BR0011684A - Aparelho e método de deteção de falha em alta velocidade para material refletivo - Google Patents
Aparelho e método de deteção de falha em alta velocidade para material refletivoInfo
- Publication number
- BR0011684A BR0011684A BR0011684-0A BR0011684A BR0011684A BR 0011684 A BR0011684 A BR 0011684A BR 0011684 A BR0011684 A BR 0011684A BR 0011684 A BR0011684 A BR 0011684A
- Authority
- BR
- Brazil
- Prior art keywords
- light
- high speed
- reflective material
- light source
- detector
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8822—Dark field detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
- G01N2021/8918—Metal
Abstract
APARELHO E MéTODO DE DETEçãO DE FALHA EM ALTA VELOCIDADE PARA MATERIAL REFLETIVO . A presente refere-se a um aparelho de detecção de falhas de superfície em um material tendo uma superfície a qual é parcialmente refletiva que inclui pelo menos uma fonte de luz disposta para incidir luz direta sobre uma superfície de pelo menos um material parcialmente refletivo, e um detector de luz disposto acima da superfície do material. O detector de luz e a pelo menos uma fonte de luz são dispostos próximos um do outro de modo que, na ausência de uma falha de superfície no material, substancialmente nenhuma luz da pelo menos uma fonte de luz é detectada pelo detector de luz e, na presença de uma falha de superfície no material, uma luz da pelo menos uma fonte de luz é refletida para fora da falha e para o detector.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/327,531 US6097482A (en) | 1999-06-08 | 1999-06-08 | High speed flaw detecting system for reflective material |
PCT/US2000/040126 WO2000075630A1 (en) | 1999-06-08 | 2000-06-07 | High speed flaw detecting apparatus and method for reflective material |
Publications (1)
Publication Number | Publication Date |
---|---|
BR0011684A true BR0011684A (pt) | 2002-04-30 |
Family
ID=23276921
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BR0011684-0A BR0011684A (pt) | 1999-06-08 | 2000-06-07 | Aparelho e método de deteção de falha em alta velocidade para material refletivo |
Country Status (10)
Country | Link |
---|---|
US (1) | US6097482A (pt) |
EP (1) | EP1203215A4 (pt) |
JP (1) | JP2003501649A (pt) |
CN (1) | CN1242251C (pt) |
AU (1) | AU6119600A (pt) |
BR (1) | BR0011684A (pt) |
CZ (1) | CZ20014414A3 (pt) |
MY (1) | MY123530A (pt) |
RU (1) | RU2243540C2 (pt) |
WO (1) | WO2000075630A1 (pt) |
Families Citing this family (26)
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US6264591B1 (en) * | 1999-07-27 | 2001-07-24 | Philip Morris Incorporated | Plug combiner inspection system and method |
JP4507304B2 (ja) * | 1999-08-24 | 2010-07-21 | コニカミノルタホールディングス株式会社 | 変位測定装置 |
US6356346B1 (en) * | 2000-01-21 | 2002-03-12 | International Business Machines Corporation | Device and method for inspecting a disk for physical defects |
TW500920B (en) * | 2000-03-24 | 2002-09-01 | Olympus Optical Co | Defect detecting apparatus |
FR2811761B1 (fr) * | 2000-07-17 | 2002-10-11 | Production Rech S Appliquees | Ellipsometre a haute resolution spatiale fonctionnant dans l'infrarouge |
US7477388B1 (en) | 2001-01-09 | 2009-01-13 | J.A. Woollam Co., Inc. | Sample masking in ellipsometer and the like systems including detection of substrate backside reflections |
US7768660B1 (en) | 2001-01-09 | 2010-08-03 | J.A. Woollam Co., Inc. | Non-destructive approach to ellipsometric monitoring of a film coating on the inner surface of a tube shaped sample |
