FR2979708B1 - Procede de caracterisation de la sensibilite d'un composant electronique soumis a des conditions d'irradiation - Google Patents

Procede de caracterisation de la sensibilite d'un composant electronique soumis a des conditions d'irradiation

Info

Publication number
FR2979708B1
FR2979708B1 FR1157892A FR1157892A FR2979708B1 FR 2979708 B1 FR2979708 B1 FR 2979708B1 FR 1157892 A FR1157892 A FR 1157892A FR 1157892 A FR1157892 A FR 1157892A FR 2979708 B1 FR2979708 B1 FR 2979708B1
Authority
FR
France
Prior art keywords
characterizing
sensitivity
electronic component
irradiation conditions
component subject
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR1157892A
Other languages
English (en)
Other versions
FR2979708A1 (fr
Inventor
Florent Miller
Cecile Weulersse
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Airbus Group SAS
Original Assignee
European Aeronautic Defence and Space Company EADS France
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by European Aeronautic Defence and Space Company EADS France filed Critical European Aeronautic Defence and Space Company EADS France
Priority to FR1157892A priority Critical patent/FR2979708B1/fr
Priority to PCT/EP2012/067305 priority patent/WO2013034588A1/fr
Priority to BR112014005117A priority patent/BR112014005117A2/pt
Priority to US14/342,998 priority patent/US20140203836A1/en
Priority to EP12755864.1A priority patent/EP2753943A1/fr
Publication of FR2979708A1 publication Critical patent/FR2979708A1/fr
Application granted granted Critical
Publication of FR2979708B1 publication Critical patent/FR2979708B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31816—Soft error testing; Soft error rate evaluation; Single event testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2881—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to environmental aspects other than temperature, e.g. humidity or vibrations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/005—Testing of electric installations on transport means
    • G01R31/008—Testing of electric installations on transport means on air- or spacecraft, railway rolling stock or sea-going vessels

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • Measurement Of Radiation (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
FR1157892A 2011-09-06 2011-09-06 Procede de caracterisation de la sensibilite d'un composant electronique soumis a des conditions d'irradiation Expired - Fee Related FR2979708B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR1157892A FR2979708B1 (fr) 2011-09-06 2011-09-06 Procede de caracterisation de la sensibilite d'un composant electronique soumis a des conditions d'irradiation
PCT/EP2012/067305 WO2013034588A1 (fr) 2011-09-06 2012-09-05 Procédé de caractérisation de la sensibilité d'un composant électronique soumis à des conditions d'irradiation
BR112014005117A BR112014005117A2 (pt) 2011-09-06 2012-09-05 método para selecionar um equipamento eletrônico
US14/342,998 US20140203836A1 (en) 2011-09-06 2012-09-05 Method of characterizing the sensitivity of an electronic component subjected to irradiation conditions
EP12755864.1A EP2753943A1 (fr) 2011-09-06 2012-09-05 Procédé de caractérisation de la sensibilité d'un composant électronique soumis à des conditions d'irradiation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1157892A FR2979708B1 (fr) 2011-09-06 2011-09-06 Procede de caracterisation de la sensibilite d'un composant electronique soumis a des conditions d'irradiation

Publications (2)

Publication Number Publication Date
FR2979708A1 FR2979708A1 (fr) 2013-03-08
FR2979708B1 true FR2979708B1 (fr) 2014-06-06

Family

ID=46799249

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1157892A Expired - Fee Related FR2979708B1 (fr) 2011-09-06 2011-09-06 Procede de caracterisation de la sensibilite d'un composant electronique soumis a des conditions d'irradiation

Country Status (5)

Country Link
US (1) US20140203836A1 (fr)
EP (1) EP2753943A1 (fr)
BR (1) BR112014005117A2 (fr)
FR (1) FR2979708B1 (fr)
WO (1) WO2013034588A1 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105677954B (zh) * 2015-12-31 2018-09-11 重庆真测科技股份有限公司 一种射线检测室辐射防护设计方法
US9939477B2 (en) * 2016-06-24 2018-04-10 International Business Machines Corporation On-demand detection of electromagnetic disturbances using mobile devices
CN111709183B (zh) * 2020-05-25 2023-09-12 西安交通大学 一种基于遗传算法的中子管加速系统优化方法
CN111695315B (zh) * 2020-05-26 2023-06-23 电子科技大学 一种辐射环境下cpu失效仿真方法
CN113156302B (zh) * 2021-03-09 2024-04-09 中国科学院新疆理化技术研究所 一种模拟电路单粒子瞬态效应的测试表征方法
CN115420966A (zh) * 2022-06-27 2022-12-02 西北核技术研究所 一种cmos图像传感器位移损伤和电离损伤协和效应实验方法
CN115356609B (zh) * 2022-08-11 2023-05-26 中国科学院近代物理研究所 提高主动延迟滤波器件抗单粒子翻转效应的方法和系统

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2914579A1 (de) * 1979-04-10 1980-10-23 Siemens Ag Verfahren zur analyse von integrierten schaltungen
US4816753A (en) * 1987-05-21 1989-03-28 Advanced Research And Applications Corporation Method for reliability testing of integrated circuits
US20040187050A1 (en) * 2003-03-19 2004-09-23 Baumann Robert Christopher Test structure and method for accurate determination of soft error of logic components
JP2005276360A (ja) * 2004-03-25 2005-10-06 Renesas Technology Corp 半導体デバイスのエラー評価支援方法および装置
US7535213B1 (en) * 2005-08-29 2009-05-19 Xilinx, Inc. Method and system for prediction of atmospheric upsets in an integrated circuit
FR2923021B1 (fr) * 2007-10-26 2010-02-19 Eads Europ Aeronautic Defence Procede de determination de la sensibilite des composants electroniques vis-a-vis des particules.
US8145959B2 (en) * 2009-10-23 2012-03-27 Avago Technologies Enterprise IP (Singapore) Pte. Ltd. Systems and methods for measuring soft errors and soft error rates in an application specific integrated circuit

Also Published As

Publication number Publication date
WO2013034588A1 (fr) 2013-03-14
FR2979708A1 (fr) 2013-03-08
EP2753943A1 (fr) 2014-07-16
US20140203836A1 (en) 2014-07-24
BR112014005117A2 (pt) 2017-03-21

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