BR112017007137A2 - scanner de patologia digital - Google Patents

scanner de patologia digital

Info

Publication number
BR112017007137A2
BR112017007137A2 BR112017007137A BR112017007137A BR112017007137A2 BR 112017007137 A2 BR112017007137 A2 BR 112017007137A2 BR 112017007137 A BR112017007137 A BR 112017007137A BR 112017007137 A BR112017007137 A BR 112017007137A BR 112017007137 A2 BR112017007137 A2 BR 112017007137A2
Authority
BR
Brazil
Prior art keywords
radiation
receiving device
sample receiving
sensor unit
source
Prior art date
Application number
BR112017007137A
Other languages
English (en)
Portuguese (pt)
Inventor
Iosif Boamfa Marius
Wimberger-Friedl Reinhold
Bastiaan Johannes Haddeman Theodoor
Original Assignee
Koninklijke Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Nv filed Critical Koninklijke Philips Nv
Publication of BR112017007137A2 publication Critical patent/BR112017007137A2/pt

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B3/00—Simple or compound lenses
    • G02B3/0006—Arrays
    • G02B3/0037—Arrays characterized by the distribution or form of lenses
    • G02B3/005—Arrays characterized by the distribution or form of lenses arranged along a single direction only, e.g. lenticular sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/082—Condensers for incident illumination only
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/12—Condensers affording bright-field illumination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N2021/6463—Optics
    • G01N2021/6471—Special filters, filter wheel
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N2021/6463—Optics
    • G01N2021/6478—Special lenses

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
BR112017007137A 2015-03-19 2016-03-07 scanner de patologia digital BR112017007137A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP15159793 2015-03-19
PCT/EP2016/054724 WO2016146411A1 (en) 2015-03-19 2016-03-07 Illumination in digital pathology scanning

Publications (1)

Publication Number Publication Date
BR112017007137A2 true BR112017007137A2 (pt) 2017-12-19

Family

ID=52726994

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112017007137A BR112017007137A2 (pt) 2015-03-19 2016-03-07 scanner de patologia digital

Country Status (7)

Country Link
US (1) US10268031B2 (enExample)
EP (1) EP3191885B1 (enExample)
JP (2) JP6905932B2 (enExample)
CN (1) CN107076882B (enExample)
BR (1) BR112017007137A2 (enExample)
RU (1) RU2718149C2 (enExample)
WO (1) WO2016146411A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019143558A1 (en) * 2018-01-22 2019-07-25 Verily Life Sciences Llc High-throughput hyperspectral imaging systems
EP3637240B1 (en) * 2018-10-10 2023-06-07 Robert Bosch GmbH Scanning device with improved efficiency and household appliance comprising said scanning device

Family Cites Families (23)

* Cited by examiner, † Cited by third party
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JPS61139746A (ja) * 1984-12-13 1986-06-27 Diesel Kiki Co Ltd 噴霧形状判定装置
JP3438855B2 (ja) * 1997-01-23 2003-08-18 横河電機株式会社 共焦点装置
JP3816632B2 (ja) * 1997-05-14 2006-08-30 オリンパス株式会社 走査型顕微鏡
WO2002010830A2 (en) * 2000-07-27 2002-02-07 Zetetic Institute Multiple-source arrays for confocal and near-field microscopy
JP3576523B2 (ja) * 2000-12-26 2004-10-13 オリンパス株式会社 蛍光輝度測定方法及び装置
EP1825317B1 (en) * 2004-11-24 2013-04-17 Battelle Memorial Institute Optical system for cell imaging
US7715001B2 (en) * 2006-02-13 2010-05-11 Pacific Biosciences Of California, Inc. Methods and systems for simultaneous real-time monitoring of optical signals from multiple sources
DE102007009550B4 (de) 2007-02-27 2008-12-18 Ludwig-Maximilian-Universität Verfahren und Mikroskopvorrichtung zur Beobachtung einer bewegten Probe
JP5307353B2 (ja) 2007-04-26 2013-10-02 オリンパス株式会社 多光子励起レーザ走査型顕微鏡および多光子励起蛍光画像取得方法
JP5829621B2 (ja) 2009-12-30 2015-12-09 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 顕微鏡センサ
JP2011216863A (ja) 2010-03-17 2011-10-27 Hitachi Via Mechanics Ltd ビームサイズ可変照明光学装置及びビームサイズ変更方法
CN102893198B (zh) * 2010-05-18 2015-11-25 皇家飞利浦电子股份有限公司 自动聚焦成像系统、成像方法及显微镜
JP2012163920A (ja) * 2011-02-09 2012-08-30 Nikon Corp 顕微鏡装置
JP2012220558A (ja) 2011-04-05 2012-11-12 Nikon Corp 顕微鏡装置
EP2715321A4 (en) 2011-05-25 2014-10-29 Huron Technologies Internat Inc 3D DISEASE GLEITSCANNER
JP2013015762A (ja) 2011-07-06 2013-01-24 Sony Corp 照明光学系および画像表示装置
DE102011114500B4 (de) * 2011-09-29 2022-05-05 Fei Company Mikroskopvorrichtung
CN103874917B (zh) * 2011-10-12 2017-05-24 文塔纳医疗系统公司 多焦点干涉图像获取
US9575304B2 (en) 2012-06-25 2017-02-21 Huron Technologies International Inc. Pathology slide scanners for fluorescence and brightfield imaging and method of operation
US9563044B2 (en) 2012-07-17 2017-02-07 Ecole Polytechnique Federale De Lausanne Reflective optical objective
US9304280B2 (en) 2013-03-14 2016-04-05 The Regents Of The University Of Michigan Compact lens system and array
US9163928B2 (en) 2013-04-17 2015-10-20 Kla-Tencor Corporation Reducing registration error of front and back wafer surfaces utilizing a see-through calibration wafer
JP2014228321A (ja) 2013-05-20 2014-12-08 ウシオ電機株式会社 検査方法

Also Published As

Publication number Publication date
CN107076882B (zh) 2020-10-30
RU2718149C2 (ru) 2020-03-30
CN107076882A (zh) 2017-08-18
JP6905932B2 (ja) 2021-07-21
JP2018509640A (ja) 2018-04-05
JP7072015B2 (ja) 2022-05-19
WO2016146411A1 (en) 2016-09-22
EP3191885B1 (en) 2022-08-17
US20170299852A1 (en) 2017-10-19
EP3191885A1 (en) 2017-07-19
JP2020129118A (ja) 2020-08-27
RU2017113461A3 (enExample) 2019-09-20
US10268031B2 (en) 2019-04-23
RU2017113461A (ru) 2018-10-19

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Legal Events

Date Code Title Description
B11A Dismissal acc. art.33 of ipl - examination not requested within 36 months of filing
B11Y Definitive dismissal - extension of time limit for request of examination expired [chapter 11.1.1 patent gazette]