US7385698B1 (en) | 2001-01-09 | 2008-06-10 | J.A. Woollam Co., Inc. | System and method of selectively monitoring sample front and backside reflections in ellipsometer and the like systems |
US6934029B1 (en) * | 2002-04-22 | 2005-08-23 | Eugene Matzan | Dual laser web defect scanner |
US6838670B2 (en) * | 2002-11-12 | 2005-01-04 | Siemens Westinghouse Power Corporation | Methods and system for ultrasonic thermographic non-destructive examination for enhanced defect determination |
DE102004034167A1 (de) * | 2004-07-15 | 2006-02-09 | Byk Gardner Gmbh | Vorrichtung zur goniometrischen Untersuchung optischer Oberflächeneigenschaften |
WO2007132925A1 (ja) * | 2006-05-15 | 2007-11-22 | Nikon Corporation | 表面検査装置 |
KR101439546B1 (ko) * | 2007-12-27 | 2014-09-30 | 주식회사 포스코 | 슬라브 측면 흠 검출 장치 |
US20110080588A1 (en) * | 2009-10-02 | 2011-04-07 | Industrial Optical Measurement Systems | Non-contact laser inspection system |
CN102445451A (zh) * | 2011-09-28 | 2012-05-09 | 吴江市联航纺织有限公司 | 带遮光罩的布匹的检测装置 |
JP5630887B2 (ja) * | 2011-11-24 | 2014-11-26 | 日本たばこ産業株式会社 | バンド検出センサ及びその検出方法 |
EP2703772B1 (de) * | 2012-08-28 | 2015-05-20 | Texmag GmbH Vertriebsgesellschaft | Sensor zum Erfassen einer laufenden Warenbahn |
US9134232B1 (en) | 2012-11-15 | 2015-09-15 | Industrial Optical Measurement Systems, LLC | Laser inspection system |
US9581556B1 (en) | 2012-11-15 | 2017-02-28 | Industrial Optical Measurement Systems, LLC | Laser probe for use in an inspection system |
WO2015098929A1 (ja) * | 2013-12-27 | 2015-07-02 | Jfeスチール株式会社 | 表面欠陥検出方法及び表面欠陥検出装置 |
CN103728306A (zh) * | 2014-01-15 | 2014-04-16 | 唐山英莱科技有限公司 | 一种基于双路会聚可调光路的无坡口对接焊缝检测系统 |
US9429398B2 (en) * | 2014-05-21 | 2016-08-30 | Universal City Studios Llc | Optical tracking for controlling pyrotechnic show elements |
EP3237887B1 (en) * | 2014-12-22 | 2024-02-07 | Intercede Ventures Ltd. | Method for determining surface related drag |
US9746316B1 (en) * | 2015-02-23 | 2017-08-29 | 4D Technology Corporation | High-resolution in-line metrology for roll-to-roll processing operations |
TWI721720B (zh) * | 2019-12-19 | 2021-03-11 | 由田新技股份有限公司 | 光源裝置及光學檢測系統 |
CN113369152A (zh) * | 2021-08-13 | 2021-09-10 | 苏州华兴源创科技股份有限公司 | 一种检测设备 |
Family Cites Families (30)
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US3780570A (en) * | 1970-03-02 | 1973-12-25 | Automation Ind Inc | Ultrasonic inspection device |
US3779843A (en) * | 1971-01-21 | 1973-12-18 | H Knapp | Continuous process for producing consolidated lignocellulosic material |
US3762496A (en) * | 1971-09-01 | 1973-10-02 | Martin Tracker Corp | Delamination detector |
US3937065A (en) * | 1971-09-01 | 1976-02-10 | William Moore | Delamination detector |
US4162126A (en) * | 1976-12-10 | 1979-07-24 | Hitachi, Ltd. | Surface detect test apparatus |
US4377340A (en) * | 1980-10-24 | 1983-03-22 | Hamamatsu Systems, Inc. | Method and apparatus for detecting particles on a material |
US4519245A (en) * | 1983-04-05 | 1985-05-28 | Evans Herbert M | Method and apparatus for the non-destructive testing of materials |
US4509369A (en) * | 1983-08-25 | 1985-04-09 | Combustion Engineering, Inc. | Near surface inspection system |
US4577337A (en) * | 1984-05-21 | 1986-03-18 | Southwest Research Institute | X-Ray fluorescence testing of laminate structures |
US4976150A (en) * | 1986-12-30 | 1990-12-11 | Bethlehem Steel Corporation | Ultrasonic transducers |
US4807996A (en) * | 1987-07-10 | 1989-02-28 | United Technologies Corporation | Transient holographic indication analysis |
US5046363A (en) * | 1988-03-23 | 1991-09-10 | Texas Instruments Incorporated | Apparatus for rapid non-destructive measurement of die attach quality in packaged integrated circuits |
