light emitting device |
Publications (1)
Publication Number | Publication Date |
---|---|
BR112018006139A2 true BR112018006139A2 (pt) | 2018-10-23 |
Family
ID=54252121
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR112018006139A BR112018006139A2 (pt) | 2015-10-01 | 2016-09-22 | dispositivo emissor de luz e método de fabricação de um dispositivo emissor de luz |
Country Status (7)
Country | Link |
---|---|
US (1) | US10381802B2 (pt) |
EP (1) | EP3357134A1 (pt) |
JP (1) | JP6783435B2 (pt) |
CN (1) | CN108141011B (pt) |
BR (1) | BR112018006139A2 (pt) |
RU (1) | RU2713080C1 (pt) |
WO (1) | WO2017055160A1 (pt) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3447862A1 (en) | 2017-08-23 | 2019-02-27 | Koninklijke Philips N.V. | Vcsel array with common wafer level integrated optical device |
EP3451470A1 (en) | 2017-08-30 | 2019-03-06 | Koninklijke Philips N.V. | Laser arrangement comprising a vcsel array |
EP3561553A1 (en) | 2018-04-25 | 2019-10-30 | Koninklijke Philips N.V. | Laser arrangement with reduced scattering loss |
EP3598591A1 (en) | 2018-07-17 | 2020-01-22 | Koninklijke Philips N.V. | Laser arrangement with reduced building height |
US11641007B2 (en) | 2019-12-16 | 2023-05-02 | Lumileds Llc | Light-emitting device with internal non-specular light redirection and anti-reflective exit surface |
DE102021211736A1 (de) | 2021-10-18 | 2023-04-20 | Robert Bosch Gesellschaft mit beschränkter Haftung | Verfahren zu einer Erzeugung von Mikrooptiken auf Oberflächenemitter-Laserdioden (VCSEL) |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62112102A (ja) * | 1985-11-12 | 1987-05-23 | Dainippon Printing Co Ltd | 反射防止光学フイルタ− |
US6235141B1 (en) | 1996-09-27 | 2001-05-22 | Digital Optics Corporation | Method of mass producing and packaging integrated optical subsystems |
US6410209B1 (en) * | 1998-09-15 | 2002-06-25 | Shipley Company, L.L.C. | Methods utilizing antireflective coating compositions with exposure under 200 nm |
US6117618A (en) * | 1998-11-04 | 2000-09-12 | Advanced Micro Devices, Inc. | Carbonized antireflective coating produced by spin-on polymer material |
JP2002026452A (ja) * | 2000-07-12 | 2002-01-25 | Toyota Central Res & Dev Lab Inc | 面発光型光源及びその製造方法、レーザ加工機用光源 |
JP2002208755A (ja) * | 2000-11-13 | 2002-07-26 | Fuji Xerox Co Ltd | 面発光型半導体レーザ |
US7065656B2 (en) | 2001-07-03 | 2006-06-20 | Hewlett-Packard Development Company, L.P. | Tamper-evident/tamper-resistant electronic components |
JP2004119583A (ja) * | 2002-09-25 | 2004-04-15 | Seiko Epson Corp | 光学素子の製造方法 |
EP1460738A3 (en) | 2003-03-21 | 2004-09-29 | Avalon Photonics AG | Wafer-scale replication-technique for opto-mechanical structures on opto-electronic devices |
JP2005072130A (ja) * | 2003-08-21 | 2005-03-17 | Mitsubishi Electric Corp | 半導体レーザ装置 |
JP2005092049A (ja) * | 2003-09-19 | 2005-04-07 | Seiko Epson Corp | 吐出方法、レンズおよびその製造方法、半導体レーザおよびその製造方法、光学装置、ならびに吐出装置 |
EP1569276A1 (en) | 2004-02-27 | 2005-08-31 | Heptagon OY | Micro-optics on optoelectronics |
US7429915B2 (en) | 2005-04-20 | 2008-09-30 | Honeywell International Inc. | System and method for detecting unauthorized access to electronic equipment or components |
JP4720621B2 (ja) | 2005-06-09 | 2011-07-13 | セイコーエプソン株式会社 | レーザ光源装置、表示装置、走査型表示装置およびプロジェクタ |
JP2007258667A (ja) * | 2006-02-21 | 2007-10-04 | Seiko Epson Corp | 光電気複合基板及び電子機器 |
CN101026285A (zh) * | 2006-02-21 | 2007-08-29 | 精工爱普生株式会社 | 光电复合基板以及电子设备 |
JP2011515846A (ja) * | 2008-03-21 | 2011-05-19 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 発光装置 |
JP5768410B2 (ja) * | 2010-04-22 | 2015-08-26 | 信越化学工業株式会社 | 近赤外光吸収膜形成材料及び積層膜 |
CN101887939A (zh) * | 2010-05-24 | 2010-11-17 | 晶科电子(广州)有限公司 | 一种提高led外量子效率的封装结构及其封装方法 |
US8288857B2 (en) | 2010-09-17 | 2012-10-16 | Endicott Interconnect Technologies, Inc. | Anti-tamper microchip package based on thermal nanofluids or fluids |
CN103681293B (zh) * | 2012-09-10 | 2016-04-20 | 中芯国际集成电路制造(上海)有限公司 | 自对准双重图形化方法 |
CN103178161B (zh) * | 2013-03-21 | 2016-04-20 | 武汉电信器件有限公司 | 一种微透镜的制作方法 |
JP6461786B2 (ja) * | 2013-03-29 | 2019-01-30 | アイオーコア株式会社 | 光電気混載デバイス及びその製造方法 |
CN204290034U (zh) * | 2014-11-10 | 2015-04-22 | 李德龙 | 基于光学灌封工艺的vcsel阵列封装结构及其高功率vcsel激光器 |
-
2016
- 2016-09-22 WO PCT/EP2016/072498 patent/WO2017055160A1/en active Application Filing
- 2016-09-22 CN CN201680057997.1A patent/CN108141011B/zh active Active
- 2016-09-22 JP JP2018516109A patent/JP6783435B2/ja active Active
- 2016-09-22 RU RU2018115845A patent/RU2713080C1/ru active
- 2016-09-22 US US15/762,277 patent/US10381802B2/en active Active
- 2016-09-22 BR BR112018006139A patent/BR112018006139A2/pt not_active Application Discontinuation
- 2016-09-22 EP EP16787734.9A patent/EP3357134A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
CN108141011B (zh) | 2020-09-01 |
JP6783435B2 (ja) | 2020-11-11 |
CN108141011A (zh) | 2018-06-08 |
US10381802B2 (en) | 2019-08-13 |
US20180278024A1 (en) | 2018-09-27 |
JP2018530158A (ja) | 2018-10-11 |
RU2713080C1 (ru) | 2020-02-03 |
EP3357134A1 (en) | 2018-08-08 |
WO2017055160A1 (en) | 2017-04-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B06U | Preliminary requirement: requests with searches performed by other patent offices: suspension of the patent application procedure | ||
B11B | Dismissal acc. art. 36, par 1 of ipl - no reply within 90 days to fullfil the necessary requirements |