BR0010409A - Processo e circuito para medir concentração de analito em um fluido, processo para fabricação de dispositivos quìmicos de microbalanço de cristal de quartzo complementares, e, circuito de amostragem de frequência média - Google Patents
Processo e circuito para medir concentração de analito em um fluido, processo para fabricação de dispositivos quìmicos de microbalanço de cristal de quartzo complementares, e, circuito de amostragem de frequência médiaInfo
- Publication number
- BR0010409A BR0010409A BR0010409-4A BR0010409A BR0010409A BR 0010409 A BR0010409 A BR 0010409A BR 0010409 A BR0010409 A BR 0010409A BR 0010409 A BR0010409 A BR 0010409A
- Authority
- BR
- Brazil
- Prior art keywords
- fluid
- quartz crystal
- circuit
- crystal microbalance
- analyte
- Prior art date
Links
- 239000012491 analyte Substances 0.000 title abstract 5
- 239000012530 fluid Substances 0.000 title abstract 5
- 238000000034 method Methods 0.000 title abstract 4
- 238000003380 quartz crystal microbalance Methods 0.000 title abstract 3
- 230000000295 complement effect Effects 0.000 title abstract 2
- 238000004519 manufacturing process Methods 0.000 title abstract 2
- 238000005070 sampling Methods 0.000 title abstract 2
- 239000000126 substance Substances 0.000 title abstract 2
- 239000013078 crystal Substances 0.000 abstract 1
- 239000010453 quartz Substances 0.000 abstract 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/02—Analysing fluids
- G01N29/022—Fluid sensors based on microsensors, e.g. quartz crystal-microbalance [QCM], surface acoustic wave [SAW] devices, tuning forks, cantilevers, flexural plate wave [FPW] devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01G—WEIGHING
- G01G3/00—Weighing apparatus characterised by the use of elastically-deformable members, e.g. spring balances
- G01G3/12—Weighing apparatus characterised by the use of elastically-deformable members, e.g. spring balances wherein the weighing element is in the form of a solid body stressed by pressure or tension during weighing
- G01G3/13—Weighing apparatus characterised by the use of elastically-deformable members, e.g. spring balances wherein the weighing element is in the form of a solid body stressed by pressure or tension during weighing having piezoelectric or piezoresistive properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/01—Indexing codes associated with the measuring variable
- G01N2291/014—Resonance or resonant frequency
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/022—Liquids
- G01N2291/0222—Binary liquids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/025—Change of phase or condition
- G01N2291/0256—Adsorption, desorption, surface mass change, e.g. on biosensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/02809—Concentration of a compound, e.g. measured by a surface mass change
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/042—Wave modes
- G01N2291/0426—Bulk waves, e.g. quartz crystal microbalance, torsional waves
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Acoustics & Sound (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
"PROCESSO E CIRCUITO PARA MEDIR CONCENTRAçãO DE ANALITO EM UM FLUIDO, PROCESSO PARA FABRICAçãO DE DISPOSITIVOS QUìMICOS DE MICROBALANçO DE CRISTAL DE QUARTZO COMPLEMENTARES, E, CIRCUITO DE AMOSTRAGEM DE FREQuêNCIA MéDIA". A concentração de um analito em um fluido é medida por um dispositivo sensor de microbalanço de cristal de quartzo (10) no fluindo contendo uma concentração do analito. O dispositivo sensor mostra uma freq³ência ressonante representativa da concentração do analito no fluido. O dispositivo de referência de microbalanço de cristal de quartzo (16) tem uma freq³ência ressonante menor, por uma quantidade predeterminada, do que a freq³ência ressonante inicial do dispositivo sensor antes que o dispositivo sensor seja exposto ao analito. Um sinal é derivado com base na diferença das freq³ências ressonantes do sensor e do dispositivo de referência, e um primeiro contador (20) conta um número predeterminado de ciclos da freq³ência de sinal de diferença para derivar um período de tempo de amostra. Um segundo contador (24) conta ciclos de uma freq³ência de sinal de relógio durante o período de tempo de amostra para derivar uma contagem representativa da freq³ência de sinal de diferença.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/310,008 US6222366B1 (en) | 1999-05-10 | 1999-05-10 | High frequency measuring circuit with inherent noise reduction for resonating chemical sensors |
PCT/US2000/011137 WO2000068679A1 (en) | 1999-05-10 | 2000-04-26 | High frequency measuring circuit with inherent noise reduction for resonating chemical sensors |
Publications (2)
Publication Number | Publication Date |
---|---|
BR0010409A true BR0010409A (pt) | 2002-02-13 |
BR0010409B1 BR0010409B1 (pt) | 2013-03-05 |
Family
ID=23200602