US4939469A (en) * | 1988-08-01 | 1990-07-03 | Hughes Aircraft Company | Non-destructive method for evaluation of printed wiring boards |
US4924182A (en) * | 1989-01-09 | 1990-05-08 | The United States Of America As Represented By The Secretary Of The Navy | Eddy current method to measure distance between scanned surface and a subsurface defect |
US4936649A (en) * | 1989-01-25 | 1990-06-26 | Lymer John D | Damage evaluation system and method using optical fibers |
FR2647904B2 (fr) * | 1989-02-02 | 1991-09-20 | Aerospatiale | Tete de controle par ultrasons |
US5001932A (en) * | 1989-06-22 | 1991-03-26 | General Dynamics Corporation | Ultrasonic squirter |
US5094108A (en) * | 1990-09-28 | 1992-03-10 | Korea Standards Research Institute | Ultrasonic contact transducer for point-focussing surface waves |
FR2668829B1 (fr) * | 1990-11-05 | 1993-10-22 | Commissariat Energie Atomique | Dispositif et procede de controle non destructif a acquisition simultanee de donnees radiographiques et de donnees tomographiques. |
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GB9113437D0 (en) * | 1991-06-21 | 1991-08-07 | Gore W L & Ass Uk | Improvements in security enclosures |
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US5203942A (en) * | 1991-08-23 | 1993-04-20 | Eastman Kodak Company | Delaminator apparatus and method |
US5231536A (en) * | 1992-05-01 | 1993-07-27 | Xrl, Inc. | Robust, LED illumination system for OCR of indicia on a substrate |
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US5376793A (en) * | 1993-09-15 | 1994-12-27 | Stress Photonics, Inc. | Forced-diffusion thermal imaging apparatus and method |
US5444241A (en) * | 1993-10-01 | 1995-08-22 | The Regents Of The University Of California | Emissivity corrected infrared method for imaging anomalous structural heat flows |
JPH0815169A (ja) * | 1994-06-28 | 1996-01-19 | Canon Inc | 異物検査装置及びそれを用いた半導体デバイスの製造 方法 |
US5943127A (en) * | 1998-11-09 | 1999-08-24 | General Electric Company | Coined line analyzer |
-
1999
- 1999-06-08 US US09/327,531 patent/US6097482A/en not_active Expired - Lifetime
-
2000
- 2000-06-07 CZ CZ20014414A patent/CZ20014414A3/cs unknown
- 2000-06-07 EP EP00947623A patent/EP1203215A4/en not_active Withdrawn
- 2000-06-07 JP JP2001501857A patent/JP2003501649A/ja active Pending
- 2000-06-07 BR BR0011684-0A patent/BR0011684A/pt not_active IP Right Cessation
- 2000-06-07 AU AU61196/00A patent/AU6119600A/en not_active Abandoned
- 2000-06-07 RU RU2002100056/28A patent/RU2243540C2/ru not_active IP Right Cessation
- 2000-06-07 CN CNB008148449A patent/CN1242251C/zh not_active Expired - Fee Related
- 2000-06-07 WO PCT/US2000/040126 patent/WO2000075630A1/en not_active Application Discontinuation
- 2000-06-08 MY MYPI20002582 patent/MY123530A/en unknown
Also Published As
Publication number | Publication date |
---|---|
JP2003501649A (ja) | 2003-01-14 |
CZ20014414A3 (cs) | 2002-06-12 |
CN1434917A (zh) | 2003-08-06 |
AU6119600A (en) | 2000-12-28 |
MY123530A (en) | 2006-05-31 |
CN1242251C (zh) | 2006-02-15 |
WO2000075630A1 (en) | 2000-12-14 |
EP1203215A1 (en) | 2002-05-08 |
RU2243540C2 (ru) | 2004-12-27 |
EP1203215A4 (en) | 2006-10-25 |
US6097482A (en) | 2000-08-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B08F | Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette] |
Free format text: REFERENTE A 8O E 9O ANUIDADES. |
|
B08K | Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette] |
Free format text: REFERENTE AO DESPACHO 8.6 DA RPI 2008 DE 30/06/2009. |