BR0011684A - Aparelho e método de deteção de falha em alta velocidade para material refletivo - Google Patents

Aparelho e método de deteção de falha em alta velocidade para material refletivo

Info

Publication number
BR0011684A
BR0011684A BR0011684-0A BR0011684A BR0011684A BR 0011684 A BR0011684 A BR 0011684A BR 0011684 A BR0011684 A BR 0011684A BR 0011684 A BR0011684 A BR 0011684A
Authority
BR
Brazil
Prior art keywords
light
high speed
reflective material
light source
detector
Prior art date
Application number
BR0011684-0A
Other languages
English (en)
Inventor
Barry S Smith
Michael J Mullins
Roy Derlinden
Donal Irvin
Original Assignee
Philip Morris Prod
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philip Morris Prod filed Critical Philip Morris Prod
Publication of BR0011684A publication Critical patent/BR0011684A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8822—Dark field detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

APARELHO E MéTODO DE DETEçãO DE FALHA EM ALTA VELOCIDADE PARA MATERIAL REFLETIVO . A presente refere-se a um aparelho de detecção de falhas de superfície em um material tendo uma superfície a qual é parcialmente refletiva que inclui pelo menos uma fonte de luz disposta para incidir luz direta sobre uma superfície de pelo menos um material parcialmente refletivo, e um detector de luz disposto acima da superfície do material. O detector de luz e a pelo menos uma fonte de luz são dispostos próximos um do outro de modo que, na ausência de uma falha de superfície no material, substancialmente nenhuma luz da pelo menos uma fonte de luz é detectada pelo detector de luz e, na presença de uma falha de superfície no material, uma luz da pelo menos uma fonte de luz é refletida para fora da falha e para o detector.
BR0011684-0A 1999-06-08 2000-06-07 Aparelho e método de deteção de falha em alta velocidade para material refletivo BR0011684A (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/327,531 US6097482A (en) 1999-06-08 1999-06-08 High speed flaw detecting system for reflective material
PCT/US2000/040126 WO2000075630A1 (en) 1999-06-08 2000-06-07 High speed flaw detecting apparatus and method for reflective material

Publications (1)

Publication Number Publication Date
BR0011684A true BR0011684A (pt) 2002-04-30

Family

ID=23276921

Family Applications (1)

Application Number Title Priority Date Filing Date
BR0011684-0A BR0011684A (pt) 1999-06-08 2000-06-07 Aparelho e método de deteção de falha em alta velocidade para material refletivo

Country Status (10)

Country Link
US (1) US6097482A (pt)
EP (1) EP1203215A4 (pt)
JP (1) JP2003501649A (pt)
CN (1) CN1242251C (pt)
AU (1) AU6119600A (pt)
BR (1) BR0011684A (pt)
CZ (1) CZ20014414A3 (pt)
MY (1) MY123530A (pt)
RU (1) RU2243540C2 (pt)
WO (1) WO2000075630A1 (pt)

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WO2015098929A1 (ja) 2013-12-27 2015-07-02 Ｊｆｅスチール株式会社 表面欠陥検出方法及び表面欠陥検出装置
CN103728306A (zh) * 2014-01-15 2014-04-16 唐山英莱科技有限公司 一种基于双路会聚可调光路的无坡口对接焊缝检测系统
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TWI721720B (zh) * 2019-12-19 2021-03-11 由田新技股份有限公司 光源裝置及光學檢測系統
CN113369152A (zh) * 2021-08-13 2021-09-10 苏州华兴源创科技股份有限公司 一种检测设备
CN119333774B (zh) * 2024-10-23 2025-11-18 中国科学院光电技术研究所 一种多角度环形均匀照明装置及设计方法

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Also Published As

Publication number Publication date
WO2000075630A1 (en) 2000-12-14
CZ20014414A3 (cs) 2002-06-12
RU2243540C2 (ru) 2004-12-27
EP1203215A1 (en) 2002-05-08
CN1434917A (zh) 2003-08-06
CN1242251C (zh) 2006-02-15
MY123530A (en) 2006-05-31
EP1203215A4 (en) 2006-10-25
US6097482A (en) 2000-08-01
AU6119600A (en) 2000-12-28
JP2003501649A (ja) 2003-01-14

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Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 8O E 9O ANUIDADES.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: REFERENTE AO DESPACHO 8.6 DA RPI 2008 DE 30/06/2009.