BE845847A - Dispositif d'analyse de faute - Google Patents

Dispositif d'analyse de faute

Info

Publication number
BE845847A
BE845847A BE170348A BE170348A BE845847A BE 845847 A BE845847 A BE 845847A BE 170348 A BE170348 A BE 170348A BE 170348 A BE170348 A BE 170348A BE 845847 A BE845847 A BE 845847A
Authority
BE
Belgium
Prior art keywords
analysis device
fault analysis
fault
analysis
Prior art date
Application number
BE170348A
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of BE845847A publication Critical patent/BE845847A/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
BE170348A 1975-09-05 1976-09-03 Dispositif d'analyse de faute BE845847A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/610,581 US4012625A (en) 1975-09-05 1975-09-05 Non-logic printed wiring board test system

Publications (1)

Publication Number Publication Date
BE845847A true BE845847A (fr) 1976-12-31

Family

ID=24445606

Family Applications (1)

Application Number Title Priority Date Filing Date
BE170348A BE845847A (fr) 1975-09-05 1976-09-03 Dispositif d'analyse de faute

Country Status (7)

Country Link
US (1) US4012625A (fr)
JP (1) JPS5245058A (fr)
BE (1) BE845847A (fr)
CA (1) CA1065062A (fr)
DE (1) DE2639323A1 (fr)
FR (1) FR2323297A1 (fr)
GB (1) GB1523060A (fr)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4125763A (en) * 1977-07-15 1978-11-14 Fluke Trendar Corporation Automatic tester for microprocessor board
US4174805A (en) * 1978-04-13 1979-11-20 Ncr Corporation Method and apparatus for transmitting data to a predefined destination bus
US4168796A (en) * 1978-04-13 1979-09-25 Ncr Corporation Tester with driver/sensor circuit having programmable termination devices
USRE31828E (en) * 1978-05-05 1985-02-05 Zehntel, Inc. In-circuit digital tester
US4216539A (en) * 1978-05-05 1980-08-05 Zehntel, Inc. In-circuit digital tester
US4192451A (en) * 1978-05-30 1980-03-11 Tektronix, Inc. Digital diagnostic system employing signature analysis
US4242751A (en) * 1978-08-28 1980-12-30 Genrad, Inc. Automatic fault-probing method and apparatus for checking electrical circuits and the like
US4404627A (en) * 1979-05-11 1983-09-13 Rca Corporation Interrupt signal generating means for data processor
US4417336A (en) * 1981-06-18 1983-11-22 The Bendix Corporation Method of testing with computers
DE3234413A1 (de) * 1982-09-16 1984-03-22 Siemens AG, 1000 Berlin und 8000 München Verfahren zur automatischen fehlersuche im innern von vlsi-schaltungen mit einer elektronensonde und vorrichtung zur durchfuehrung eines solchen verfahrens
US4538269A (en) * 1983-04-18 1985-08-27 International Telephone And Telegraph Corporation Programmable coding and decoding arrangement
GB8432305D0 (en) * 1984-12-20 1985-01-30 Int Computers Ltd Crystal oscillator overdrive
US4713815A (en) * 1986-03-12 1987-12-15 International Business Machines Corp. Automatic fault location system for electronic devices
EP0296884A3 (fr) * 1987-06-24 1991-01-16 Schlumberger Technologies, Inc. Procédé pour tester in-circuit un dispositif électronique
US5047708A (en) * 1988-12-23 1991-09-10 Kondner Jr Robert L Apparatus for testing circuit boards
US5032789A (en) * 1989-06-19 1991-07-16 Hewlett-Packard Company Modular/concurrent board tester
US5045782A (en) * 1990-01-23 1991-09-03 Hewlett-Packard Company Negative feedback high current driver for in-circuit tester
US5091693A (en) * 1990-07-13 1992-02-25 Schlumberger Technologies, Inc. Dual-sided test head having floating contact surfaces
FR2675921B1 (fr) * 1991-04-24 1993-08-20 Hewlett Packard Co Procede et dispositif de test d'une carte d'un systeme informatique.
US5414712A (en) * 1991-07-23 1995-05-09 Progressive Computing, Inc. Method for transmitting data using a communication interface box
US5455938A (en) * 1994-09-14 1995-10-03 Ahmed; Sultan Network based machine instruction generator for design verification
US5748497A (en) * 1994-10-31 1998-05-05 Texas Instruments Incorporated System and method for improving fault coverage of an electric circuit
US5663967A (en) * 1995-10-19 1997-09-02 Lsi Logic Corporation Defect isolation using scan-path testing and electron beam probing in multi-level high density asics
EP0938800B1 (fr) * 1996-11-13 2003-09-17 BRITISH TELECOMMUNICATIONS public limited company Systeme de gestion de pannes pour un reseau de telecommunications
US6473707B1 (en) * 1998-08-21 2002-10-29 National Instruments Corporation Test executive system and method including automatic result collection
US6266787B1 (en) * 1998-10-09 2001-07-24 Agilent Technologies, Inc. Method and apparatus for selecting stimulus locations during limited access circuit test
US20020152046A1 (en) * 2001-04-13 2002-10-17 Velichko Sergey A. Concurrent control of semiconductor parametric testing
US7162386B2 (en) * 2002-04-25 2007-01-09 Micron Technology, Inc. Dynamically adaptable semiconductor parametric testing
US7010451B2 (en) * 2003-04-17 2006-03-07 Micron Technology, Inc. Dynamic creation and modification of wafer test maps during wafer testing
WO2007114930A2 (fr) * 2006-03-31 2007-10-11 Teseda Corporation Système et procédé de gestion de diagnostic sécurisée de puces d'essai pour la production
US20090105983A1 (en) * 2007-10-23 2009-04-23 Texas Instruments Incorporated Test definer, a method of automatically determining and representing functional tests for a pcb having analog components and a test system
US8539389B2 (en) 2010-09-27 2013-09-17 Teseda Corporation Correlation of device manufacturing defect data with device electrical test data
US9939488B2 (en) 2011-08-31 2018-04-10 Teseda Corporation Field triage of EOS failures in semiconductor devices
US8907697B2 (en) 2011-08-31 2014-12-09 Teseda Corporation Electrical characterization for a semiconductor device pin
US12007423B2 (en) * 2021-09-02 2024-06-11 Qmax Test Equipments Pvt, Ltd Portable nodal impedance analyser

