BR112014031974A2 - dispositivo; e método - Google Patents

dispositivo; e método

Info

Publication number
BR112014031974A2
BR112014031974A2 BR112014031974A BR112014031974A BR112014031974A2 BR 112014031974 A2 BR112014031974 A2 BR 112014031974A2 BR 112014031974 A BR112014031974 A BR 112014031974A BR 112014031974 A BR112014031974 A BR 112014031974A BR 112014031974 A2 BR112014031974 A2 BR 112014031974A2
Authority
BR
Brazil
Prior art keywords
analog
pulse
peak detector
sequence
minimum
Prior art date
Application number
BR112014031974A
Other languages
English (en)
Inventor
Herrmann Christoph
Original Assignee
Koninklijke Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Nv filed Critical Koninklijke Philips Nv
Publication of BR112014031974A2 publication Critical patent/BR112014031974A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G01T1/171—Compensation of dead-time counting losses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods
    • H03M1/125—Asynchronous, i.e. free-running operation within each conversion cycle

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Radiology & Medical Imaging (AREA)
  • Pulmonology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Radiation (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

resumo dispositivo; e método um dispositivo, que inclui um modelador de pulso (120) para receber sinais indicativos de fótons detectados e gerar uma pluralidade de pulsos destes para formar uma sequência de pulso (200) e um detector de pico (150) para a amostragem de sequência de pulso (200) em uma saída do modelador de pulso (120). o detector de pico (150) inclui um circuito (300) para detectar seletivamente e um valor máximo (202a, b, c) e um valor mínimo (204a, b) da sequência de pulso (200). os valores máximo (202a, b, c) e mínimo (204a, b) amostrados são então convertidos de formato análogo para digital por meio de um conversor de análogo para digital (160).
BR112014031974A 2012-06-27 2013-06-26 dispositivo; e método BR112014031974A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201261664984P 2012-06-27 2012-06-27
PCT/IB2013/055237 WO2014002022A2 (en) 2012-06-27 2013-06-26 Spectral photon counting detector

Publications (1)

Publication Number Publication Date
BR112014031974A2 true BR112014031974A2 (pt) 2017-06-27

Family

ID=49165795

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112014031974A BR112014031974A2 (pt) 2012-06-27 2013-06-26 dispositivo; e método

Country Status (7)

Country Link
US (1) US9268035B2 (pt)
EP (1) EP2867702B1 (pt)
JP (1) JP6175137B2 (pt)
CN (1) CN104471441B (pt)
BR (1) BR112014031974A2 (pt)
RU (1) RU2015102321A (pt)
WO (1) WO2014002022A2 (pt)

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CN104812305B (zh) * 2012-12-27 2018-03-30 东芝医疗系统株式会社 X射线ct装置以及控制方法
JP6289223B2 (ja) * 2013-04-04 2018-03-07 キヤノンメディカルシステムズ株式会社 Ｘ線コンピュータ断層撮影装置
EP2871496B1 (en) * 2013-11-12 2020-01-01 Samsung Electronics Co., Ltd Radiation detector and computed tomography apparatus using the same
KR101635980B1 (ko) * 2013-12-30 2016-07-05 삼성전자주식회사 방사선 디텍터 및 그에 따른 컴퓨터 단층 촬영 장치
JP2015180859A (ja) * 2014-03-05 2015-10-15 株式会社東芝 フォトンカウンティングｃｔ装置
WO2015197786A1 (en) 2014-06-27 2015-12-30 Koninklijke Philips N.V. Spectral material decomposition for photon-counting applications
US10159450B2 (en) * 2014-10-01 2018-12-25 Toshiba Medical Systems Corporation X-ray CT apparatus including a photon-counting detector, and an image processing apparatus and an image processing method for correcting detection signals detected by the photon-counting detector
KR101725099B1 (ko) * 2014-12-05 2017-04-26 삼성전자주식회사 컴퓨터 단층 촬영장치 및 그 제어방법
EP3234651B1 (en) * 2014-12-16 2019-09-11 Koninklijke Philips N.V. Baseline shift determination for a photon detector
JP7019286B2 (ja) * 2015-11-02 2022-02-15 キヤノンメディカルシステムズ株式会社 データ収集装置及びｘ線ｃｔ装置
WO2017082785A1 (en) * 2015-11-12 2017-05-18 Prismatic Sensors Ab High-resolution computed tomography using edge-on detectors with temporally offset depth-segments
WO2017216378A1 (en) * 2016-06-16 2017-12-21 Koninklijke Philips N.V. Improved photon-counting in a spectral radiation detector
WO2018002226A1 (en) 2016-06-29 2018-01-04 Koninklijke Philips N.V. Photon-counting computed tomography
WO2018002744A1 (en) * 2016-06-29 2018-01-04 Siemens Medical Solutions Usa, Inc. System and method to unpile overlapping pulses
US10162066B2 (en) * 2017-02-06 2018-12-25 General Electric Company Coincidence-enabling photon-counting detector
EP3385756A1 (en) 2017-04-06 2018-10-10 Koninklijke Philips N.V. Pulse shaper
JP6912304B2 (ja) * 2017-07-20 2021-08-04 株式会社日立製作所 波高頻度分布取得装置、波高頻度分布取得方法、波高頻度分布取得プログラム及び放射線撮像装置
US11204432B2 (en) * 2017-11-24 2021-12-21 Hamamatsu Photonics K.K. Photon counting device and photon counting method
ES2967496T3 (es) * 2018-03-08 2024-04-30 Alcon Inc Detección de impulsos láser de pico mediante temporización de señales de control
CN110161549B (zh) * 2019-05-07 2020-07-31 东软医疗系统股份有限公司 一种控制脉冲堆叠的方法及装置
JP7283218B2 (ja) * 2019-05-10 2023-05-30 オムロン株式会社 信号計測ユニット
CN113138406B (zh) * 2021-03-04 2024-04-12 南京模数智芯微电子科技有限公司 一种具有基线保持功能的辐射探测器读出电路

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Also Published As

Publication number Publication date
CN104471441B (zh) 2017-07-18
EP2867702A2 (en) 2015-05-06
JP2015528901A (ja) 2015-10-01
US20150185332A1 (en) 2015-07-02
JP6175137B2 (ja) 2017-08-02
WO2014002022A3 (en) 2014-03-20
CN104471441A (zh) 2015-03-25
EP2867702B1 (en) 2020-03-25
US9268035B2 (en) 2016-02-23
WO2014002022A2 (en) 2014-01-03
RU2015102321A (ru) 2016-08-10

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Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]
B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]