BR112013018523A2 - espectrômetro de emissão e método de operação - Google Patents

espectrômetro de emissão e método de operação

Info

Publication number
BR112013018523A2
BR112013018523A2 BR112013018523A BR112013018523A BR112013018523A2 BR 112013018523 A2 BR112013018523 A2 BR 112013018523A2 BR 112013018523 A BR112013018523 A BR 112013018523A BR 112013018523 A BR112013018523 A BR 112013018523A BR 112013018523 A2 BR112013018523 A2 BR 112013018523A2
Authority
BR
Brazil
Prior art keywords
radiation
detector
sample
spectral characteristics
emission spectrometer
Prior art date
Application number
BR112013018523A
Other languages
English (en)
Inventor
Leigh Paulsen Gale
Alan Carter Geoffrey
Cohen Joanna
Moreschini Paolo
Original Assignee
Tech Resources Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=46580110&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=BR112013018523(A2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Tech Resources Pty Ltd filed Critical Tech Resources Pty Ltd
Publication of BR112013018523A2 publication Critical patent/BR112013018523A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G01N21/276—Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma

Landscapes

  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Mathematical Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

espectrômetro de emissão e método de operação a presente invenção refere-se a um método de calibração de um espectrômetro de emissão (10), tendo um detector (11) capaz de detectar componentes espectrais de radiação incidente, e um trajeto ótico de medição (28) que direciona um feixe de energia (26) para uma amostra (20) e radiação emitida pela amostra quando irradiada pelo feixe de energia para o detector de radiação (11). o método compreende direcionar radiação de característica espectral conhecida ao longo de um trajeto alternativo para o detector (11). o detector (11) detecta as características espectrais da radiação e faz a comparação com as características espectrais conhecidas. dados de deslocamento são determinados com base em qualquer variação entre as características espectrais detectadas e conhecidas. os dados de deslocamento são armazenados e subsequentemente utilizados para ajustar as características espectrais detectadas de uma amostra no trajeto ótico de medição (28) produzem uma análise espectral de saída calibrada de deslocamento da amostra.
BR112013018523A 2011-01-26 2012-01-11 espectrômetro de emissão e método de operação BR112013018523A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161436328P 2011-01-26 2011-01-26
PCT/AU2012/000016 WO2012100284A1 (en) 2011-01-26 2012-01-11 An emission spectrometer and method of operation

Publications (1)

Publication Number Publication Date
BR112013018523A2 true BR112013018523A2 (pt) 2017-08-01

Family

ID=46580110

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112013018523A BR112013018523A2 (pt) 2011-01-26 2012-01-11 espectrômetro de emissão e método de operação

Country Status (7)

Country Link
CN (1) CN103518121A (pt)
AU (1) AU2012211024A1 (pt)
BR (1) BR112013018523A2 (pt)
CA (1) CA2824940A1 (pt)
CL (1) CL2013002117A1 (pt)
PE (1) PE20141402A1 (pt)
WO (1) WO2012100284A1 (pt)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014202618A2 (en) * 2013-06-17 2014-12-24 University Of Neuchâtel Method for determining the configuration of a structure
CN107037012B (zh) 2017-04-05 2019-10-25 华中科技大学 用于激光诱导击穿光谱采集的阶梯光谱仪动态校正方法
CN115839943B (zh) * 2023-02-13 2023-07-11 合肥金星智控科技股份有限公司 激光诱导光谱系统、光谱校准方法及电子设备

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6621574B1 (en) * 2000-05-25 2003-09-16 Inphotonics, Inc. Dual function safety and calibration accessory for raman and other spectroscopic sampling
US7321424B2 (en) * 2004-08-05 2008-01-22 Acton Research Corp. Self-referencing instrument and method thereof for measuring electromagnetic properties
US7502105B2 (en) * 2004-09-15 2009-03-10 General Electric Company Apparatus and method for producing a calibrated Raman spectrum
US7994479B2 (en) * 2006-11-30 2011-08-09 The Science And Technology Facilities Council Infrared spectrometer
TWI379074B (en) * 2007-05-07 2012-12-11 Verity Instr Inc Calibration method of a radiometric optical monitoring system used for fault detection and process monitoring
CN101354287B (zh) * 2007-07-24 2010-12-22 杭州远方光电信息有限公司 一种光谱仪及其校正方法

Also Published As

Publication number Publication date
PE20141402A1 (es) 2014-10-29
CN103518121A (zh) 2014-01-15
CA2824940A1 (en) 2012-08-02
CL2013002117A1 (es) 2013-12-13
WO2012100284A1 (en) 2012-08-02
AU2012211024A1 (en) 2013-08-01

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Legal Events

Date Code Title Description
B08F Application fees: dismissal - article 86 of industrial property law
B08K Lapse as no evidence of payment of the annual fee has been furnished to inpi (acc. art. 87)