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BRPI0010409-4A BR0010409B1 (pt) | 1999-05-10 | 2000-04-26 | processo e circuito para medir concentraÇço de analito em um fluido e processo para fabricaÇço de dispositivos quÍmicos de microbalanÇa de cristal de quartzo complementares. |
Country Status (7)
Country | Link |
---|---|
US (1) | US6222366B1 (pt) |
EP (1) | EP1181544B1 (pt) |
JP (1) | JP4476496B2 (pt) |
BR (1) | BR0010409B1 (pt) |
CA (1) | CA2373144C (pt) |
DE (1) | DE60042923D1 (pt) |
WO (1) | WO2000068679A1 (pt) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6654470B1 (en) * | 1999-07-13 | 2003-11-25 | Fisher-Rosemount Systems, Inc. | Frequency warping for improving resonator signal-to-noise ratio |
US6360585B1 (en) * | 2000-03-06 | 2002-03-26 | General Electric Company | Method and apparatus for determining chemical properties |
US6879936B2 (en) * | 2002-01-09 | 2005-04-12 | Fisher Controls International Llc | Diagnostic apparatus and methods for a chemical detection system |
JP2004205392A (ja) * | 2002-12-26 | 2004-07-22 | Japan Science & Technology Agency | Qcm装置及び試料測定方法 |
AT413767B (de) * | 2003-03-20 | 2006-05-15 | Avl List Gmbh | Verfahren, vorrichtung und sensor zur bestimmung des redoxzustandes eines katalysatormaterials |
JP4504222B2 (ja) * | 2005-02-21 | 2010-07-14 | 矢崎総業株式会社 | 過電流検出装置 |
JP2006300742A (ja) * | 2005-04-21 | 2006-11-02 | Shizuoka Prefecture | 発振周波数調整方式を利用した化学物質検出装置 |
CA2622383A1 (en) * | 2005-09-22 | 2007-04-05 | Nano-Proprietary, Inc. | Hydrogen sensor |
KR20090043967A (ko) * | 2007-10-30 | 2009-05-07 | 삼성에스디아이 주식회사 | 연료전지 시스템 |
ES2333088B2 (es) | 2009-06-23 | 2011-02-07 | Universidad Politecnica De Valencia | Metodo y dispositivo de nanogravimetria en medios fluidos basado en resonadores piezoelectricos. |
GB2473635A (en) * | 2009-09-18 | 2011-03-23 | Cambridge Entpr Ltd | Detecting concentration of target species |
US9939412B2 (en) * | 2013-02-06 | 2018-04-10 | Empire Technology Development Llc | Devices, systems, and methods for detecting odorants |
CN104422630A (zh) * | 2013-09-10 | 2015-03-18 | 河南圣玛斯光电科技有限公司 | 多通道石英晶体微天平阵列以及基于该阵列的测量系统 |
EP3715826B1 (en) * | 2019-03-26 | 2024-03-06 | Infineon Technologies AG | Sensor device, particle sensor device and method for detecting a particulate matter density |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3260104A (en) | 1962-10-22 | 1966-07-12 | Exxon Research Engineering Co | Apparatus for fluid analysis |
US3863495A (en) | 1973-04-16 | 1975-02-04 | Exxon Research Engineering Co | Quartz crystal solute mass detector |
US5501986A (en) | 1988-04-06 | 1996-03-26 | E. I. Du Pont De Nemours And Company | Piezoelectric specific binding assay with mass amplified reagents |
US5065140A (en) | 1991-03-08 | 1991-11-12 | Bell Communications Research, Inc. | Early warning reactive gas detection system |
JP3354217B2 (ja) | 1993-07-30 | 2002-12-09 | 柴田科学株式会社 | 気体中の塵埃粒子の質量濃度を測定する方法 |
US5705399A (en) | 1994-05-20 | 1998-01-06 | The Cooper Union For Advancement Of Science And Art | Sensor and method for detecting predetermined chemical species in solution |
US5918258A (en) * | 1996-07-11 | 1999-06-29 | Bowers; William D. | High-sensitivity instrument to measure NVR in fluids |
US5817921A (en) | 1996-07-12 | 1998-10-06 | Advanced Technology Materials, Inc. | Piezoelectric enviromental fluid monitoring assembly and method |
DE19746261A1 (de) * | 1997-10-20 | 1999-04-29 | Karlsruhe Forschzent | Sensor |
-
1999
- 1999-05-10 US US09/310,008 patent/US6222366B1/en not_active Expired - Lifetime
-
2000
- 2000-04-26 EP EP00926372A patent/EP1181544B1/en not_active Expired - Lifetime
- 2000-04-26 BR BRPI0010409-4A patent/BR0010409B1/pt not_active IP Right Cessation
- 2000-04-26 DE DE60042923T patent/DE60042923D1/de not_active Expired - Lifetime
- 2000-04-26 JP JP2000616413A patent/JP4476496B2/ja not_active Expired - Lifetime
- 2000-04-26 WO PCT/US2000/011137 patent/WO2000068679A1/en active Application Filing
- 2000-04-26 CA CA002373144A patent/CA2373144C/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
WO2000068679A1 (en) | 2000-11-16 |
EP1181544B1 (en) | 2009-09-09 |
CA2373144A1 (en) | 2000-11-16 |
US6222366B1 (en) | 2001-04-24 |
EP1181544A1 (en) | 2002-02-27 |
CA2373144C (en) | 2007-09-25 |
DE60042923D1 (de) | 2009-10-22 |
BR0010409B1 (pt) | 2013-03-05 |
JP4476496B2 (ja) | 2010-06-09 |
JP2002544479A (ja) | 2002-12-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
B25D | Requested change of name of applicant approved | ||
B25G | Requested change of headquarter approved | ||
B06A | Patent application procedure suspended [chapter 6.1 patent gazette] | ||
B09A | Decision: intention to grant [chapter 9.1 patent gazette] | ||
B16A | Patent or certificate of addition of invention granted [chapter 16.1 patent gazette] |
Free format text: PRAZO DE VALIDADE: 10 (DEZ) ANOS CONTADOS A PARTIR DE 05/03/2013, OBSERVADAS AS CONDICOES LEGAIS. |
|
B21A | Patent or certificate of addition expired [chapter 21.1 patent gazette] |
Free format text: PATENTE EXTINTA EM 05/03/2023 |