BR112014005117A2 - método para selecionar um equipamento eletrônico - Google Patents

método para selecionar um equipamento eletrônico

Info

Publication number
BR112014005117A2
BR112014005117A2 BR112014005117A BR112014005117A BR112014005117A2 BR 112014005117 A2 BR112014005117 A2 BR 112014005117A2 BR 112014005117 A BR112014005117 A BR 112014005117A BR 112014005117 A BR112014005117 A BR 112014005117A BR 112014005117 A2 BR112014005117 A2 BR 112014005117A2
Authority
BR
Brazil
Prior art keywords
electronic component
irradiation
electronic equipment
selecting
irradiation conditions
Prior art date
Application number
BR112014005117A
Other languages
English (en)
Inventor
Weulersse Cecile
Miller Florent
Original Assignee
European Aeronautic Defence & Space Co Eads France
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by European Aeronautic Defence & Space Co Eads France filed Critical European Aeronautic Defence & Space Co Eads France
Publication of BR112014005117A2 publication Critical patent/BR112014005117A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31816—Soft error testing; Soft error rate evaluation; Single event testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2881—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to environmental aspects other than temperature, e.g. humidity or vibrations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/005—Testing of electric installations on transport means
    • G01R31/008—Testing of electric installations on transport means on air- or spacecraft, railway rolling stock or sea-going vessels

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • Measurement Of Radiation (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

resumo “método para selecionar um equipamento eletrônico” a invenção se refere a um método de seleção de um equipamento eletrônico que compreende pelo menos um componente eletrônico (101), sendo o dito equipamento eletrônico potencialmente submetido a condições de irradiação indicadas num caderno de encargos predefinido, o método compreendendo uma fase de caracterização de um parâmetro de sensibilidade do componente eletrônico (101) a estas condições de irradiação, esta fase compreendendo: uma etapa (210) de irradiação do componente eletrônico (101) por uma fonte de radiação ionizante (100) com caraterísticas e geometria de irradiação conhecidas, uma etapa (220) de medição de um conjunto de valores de funcionamento do componente eletrônico (101) durante esta etapa de irradiação, sendo o referido método caracterizado por: a etapa de irradiação incluir medidas de sensibilidade do componente eletrônico (101) para uma série de condições de irradiação inferior ao conjunto das condições enumeradas no caderno de encargos, o método compreender ainda uma etapa de (240) de extrapolação dos resultados medidos para outras condições de irradiação do caderno de encargos. 1/1
BR112014005117A 2011-09-06 2012-09-05 método para selecionar um equipamento eletrônico BR112014005117A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1157892A FR2979708B1 (fr) 2011-09-06 2011-09-06 Procede de caracterisation de la sensibilite d'un composant electronique soumis a des conditions d'irradiation
PCT/EP2012/067305 WO2013034588A1 (fr) 2011-09-06 2012-09-05 Procédé de caractérisation de la sensibilité d'un composant électronique soumis à des conditions d'irradiation

Publications (1)

Publication Number Publication Date
BR112014005117A2 true BR112014005117A2 (pt) 2017-03-21

Family

ID=46799249

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112014005117A BR112014005117A2 (pt) 2011-09-06 2012-09-05 método para selecionar um equipamento eletrônico

Country Status (5)

Country Link
US (1) US20140203836A1 (pt)
EP (1) EP2753943A1 (pt)
BR (1) BR112014005117A2 (pt)
FR (1) FR2979708B1 (pt)
WO (1) WO2013034588A1 (pt)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105677954B (zh) * 2015-12-31 2018-09-11 重庆真测科技股份有限公司 一种射线检测室辐射防护设计方法
US9939477B2 (en) * 2016-06-24 2018-04-10 International Business Machines Corporation On-demand detection of electromagnetic disturbances using mobile devices
CN111709183B (zh) * 2020-05-25 2023-09-12 西安交通大学 一种基于遗传算法的中子管加速系统优化方法
CN111695315B (zh) * 2020-05-26 2023-06-23 电子科技大学 一种辐射环境下cpu失效仿真方法
CN113156302B (zh) * 2021-03-09 2024-04-09 中国科学院新疆理化技术研究所 一种模拟电路单粒子瞬态效应的测试表征方法
CN115420966A (zh) * 2022-06-27 2022-12-02 西北核技术研究所 一种cmos图像传感器位移损伤和电离损伤协和效应实验方法
CN115356609B (zh) * 2022-08-11 2023-05-26 中国科学院近代物理研究所 提高主动延迟滤波器件抗单粒子翻转效应的方法和系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2914579A1 (de) * 1979-04-10 1980-10-23 Siemens Ag Verfahren zur analyse von integrierten schaltungen
US4816753A (en) * 1987-05-21 1989-03-28 Advanced Research And Applications Corporation Method for reliability testing of integrated circuits
US20040187050A1 (en) * 2003-03-19 2004-09-23 Baumann Robert Christopher Test structure and method for accurate determination of soft error of logic components
JP2005276360A (ja) * 2004-03-25 2005-10-06 Renesas Technology Corp 半導体デバイスのエラー評価支援方法および装置
US7535213B1 (en) * 2005-08-29 2009-05-19 Xilinx, Inc. Method and system for prediction of atmospheric upsets in an integrated circuit
FR2923021B1 (fr) * 2007-10-26 2010-02-19 Eads Europ Aeronautic Defence Procede de determination de la sensibilite des composants electroniques vis-a-vis des particules.
US8145959B2 (en) * 2009-10-23 2012-03-27 Avago Technologies Enterprise IP (Singapore) Pte. Ltd. Systems and methods for measuring soft errors and soft error rates in an application specific integrated circuit

Also Published As

Publication number Publication date
FR2979708A1 (fr) 2013-03-08
FR2979708B1 (fr) 2014-06-06
WO2013034588A1 (fr) 2013-03-14
US20140203836A1 (en) 2014-07-24
EP2753943A1 (fr) 2014-07-16

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Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]
B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2478 DE 03-07-2018 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.