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1237325A (en) * 1968-10-17 1971-06-30 Bowater Flexpipe Ltd Improved helically wound tubing
DE2013070A1 (de) * 1970-03-19 1971-09-30 Licentia Gmbh Verfahren und Vorrichtung zur Prüfung von unbestuckten gedruckten Schaltungs platten
US3631229A (en) * 1970-09-30 1971-12-28 Ibm Monolithic memory array tester
BE790243A (fr) * 1971-11-08 1973-02-15 Burroughs Corp Procede et appareil de verification de sous-systemes de circuits binaires
US3764995A (en) * 1971-12-21 1973-10-09 Prd Electronics Inc Programmable test systems
US3777129A (en) * 1972-05-22 1973-12-04 Gte Automatic Electric Lab Inc Fault detection and localization in digital systems
US3851249A (en) * 1973-06-04 1974-11-26 Electroglass Inc Microcircuit test device with multi-axes probe control and probe stop means
DE2443716A1 (de) * 1974-09-12 1976-03-25 Siemens Ag Einrichtung zum orten von kurzschluessen auf bestueckten und unbestueckten gedruckten schaltungen
US3931506A (en) * 1974-12-30 1976-01-06 Zehntel, Inc. Programmable tester
US4001818A (en) * 1975-10-22 1977-01-04 Storage Technology Corporation Digital circuit failure detector

Also Published As

Publication number Publication date
JPS5245058A (en) 1977-04-08
GB1523060A (en) 1978-08-31
US4012625A (en) 1977-03-15
AU1682876A (en) 1978-02-16
FR2323297A1 (fr) 1977-04-01
DE2639323A1 (de) 1977-03-10
CA1065062A (fr) 1979-10-23

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